Selection from a lot of workpieces to be inspected

Industry

CPC
G05B2219/32206

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Parent Industries

GPHYSICS G05Controlling systems G05BCONTROL OR REGULATING SYSTEMS IN GENERAL FUNCTIONAL ELEMENTS OF SUCH SYSTEMS MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS G05B2219/00Program-control systems

Current Industry

G05B2219/32206Selection from a lot of workpieces to be inspected

Industries

Patents Grantslast 30 patents

Information Patent Grant
Adaptive value capture for process monitoring
- Patent number 9,905,483
- Issue date Feb 27, 2018
- Advantest Corporation
- Henry Arnold
- G05 - CONTROLLING REGULATING
Information Patent Grant
Manufacturing execution system (MES) including a wafer sampling eng...
- Patent number 8,565,910
- Issue date Oct 22, 2013
- International Business Machines Corporation
- Gary W. Behm
- G05 - CONTROLLING REGULATING
Information Patent Grant
Dual-phase virtual metrology method
- Patent number 7,603,328
- Issue date Oct 13, 2009
- National Cheng Kung University
- Fan-Tien Cheng
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Method and apparatus for selecting wafers for sampling
- Patent number 7,460,968
- Issue date Dec 2, 2008
- Advanced Micro Devices, Inc.
- Richard P. Good
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test data analyzing system and test data analyzing program
- Patent number 7,424,336
- Issue date Sep 9, 2008
- Hitachi High-Technologies Corporation
- Makoto Ono
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Automatically selecting wafers for review
- Patent number 7,324,863
- Issue date Jan 29, 2008
- Intel Corporation
- Paul P. Thirumalai
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Method and apparatus for inspecting semiconductor wafer
- Patent number 7,308,329
- Issue date Dec 11, 2007
- Olympus Corporation
- Yasunori Ikeno
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...

Patents Applicationslast 30 patents

Information Patent Application
MANUFACTURING EXECUTION SYSTEM (MES) INCLUDING A WAFER SAMPLING ENG...
- Publication number 20120203369
- Publication date Aug 9, 2012
- International Business Machines Corporation
- Gary W. Behm
- G05 - CONTROLLING REGULATING
Information Patent Application
Dual-phase virtual metrology method
- Publication number 20080306625
- Publication date Dec 11, 2008
- National Cheng Kung University
- Fan-Tien Cheng
- G05 - CONTROLLING REGULATING
Information Patent Application
Automatically selecting wafers for review
- Publication number 20070239306
- Publication date Oct 11, 2007
- Paul P. Thirumalai
- G05 - CONTROLLING REGULATING
Information Patent Application
Test data analyzing system and test data analyzing program
- Publication number 20070021855
- Publication date Jan 25, 2007
- Makoto Ono
- G05 - CONTROLLING REGULATING
Information Patent Application
Systems and methods for inspection control
- Publication number 20060178767
- Publication date Aug 10, 2006
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Song-Bor Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and apparatus for inspecting semiconductor wafer
- Publication number 20060161284
- Publication date Jul 20, 2006
- OLYMPUS CORPORATION
- Yasunori Ikeno
- G05 - CONTROLLING REGULATING

Selection from a lot of workpieces to be inspected

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Adaptive value capture for process monitoring

Manufacturing execution system (MES) including a wafer sampling eng...

Dual-phase virtual metrology method

Method and apparatus for selecting wafers for sampling

Test data analyzing system and test data analyzing program

Automatically selecting wafers for review

Method and apparatus for inspecting semiconductor wafer

Patents Applicationslast 30 patents

MANUFACTURING EXECUTION SYSTEM (MES) INCLUDING A WAFER SAMPLING ENG...

Dual-phase virtual metrology method

Automatically selecting wafers for review

Test data analyzing system and test data analyzing program

Systems and methods for inspection control

Method and apparatus for inspecting semiconductor wafer