Scanning

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CPC
G01N2201/10

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2201/00Features of devices classified in G01N21/00

Current Industry

G01N2201/10Scanning

Industries

Patents Grantslast 30 patents

Information Patent Grant
Multiplex labeling of molecules by sequential hybridization barcoding
- Patent number 12,305,224
- Issue date May 20, 2025
- California Institute of Technology
- Long Cai
- G02 - OPTICS
Information Patent Grant
Method, apparatus and computer program for localizing an emitter in...
- Patent number 12,306,392
- Issue date May 20, 2025
- Abberior Instruments GmbH
- Roman Schmidt
- G01 - MEASURING TESTING
Information Patent Grant
Foreign substance/defect inspection device, image generation device...
- Patent number 12,292,386
- Issue date May 6, 2025
- VIENEX CORPORATION
- Yukihiro Kagawa
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for multicolor imaging
- Patent number 12,247,921
- Issue date Mar 11, 2025
- Singular Genomics Systems, Inc.
- Fedor Trintchouk
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Combined scatter and transmission multi-view imaging system
- Patent number 12,235,226
- Issue date Feb 25, 2025
- Rapiscan Systems, Inc.
- Edward James Morton
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Three-dimensional fluorescence imaging system comprising single-obj...
- Patent number 12,210,144
- Issue date Jan 28, 2025
- WUHAN SMARTVIEW BIOTECHNOLOGY CO., LTD.
- Yuxuan Zhao
- G01 - MEASURING TESTING
Information Patent Grant
Dark-field confocal microscopy measurement apparatus and method bas...
- Patent number 12,203,867
- Issue date Jan 21, 2025
- Harbin Institute of Technology
- Jian Liu
- G01 - MEASURING TESTING
Information Patent Grant
Stimulated Raman photothermal microscope
- Patent number 12,196,682
- Issue date Jan 14, 2025
- Trustees of Boston University
- Ji-Xin Cheng
- G01 - MEASURING TESTING
Information Patent Grant
Multi-modal imaging systems and methods
- Patent number 12,184,037
- Issue date Dec 31, 2024
- LI-COR BIOTECH, LLC
- Andrew Ragatz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for controlling a focus point of a stationary...
- Patent number 12,179,219
- Issue date Dec 31, 2024
- SpinChip Diagnostics AS
- Ole Christian Tronrud
- G01 - MEASURING TESTING
Information Patent Grant
Nanoscale scanning sensors
- Patent number 12,169,209
- Issue date Dec 17, 2024
- President and Fellows of Harvard College
- Michael S. Grinolds
- G01 - MEASURING TESTING
Information Patent Grant
Optical interrogation system and method
- Patent number 12,169,173
- Issue date Dec 17, 2024
- Universite Laval
- Maxime Joly
- G01 - MEASURING TESTING
Information Patent Grant
Digital mirror device based code-division multiplexed Raman optical...
- Patent number 12,163,891
- Issue date Dec 10, 2024
- CytoVeris, Inc.
- Alan Kersey
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Inspection system
- Patent number 12,140,554
- Issue date Nov 12, 2024
- THE NIPPON SIGNAL CO., LTD.
- Kazuaki Takayama
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for fluorescence lifetime based sequencing
- Patent number 12,140,541
- Issue date Nov 12, 2024
- Illumina, Inc.
- Hod Finkelstein
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Non-linear optical scanning microscope having kinematic flexure mec...
- Patent number 12,135,412
- Issue date Nov 5, 2024
- PXYL Limited
- Craig James Hamilton
- G02 - OPTICS
Information Patent Grant
Inspection apparatus and focal position adjustment method
- Patent number 12,135,295
- Issue date Nov 5, 2024
- NuFlare Technology, Inc.
- Masaya Takeda
- G01 - MEASURING TESTING
Information Patent Grant
Micro scale image capture system
- Patent number 12,066,387
- Issue date Aug 20, 2024
- SEDDI, INC.
- Carlos Aliaga
- G01 - MEASURING TESTING
Information Patent Grant
Communication hole inspection device and communication hole inspect...
- Patent number 12,055,499
- Issue date Aug 6, 2024
- Honda Motor Co., Ltd.
- Ken Akiyama
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
Defect inspection device and defect inspection method
- Patent number 12,044,627
- Issue date Jul 23, 2024
- HITACHI HIGH-TECH CORPORATION
- Masaya Yamamoto
- G02 - OPTICS
Information Patent Grant
Wafer inspection apparatus and method
- Patent number 12,038,389
