Scanning tunnelling microscopes

Industry

CPC
H01J2237/2818

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Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J2237/00Discharge tubes exposing object to beam

Current Industry

H01J2237/2818Scanning tunnelling microscopes

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Methods and devices configured to operated scanning tunneling micro...
- Patent number 11,650,222
- Issue date May 16, 2023
- Board of Regents, The University of Texas System
- Seyed Omid Reza Moheimani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and devices for examining an electrically charged specimen...
- Patent number 11,170,970
- Issue date Nov 9, 2021
- Carl Zeiss SMT GmbH
- Michael Budach
- G01 - MEASURING TESTING
Information Patent Grant
Methods and devices configured to operated scanning tunneling micro...
- Patent number 11,143,671
- Issue date Oct 12, 2021
- Board of Regents, The University of Texas System
- Seyed Omid Reza Moheimani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for determining the shape of a sample tip for atom probe tom...
- Patent number 10,746,759
- Issue date Aug 18, 2020
- Imec VZW
- Kristof Paredis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Tunnel current control apparatus and tunnel current control method
- Patent number 10,451,651
- Issue date Oct 22, 2019
- Hamamatsu Photonics K.K.
- Yoichi Kawada
- G01 - MEASURING TESTING
Information Patent Grant
Methods and devices for examining an electrically charged specimen...
- Patent number 10,068,747
- Issue date Sep 4, 2018
- Carl Zeiss SMT GmbH
- Michael Budach
- G01 - MEASURING TESTING
Information Patent Grant
Three-dimensional semiconductor image reconstruction apparatus and...
- Patent number 9,324,178
- Issue date Apr 26, 2016
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Wen-Hao Cheng
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for investigating an object
- Patent number 9,115,981
- Issue date Aug 25, 2015
- Carl Zeiss SMS GmbH
- Christof Baur
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method of fabricating nanotips with controlled profile
- Patent number 9,102,190
- Issue date Aug 11, 2015
- National Research Council of Canada
- Jason L. Pitters
- B44 - DECORATIVE ARTS
Information Patent Grant
Pump probe measuring device
- Patent number 8,982,451
- Issue date Mar 17, 2015
- Japan Science and Technology Agency
- Hidemi Shigekawa
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Three-dimensional semiconductor image reconstruction apparatus and...
- Patent number 8,901,492
- Issue date Dec 2, 2014
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Wen-Hao Cheng
- G01 - MEASURING TESTING
Information Patent Grant
3D atomic scale imaging methods
- Patent number 8,670,608
- Issue date Mar 11, 2014
- Cameca Instruments, Inc.
- Thomas F. Kelly
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Integrated circuit inspection system
- Patent number 8,049,514
- Issue date Nov 1, 2011
- Micron Technology, Inc.
- Gurtej S. Sandhu
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Defining a pattern on a substrate
- Patent number 7,847,926
- Issue date Dec 7, 2010
- International Business Machines Corporation
- Gerhard Meyer
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Integrated circuit inspection system
- Patent number 7,662,648
- Issue date Feb 16, 2010
- Micron Technology, Inc.
- Gurtej S. Sandhu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electric charged particle beam microscopy and electric charged part...
- Patent number 7,633,064
- Issue date Dec 15, 2009
- Hitachi High-Technologies Corporation
- Ruriko Tsuneta
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Micro-column electron beam apparatus
- Patent number 7,375,351
- Issue date May 20, 2008
- Electronics and Telecommunications Research Instutute
- Sang Kuk Choi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Defining a pattern on a substrate
- Patent number 7,315,367
- Issue date Jan 1, 2008
- International Business Machines Corporation
- Gerhard Meyer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning atom probe and analysis method utilizing scanning atom probe
- Patent number 6,875,981
- Issue date Apr 5, 2005
- Kanazawa Institute of Technology
- Osamu Nishikawa
- G01 - MEASURING TESTING
Information Patent Grant
System and method for accurate positioning of a scanning probe micr...
- Patent number 6,608,307
- Issue date Aug 19, 2003
- Zyvex Corporation
- Christof Baur
- G01 - MEASURING TESTING
Information Patent Grant
Scanning force microscope to determine interaction forces with high...
- Patent number 6,452,170
- Issue date Sep 17, 2002
- University of Puerto Rico
- Fredy R. Zypman
