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G01N21/455
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PHYSICS
G01
Measuring instruments
G01N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G01N21/00
Investigating or analysing materials by the use of optical means
Current Industry
G01N21/455
Schlieren methods
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Patents Grants
last 30 patents
Information
Patent Grant
Methods and apparatus for a self-aligned digital projection and ref...
Patent number
12,072,286
Issue date
Aug 27, 2024
UNITED STATES OF AMERICA AS REPRESENTED BY THE ADMINISTRATOR OF NASA.
Brett F. Bathel
G01 - MEASURING TESTING
Information
Patent Grant
Deflectometry measurement system
Patent number
12,000,752
Issue date
Jun 4, 2024
LAMBDA-X OPHTHALMICS
Philippe Antoine
G01 - MEASURING TESTING
Information
Patent Grant
Visualizing catheter irrigation using schlieren images
Patent number
11,867,924
Issue date
Jan 9, 2024
BIOSENSE WEBSTER (ISRAEL) LTD.
Assaf Govari
G02 - OPTICS
Information
Patent Grant
Real-time, reference-free background oriented schlieren imaging system
Patent number
11,796,469
Issue date
Oct 24, 2023
UNITED STATES OF AMERICA AS REPRESENTED BY THE ADMINISTRATOR OF NASA.
Joshua M. Weisberger
G01 - MEASURING TESTING
Information
Patent Grant
System and method for focusing color Schlieren diagnostics
Patent number
11,709,131
Issue date
Jul 25, 2023
BOARD OF SUPERVISORS OF LOUISIANA SATE UNIVERSITY AND AGRICULTURAL AND MECHAN...
Ingmar Schoegl
G01 - MEASURING TESTING
Information
Patent Grant
Optical test apparatus and optical test method
Patent number
11,693,162
Issue date
Jul 4, 2023
Kabushiki Kaisha Toshiba
Hiroya Kano
G01 - MEASURING TESTING
Information
Patent Grant
Compact, self-aligned projection focusing schlieren method and system
Patent number
11,650,151
Issue date
May 16, 2023
UNITED STATES OF AMERICA AS REPRESENTED BY THE ADMINISTRATOR OF NASA.
Brett F. Bathel
G02 - OPTICS
Information
Patent Grant
Optical test apparatus and optical test method
Patent number
11,536,652
Issue date
Dec 27, 2022
Kabushiki Kaisha Toshiba
Hiroshi Ohno
G01 - MEASURING TESTING
Information
Patent Grant
System and method for focusing color Schlieren diagnostics
Patent number
10,866,186
Issue date
Dec 15, 2020
Board of Supervisors Louisiana State University and Agricultural and Mechanic...
Ingmar Schoegl
G01 - MEASURING TESTING
Information
Patent Grant
Device that generates salt-state information of a road
Patent number
10,739,258
Issue date
Aug 11, 2020
Ford Global Technologies, LLC
Frederic Stefan
B60 - VEHICLES IN GENERAL
Information
Patent Grant
Optical test apparatus and optical test method
Patent number
10,732,102
Issue date
Aug 4, 2020
Kabushiki Kaisha Toshiba
Hiroshi Ohno
G01 - MEASURING TESTING
Information
Patent Grant
Method and device for determining a three-dimensional distortion
Patent number
10,289,895
Issue date
May 14, 2019
Isra Surface Vision GmbH
Rolf Kubiak
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Systems and methods for optical scanning of fluid transport pipelines
Patent number
10,254,193
Issue date
Apr 9, 2019
Illusense Inc.
