Semiconductor IC Wafer

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G06T2207/30148

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GPHYSICS G06Computing G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL G06T2207/00Indexing scheme for image analysis or image enhancement

Current Industry

G06T2207/30148Semiconductor IC Wafer

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Method for inspecting semiconductor and semiconductor inspecting de...
- Patent number 12,211,199
- Issue date Jan 28, 2025
- Hamamatsu Photonics K.K.
- Tomochika Takeshima
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Edge defect detection via image analytics
- Patent number 12,211,195
- Issue date Jan 28, 2025
- Applied Materials, Inc.
- Yash Chhabra
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect inspection with images of different synthesis ratios
- Patent number 12,211,194
- Issue date Jan 28, 2025
- HITACHI HIGH-TECH CORPORATION
- Yasushi Ebizuka
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Ensemble of deep learning models for defect review in high volume m...
- Patent number 12,211,196
- Issue date Jan 28, 2025
- KLA Corp.
- Kuljit S. Virk
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Component conveying instrument with an adjusting unit and method of...
- Patent number 12,211,721
- Issue date Jan 28, 2025
- Muehlbauer GmbH & Co. KG
- Rainer Miehlich
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optical measurement tool containing chromatic aberration enhancemen...
- Patent number 12,211,724
- Issue date Jan 28, 2025
- SanDisk Technologies LLC
- Michio Ohi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Substrate processing apparatus and substrate processing method
- Patent number 12,211,197
- Issue date Jan 28, 2025
- SCREEN Holdings Co., Ltd.
- Hideji Naohara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Wafer inspection system method
- Patent number 12,211,200
- Issue date Jan 28, 2025
- NANYA TECHNOLOGY CORPORATION
- Chia-Lin Tsai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect detection system
- Patent number 12,205,360
- Issue date Jan 21, 2025
- Nanotronics Imaging, Inc.
- Tonislav Ivanov
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and method for inspecting light-emitting diode dies
- Patent number 12,203,971
- Issue date Jan 21, 2025
- Industrial Technology Research Institute
- Yan-Rung Lin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern inspection device and pattern inspection method
- Patent number 12,205,272
- Issue date Jan 21, 2025
- NuFlare Technology, Inc.
- Hiromu Inoue
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Vision-based wafer pre-alignment platform and alignment method
- Patent number 12,205,325
- Issue date Jan 21, 2025
- WUXI XIVI SCIENCE AND TECHNOLOGY CO., LTD.
- Minjie Lu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern inspection method using pattern model
- Patent number 12,205,267
- Issue date Jan 21, 2025
- Samsung Electronics Co., Ltd.
- Nohong Kwak
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Recessed structure capable of being conveniently monitored online a...
- Patent number 12,205,268
- Issue date Jan 21, 2025
- Shanghai IC R&D Center Co., Ltd.
- Xiaoxu Kang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Deep learning based sample localization
- Patent number 12,205,318
- Issue date Jan 21, 2025
- FEI Company
- Sven Beunen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Syclops
- Patent number 12,198,319
- Issue date Jan 14, 2025
- Ronald Baker
- G01 - MEASURING TESTING
Information Patent Grant
X-ray based measurements in patterned structure
- Patent number 12,196,691
- Issue date Jan 14, 2025
- Nova Ltd.
- Gilad Barak
- G01 - MEASURING TESTING
Information Patent Grant
ML-enabled assured microelectronics manufacturing: a technique to m...
- Patent number 12,198,325
- Issue date Jan 14, 2025
- University of Southern California
- Ajey Poovannummoottil Jacob
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Measurement system, method for generating learning model to be used...
- Patent number 12,198,327
- Issue date Jan 14, 2025
- HITACHI HIGH-TECH CORPORATION
- Ryou Yumiba
- G01 - MEASURING TESTING
Information Patent Grant
Defect detection method, electronic device and readable storage medium