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Integrated microcolumn and scanning probe microscope arrays
- Patent number 6,369,385
- Issue date Apr 9, 2002
- Applied Materials, Inc.
- Lawrence P. Muray
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Heated stage for a scanning probe microscope
- Patent number 5,821,545
- Issue date Oct 13, 1998
- Molecular Imaging Corporation
- Stuart M. Lindsay
- G01 - MEASURING TESTING
Information Patent Grant
Variable temperature scanning probe microscope based on a peltier d...
- Patent number 5,654,546
- Issue date Aug 5, 1997
- Molecular Imaging Corporation
- Stuart M. Lindsay
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscope apparatus for use in a scanning electron...
- Patent number 5,510,615
- Issue date Apr 23, 1996
- TopoMetrix Corporation
- Huddee Ho
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscope apparatus for use in a scanning electron
- Patent number 5,455,420
- Issue date Oct 3, 1995
- Topometrix
- Huddee Ho
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning device for scanning tunneling microscope
- Patent number 4,894,538
- Issue date Jan 16, 1990
- Jeol Ltd.
- Masashi Iwatsuki
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Tunnel and field effect carrier ballistics
- Patent number 4,823,004
- Issue date Apr 18, 1989
- California Institute of Technology
- William J. Kaiser
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
METHODS AND DEVICES CONFIGURED TO OPERATED SCANNING TUNNELING MICRO...
- Publication number 20220082582
- Publication date Mar 17, 2022
- Board of Regents, The University of Texas System
- Seyed Omid Reza Moheimani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS AND DEVICES CONFIGURED TO OPERATED SCANNING TUNNELING MICRO...
- Publication number 20210132109
- Publication date May 6, 2021
- Board of Regents, The University of Texas System
- Seyed Omid Reza Moheimani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TUNNEL CURRENT CONTROL APPARATUS AND TUNNEL CURRENT CONTROL METHOD
- Publication number 20190064210
- Publication date Feb 28, 2019
- HAMAMATSU PHOTONICS K. K.
- Yoichi KAWADA
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND DEVICES FOR EXAMINING AN ELECTRICALLY CHARGED SPECIMEN...
- Publication number 20190035601
- Publication date Jan 31, 2019
- Carl Zeiss SMT GMBH
- Michael Budach
- G01 - MEASURING TESTING
Information Patent Application
PUMP PROBE MEASURING DEVICE
- Publication number 20140240710
- Publication date Aug 28, 2014
- Japan Science and Technology Agency
- Hidemi Shigekawa
- B82 - NANO-TECHNOLOGY
Information Patent Application
METHOD OF FABRICATING NANOTIPS WITH CONTROLLED PROFILE
- Publication number 20140231379
- Publication date Aug 21, 2014
- National Research Council of Canada
- Jason L. Pitters
- B44 - DECORATIVE ARTS
Information Patent Application
APPARATUS AND METHOD FOR INVESTIGATING AN OBJECT
- Publication number 20140027512
- Publication date Jan 30, 2014
- Christof Baur
- B82 - NANO-TECHNOLOGY
Information Patent Application
3D atomic scale imaging methods
- Publication number 20110103681
- Publication date May 5, 2011
- Thomas F. Kelly
- B82 - NANO-TECHNOLOGY
Information Patent Application
INTEGRATED CIRCUIT INSPECTION SYSTEM
- Publication number 20100141265
- Publication date Jun 10, 2010
- Gurtej S. Sandhu
- B82 - NANO-TECHNOLOGY
Information Patent Application
ELECTRIC CHARGED PARTICLE BEAM MICROSCOPY AND ELECTRIC CHARGED PART...
- Publication number 20080093551
- Publication date Apr 24, 2008
- Ruriko TSUNETA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFINING A PATTERN ON A SUBSTRATE
- Publication number 20080074656
- Publication date Mar 27, 2008
- Gerhard Meyer
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Electron microscope and scanning probe microscope calibration device
- Publication number 20080067370
- Publication date Mar 20, 2008
- John Patrick McCaffrey
- G01 - MEASURING TESTING
Information Patent Application
Integrated circuit inspection system
- Publication number 20070046172
- Publication date Mar 1, 2007
- Gurtej S. Sandhu
- B82 - NANO-TECHNOLOGY
Information Patent Application
Micro-column electron beam apparatus
- Publication number 20060151716
- Publication date Jul 13, 2006
- Sang Kuk Choi
- B82 - NANO-TECHNOLOGY
Information Patent Application
Defining a pattern on a substrate
- Publication number 20050280792
- Publication date Dec 22, 2005
- International Business Machines Corporation
- Gerhard Meyer
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Scanning atom probe and analysis method utilizing scanning atom probe
- Publication number 20030154773
- Publication date Aug 21, 2003
- Osamu Nishikawa
- G01 - MEASURING TESTING

