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Industry
CPC
G01N2223/055
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Parent Industries
G
PHYSICS
G01
Measuring instruments
G01N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G01N2223/00
Investigating materials by wave or particle radiation
Current Industry
G01N2223/055
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Patents Grants
last 30 patents
Information
Patent Grant
System, method, and apparatus for x-ray backscatter inspection of p...
Patent number
11,169,098
Issue date
Nov 9, 2021
The Boeing Company
Morteza Safai
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
SYSTEMS, DEVICES, AND METHODS FOR MULTISOURCE VOLUMETRIC SPECTRAL C...
Publication number
20230375484
Publication date
Nov 23, 2023
The University of North Carolina at Chapel Hill
Christina Inscoe
G06 - COMPUTING CALCULATING COUNTING