- Issue date Jul 16, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Chung-Pin Chou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Estimating a condition of a physical structure
- Patent number 12,039,669
- Issue date Jul 16, 2024
- STATE FARM MUTUAL AUTOMOBILE INSURANCE COMPANY
- James M. Freeman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for mobile device display and housing diagnostics
- Patent number 12,013,348
- Issue date Jun 18, 2024
- BLANCCO TECHNOLOGY GROUP IP OY
- William Fitzgerald
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
High speed deep tissue imaging system using multiplexed scanned tem...
- Patent number 11,988,603
- Issue date May 21, 2024
- University of Vienna
- Alipasha Vaziri
- G01 - MEASURING TESTING
Information Patent Grant
System and method for internal coating of offshore pipeline weld jo...
- Patent number 11,982,632
- Issue date May 14, 2024
- Saudi Arabian Oil Company
- Mana H. Al-Mansour
- G01 - MEASURING TESTING
Information Patent Grant
Quantum enhanced magneto-optical microscopy and spectroscopy
- Patent number 11,953,432
- Issue date Apr 9, 2024
- UT-Battelle, LLC
- Benjamin J. Lawrie
- G01 - MEASURING TESTING
Information Patent Grant
Method for reducing analyzer variability using a normalization target
- Patent number 11,953,428
- Issue date Apr 9, 2024
- Quidel Corporation
- David Dickson Booker
- G01 - MEASURING TESTING
Information Patent Grant
Device of complex gas mixture detection based on optical-path-adjus...
- Patent number 11,933,724
- Issue date Mar 19, 2024
- HUBEI UNIVERSITY OF TECHNOLOGY
- Yin Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Appearance inspection device and defect inspection method
- Patent number 11,936,985
- Issue date Mar 19, 2024
- Omron Corporation
- Shingo Hayashi
- G01 - MEASURING TESTING
Information Patent Grant
Method of scanning an optical beam using an acousto-optic deflector...
- Patent number 11,927,873
- Issue date Mar 12, 2024
- Femtonics Kft.
- Gergely Katona
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Fluorescence Imaging Flow Cytometry With Enhanced Image Resolution
- Publication number 20250155353
- Publication date May 15, 2025
- Becton, Dickinson and Company
- Eric D. Diebold
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR DETECTION OF ALKALI-SILICA REACTIVITY ON CONC...
- Publication number 20250146946
- Publication date May 8, 2025
- Board of Trustees of Western Michigan University
- Upul Attanayake
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR INSPECTION OF PANEL EMBEDDED DIES USING CO...
- Publication number 20250146955
- Publication date May 8, 2025
- ORBOTECH LTD.
- Elkana Porat
- G01 - MEASURING TESTING
Information Patent Application
MATERIAL IDENTIFICATION APPARATUS AND METHOD
- Publication number 20250146937
- Publication date May 8, 2025
- TOMRA SORTING GMBH
- Dirk BALTHASAR
- G01 - MEASURING TESTING
Information Patent Application
VERIFICATION METHOD FOR A BIRD PROTECTION FUNCTION OF A GLASS SURFACE
- Publication number 20250137939
- Publication date May 1, 2025
- BirdShades Innovations GmbH
- Christoph CERNY
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPEN-TOP TWO-PHOTON LIGHT SHEET MICROSCOPE AND OPERATING METHOD THE...
- Publication number 20250102786
- Publication date Mar 27, 2025
- POSTECH Research and Business Development Foundation
- Ki Hean KIM
- G01 - MEASURING TESTING
Information Patent Application
ILLUMINATION OPTICAL UNIT FOR A MASK INSPECTION SYSTEM
- Publication number 20250093770
- Publication date Mar 20, 2025
- Carl Zeiss SMT GMBH
- Sören Schmidt
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR FLUORESCENCE LIFETIME BASED SEQUENCING
- Publication number 20250052681
- Publication date Feb 13, 2025
- Illumina, Inc.
- Hod Finkelstein
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
SEMICONDUCTOR MEASUREMENT APPARATUS AND METHOD OF MANUFACTURING SEM...
- Publication number 20250052691
- Publication date Feb 13, 2025
- Samsung Electronics Co., Ltd.
- Youngsun CHOI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
A METHOD AND SYSTEM FOR DISCRIMINATING DEFECTS PRESENT ON A FRONTSI...
- Publication number 20250052692
- Publication date Feb 13, 2025
- Unity Semiconductor
- Alexey Butkevich
- G01 - MEASURING TESTING
Information Patent Application
MULTIPLEX LABELING OF MOLECULES BY SEQUENTIAL HYBRIDIZATION BARCODING
