Scintillation detectors

Industry

CPC
H01J2237/2443

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J2237/00Discharge tubes exposing object to beam

Current Industry

H01J2237/2443Scintillation detectors

Industries

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for Schottky TFE inspection
- Patent number 12,165,834
- Issue date Dec 10, 2024
- NUFLARE TECHNOLOGY, INC.
- Victor Katsap
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 12,142,457
- Issue date Nov 12, 2024
- HITACHI HIGH-TECH CORPORATION
- Takahiro Nishihata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for operating a multi-beam particle beam microscope
- Patent number 12,094,683
- Issue date Sep 17, 2024
- Carl Zeiss MultiSEM GmbH
- Dirk Zeidler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device and charged particle beam device calib...
- Patent number 11,848,171
- Issue date Dec 19, 2023
- HITACHI HIGH-TECH CORPORATION
- Akio Yamamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scintillator for charged particle beam apparatus and charged partic...
- Patent number 11,846,736
- Issue date Dec 19, 2023
- HITACHI HIGH-TECH CORPORATION
- Eri Takahashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 11,749,497
- Issue date Sep 5, 2023
- HITACHI HIGH-TECH CORPORATION
- Shunsuke Mizutani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for operating a multi-beam particle beam microscope
- Patent number 11,735,393
- Issue date Aug 22, 2023
- Carl Zeiss MultiSEM GmbH
- Dirk Zeidler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Lithography system, sensor and measuring method
- Patent number RE49602
- Issue date Aug 8, 2023
- ASML Netherlands B.V.
- Pieter Kruit
Information Patent Grant
Method for detector equalization during the imaging of objects with...
- Patent number 11,645,740
- Issue date May 9, 2023
- Carl Zeiss MultiSEM GmbH
- Dirk Zeidler
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Scanning electron microscope and a method for overlay monitoring
- Patent number 11,646,173
- Issue date May 9, 2023
- Applied Materials Israel Ltd.
- Itay Asulin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for Schottky TFE inspection
- Patent number 11,640,896
- Issue date May 2, 2023
- NUFLARE TECHNOLOGY, INC.
- Victor Katsap
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multiple beam secondary ion mass spectrometry device
- Patent number 11,545,352
- Issue date Jan 3, 2023
- LUXEMBOURG INSTITUTE OF SCIENCE AND TECHNOLOGY (LIST)
- Marina Verruno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Light sensor assembly in a vacuum environment
- Patent number 11,536,604
- Issue date Dec 27, 2022
- EL-MUL TECHNOLOGIES LTD.
- Jonathan Garel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion detection system
- Patent number 11,476,104
- Issue date Oct 18, 2022
- Micromass UK Limited
- Martin Raymond Green
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sensor for electron detection
- Patent number 11,355,309
- Issue date Jun 7, 2022
- Applied Materials Israel Ltd.
- Itay Assulin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle detection system
- Patent number 11,322,333
- Issue date May 3, 2022
- EL-MUL TECHNOLOGIES LTD.
- Dmitry Shur
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged-particle beam apparatus
- Patent number 11,282,671
- Issue date Mar 22, 2022
- HITACHI HIGH-TECH CORPORATION
- Uki Ikeda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Compact arrangement for aberration correction of electron lenses
- Patent number 11,276,549
- Issue date Mar 15, 2022
- Marian Mankos
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Arrayed column detector
- Patent number 11,239,048
- Issue date Feb 1, 2022
- KLA Corporation
- Alan D. Brodie
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle scanners
- Patent number 11,152,190
- Issue date Oct 19, 2021
- Decision Sciences International Corporation
- Robert D. Penny
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 11,139,144
- Issue date Oct 5, 2021
- HITACHI HIGH-TECH CORPORATION
- Shunsuke Mizutani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 11,107,656
- Issue date Aug 31, 2021
- HITACHI HIGH-TECH CORPORATION
- Tsunenori Nomaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle detector including a light-emitting section having...
- Patent number 11,062,892
- Issue date Jul 13, 2021
- HITACHI HIGH-TECH CORPORATION
- Shin Imamura
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle detection system
- Patent number 11,031,210
- Issue date Jun 8, 2021
- EL-MUL TECHNOLOGIES LTD.
- Dmitry Shur
- G02 - OPTICS
Information Patent Grant
Ion detection system
- Patent number 11,031,220
- Issue date Jun 8, 2021
- Micromass UK Limited
- Martin Raymond Green
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle detector and charged particle beam apparatus
- Patent number 10,984,979
- Issue date Apr 20, 2021
- HITACHI HIGH-TECH CORPORATION
- Shin Imamura
- G01 - MEASURING TESTING
Information Patent Grant
Multiple electron beam inspection apparatus with through-hole with...
- Patent number 10,950,410
- Issue date Mar 16, 2021
- NuFlare Technology, Inc.
- Kazuhiko Inoue
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Holder and charged particle beam apparatus
- Patent number 10,937,626
- Issue date Mar 2, 2021
- HITACHI HIGH-TECH CORPORATION
- Kotaro Hosoya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-beam electron microscope
- Patent number 10,937,627
- Issue date Mar 2, 2021
- FEI Company
- Pavel Stejskal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Phosphor screen for MEMS image intensifiers
- Patent number 10,923,244
- Issue date Feb 16, 2021
- Elbit Systems of America, LLC
- Arlynn W. Smith
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...