Nathan Chan
G01 - MEASURING TESTING
Information
Patent Grant
Method for observing a sample by lens-free imaging
Patent number
10,254,531
Issue date
Apr 9, 2019
Commissariat a l'Energie Atomique et Aux Energies Alternatives
Sophie Morel
G01 - MEASURING TESTING
Information
Patent Grant
Method for observing a sample by lens-free imaging
Patent number
10,088,664
Issue date
Oct 2, 2018
Commissariat a l'Energie Atomique et Aux Energies Alternatives
Sophie Morel
G01 - MEASURING TESTING
Information
Patent Grant
Method for determining a local refractive power and device therefor
Patent number
9,818,021
Issue date
Nov 14, 2017
Isra Surface Vision GmbH
Rolf Kubiak
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Glazing inspection
Patent number
7,692,781
Issue date
Apr 6, 2010
Pilkington plc
Barry Raymond Hill
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method to determine the optical quality of a glazing
Patent number
7,528,945
Issue date
May 5, 2009
Pilkington plc
Barry Raymond Hill
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Apparatus and process for characterizing samples
Patent number
7,206,079
Issue date
Apr 17, 2007
Universite Libre de Bruxelles
Luc Joannes
G01 - MEASURING TESTING
Information
Patent Grant
Method of determining local structures in optical crystals
Patent number
6,989,904
Issue date
Jan 24, 2006
Schott AG
Ewald Moersen
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for analysis of schlieren
Patent number
6,891,980
Issue date
May 10, 2005
Schott Glas
Michael Gerhard
G01 - MEASURING TESTING
Information
Patent Grant
Method for detecting optical errors in large surface panels
Patent number
6,509,967
Issue date
Jan 21, 2003
Innomess Gelsellschaft fur Messtechnik mbH
Ulrich Pingel
G01 - MEASURING TESTING
Information
Patent Grant
Schlieren method for imaging semiconductor device properties
Patent number
6,181,416
Issue date
Jan 30, 2001
OptoMetrix, Inc.
Robert Aaron Falk
G01 - MEASURING TESTING
Information
Patent Grant
Method of detecting weather conditions in the atmosphere
Patent number
6,034,760
Issue date
Mar 7, 2000
Flight Safety Technologies, Inc.
Frank L. Rees
G01 - MEASURING TESTING
Information
Patent Grant
Methods for detecting inhomogeneities, specifically, striae, infuse...
Patent number
5,764,345
Issue date
Jun 9, 1998
Corning Incorporated
David R. Fladd
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Scanning mode sensor for detection of flow inhomogeneities
Patent number
5,715,047
Issue date
Feb 3, 1998
The United States of America as represented by the administrator of the Natio...
Grigory Adamovsky
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for two or three dimensional optical inspection of a sample
Patent number
5,583,632
Issue date
Dec 10, 1996
New Creation Co., Ltd.
Kazumi Haga
G01 - MEASURING TESTING
Information
Patent Grant
Schlieren system and method for moving objects
Patent number
5,534,995
Issue date
Jul 9, 1996
The United States of America as represented by the administrator of the Natio...
Leonard M. Weinstein
G01 - MEASURING TESTING
Information
Patent Grant
Retroreflection focusing schlieren system
Patent number
5,515,158
Issue date
May 7, 1996
The United States of America as represented by the administrator of the Natio...
James T. Heineck
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for detecting universally and selectively conc...
Patent number
4,940,333
Issue date
Jul 10, 1990
Torres; Anthony R.
Janusz B. Pawliszyn
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
VISUALIZING CATHETER IRRIGATION USING SCHLIEREN IMAGES
Publication number
20240142791
Publication date
May 2, 2024
BIOSENSE WEBSTER (ISRAEL) LTD.
Assaf GOVARI
G01 - MEASURING TESTING
Information
Patent Application
REAL-TIME, REFERENCE-FREE BACKGROUND ORIENTED SCHLIEREN IMAGING SYSTEM
Publication number
20240027342
Publication date
Jan 25, 2024
United States of America as represented by the Administrator of NASA
Joshua M. Weisberger
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR FOCUSING COLOR SCHLIEREN DIAGNOSTICS
Publication number
20230324297
Publication date
Oct 12, 2023
Board of Supervisors of Louisiana State University and Agricultural and Mecha...
Ingmar SCHOEGL
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
OPTICAL TEST APPARATUS AND OPTICAL TEST METHOD
Publication number
20230288619
Publication date
Sep 14, 2023
Kabushiki Kaisha Toshiba
Hiroya KANO
G01 - MEASURING TESTING
Information
Patent Application
Real-Time, Reference-Free Background Oriented Schlieren Imaging System
Publication number
20230123777
Publication date
Apr 20, 2023
United States of America as represented by the Administrator of NASA
Joshua M. Weisberger
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL TEST APPARATUS AND OPTICAL TEST METHOD
Publication number
20230099653
Publication date
Mar 30, 2023
Kabushiki Kaisha Toshiba
Hiroshi OHNO
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS FOR MONITORING THERAPEUTIC SAMPLES USING SCHLIEREN
Publication number
20230082814
Publication date
Mar 16, 2023
Purdue Research Foundation
Arezoo M. Ardekani
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
PROCESSING APPARATUS, OPTICAL APPARATUS, MANUFACTURING APPARATUS, P...