- Publication number 20250043340
- Publication date Feb 6, 2025
- California Institute of Technology
- Long Cai
- G01 - MEASURING TESTING
Information Patent Application
SINGLE-PIXEL MULTISPECTRAL IMAGER FOR FLARE AND BURNER COMBUSTION E...
- Publication number 20250044219
- Publication date Feb 6, 2025
- SCHLUMBERGER TECHNOLOGY CORPORATION
- Sebastien Catheline
- G01 - MEASURING TESTING
Information Patent Application
WAFER DEFECT INSPECTION SYSTEM
- Publication number 20250044241
- Publication date Feb 6, 2025
- SYNTEC RESOURCES CO., LTD.
- KANG-FENG FAN
- G01 - MEASURING TESTING
Information Patent Application
Inspection System
- Publication number 20250027888
- Publication date Jan 23, 2025
- The Nippon Signal Co., Ltd.
- Kazuaki TAKAYAMA
- G01 - MEASURING TESTING
Information Patent Application
PATH-INTEGRATED OPTICAL SENSING AND SIMULTANEOUS RETROREFLECTOR TRA...
- Publication number 20250028049
- Publication date Jan 23, 2025
- The Trustees of Princeton University
- Michael Soskind
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR ILLUMINATING MATTER
- Publication number 20250018433
- Publication date Jan 16, 2025
- TOMRA SORTING GMBH
- Dirk BALTHASAR
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Application
360° MANHOLE INSPECTION SYSTEM AND METHOD
- Publication number 20250016455
- Publication date Jan 9, 2025
- Envirosight LLC
- Stéphane CUENET
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
TOMOGRAPHIC REFRACTIVE INDEX PROFILE EVALUATION OF NON-SYMMETRICAL...
- Publication number 20240426750
- Publication date Dec 26, 2024
- Heraeus Quartz North America LLC
- Maximilian SCHMITT
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR LOCALIZING SINGLE FLUORESCENT MOLECULES COMPRISED IN...
- Publication number 20240393250
- Publication date Nov 28, 2024
- ABBELIGHT
- Nicolas BOURG
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR MEASURING WAFERS
- Publication number 20240393261
- Publication date Nov 28, 2024
- PRECITEC OPTRONIK GMBH
- Tobias Beck
- G01 - MEASURING TESTING
Information Patent Application
ESTIMATING A CONDITION OF A PHYSICAL STRUCTURE
- Publication number 20240378813
- Publication date Nov 14, 2024
- State Farm Mutual Automobile Insurance Company
- James M. Freeman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
HIGH SPEED DEEP TISSUE IMAGING SYSTEM USING MULTIPLEXED SCANNED TEM...
- Publication number 20240377322
- Publication date Nov 14, 2024
- UNIVERSITY OF VIENNA
- Alipasha VAZIRI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WIRE MELTING TRACE PHOTOGRAPHING APPARATUS, APPARATUS AND METHOD OF...
- Publication number 20240369498
- Publication date Nov 7, 2024
- Republic of Korea (National Forensic Service Director Ministry of the Interio...
- Kyu Young LIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEVICE FOR INSPECTING LATERAL SURFACE OF CYLINDRICAL BATTERY
- Publication number 20240361252
- Publication date Oct 31, 2024
- LG ENERGY SOLUTION, LTD.
- Tae Young KIM
- G01 - MEASURING TESTING
Information Patent Application
THREE-DIMENSIONAL FLUORESCENCE IMAGING SYSTEM COMPRISING SINGLE-OBJ...
- Publication number 20240345375
- Publication date Oct 17, 2024
- Wuhan Smartview Biotechnology Co., Ltd.
- Yuxuan ZHAO
- G01 - MEASURING TESTING
Information Patent Application
FLUID BREAKDOWN DETECTION SYSTEMS AND PROCESSES USEFUL FOR LIQUID I...
- Publication number 20240349451
- Publication date Oct 17, 2024
- Modine LLC
- John David Enright
- G01 - MEASURING TESTING
Information Patent Application
SIDE SURFACE INSPECTION DEVICE OF CYLINDRICAL BATTERY
- Publication number 20240345000
- Publication date Oct 17, 2024
- LG ENERGY SOLUTION, LTD.
- Jiwon KIM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPEARANCE INSPECTION DEVICE, WELDING SYSTEM, AND METHOD FOR APPEAR...
- Publication number 20240337608
- Publication date Oct 10, 2024
- Panasonic Intellectual Property Management Co., Ltd.
- Toru SAKAI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MULTIPLE CHANNEL LASER ULTRASONIC SYSTEM
- Publication number 20240328926
- Publication date Oct 3, 2024
- The Boeing Company
- Marc DUBOIS
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM INCLUDING A LASER MODULE
- Publication number 20240328952
- Publication date Oct 3, 2024
- ATONARP INC.
- Neil OU
- G01 - MEASURING TESTING

