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CPC
G01N2033/009

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

Current Industry

G01N2033/009seals

Industries

Patents Grantslast 30 patents

Information Patent Grant
Powder identification system and method
- Patent number 12,007,366
- Issue date Jun 11, 2024
- Gamlen Tableting Limited
- Henry David Kafeman
- G01 - MEASURING TESTING
Information Patent Grant
Method for determining a concentration of a synthesis component in...
- Patent number 12,007,376
- Issue date Jun 11, 2024
- Trace-Ability, Inc.
- Artem Y. Lebedev
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Sealant profile system and method
- Patent number 11,983,468
- Issue date May 14, 2024
- Airbus S.A.S.
- Arumugam Thinket Selvan
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Grant
Sampling device
- Patent number 11,927,507
- Issue date Mar 12, 2024
- PHARMA AND NUTRACEUTICAL PD PTY LTD
- Attila Pataki
- G01 - MEASURING TESTING
Information Patent Grant
Method of evaluating cleanliness, method of determining cleaning co...
- Patent number 11,920,257
- Issue date Mar 5, 2024
- Sumco Corporation
- Takashi Muramatsu
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Systems and methods for collecting and analyzing hazardous material...
- Patent number 11,922,821
- Issue date Mar 5, 2024
- Alliance Solutions Group, Inc.
- Robert K. Campbell
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Use of stable isotopes of CO2 to validate cylinder preparation
- Patent number 11,920,732
- Issue date Mar 5, 2024
- Airgas, Inc.
- Tracey Jacksier
- F17 - STORING OF DISTRIBUTING GASES OR LIQUIDS
Information Patent Grant
Measuring system, measuring arrangement and method for determining...
- Patent number 11,867,666
- Issue date Jan 9, 2024
- Helmut Fischer
- G01 - MEASURING TESTING
Information Patent Grant
Part, sensor, and metrology data integration
- Patent number 11,853,042
- Issue date Dec 26, 2023
- Applied Materials, Inc.
- Garrett Ho-Yee Sin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of determining radiation characteristic of a sample
- Patent number 11,846,621
- Issue date Dec 19, 2023
- Trace-Ability, Inc.
- Artem Y. Lebedev
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
3-d printed devices formed with magnetic inks and methods of making...
- Patent number 11,845,219
- Issue date Dec 19, 2023
- Massachusetts Institute of Technology
- Theodore H. Fedynyshyn
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Grant
Conductive sensor systems and methods of use thereof
- Patent number 11,808,724
- Issue date Nov 7, 2023
- The Boeing Company
- Patrick J. Kinlen
- G01 - MEASURING TESTING
Information Patent Grant
Systems for integrated decomposition and scanning of a semiconducti...
- Patent number 11,804,390
- Issue date Oct 31, 2023
- Elemental Scientific, Inc.
- Tyler Yost
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for coating a cell culture surface
- Patent number 11,788,961
- Issue date Oct 17, 2023
- Terumo Kabushiki Kaisha
- Zhe Xu
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
Additively manufacturing fluorine-containing polymers
- Patent number 11,731,346
- Issue date Aug 22, 2023
- Honeywell Federal Manufacturing & Technologies, LLC
- Thomas Matthew Selter
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
Systems for integrated decomposition and scanning of a semiconducti...
- Patent number 11,705,351
- Issue date Jul 18, 2023
- Elemental Scientific, Inc.
- Tyler Yost
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems for integrated decomposition and scanning of a semiconducti...
- Patent number 11,694,914
- Issue date Jul 4, 2023
- Elemental Scientific, Inc.
- Tyler Yost
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Use of stable isotopes to prove authentication of manufacturing loc...
- Patent number 11,679,156
- Issue date Jun 20, 2023
- American Air Liquide, Inc.
- Tracey Jacksier
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Method for analyzing degree of hydrophobicity of powder, highly hyd...
- Patent number 11,639,885
- Issue date May 2, 2023
- Shin-Etsu Chemical Co., Ltd.
- Tetsuya Inukai
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Grant
Biological sample reaction box
- Patent number 11,628,440
- Issue date Apr 18, 2023
- LEADWAY (HK) LIMITED