- Patent number 12,198,328
- Issue date Jan 14, 2025
- Hon Hai Precision Industry Co., Ltd.
- Chih-Te Lu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and structures for acoustic wave overlay error determination
- Patent number 12,189,304
- Issue date Jan 7, 2025
- Taiwan Semiconductor Manufacturing Co., Ltd
- Yu-Ching Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for semiconductor wafer defect review
- Patent number 12,190,036
- Issue date Jan 7, 2025
- Taiwan Semiconductor Manufacturing Co., Ltd
- Chung-Pin Chou
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Metrology data correction using image quality metric
- Patent number 12,189,307
- Issue date Jan 7, 2025
- ASML Netherlands B.V.
- Fuming Wang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Detecting defects on specimens
- Patent number 12,190,500
- Issue date Jan 7, 2025
- KLA Corp.
- Chunwei Song
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Print check repeater defect detection
- Patent number 12,190,498
- Issue date Jan 7, 2025
- KLA Corp.
- Nurmohammed Patwary
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
EUV vessel perimeter flow auto adjustment
- Patent number 12,189,298
- Issue date Jan 7, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd
- Che-Chang Hsu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Visual inspection apparatus and visual inspection methods
- Patent number 12,182,993
- Issue date Dec 31, 2024
- Renesas Electronics Corporation
- Hiroshi Yamashita
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Utilize machine learning in selecting high quality averaged SEM ima...
- Patent number 12,182,983
- Issue date Dec 31, 2024
- ASML Netherlands B.V.
- Chen Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Substrate inspection method and device
- Patent number 12,175,655
- Issue date Dec 24, 2024
- Samsung Electronics Co., Ltd.
- Doyoung Yoon
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Multi-angle image semantic segmentation method for cadmium zinc tel...
- Patent number 12,175,721
- Issue date Dec 24, 2024
- Beijing Jiaotong University
- Peihao Li
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
AUTO PARAMETER TUNING FOR CHARGED PARTICLE INSPECTION IMAGE ALIGNMENT
- Publication number 20250036030
- Publication date Jan 30, 2025
- ASML NETHERLANDS B.V.
- Haoyi LIANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SUBSTRATE INSPECTION METHOD, SUBSTRATE INSPECTION PROGRAM, AND SUBS...
- Publication number 20250037267
- Publication date Jan 30, 2025
- TOKYO ELECTRON LIMITED
- Tatsuya Tokumaru
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION APPARATUS AND METHOD FOR GENERATING INSPECTION IMAGE
- Publication number 20250037269
- Publication date Jan 30, 2025
- NuFlare Technology, Inc.
- Shinji SUGIHARA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTERFACE DETECTION IN RECIPROCAL SPACE
- Publication number 20250037286
- Publication date Jan 30, 2025
- FEI Company
- John Francis Flanagan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF GENERATING DEFECT CLASSIFICATION MODEL
- Publication number 20250037486
- Publication date Jan 30, 2025
- Samsung Electronics Co., Ltd.
- Jinwoo LEE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
HIGH-QUALITY WIDE-SPECTRUM DATA BY GENERATIVE AI
- Publication number 20250037261
- Publication date Jan 30, 2025
- ORBOTECH LTD.
- Hagit Schechter
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS AND SYSTEMS FOR GENERATING A BOND LINE PARAMETER OF A CIRCU...
- Publication number 20250037294
- Publication date Jan 30, 2025
- Arieca Inc.
- Loren Russell
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS, SYSTEMS, AND APPARATUS FOR MEASURING A GAP BETWEEN A SUPPO...
- Publication number 20250029862
- Publication date Jan 23, 2025
- Trung H. DAO
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor Molding System and Foreign Object Detection Method
- Publication number 20250029232
- Publication date Jan 23, 2025
- DIODES INCORPORATED
- Desen Wang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT INSPECTION METHOD AND DEFECT INSPECTION SYSTEM
- Publication number 20250027886
- Publication date Jan 23, 2025
- Taiwan Semiconductor Manufacturing company Ltd.
- SHAO-CHIEN CHIU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEEP LEARNING BASED MODE SELECTION FOR INSPECTION