Patents Applicationslast 30 patents

Information Patent Application
CHARGED-PARTICLE OPTICAL DEVICE
- Publication number 20240321547
- Publication date Sep 26, 2024
- ASML NETHERLANDS B.V.
- Marco Jan-Jaco WIELAND
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR OPERATING A MULTI-BEAM PARTICLE BEAM MICROSCOPE
- Publication number 20240312759
- Publication date Sep 19, 2024
- Carl Zeiss MultiSEM GmbH
- Dirk Zeidler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PARTICLE BEAM MICROSCOPE
- Publication number 20240304412
- Publication date Sep 12, 2024
- CARL ZEISS MICROSCOPY GMBH
- Erik Essers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PARTICLE BEAM MICROSCOPE
- Publication number 20240304409
- Publication date Sep 12, 2024
- CARL ZEISS MICROSCOPY GMBH
- Erik Essers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON BEAM MICROSCOPE
- Publication number 20240304410
- Publication date Sep 12, 2024
- CARL ZEISS MICROSCOPY GMBH
- Erik Essers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR MULTI-BEAM ELECTRON MICROSCOPY USING A DETECT...
- Publication number 20240194440
- Publication date Jun 13, 2024
- KLA Corporation
- Xinrong Jiang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS FOR DETERMINING THE VIRTUAL SOURCE LOCATION OF A LIQUID MET...
- Publication number 20230411109
- Publication date Dec 21, 2023
- FEI Company
- Sean M. Kellogg
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device and Specimen Observation Method
- Publication number 20230343549
- Publication date Oct 26, 2023
- Hitachi High-Tech Corporation
- Masahiro FUKUTA
- G01 - MEASURING TESTING
Information Patent Application
STROBOSCOPIC ELECTRON-BEAM SIGNAL IMAGE MAPPING
- Publication number 20230317408
- Publication date Oct 5, 2023
- Intel Corporation
- Xianghong Tong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR SCHOTTKY TFE INSPECTION
- Publication number 20230253178
- Publication date Aug 10, 2023
- NUFLARE TECHNOLOGY, INC.
- Victor KATSAP
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR OPERATING A MULTI-BEAM PARTICLE BEAM MICROSCOPE
- Publication number 20230215686
- Publication date Jul 6, 2023
- Carl Zeiss MultiSEM GmbH
- Dirk Zeidler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PARTICLE BEAM SYSTEM
- Publication number 20230109124
- Publication date Apr 6, 2023
- CARL ZEISS MICROSCOPY GMBH
- Gero Walter
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TOOL FOR TESTING AN ELECTRON-OPTICAL ASSEMBLY
- Publication number 20220392729
- Publication date Dec 8, 2022
- ASML NETHERLANDS B.V.
- Arjen Benjamin STORM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR SCHOTTKY TFE INSPECTION
- Publication number 20220367145
- Publication date Nov 17, 2022
- NUFLARE TECHNOLOGY, INC.
- Victor KATSAP
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20220367147
- Publication date Nov 17, 2022
- Hitachi High-Tech Corporation
- Takahiro NISHIHATA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE AND CHARGED PARTICLE BEAM DEVICE CALIB...
- Publication number 20220246392
- Publication date Aug 4, 2022
- HITACHI HIGH-TECH CORPORATION
- Akio YAMAMOTO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCINTILLATOR FOR CHARGED PARTICLE BEAM APPARATUS AND CHARGED PARTIC...
- Publication number 20220244412
- Publication date Aug 4, 2022
- HITACHI HIGH-TECH CORPORATION
- Eri TAKAHASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Apparatus
- Publication number 20210375583
- Publication date Dec 2, 2021
- HITACHI HIGH-TECH CORPORATION
- Shunsuke MIZUTANI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCANNING ELECTRON MICROSCOPE AND A METHOD FOR OVERLAY MONITORING
- Publication number 20210335569
- Publication date Oct 28, 2021
- APPLIED MATERIALS ISRAEL LTD.
- Itay Asulin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION DETECTION SYSTEM
- Publication number 20210327697
- Publication date Oct 21, 2021
- Micromass UK Limited
- Martin Raymond Green
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SENSOR FOR ELECTRON DETECTION
- Publication number 20210319976
- Publication date Oct 14, 2021
- APPLIED MATERIALS ISRAEL LTD.
- Itay Assulin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Arrayed Column Detector
- Publication number 20210280386
- Publication date Sep 9, 2021
- KLA Corporation
- Alan D. Brodie
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE DETECTION SYSTEM
- Publication number 20210280387
- Publication date Sep 9, 2021
- EL-MULTECHNOLOGIES LTD
- Dmitry SHUR
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR OPERATING A MULTI-BEAM PARTICLE BEAM MICROSCOPE
- Publication number 20210210306
- Publication date Jul 8, 2021
- Carl Zeiss MultiSEM GmbH
- Dirk Zeidler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR DETECTOR EQUALIZATION DURING THE IMGAGING OF OBJECTS WIT...
- Publication number 20210192700
- Publication date Jun 24, 2021
- Carl Zeiss MultiSEM GmbH
- Dirk Zeidler
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHARGED PARTICLE SCANNERS
- Publication number 20200335299
- Publication date Oct 22, 2020
- DECISION SCIENCES INTERNATIONAL CORPORATION
- Robert D. Penny
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE DETECTION SYSTEM
- Publication number 20200312609
- Publication date Oct 1, 2020
- EL-MUL TECHNOLOGIES LTD.
- Dmitry SHUR
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device
- Publication number 20200211815
- Publication date Jul 2, 2020
- Hitachi High-Technologies Corporation
- Tsunenori NOMAGUCHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Light Guide, Detector Having Light Guide, and Charged Particle Beam...
- Publication number 20200203120
- Publication date Jun 25, 2020
- Hitachi High-Technologies Corporation
- Yoshifumi SEKIGUCHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTIPLE ELECTRON BEAM INSPECTION APPARATUS
- Publication number 20200176216
- Publication date Jun 4, 2020
- NuFlare Technology, Inc.
- Kazuhiko INOUE
- H01 - BASIC ELECTRIC ELEMENTS