- Shengqiang Liu
- G01 - MEASURING TESTING
Information Patent Grant
Syringe with PECVD lubrication
- Patent number 11,624,115
- Issue date Apr 11, 2023
- SIO2 Medical Products, Inc.
- John T. Felts
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Substrate carrier deterioration detection and repair
- Patent number 11,584,019
- Issue date Feb 21, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd
- Jen-Ti Wang
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method for separation of radioactive sample using monolithic body o...
- Patent number 11,559,785
- Issue date Jan 24, 2023
- The University of Hull
- Stephen James Archibald
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Selective monitoring of multiple silicon compounds
- Patent number 11,555,798
- Issue date Jan 17, 2023
- ECI Technology, Inc.
- Eugene Shalyt
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Seal validation with chemical pre-treatment
- Patent number 11,543,372
- Issue date Jan 3, 2023
- Dril-Quip, Inc.
- Kyle A. Comeau
- G01 - MEASURING TESTING
Information Patent Grant
Nanopore-forming method, nanopore-forming device and biomolecule me...
- Patent number 11,499,959
- Issue date Nov 15, 2022
- HITACHI HIGH-TECH CORPORATION
- Yoshimitsu Yanagawa
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Space time electron-hole charge transport network for solid-state m...
- Patent number 11,480,608
- Issue date Oct 25, 2022
- Siemens Medical Solutions USA, Inc.
- Srutarshi Banerjee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems for integrated decomposition and scanning of a semiconducti...
- Patent number 11,476,134
- Issue date Oct 18, 2022
- Elemental Scientific, Inc.
- Tyler Yost
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Detection device
- Patent number 11,413,618
- Issue date Aug 16, 2022
- Hangzhou Biotest Biotech Co., LTD.
- Shujiang Wu
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Rare metals as components of coatings in diagnostic test elements a...
- Patent number 11,391,715
- Issue date Jul 19, 2022
- Roche Diabetes Care, Inc.
- Wolfgang Schick
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
LAMINATE FOR WIRING BOARD
- Publication number 20240179849
- Publication date May 30, 2024
- Namics Corporation
- Naoki OBATA
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR MEASURING CAPSAICIN IN CHILI PEPPERS
- Publication number 20240167980
- Publication date May 23, 2024
- DAEPUNGNYUN CO., LTD.
- Hyeong Won SEO
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS, METHOD, AND SYSTEM FOR DETECTION OF THE ISOTOPIC COMPOSI...
- Publication number 20240125725
- Publication date Apr 18, 2024
- AquaSensing Inc.
- Xiaoye ZHAO
- G01 - MEASURING TESTING
Information Patent Application
SYRINGE WITH PECVD LUBRICATION
- Publication number 20230383409
- Publication date Nov 30, 2023
- SiO2 Medical Products, Inc.
- John T. Felts
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
METHOD FOR DETERMINING 224Ra IN SEDIMENT BY USING PULSE IONIZATION...
- Publication number 20230375725
- Publication date Nov 23, 2023
- FIRST INSTITUTE OF OCEANOGRAPHY, MINISTRY OF NATURAL RESOURCES
- Guangquan Chen
- G01 - MEASURING TESTING
Information Patent Application
Thermal Desorption Analysis Automation System and Analysis Method U...
- Publication number 20230333036
- Publication date Oct 19, 2023
- WITHTECH Inc.
- Ho Chan Kim
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF QUALITY CONTROL AND SERVICE INSPECTION FOR METALLIC ELECT...
- Publication number 20230314304
- Publication date Oct 5, 2023
- GOODRICH CORPORATION
- Mark R. Gurvich
- G01 - MEASURING TESTING
Information Patent Application
SPARC Assay
- Publication number 20230152323
- Publication date May 18, 2023
- Nordic Bioscience A/S
- Stephanie Nina Kehlet
- C07 - ORGANIC CHEMISTRY
Information Patent Application
DEVICE TO DEFINE THE RETENTION BOUNDARY OF GRANULAR MATERIALS
- Publication number 20230102574
- Publication date Mar 30, 2023
- Richard E. Nicholson
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR VERIFICATION OF CONDUCTIVITY TYPE OF SILICON WAFER
- Publication number 20230037569
- Publication date Feb 9, 2023
- ZING SEMICONDUCTOR CORPORATION
- Xing WEI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH THROUGHPUT RADIOCHEMISTRY SYSTEM
- Publication number 20220401960