- Publication number 20250020598
- Publication date Jan 16, 2025
- KLA Corporation
- Rajkumar Theagarajan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGING OVERLAY TARGETS USING MOIRÉ ELEMENTS AND ROTATIONAL SYMMETR...
- Publication number 20250021019
- Publication date Jan 16, 2025
- KLA Corporation
- Yoel Feler
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS AND APPARATUS FOR SEMICONDCUTOR DIE FAULT ANALYSIS USING MU...
- Publication number 20250022123
- Publication date Jan 16, 2025
- Intel Corporation
- Binbin Wang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
COMPUTER IMPLEMENTED METHOD FOR THE DETECTION OF ANOMALIES IN AN IM...
- Publication number 20250021828
- Publication date Jan 16, 2025
- Carl Zeiss SMT GMBH
- Anna Alperovich
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS OF DETECTING A CRACK IN A SEMICONDUCTOR ELEMENT, AND RELATE...
- Publication number 20250022122
- Publication date Jan 16, 2025
- KULICKE AND SOFFA INDUSTRIES, INC.
- Aashish Shah
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS AND METHODS FOR DENOISING IMAGE DATA
- Publication number 20250014152
- Publication date Jan 9, 2025
- Gauss Labs Inc.
- Yonghyun Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF OPTIMIZING OVERLAY MEASUREMENT CONDITION AND OVERLAY MEAS...
- Publication number 20250012736
- Publication date Jan 9, 2025
- Samsung Electronics Co., Ltd.
- Dohun Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MOUNTING APPARATUS, MOUNTING METHOD, AND RECORDING MEDIUM
- Publication number 20250014921
- Publication date Jan 9, 2025
- SHINKAWA LTD.
- Kohei SEYAMA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METROLOGY METHOD AND METHOD FOR TRAINING A DATA STRUCTURE FOR USE I...
- Publication number 20250014164
- Publication date Jan 9, 2025
- ASML NETHERLANDS B.V.
- Vasco Tomas TENNER
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FAULT DETECTION METHOD AND DEVICE FOR DISPLAY SCREEN, AND INSPECTIO...
- Publication number 20250014170
- Publication date Jan 9, 2025
- BOE TECHNOLOGY GROUP CO., LTD.
- Rongzuo ZHANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF INSPECTING DEFECTS
- Publication number 20250014169
- Publication date Jan 9, 2025
- Samsung Electronics Co., Ltd.
- Bumjoo LEE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS AND METHODS FOR DETERMINING AND QUANTIFYING IMAGE DATA
- Publication number 20250013341
- Publication date Jan 9, 2025
- Gauss Labs Inc.
- Yonghyun Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS AND APPARATUS TO IMPROVE INSPECTION TECHNIQUES FOR INTEGRAT...
- Publication number 20250014927
- Publication date Jan 9, 2025
- Intel Corporation
- Chrystian Mauricio Posada Arbelaez
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS AND METHODS FOR DEFECT DETECTION AND DEFECT LOCATION IDENTI...
- Publication number 20250005739
- Publication date Jan 2, 2025
- ASML NETHERLANDS B.V.
- Shengcheng JIN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM OF IMAGE ANALYSIS AND CRITICAL DIMENSION MATCHING...
- Publication number 20250003899
- Publication date Jan 2, 2025
- ASML NETHERLANDS B.V.
- Tim HOUBEN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FOREIGN OBJECT HEIGHT MEASUREMENT METHOD AND CHARGED PARTICLE BEAM...
- Publication number 20250003898
- Publication date Jan 2, 2025
- HITACHI HIGH-TECH CORPORATION
- Wei SUN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
POST-PLASMA CLEAN INFRARED IMAGE INSPECTION FOR OXIDELESS BONDING A...
- Publication number 20250006690
- Publication date Jan 2, 2025
- Taiwan Semiconductor Manufacturing Company Limited
- Amram Eitan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION SYSTEM
- Publication number 20250006527
- Publication date Jan 2, 2025
- BROOKS AUTOMATION (GERMANY) GMBH
- Lutz REBSTOCK
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SUBSTRATE PROCESSING APPARATUS, INFORMATION PROCESSING METHOD, AND...
- Publication number 20250005737
- Publication date Jan 2, 2025
- TOKYO ELECTRON LIMITED
- Takeshi SHIMOAOKI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ENHANCED CROSS SECTIONAL FEATURES MEASUREMENT METHODOLOGY
- Publication number 20250003742
- Publication date Jan 2, 2025
- Applied Materials, Inc.
- Manoj Kumar Dayyala
- G06 - COMPUTING CALCULATING COUNTING