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Multiplex labeling of molecules by sequential hybridization barcoding

Method, apparatus and computer program for localizing an emitter in...

Foreign substance/defect inspection device, image generation device...

Systems and methods for multicolor imaging

Combined scatter and transmission multi-view imaging system

Three-dimensional fluorescence imaging system comprising single-obj...

Dark-field confocal microscopy measurement apparatus and method bas...

Stimulated Raman photothermal microscope

Multi-modal imaging systems and methods

Method and apparatus for controlling a focus point of a stationary...

Nanoscale scanning sensors

Optical interrogation system and method

Digital mirror device based code-division multiplexed Raman optical...

Inspection system

Method and system for fluorescence lifetime based sequencing

Non-linear optical scanning microscope having kinematic flexure mec...

Inspection apparatus and focal position adjustment method

Micro scale image capture system

Communication hole inspection device and communication hole inspect...

Defect inspection device and defect inspection method

Wafer inspection apparatus and method

Estimating a condition of a physical structure

System and method for mobile device display and housing diagnostics

High speed deep tissue imaging system using multiplexed scanned tem...

System and method for internal coating of offshore pipeline weld jo...

Quantum enhanced magneto-optical microscopy and spectroscopy

Method for reducing analyzer variability using a normalization target

Device of complex gas mixture detection based on optical-path-adjus...

Appearance inspection device and defect inspection method

Method of scanning an optical beam using an acousto-optic deflector...

Patents Applicationslast 30 patents

Fluorescence Imaging Flow Cytometry With Enhanced Image Resolution

DEVICE AND METHOD FOR DETECTION OF ALKALI-SILICA REACTIVITY ON CONC...

METHOD AND APPARATUS FOR INSPECTION OF PANEL EMBEDDED DIES USING CO...

MATERIAL IDENTIFICATION APPARATUS AND METHOD

VERIFICATION METHOD FOR A BIRD PROTECTION FUNCTION OF A GLASS SURFACE

OPEN-TOP TWO-PHOTON LIGHT SHEET MICROSCOPE AND OPERATING METHOD THE...

ILLUMINATION OPTICAL UNIT FOR A MASK INSPECTION SYSTEM

METHOD AND SYSTEM FOR FLUORESCENCE LIFETIME BASED SEQUENCING

SEMICONDUCTOR MEASUREMENT APPARATUS AND METHOD OF MANUFACTURING SEM...

A METHOD AND SYSTEM FOR DISCRIMINATING DEFECTS PRESENT ON A FRONTSI...

MULTIPLEX LABELING OF MOLECULES BY SEQUENTIAL HYBRIDIZATION BARCODING

SINGLE-PIXEL MULTISPECTRAL IMAGER FOR FLARE AND BURNER COMBUSTION E...

WAFER DEFECT INSPECTION SYSTEM

Inspection System

PATH-INTEGRATED OPTICAL SENSING AND SIMULTANEOUS RETROREFLECTOR TRA...

APPARATUS FOR ILLUMINATING MATTER

360° MANHOLE INSPECTION SYSTEM AND METHOD

TOMOGRAPHIC REFRACTIVE INDEX PROFILE EVALUATION OF NON-SYMMETRICAL...

APPARATUS FOR LOCALIZING SINGLE FLUORESCENT MOLECULES COMPRISED IN...

APPARATUS AND METHOD FOR MEASURING WAFERS

ESTIMATING A CONDITION OF A PHYSICAL STRUCTURE

HIGH SPEED DEEP TISSUE IMAGING SYSTEM USING MULTIPLEXED SCANNED TEM...

WIRE MELTING TRACE PHOTOGRAPHING APPARATUS, APPARATUS AND METHOD OF...

DEVICE FOR INSPECTING LATERAL SURFACE OF CYLINDRICAL BATTERY

THREE-DIMENSIONAL FLUORESCENCE IMAGING SYSTEM COMPRISING SINGLE-OBJ...

FLUID BREAKDOWN DETECTION SYSTEMS AND PROCESSES USEFUL FOR LIQUID I...

SIDE SURFACE INSPECTION DEVICE OF CYLINDRICAL BATTERY

APPEARANCE INSPECTION DEVICE, WELDING SYSTEM, AND METHOD FOR APPEAR...

MULTIPLE CHANNEL LASER ULTRASONIC SYSTEM

SYSTEM INCLUDING A LASER MODULE