- Publication date Dec 22, 2022
- The Regents of the University of California
- R. Michael van Dam
- G01 - MEASURING TESTING
Information Patent Application
BIPHASIC COATINGS WITH CHEMICAL SENSING, AND METHODS OF MAKING AND...
- Publication number 20220381718
- Publication date Dec 1, 2022
- HRL LABORATORIES, LLC
- Adam GROSS
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DIAGNOSING FILM DEGRADATION
- Publication number 20220364966
- Publication date Nov 17, 2022
- ASHIGARA MANUFACTURING INC.
- Terumitsu ISHII
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF DETECTING CRYSTALLOGRAPHIC DEFECTS AND METHOD OF GROWING...
- Publication number 20220333269
- Publication date Oct 20, 2022
- ZING SEMICONDUCTOR CORPORATION
- Xing WEI
- C30 - CRYSTAL GROWTH
Information Patent Application
PART, SENSOR, AND METROLOGY DATA INTEGRATION
- Publication number 20220260978
- Publication date Aug 18, 2022
- Applied Materials, Inc.
- Garrett Ho-Yee Sin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PROCESS AND APPARATUS FOR QUANTIFYING SOLID RESIDUE ON A SUBSTRATE
- Publication number 20220178808
- Publication date Jun 9, 2022
- THE CHEMOURS COMPANY FC, LLC
- SCOTT C. BROWN
- G01 - MEASURING TESTING
Information Patent Application
WAFER DEFECT ANALYSIS METHOD AND SYSTEM, DEVICE AND MEDIUM
- Publication number 20220139744
- Publication date May 5, 2022
- Changxin Memory Technologies, Inc.
- MENG-HSUAN TSAI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEASURING SYSTEM, MEASURING ARRANGEMENT AND METHOD FOR DETERMINING...
- Publication number 20220074838
- Publication date Mar 10, 2022
- HELMUT FISCHER GMBH INSTITUTE FUR ELEKTRONIK UND MESSTECHNIK
- HELMUT FISCHER
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR COLLECTING AND ANALYZING HAZARDOUS MATERIAL...
- Publication number 20210343168
- Publication date Nov 4, 2021
- Alliance Solutions Group, Inc.
- Robert K. CAMPBELL
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
POWDER IDENTIFICATION SYSTEM AND METHOD
- Publication number 20210341364
- Publication date Nov 4, 2021
- Gamlen Tableting Limited
- Henry David KAFEMAN
- G01 - MEASURING TESTING
Information Patent Application
Sampling Device
- Publication number 20210190644
- Publication date Jun 24, 2021
- Pharma and Nutraceutical PD Pty Ltd
- Attila Pataki
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
METHOD AND DEVICE FOR INSPECTION OF SEMICONDUCTOR SAMPLES
- Publication number 20210159126
- Publication date May 27, 2021
- Carl Zeiss SMT GMBH
- Si Ping Zhao
- B24 - GRINDING POLISHING
Information Patent Application
MEASURING SYSTEM, MEASURING ARRANGEMENT AND METHOD FOR DETERMINING...
- Publication number 20210116344
- Publication date Apr 22, 2021
- Helmut Fischer GmbH Institut fur Elektronik und Messtechnik
- Helmut Fischer
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DETERMINING A CONCENTRATION OF A SYNTHESIS COMPONENT IN...
- Publication number 20210102929
- Publication date Apr 8, 2021
- Trace-Ability, Inc.
- Artem Y. LEBEDEV
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND A SYSTEM FOR QUANTITATIVE OR QUALITATIVE DETERMINATION O...
- Publication number 20210063388
- Publication date Mar 4, 2021
- Zoetis Denmark ApS
- Bent Overby
- B82 - NANO-TECHNOLOGY
Information Patent Application
Method Of Determining Radiation Characteristic Of A Sample
- Publication number 20210048422
- Publication date Feb 18, 2021
- Trace-Ability, Inc.
- Artem Y. LEBEDEV
- G01 - MEASURING TESTING
Information Patent Application
Detection Device
- Publication number 20210031203
- Publication date Feb 4, 2021
- Hangzhou Biotest Biotech Co., LTD.
- Shujiang Wu
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
SENSING SENSOR
- Publication number 20200408724
- Publication date Dec 31, 2020
- NIHON DEMPA KOGYO CO., LTD.
- Hiroyuki KUKITA
- G01 - MEASURING TESTING
Information Patent Application
SUBSURFACE INSPECTION METHOD AND SYSTEM
- Publication number 20200340953
- Publication date Oct 29, 2020
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST-NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Wouter Dick KOEK
- G01 - MEASURING TESTING
Information Patent Application
MOBILE INSPECTION SYSTEM FOR THE DETECTION OF DEFECT OCCURRENCE AND...
- Publication number 20200343116
- Publication date Oct 29, 2020
- Matan LAPIDOT
- H01 - BASIC ELECTRIC ELEMENTS