Scintillation detectors

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method and apparatus for Schottky TFE inspection

Charged particle beam device

Method for operating a multi-beam particle beam microscope

Charged particle beam device and charged particle beam device calib...

Scintillator for charged particle beam apparatus and charged partic...

Charged particle beam apparatus

Method for operating a multi-beam particle beam microscope

Lithography system, sensor and measuring method

Method for detector equalization during the imaging of objects with...

Scanning electron microscope and a method for overlay monitoring

Method and apparatus for Schottky TFE inspection

Multiple beam secondary ion mass spectrometry device

Light sensor assembly in a vacuum environment

Ion detection system

Sensor for electron detection

Charged particle detection system

Charged-particle beam apparatus

Compact arrangement for aberration correction of electron lenses

Arrayed column detector

Charged particle scanners

Charged particle beam apparatus

Charged particle beam device

Charged particle detector including a light-emitting section having...

Charged particle detection system

Ion detection system

Charged particle detector and charged particle beam apparatus

Multiple electron beam inspection apparatus with through-hole with...

Holder and charged particle beam apparatus

Multi-beam electron microscope

Phosphor screen for MEMS image intensifiers

Patents Applicationslast 30 patents

CHARGED-PARTICLE OPTICAL DEVICE

METHOD FOR OPERATING A MULTI-BEAM PARTICLE BEAM MICROSCOPE

PARTICLE BEAM MICROSCOPE

PARTICLE BEAM MICROSCOPE

ELECTRON BEAM MICROSCOPE

SYSTEM AND METHOD FOR MULTI-BEAM ELECTRON MICROSCOPY USING A DETECT...

METHODS FOR DETERMINING THE VIRTUAL SOURCE LOCATION OF A LIQUID MET...

Charged Particle Beam Device and Specimen Observation Method

STROBOSCOPIC ELECTRON-BEAM SIGNAL IMAGE MAPPING

METHOD AND APPARATUS FOR SCHOTTKY TFE INSPECTION

METHOD FOR OPERATING A MULTI-BEAM PARTICLE BEAM MICROSCOPE

PARTICLE BEAM SYSTEM

TOOL FOR TESTING AN ELECTRON-OPTICAL ASSEMBLY

METHOD AND APPARATUS FOR SCHOTTKY TFE INSPECTION

CHARGED PARTICLE BEAM DEVICE

CHARGED PARTICLE BEAM DEVICE AND CHARGED PARTICLE BEAM DEVICE CALIB...

SCINTILLATOR FOR CHARGED PARTICLE BEAM APPARATUS AND CHARGED PARTIC...

Charged Particle Beam Apparatus

SCANNING ELECTRON MICROSCOPE AND A METHOD FOR OVERLAY MONITORING

ION DETECTION SYSTEM

SENSOR FOR ELECTRON DETECTION

Arrayed Column Detector

CHARGED PARTICLE DETECTION SYSTEM

METHOD FOR OPERATING A MULTI-BEAM PARTICLE BEAM MICROSCOPE

METHOD FOR DETECTOR EQUALIZATION DURING THE IMGAGING OF OBJECTS WIT...

CHARGED PARTICLE SCANNERS

CHARGED PARTICLE DETECTION SYSTEM

Charged Particle Beam Device

Light Guide, Detector Having Light Guide, and Charged Particle Beam...

MULTIPLE ELECTRON BEAM INSPECTION APPARATUS