Semiconductor IC Wafer

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method for inspecting semiconductor and semiconductor inspecting de...

Edge defect detection via image analytics

Defect inspection with images of different synthesis ratios

Ensemble of deep learning models for defect review in high volume m...

Component conveying instrument with an adjusting unit and method of...

Optical measurement tool containing chromatic aberration enhancemen...

Substrate processing apparatus and substrate processing method

Wafer inspection system method

Defect detection system

Apparatus and method for inspecting light-emitting diode dies

Pattern inspection device and pattern inspection method

Vision-based wafer pre-alignment platform and alignment method

Pattern inspection method using pattern model

Recessed structure capable of being conveniently monitored online a...

Deep learning based sample localization

Syclops

X-ray based measurements in patterned structure

ML-enabled assured microelectronics manufacturing: a technique to m...

Measurement system, method for generating learning model to be used...

Defect detection method, electronic device and readable storage medium

Method and structures for acoustic wave overlay error determination

Method and system for semiconductor wafer defect review

Metrology data correction using image quality metric

Detecting defects on specimens

Print check repeater defect detection

EUV vessel perimeter flow auto adjustment

Visual inspection apparatus and visual inspection methods

Utilize machine learning in selecting high quality averaged SEM ima...

Substrate inspection method and device

Multi-angle image semantic segmentation method for cadmium zinc tel...

Patents Applicationslast 30 patents

AUTO PARAMETER TUNING FOR CHARGED PARTICLE INSPECTION IMAGE ALIGNMENT

SUBSTRATE INSPECTION METHOD, SUBSTRATE INSPECTION PROGRAM, AND SUBS...

INSPECTION APPARATUS AND METHOD FOR GENERATING INSPECTION IMAGE

INTERFACE DETECTION IN RECIPROCAL SPACE

METHOD OF GENERATING DEFECT CLASSIFICATION MODEL

HIGH-QUALITY WIDE-SPECTRUM DATA BY GENERATIVE AI

METHODS AND SYSTEMS FOR GENERATING A BOND LINE PARAMETER OF A CIRCU...

METHODS, SYSTEMS, AND APPARATUS FOR MEASURING A GAP BETWEEN A SUPPO...

Semiconductor Molding System and Foreign Object Detection Method

DEFECT INSPECTION METHOD AND DEFECT INSPECTION SYSTEM

DEEP LEARNING BASED MODE SELECTION FOR INSPECTION

IMAGING OVERLAY TARGETS USING MOIRÉ ELEMENTS AND ROTATIONAL SYMMETR...

METHODS AND APPARATUS FOR SEMICONDCUTOR DIE FAULT ANALYSIS USING MU...

COMPUTER IMPLEMENTED METHOD FOR THE DETECTION OF ANOMALIES IN AN IM...

METHODS OF DETECTING A CRACK IN A SEMICONDUCTOR ELEMENT, AND RELATE...

SYSTEMS AND METHODS FOR DENOISING IMAGE DATA

METHOD OF OPTIMIZING OVERLAY MEASUREMENT CONDITION AND OVERLAY MEAS...

MOUNTING APPARATUS, MOUNTING METHOD, AND RECORDING MEDIUM

METROLOGY METHOD AND METHOD FOR TRAINING A DATA STRUCTURE FOR USE I...

FAULT DETECTION METHOD AND DEVICE FOR DISPLAY SCREEN, AND INSPECTIO...

METHOD OF INSPECTING DEFECTS

SYSTEMS AND METHODS FOR DETERMINING AND QUANTIFYING IMAGE DATA

METHODS AND APPARATUS TO IMPROVE INSPECTION TECHNIQUES FOR INTEGRAT...

SYSTEMS AND METHODS FOR DEFECT DETECTION AND DEFECT LOCATION IDENTI...

METHOD AND SYSTEM OF IMAGE ANALYSIS AND CRITICAL DIMENSION MATCHING...

FOREIGN OBJECT HEIGHT MEASUREMENT METHOD AND CHARGED PARTICLE BEAM...

POST-PLASMA CLEAN INFRARED IMAGE INSPECTION FOR OXIDELESS BONDING A...

INSPECTION SYSTEM

SUBSTRATE PROCESSING APPARATUS, INFORMATION PROCESSING METHOD, AND...

ENHANCED CROSS SECTIONAL FEATURES MEASUREMENT METHODOLOGY