Semiconductor IC Wafer

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G06T2207/30148

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GPHYSICS G06Computing G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL G06T2207/00Indexing scheme for image analysis or image enhancement

Current Industry

G06T2207/30148Semiconductor IC Wafer

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Visual inspection apparatus and visual inspection methods
- Patent number 12,182,993
- Issue date Dec 31, 2024
- Renesas Electronics Corporation
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Utilize machine learning in selecting high quality averaged SEM ima...
- Patent number 12,182,983
- Issue date Dec 31, 2024
- ASML Netherlands B.V.
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Substrate inspection method and device
- Patent number 12,175,655
- Issue date Dec 24, 2024
- Samsung Electronics Co., Ltd.
- Doyoung Yoon
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Multi-angle image semantic segmentation method for cadmium zinc tel...
- Patent number 12,175,721
- Issue date Dec 24, 2024
- Beijing Jiaotong University
- Peihao Li
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Processing image data sets
- Patent number 12,175,650
- Issue date Dec 24, 2024
- Carl Zeiss SMT GmbH
- Jens Timo Neumann
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and non-transitory computer-readable medium for identifying...
- Patent number 12,175,652
- Issue date Dec 24, 2024
- NANYA TECHNOLOGY CORPORATION
- Ken-Huan Ho
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for monitoring edge bevel removal area in semi...
- Patent number 12,169,179
- Issue date Dec 17, 2024
- Taiwan Semiconductor Manufacturing Company Ltd.
- Chao-Tung Wu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System using film thickness estimation from machine learning based...
- Patent number 12,169,925
- Issue date Dec 17, 2024
- Applied Materials, Inc.
- Sivakumar Dhandapani
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Measurement map configuration method and apparatus
- Patent number 12,165,304
- Issue date Dec 10, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Jen-Chou Huang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Segmentation of design care areas with a rendered design image
- Patent number 12,165,306
- Issue date Dec 10, 2024
- Manikandan Mariyappan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optical diagnostics of semiconductor process using hyperspectral im...
- Patent number 12,165,937
- Issue date Dec 10, 2024
- Tokyo Electron Limited
- Yan Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System, method, and program product for manufacturing a photomask
- Patent number 12,164,225
- Issue date Dec 10, 2024
- Photronics, Inc.
- Mohamed Ramadan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Die system and method of comparing alignment vectors
- Patent number 12,159,392
- Issue date Dec 3, 2024
- Applied Materials, Inc.
- Yongan Xu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Auto qualification device and auto qualification method
- Patent number 12,159,388
- Issue date Dec 3, 2024
- Samsung Display Co., Ltd.
- Sukbin Jung
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect inspecting system and defect inspecting method
- Patent number 12,154,264
- Issue date Nov 26, 2024
- HITACHI HIGH-TECH CORPORATION
- Minoru Harada
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Training a machine learning system to detect an excursion of a CMP...
- Patent number 12,148,149
- Issue date Nov 19, 2024
- Applied Materials, Inc.
- Sidney P. Huey
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Process condition estimating apparatus, method, and program
- Patent number 12,148,140
- Issue date Nov 19, 2024
- ALITECS CORPORATION
- Akio Ishikawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Wafer inspection system
- Patent number 12,148,144
- Issue date Nov 19, 2024
- NANYA TECHNOLOGY CORPORATION
- Chia-Lin Tsai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Thickness measurement of substrate using color metrology
- Patent number 12,148,148
- Issue date Nov 19, 2024
- Applied Materials, Inc.
- Dominic J. Benvegnu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Substrate inspection device, substrate inspection method, and stora...
- Patent number 12,148,147
- Issue date Nov 19, 2024
- Tokyo Electron Limited
- Masashi Enomoto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect inspection device
- Patent number 12,146,840
- Issue date Nov 19, 2024
- HITACHI HIGH-TECH CORPORATION
- Eiji Arima
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and evaluation devices for analyzing three-dimensional data...
- Patent number 12,148,139
- Issue date Nov 19, 2024
- Carl Zeiss SMT GmbH
- Ramani Pichumani
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Detection of probabilistic process windows
- Patent number 12,142,454
- Issue date Nov 12, 2024
- Fractilla, LLC
- Chris Mack
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Substrate testing with three-dimensional scanning
- Patent number 12,135,348
- Issue date Nov 5, 2024
- Mellanox Technologies, Ltd.
- Barak Freedman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for overlay metrology and apparatus thereof
- Patent number 12,130,246
- Issue date Oct 29, 2024
- ASML Netherlands B.V.
- Simon Gijsbert Josephus Mathijssen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Wafer inspection method
- Patent number 12,131,929
- Issue date Oct 29, 2024
- Semes Co., Ltd.
- Myoung Hoon Woo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Manufacturing process with atomic level inspection
- Patent number 12,131,957
- Issue date Oct 29, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- I-Che Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Determination of a simulated image of a specimen
- Patent number 12,131,458
- Issue date Oct 29, 2024
- Applied Materials Israel Ltd.
- Irad Peleg
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Enhanced cross sectional features measurement methodology
- Patent number 12,123,708
- Issue date Oct 22, 2024
- Applied Materials, Inc.
- Manoj Kumar Dayyala
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for coating photoresist over a substrate
- Patent number 12,124,168
- Issue date Oct 22, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Jing Chang
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEMS AND METHODS FOR AIR POCKET DEFECT DETECTION
- Publication number 20240428390
- Publication date Dec 26, 2024
- GLOBALWAFERS CO., LTD.
- Andrea Laurenzi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTIMIZATION OF A METROLOGY ALGORITHM FOR EXAMINATION OF SEMICONDUC...
- Publication number 20240428395
- Publication date Dec 26, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Rafael BISTRITZER
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEVICE LINE UNDERSTANDING USING COMPOSED TEMPLATES
- Publication number 20240428400
- Publication date Dec 26, 2024
- FEI Company
- John Flanagan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PATTERN SHAPE MEASUREMENT METHOD, PATTERN SHAPE MEASUREMENT APPARAT...
- Publication number 20240426605
- Publication date Dec 26, 2024
- KIOXIA Corporation
- Taiki ITO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CUTTING PATH PLANNING ALGORITHM FOR SEMICONDUCTOR WORKPIECE BASED O...
- Publication number 20240428393
- Publication date Dec 26, 2024
- Taiyuan University of Science and Technology
- Anhong WANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MACHINE LEARNING BASED DEFECT EXAMINATION FOR SEMICONDUCTOR SPECIMENS
- Publication number 20240428396
- Publication date Dec 26, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Boris SHERMAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR DETECTING SEMICONDUCTOR PROCESSING ERROR
- Publication number 20240421005
- Publication date Dec 19, 2024
- Taiwan Semiconductor Manufacturing Company Limited
- Chen TSENG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PROFILE DETECTING METHOD AND PROFILE DETECTING APPARATUS
- Publication number 20240420359
- Publication date Dec 19, 2024
- TOKYO ELECTRON LIMITED
- Toshihiro KITAO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PROCESSING METHOD AND PROCESSING SYSTEM
- Publication number 20240416450
- Publication date Dec 19, 2024
- TOKYO ELECTRON LIMITED
- Kazuya HISANO
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
SEMICONDUCTOR MANUFACTURING DEVICE AND CONTROL OF THE SAME
- Publication number 20240412407
- Publication date Dec 12, 2024
- Samsung Electronics Co., Ltd.
- Junghee Cho
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OBSERVATION SYSTEM AND ARTIFACT CORRECTION METHOD FOR SAME
- Publication number 20240412333
- Publication date Dec 12, 2024
- Hitachi High-Tech Corporation
- Mitsutoshi KOBAYASHI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PATTERN INSPECTION DEVICE AND PATTERN INSPECTION METHOD