Scanning tunnelling microscopes

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Methods and devices configured to operated scanning tunneling micro...

Methods and devices for examining an electrically charged specimen...

Methods and devices configured to operated scanning tunneling micro...

Method for determining the shape of a sample tip for atom probe tom...

Tunnel current control apparatus and tunnel current control method

Methods and devices for examining an electrically charged specimen...

Three-dimensional semiconductor image reconstruction apparatus and...

Apparatus and method for investigating an object

Method of fabricating nanotips with controlled profile

Pump probe measuring device

Three-dimensional semiconductor image reconstruction apparatus and...

3D atomic scale imaging methods

Integrated circuit inspection system

Defining a pattern on a substrate

Integrated circuit inspection system

Electric charged particle beam microscopy and electric charged part...

Micro-column electron beam apparatus

Defining a pattern on a substrate

Scanning atom probe and analysis method utilizing scanning atom probe

System and method for accurate positioning of a scanning probe micr...

Scanning force microscope to determine interaction forces with high...

Integrated microcolumn and scanning probe microscope arrays

Heated stage for a scanning probe microscope

Variable temperature scanning probe microscope based on a peltier d...

Scanning probe microscope apparatus for use in a scanning electron...

Scanning probe microscope apparatus for use in a scanning electron

Scanning device for scanning tunneling microscope

Tunnel and field effect carrier ballistics

Patents Applicationslast 30 patents

METHODS AND DEVICES CONFIGURED TO OPERATED SCANNING TUNNELING MICRO...

METHODS AND DEVICES CONFIGURED TO OPERATED SCANNING TUNNELING MICRO...

TUNNEL CURRENT CONTROL APPARATUS AND TUNNEL CURRENT CONTROL METHOD

METHODS AND DEVICES FOR EXAMINING AN ELECTRICALLY CHARGED SPECIMEN...

PUMP PROBE MEASURING DEVICE

METHOD OF FABRICATING NANOTIPS WITH CONTROLLED PROFILE

APPARATUS AND METHOD FOR INVESTIGATING AN OBJECT

3D atomic scale imaging methods

INTEGRATED CIRCUIT INSPECTION SYSTEM

ELECTRIC CHARGED PARTICLE BEAM MICROSCOPY AND ELECTRIC CHARGED PART...

DEFINING A PATTERN ON A SUBSTRATE

Electron microscope and scanning probe microscope calibration device

Integrated circuit inspection system

Micro-column electron beam apparatus

Defining a pattern on a substrate

Scanning atom probe and analysis method utilizing scanning atom probe