Scanning capacitance probe

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CPC
Y10S977/866

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YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS Y10USPC classification Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS Y10S977/00Nanotechnology

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Y10S977/866Scanning capacitance probe

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method for scanning capacitance microscopy and spectr...
- Patent number 7,856,665
- Issue date Dec 21, 2010
- Asylum Research Corporation
- Maarten Rutgers
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method for measuring nm-scale tip-sample capacitance
- Patent number 7,023,220
- Issue date Apr 4, 2006
- The Ohio State University
- Jonathan P. Pelz
- G01 - MEASURING TESTING
Information Patent Grant
Electrical scanning probe microscope apparatus
- Patent number 6,975,129
- Issue date Dec 13, 2005
- National Applied Research Labratories
- Mao-Nan Chang
- G01 - MEASURING TESTING
Information Patent Grant
Direct, low frequency capacitance measurement for scanning capacita...
- Patent number 6,856,145
- Issue date Feb 15, 2005
- The Ohio State University
- Jonathan P. Pelz
- G01 - MEASURING TESTING
Information Patent Grant
Method of measuring electrical capacitance
- Patent number 6,828,804
- Issue date Dec 7, 2004
- Sharp Kabushiki Kaisha
- Yuji Yashiro
- G01 - MEASURING TESTING
Information Patent Grant
Scanning capacitance sample preparation technique
- Patent number 6,599,132
- Issue date Jul 29, 2003
- The Board of Trustees of the Leland Stanford Junior University
- Eric Anthony Perozziello
- G01 - MEASURING TESTING
Information Patent Grant
Multi-probe test head and process using same
- Patent number 6,426,499
- Issue date Jul 30, 2002
- Deutsche Telekom AG
- Hans Wilfried Peter Koops
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning capacitance device for film thickness mapping featuring en...
- Patent number 6,404,207
- Issue date Jun 11, 2002
- The Ohio State University
- Bharat Bhushan
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Capacitance atomic force microscopes and methods of operating such...
- Patent number 6,172,506
- Issue date Jan 9, 2001
- Veeco Instruments Inc.
- Dennis M. Adderton
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Information processing apparatus with mechanism for adjusting inter...
- Patent number 5,717,680
- Issue date Feb 10, 1998
- Canon Kabushiki Kaisha
- Akihiko Yamano
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Non-contact force microscope having a coaxial cantilever-tip config...
- Patent number 5,602,330
- Issue date Feb 11, 1997
- Arizona Board of Regents acting on behalf of Arizona State University
- Ralph V. Chamberlin
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Non-contact force microscope having a coaxial cantilever-tip config...
- Patent number 5,509,300
- Issue date Apr 23, 1996
- Arizona Board of Regents acting for Arizona State University
- Ralph V. Chamberlin
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning capacitance microscope
- Patent number 4,481,616
- Issue date Nov 6, 1984
- RCA Corporation
- James R. Matey
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
Apparatus and method for scanning capacitance microscopy and spectr...
- Publication number 20090084952
- Publication date Apr 2, 2009
- Maarten Rutgers
- G01 - MEASURING TESTING
Information Patent Application
Method for measuring nm-scale tip-sample capacitance
- Publication number 20050077915
- Publication date Apr 14, 2005
- The Ohio State University
- Jonathan P. Pelz
- G01 - MEASURING TESTING
Information Patent Application
Electrical scanning probe microscope apparatus
- Publication number 20050030054
- Publication date Feb 10, 2005
- Mao-Nan Chang
- G01 - MEASURING TESTING
Information Patent Application
Method of measuring electrical capacitance
- Publication number 20040108864
- Publication date Jun 10, 2004
- Yuji Yashiro
- G01 - MEASURING TESTING
Information Patent Application
Direct, low frequency capacitance measurement for scanning capacita...
- Publication number 20040008042
- Publication date Jan 15, 2004
- The Ohio State University
- Jonathan P. Pelz
- G01 - MEASURING TESTING

Scanning capacitance probe

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Apparatus and method for scanning capacitance microscopy and spectr...

Method for measuring nm-scale tip-sample capacitance

Electrical scanning probe microscope apparatus

Direct, low frequency capacitance measurement for scanning capacita...

Method of measuring electrical capacitance

Scanning capacitance sample preparation technique

Multi-probe test head and process using same

Scanning capacitance device for film thickness mapping featuring en...

Capacitance atomic force microscopes and methods of operating such...

Information processing apparatus with mechanism for adjusting inter...

Non-contact force microscope having a coaxial cantilever-tip config...

Non-contact force microscope having a coaxial cantilever-tip config...

Scanning capacitance microscope

Patents Applicationslast 30 patents

Apparatus and method for scanning capacitance microscopy and spectr...

Method for measuring nm-scale tip-sample capacitance

Electrical scanning probe microscope apparatus

Method of measuring electrical capacitance

Direct, low frequency capacitance measurement for scanning capacita...