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Powder identification system and method

Method for determining a concentration of a synthesis component in...

Sealant profile system and method

Sampling device

Method of evaluating cleanliness, method of determining cleaning co...

Systems and methods for collecting and analyzing hazardous material...

Use of stable isotopes of CO2 to validate cylinder preparation

Measuring system, measuring arrangement and method for determining...

Part, sensor, and metrology data integration

Method of determining radiation characteristic of a sample

3-d printed devices formed with magnetic inks and methods of making...

Conductive sensor systems and methods of use thereof

Systems for integrated decomposition and scanning of a semiconducti...

Method for coating a cell culture surface

Additively manufacturing fluorine-containing polymers

Systems for integrated decomposition and scanning of a semiconducti...

Systems for integrated decomposition and scanning of a semiconducti...

Use of stable isotopes to prove authentication of manufacturing loc...

Method for analyzing degree of hydrophobicity of powder, highly hyd...

Biological sample reaction box

Syringe with PECVD lubrication

Substrate carrier deterioration detection and repair

Method for separation of radioactive sample using monolithic body o...

Selective monitoring of multiple silicon compounds

Seal validation with chemical pre-treatment

Nanopore-forming method, nanopore-forming device and biomolecule me...

Space time electron-hole charge transport network for solid-state m...

Systems for integrated decomposition and scanning of a semiconducti...

Detection device

Rare metals as components of coatings in diagnostic test elements a...

Patents Applicationslast 30 patents

LAMINATE FOR WIRING BOARD

APPARATUS FOR MEASURING CAPSAICIN IN CHILI PEPPERS

APPARATUS, METHOD, AND SYSTEM FOR DETECTION OF THE ISOTOPIC COMPOSI...

SYRINGE WITH PECVD LUBRICATION

METHOD FOR DETERMINING 224Ra IN SEDIMENT BY USING PULSE IONIZATION...

Thermal Desorption Analysis Automation System and Analysis Method U...

METHOD OF QUALITY CONTROL AND SERVICE INSPECTION FOR METALLIC ELECT...

SPARC Assay

DEVICE TO DEFINE THE RETENTION BOUNDARY OF GRANULAR MATERIALS

METHOD FOR VERIFICATION OF CONDUCTIVITY TYPE OF SILICON WAFER

HIGH THROUGHPUT RADIOCHEMISTRY SYSTEM

BIPHASIC COATINGS WITH CHEMICAL SENSING, AND METHODS OF MAKING AND...

METHOD FOR DIAGNOSING FILM DEGRADATION

METHOD OF DETECTING CRYSTALLOGRAPHIC DEFECTS AND METHOD OF GROWING...

PART, SENSOR, AND METROLOGY DATA INTEGRATION

PROCESS AND APPARATUS FOR QUANTIFYING SOLID RESIDUE ON A SUBSTRATE

WAFER DEFECT ANALYSIS METHOD AND SYSTEM, DEVICE AND MEDIUM

MEASURING SYSTEM, MEASURING ARRANGEMENT AND METHOD FOR DETERMINING...

SYSTEMS AND METHODS FOR COLLECTING AND ANALYZING HAZARDOUS MATERIAL...

POWDER IDENTIFICATION SYSTEM AND METHOD

Sampling Device

METHOD AND DEVICE FOR INSPECTION OF SEMICONDUCTOR SAMPLES

MEASURING SYSTEM, MEASURING ARRANGEMENT AND METHOD FOR DETERMINING...

METHOD FOR DETERMINING A CONCENTRATION OF A SYNTHESIS COMPONENT IN...

METHOD AND A SYSTEM FOR QUANTITATIVE OR QUALITATIVE DETERMINATION O...

Method Of Determining Radiation Characteristic Of A Sample

Detection Device

SENSING SENSOR

SUBSURFACE INSPECTION METHOD AND SYSTEM

MOBILE INSPECTION SYSTEM FOR THE DETECTION OF DEFECT OCCURRENCE AND...