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Selection of composition of the components of the system

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GPHYSICS G01Measuring instruments G01KMEASURING TEMPERATURE MEASURING QUANTITY OF HEAT THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR G01K5/00Measuring temperature based on the expansion or contraction of a material

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G01K5/66Selection of composition of the components of the system
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Patents Grantslast 30 patents

  • Information Patent Grant

    Evaluation method for thermal expansion properties of titania-conta...
    • Patent number 11,555,796
    • Issue date Jan 17, 2023
    • AGC Inc.
    • Kazuya Sasaki
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Metallic laminate composite
    • Patent number 8,420,225
    • Issue date Apr 16, 2013
    • EMS Engineered Materials Solution, LLC
    • Michael Haynes
    • B32 - LAYERED PRODUCTS
  • Information Patent Grant

    Thermo-element
    • Patent number 7,805,936
    • Issue date Oct 5, 2010
    • Yukio Onishi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Thermocouple bimetal having a high application limit, and method of...
    • Patent number 4,383,004
    • Issue date May 10, 1983
    • G. Rau GmbH & Co.
    • Heinz Spengler
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Fe-Ni-Cu-Cr Layered bimetal
    • Patent number 4,309,489
    • Issue date Jan 5, 1982
    • Tokyo Shibaura Denki Kabushiki Kaisha
    • Kenichiro Momose
    • C22 - METALLURGY FERROUS OR NON-FERROUS ALLOYS TREATMENT OF ALLOYS OR NON-FER...
  • Information Patent Grant

    Bimetallic strip for low temperature use
    • Patent number 4,291,105
    • Issue date Sep 22, 1981
    • The United States of America as represented by the United States Department o...
    • Jean F. Bussiere
    • B32 - LAYERED PRODUCTS
  • Information Patent Grant

    Aluminum thermostat metal
    • Patent number 4,207,380
    • Issue date Jun 10, 1980
    • Hood & Company, Inc.
    • Anthony J. Izbicki
    • B32 - LAYERED PRODUCTS
  • Information Patent Grant

    Thermostatic metal
    • Patent number 4,050,906
    • Issue date Sep 27, 1977
    • Texas Instruments Incorporated
    • Jacob L. Ornstein
    • B32 - LAYERED PRODUCTS
  • Information Patent Grant

    3902867
    • Patent number 3,902,867
    • Issue date Sep 2, 1975
    • B32 - LAYERED PRODUCTS
  • Information Patent Grant

    3865559
    • Patent number 3,865,559
    • Issue date Feb 11, 1975
    • B32 - LAYERED PRODUCTS
  • Information Patent Grant

    3796100
    • Patent number 3,796,100
    • Issue date Mar 12, 1974
    • G01 - MEASURING TESTING
  • Information Patent Grant

    3765846
    • Patent number 3,765,846
    • Issue date Oct 16, 1973
    • B32 - LAYERED PRODUCTS
  • Information Patent Grant

    3756790
    • Patent number 3,756,790
    • Issue date Sep 4, 1973
    • B32 - LAYERED PRODUCTS
  • Information Patent Grant

    3712799
    • Patent number 3,712,799
    • Issue date Jan 23, 1973
    • G01 - MEASURING TESTING
  • Information Patent Grant

    3678757
    • Patent number 3,678,757
    • Issue date Jul 25, 1972
    • G01 - MEASURING TESTING
  • Information Patent Grant

    3625663
    • Patent number 3,625,663
    • Issue date Dec 7, 1971
    • C22 - METALLURGY FERROUS OR NON-FERROUS ALLOYS TREATMENT OF ALLOYS OR NON-FER...
  • Information Patent Grant

    3623370
    • Patent number 3,623,370
    • Issue date Nov 30, 1971
    • G01 - MEASURING TESTING
  • Information Patent Grant

    3591353
    • Patent number 3,591,353
    • Issue date Jul 6, 1971
    • B32 - LAYERED PRODUCTS
  • Information Patent Grant

    3581366
    • Patent number 3,581,366
    • Issue date Jun 1, 1971
    • C22 - METALLURGY FERROUS OR NON-FERROUS ALLOYS TREATMENT OF ALLOYS OR NON-FER...
  • Information Patent Grant

    3560171
    • Patent number 3,560,171
    • Issue date Feb 2, 1971
    • B32 - LAYERED PRODUCTS
  • Information Patent Grant

    3512947
    • Patent number 3,512,947
    • Issue date May 19, 1970
    • B32 - LAYERED PRODUCTS
  • Information Patent Grant

    3479732
    • Patent number 3,479,732
    • Issue date Nov 25, 1969
    • G01 - MEASURING TESTING
  • Information Patent Grant

    3415712
    • Patent number 3,415,712
    • Issue date Dec 10, 1968
    • G01 - MEASURING TESTING
  • Information Patent Grant

    3336119
    • Patent number 3,336,119
    • Issue date Aug 15, 1967
    • G01 - MEASURING TESTING
  • Information Patent Grant

    3107532
    • Patent number 3,107,532
    • Issue date Oct 22, 1963
    • G05 - CONTROLLING REGULATING
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    3030699
    • Patent number 3,030,699
    • Issue date Apr 24, 1962
    • B32 - LAYERED PRODUCTS
  • Information Patent Grant

    2700627
    • Patent number 2,700,627
    • Issue date Jan 25, 1955
    • B32 - LAYERED PRODUCTS
  • Information Patent Grant

    2578197
    • Patent number 2,578,197
    • Issue date Dec 11, 1951
    • G01 - MEASURING TESTING
  • Information Patent Grant

    2573686
    • Patent number 2,573,686
    • Issue date Nov 6, 1951
    • G01 - MEASURING TESTING
  • Information Patent Grant

    2434392
    • Patent number 2,434,392
    • Issue date Jan 13, 1948
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents