Scanning thermal probe

Industry

CPC
Y10S977/867

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YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS Y10USPC classification Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS Y10S977/00Nanotechnology

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Y10S977/867Scanning thermal probe

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Patents Grantslast 30 patents

Information Patent Grant
Method of making thin film probe tip for atomic force microscopy
- Patent number 8,689,361
- Issue date Apr 1, 2014
- Oicmicro, LLC
- Salleh Ismail
- G01 - MEASURING TESTING
Information Patent Grant
Thermal probe
- Patent number 8,595,861
- Issue date Nov 26, 2013
- National Cheng Kung University
- Bernard HaoChih Liu
- G01 - MEASURING TESTING
Information Patent Grant
Probe for scanning thermal microscope
- Patent number 7,514,678
- Issue date Apr 7, 2009
- Tsinghua University
- Yuan Yao
- G01 - MEASURING TESTING
Information Patent Grant
Dual stage instrument for scanning a specimen
- Patent number 7,100,430
- Issue date Sep 5, 2006
- KLA-Tencor Corporation
- Amin Samsavar
- G01 - MEASURING TESTING
Information Patent Grant
Heat emitting probe and heat emitting probe apparatus
- Patent number 7,073,937
- Issue date Jul 11, 2006
- Yoshikaza Nakayama
- Yoshikazu Nakayama
- G11 - INFORMATION STORAGE
Information Patent Grant
Heated self-detecting type cantilever for atomic force microscope
- Patent number 6,932,504
- Issue date Aug 23, 2005
- SII NanoTechnology Inc.
- Hiroshi Takahashi
- G01 - MEASURING TESTING
Information Patent Grant
Assembly comprising a plurality of media probes for writing/reading...
- Patent number 6,702,186
- Issue date Mar 9, 2004
- Hitachi Global Storage Technologies, Netherlands B.V.
- Hendrik F. Hamann
- G11 - INFORMATION STORAGE
Information Patent Grant
Incorporation of dielectric layer onto SThM tips for direct thermal...
- Patent number 6,566,650
- Issue date May 20, 2003
- Chartered Semiconductor Manufacturing Ltd.
- Chang Chaun Hu
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for detecting line-shorts by potential and tem...
- Patent number 6,563,321
- Issue date May 13, 2003
- NEC Corporation
- Hiroaki Kikuchi
- G01 - MEASURING TESTING
Information Patent Grant
High resolution scanning thermal probe and method of manufacturing...
- Patent number 6,518,872
- Issue date Feb 11, 2003
- University of Maryland
- Klaus Edinger
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for performing localized thermal analysis and...
- Patent number 6,491,425
- Issue date Dec 10, 2002
- TA Instruments, Inc.
- Azzedine Hammiche
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring thermal and electrical propertie...
- Patent number 6,487,515
- Issue date Nov 26, 2002
- International Business Machines Corporation
- Uttam Shyamalindu Ghoshal
- G01 - MEASURING TESTING
Information Patent Grant
Probe apparatus and method for measuring thermoelectric properties...
- Patent number 6,467,951
- Issue date Oct 22, 2002
- International Business Machines Corporation
- Uttam Shyamalindu Ghoshal
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for performing chemical analysis using imaging...
- Patent number 6,405,137
- Issue date Jun 11, 2002
- TA Instruments, Inc.
- Michael Reading
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and system for increasing the accuracy of a probe-based inst...
- Patent number 6,389,886
- Issue date May 21, 2002
- Veeco Instruments Inc.
- Robert Daniels
- G01 - MEASURING TESTING
Information Patent Grant
Dual stage instrument for scanning a specimen
- Patent number 6,267,005
- Issue date Jul 31, 2001
- KLA-Tencor Corporation
- Amin Samsavar
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and apparatus for high spatial resolution spectroscopic micr...
- Patent number 6,260,997
- Issue date Jul 17, 2001
- Michael Claybourn
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Investigation and/or manipulation device
- Patent number 6,249,747
- Issue date Jun 19, 2001
- International Business Machines Corporation
- Gerd K. Binnig
- B82 - NANO-TECHNOLOGY
Information Patent Grant
High density magnetic thermal recording and reproducing assembly
- Patent number 6,233,206
- Issue date May 15, 2001
- International Business Machines Corporation
- Hendrik F. Hamann
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and apparatus for localized dynamic mechano-thermal analysis...
- Patent number 6,200,022
- Issue date Mar 13, 2001
- TA Instruments, Inc.
- Azzedine Hammiche
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Method and system for increasing the accuracy of a probe-based inst...
- Patent number 6,185,992
- Issue date Feb 13, 2001
- Veeco Instruments Inc.
- Robert Daniels
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for performing localized thermal analysis and...
- Patent number 6,095,679
- Issue date Aug 1, 2000
- TA Instruments
- Azzedine Hammiche
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Dual stage instrument for scanning a specimen
- Patent number 5,948,972
- Issue date Sep 7, 1999
- KLA-Tencor Corporation
- Amin Samsavar
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Cantilever and measuring apparatus using it
- Patent number 5,929,438
- Issue date Jul 27, 1999
- Nikon Corporation
- Yoshihiko Suzuki
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Thermal sensing scanning probe microscope and method for measuremen...
- Patent number 5,441,343
- Issue date Aug 15, 1995
- TopoMetrix Corporation
- Russell J. Pylkki
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method of forming a probe for an atomic force microscope
- Patent number 5,388,323
- Issue date Feb 14, 1995
- Motorola, Inc.
- Theresa J. Hopson
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Probe for providing surface images
- Patent number 5,356,218
- Issue date Oct 18, 1994
- Motorola, Inc.
- Theresa J. Hopson
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Absorption microscopy and/or spectroscopy with scanning tunneling m...
- Patent number 4,941,753
- Issue date Jul 17, 1990
- International Business Machines Corp.
- Hemantha K. Wickramasinghe
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning thermal profiler
- Patent number 4,747,698
- Issue date May 31, 1988
- International Business Machines Corp.
- Hermantha K. Wickramasinghe
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
THERMAL PROBE
- Publication number 20130019352
- Publication date Jan 17, 2013
- Bernard HaoChih LIU
- B82 - NANO-TECHNOLOGY
Information Patent Application
Probe for scanning thermal microscope
- Publication number 20070085002
- Publication date Apr 19, 2007
- Tsinghua University
- Yuan Yao
- G01 - MEASURING TESTING
Information Patent Application
Dual stage instrument for scanning a specimen
- Publication number 20050005688
- Publication date Jan 13, 2005
- Amin Samsavar
- G01 - MEASURING TESTING
Information Patent Application
Temperature measurement probe and temperature measurement apparatus
- Publication number 20040028119
- Publication date Feb 12, 2004
- Hiroshi Takahashi
- G01 - MEASURING TESTING
Information Patent Application
Dual stage instrument for scanning a specimen
- Publication number 20030089162
- Publication date May 15, 2003
- Amin Samsavar
- G01 - MEASURING TESTING
Information Patent Application
Heat emitting probe and heat emitting probe apparatus
- Publication number 20020110177
- Publication date Aug 15, 2002
- YOSHIKAZU NAKAYAMA and DAIKEN CHEMICAL CO., LTD.
- Yoshikazu Nakayama
- B82 - NANO-TECHNOLOGY
Information Patent Application
Dual stage instrument for scanning a specimen
- Publication number 20010047682
- Publication date Dec 6, 2001
- Amin Samsavar
- B82 - NANO-TECHNOLOGY
Information Patent Application
Method and apparatus for detecting line-shorts by potential and tem...
- Publication number 20010040456
- Publication date Nov 15, 2001
- NEC Corporation
- Hiroaki Kikuchi
- G01 - MEASURING TESTING
Information Patent Application
Method and system for increasing the accuracy of a probe-based inst...
- Publication number 20010000279
- Publication date Apr 19, 2001
- Veeco Instruments Inc.
- Robert Daniels
- G01 - MEASURING TESTING