Publication number
20230080677
Publication date
Mar 16, 2023
Kabushiki Kaisha Toshiba
Hiroshi OHNO
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD FOR DETECTING PRIMARY GAS FLOWS IN FLOW CHAMBERS, USE OF A G...
Publication number
20220404277
Publication date
Dec 22, 2022
LaVision GmbH
Thomas Berg
G02 - OPTICS
Information
Patent Application
SIGNAL PROCESSING DEVICE, SIGNAL PROCESSING METHOD, AND SIGNAL PROC...
Publication number
20220390368
Publication date
Dec 8, 2022
University of Tsukuba
Yoshiaki Yasuno
G01 - MEASURING TESTING
Information
Patent Application
METHODS AND APPARATUS FOR A SELF-ALIGNED DIGITAL PROJECTION AND REF...
Publication number
20220299437
Publication date
Sep 22, 2022
United States of America as represented by the Administrator of NASA
Brett F. Bathel
G01 - MEASURING TESTING
Information
Patent Application
Deflectometry Measurement System
Publication number
20220187161
Publication date
Jun 16, 2022
LAMBDA-X
Philippe Antoine
G02 - OPTICS
Information
Patent Application
Compact, Self-Aligned Projection Focusing Schlieren Method and System
Publication number
20220113251
Publication date
Apr 14, 2022
United States of America as represented by the Adminstrator of NASA
Brett F. Bathel
G01 - MEASURING TESTING
Information
Patent Application
System and Method for Focusing Color Schlieren Diagnostics
Publication number
20210080389
Publication date
Mar 18, 2021
Board of Supervisors of Louisiana State University and Agricultural and Mecha...
Ingmar SCHOEGL
G01 - MEASURING TESTING
Information
Patent Application
GLASS PROCESSING APPARATUS AND METHODS
Publication number
20200378899
Publication date
Dec 3, 2020
Corning Incorporated
Yongjin Cho
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL TEST APPARATUS AND OPTICAL TEST METHOD
Publication number
20200333247
Publication date
Oct 22, 2020
Kabushiki Kaisha Toshiba
Hiroshi OHNO
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL TEST APPARATUS AND OPTICAL TEST METHOD
Publication number
20200150326
Publication date
May 14, 2020
KABUSHIKI KAISHA TOSHIBA
Hiroya KANO
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
METHOD FOR ANALYSING A SPRAY GENERATED BY A DEVICE FOR DISPENSING F...
Publication number
20190376106
Publication date
Dec 12, 2019
APTAR FRANCE SAS
Julien BOISVILLIERS
B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information
Patent Application
OPTICAL TEST APPARATUS AND OPTICAL TEST METHOD
Publication number
20190219501
Publication date
Jul 18, 2019
KABUSHIKI KAISHA TOSHISBA
Hiroshi OHNO
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR OBSERVING A SAMPLE BY LENS-FREE IMAGING
Publication number
20180341099
Publication date
Nov 29, 2018
Commissariat A L'Energie Atomique et Aux Energies Alternatives
Sophie MOREL
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR FOCUSING COLOR SCHLIEREN DIAGNOSTICS
Publication number
20180188167
Publication date
Jul 5, 2018
BOARD OF SUPERVISORS OF LOUISIANA STATE UNIVERSITY AND AGRICULTURAL AND MECHA...
Ingmar SCHOEGL
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
DEVICE THAT GENERATES SALT-STATE INFORMATION OF A ROAD
Publication number
20180095034
Publication date
Apr 5, 2018
FORD GLOBAL TECHNOLOGIES, L.L.C.
Frederic STEFAN
B60 - VEHICLES IN GENERAL
Information
Patent Application
Digital Schlieren Imaging
Publication number
20140267781
Publication date
Sep 18, 2014
Benjamin D. Buckner
G01 - MEASURING TESTING
Information
Patent Application
Method to determine the optical quality of a glazing
Publication number
20070036464
Publication date
Feb 15, 2007
Pilkington PLC
Barry Raymond Hill
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Glazing inspection
Publication number
20070008522
Publication date
Jan 11, 2007
Pilkington plc
Barry Raymond Hill
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Apparatus and process for characterizing samples
Publication number
20050036153
Publication date
Feb 17, 2005
Luc Joannes
G02 - OPTICS
Information
Patent Application
Method of determining local structures in optical crystals
Publication number
20040021803
Publication date
Feb 5, 2004
Ewald Moersen
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for analysis of schlieren
Publication number
20020154814
Publication date
Oct 24, 2002
Michael Gerhard
G01 - MEASURING TESTING