Scanning thermal probe

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method of making thin film probe tip for atomic force microscopy

Thermal probe

Probe for scanning thermal microscope

Dual stage instrument for scanning a specimen

Heat emitting probe and heat emitting probe apparatus

Heated self-detecting type cantilever for atomic force microscope

Assembly comprising a plurality of media probes for writing/reading...

Incorporation of dielectric layer onto SThM tips for direct thermal...

Method and apparatus for detecting line-shorts by potential and tem...

High resolution scanning thermal probe and method of manufacturing...

Method and apparatus for performing localized thermal analysis and...

Method and apparatus for measuring thermal and electrical propertie...

Probe apparatus and method for measuring thermoelectric properties...

Method and apparatus for performing chemical analysis using imaging...

Method and system for increasing the accuracy of a probe-based inst...

Dual stage instrument for scanning a specimen

Method and apparatus for high spatial resolution spectroscopic micr...

Investigation and/or manipulation device

High density magnetic thermal recording and reproducing assembly

Method and apparatus for localized dynamic mechano-thermal analysis...

Method and system for increasing the accuracy of a probe-based inst...

Method and apparatus for performing localized thermal analysis and...

Dual stage instrument for scanning a specimen

Cantilever and measuring apparatus using it

Thermal sensing scanning probe microscope and method for measuremen...

Method of forming a probe for an atomic force microscope

Probe for providing surface images

Absorption microscopy and/or spectroscopy with scanning tunneling m...

Scanning thermal profiler

Patents Applicationslast 30 patents

THERMAL PROBE

Probe for scanning thermal microscope

Dual stage instrument for scanning a specimen

Temperature measurement probe and temperature measurement apparatus

Dual stage instrument for scanning a specimen

Heat emitting probe and heat emitting probe apparatus

Dual stage instrument for scanning a specimen

Method and apparatus for detecting line-shorts by potential and tem...

Method and system for increasing the accuracy of a probe-based inst...