- Publication number 20240413024
- Publication date Dec 12, 2024
- Samsung Electronics Co., Ltd.
- Sangchul YEO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
THERMAL IMAGING FOR ANALYSIS OF DEVICE FABRICATION TOOLS
- Publication number 20240410760
- Publication date Dec 12, 2024
- LAM RESEARCH CORPORATION
- Karl Frederick Leeser
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTICAL METROLOGY DEVICE
- Publication number 20240412350
- Publication date Dec 12, 2024
- Samsung Electronics Co., Ltd.
- Minsu Jo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Metrology Apparatus And Method For Determining A Characteristic Of...
- Publication number 20240412067
- Publication date Dec 12, 2024
- ASML NETHERLANDS B.V.
- Lorenzo Tripodi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SHAPE CHARACTERISTIC VALUE ESTIMATION APPARATUS, SHAPE CHARACTERIST...
- Publication number 20240404042
- Publication date Dec 5, 2024
- TOKYO ELECTRON LIMITED
- Toyohisa TSURUDA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Image Processing Program, Image Processing Device, and Image Proces...
- Publication number 20240404043
- Publication date Dec 5, 2024
- HITACHI HIGH-TECH CORPORATION
- Masanori OUCHI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TEST SYSTEM AND TEST METHOD TO WAFERS
- Publication number 20240404040
- Publication date Dec 5, 2024
- NANYA TECHNOLOGY CORPORATION
- Chia-Lin TSAI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR CONTROLLING CHEMICAL MECHANICAL PLANARIZATION
- Publication number 20240404894
- Publication date Dec 5, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chun-Wei HSU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DETECTION APPARATUS FOR SIMULTANEOUS ACQUISITION OF MULTIPLE DIVERS...
- Publication number 20240404036
- Publication date Dec 5, 2024
- ASML NETHERLANDS B.V.
- Teunis Willem TUKKER
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MULTI-DEVICE AUTOMATED OPTICAL INSPECTION
- Publication number 20240394866
- Publication date Nov 28, 2024
- Nanotronics Imaging, Inc.
- Nadine Wong
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MOUNTING DEVICE AND MOUNTING METHOD
- Publication number 20240395634
- Publication date Nov 28, 2024
- Samsung Electronics Co., Ltd.
- Takamasa Sugiura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MACHINE LEARNING MODEL TRAINING
- Publication number 20240393262
- Publication date Nov 28, 2024
- Applied Materials, Inc.
- Jeong Jin Hong
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND DEVICE FOR ANALYSING AN IMAGE OF A MICROLITHOGRAPHIC MIC...
- Publication number 20240393269
- Publication date Nov 28, 2024
- Carl Zeiss SMT GMBH
- Jens Oster
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IN-TOOL AUDIO AND VISUAL BEHAVIOR MONITORING FOR PROCESS CONTROL
- Publication number 20240391048
- Publication date Nov 28, 2024
- Applied Materials, Inc.
- Justin H. WONG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
AUTOMATIC TIME DELAY AND INTEGRATION (TDI) MASK INSPECTION SYSTEM C...
- Publication number 20240388688
- Publication date Nov 21, 2024
- TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY
- Pei-Yu Zhu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and Structures for Acoustic Wave Overlay Error Determination
- Publication number 20240385533
- Publication date Nov 21, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Yu-Ching Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR COATING PHOTORESIST OVER A SUBSTRATE
- Publication number 20240377750
- Publication date Nov 14, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Jing CHANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS AND METHODS FOR THREE DIMENSIONAL RETICLE DEFECT SMART RE...
- Publication number 20240379464
- Publication date Nov 14, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Po-Chien HUANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
HOTSPOT AVOIDANCE METHOD OF MANUFACTURING INTEGRATED CIRCUITS
- Publication number 20240378362
- Publication date Nov 14, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd.
- I-Shuo Liu
- G06 - COMPUTING CALCULATING COUNTING

Semiconductor IC Wafer

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Visual inspection apparatus and visual inspection methods

Utilize machine learning in selecting high quality averaged SEM ima...

Substrate inspection method and device

Multi-angle image semantic segmentation method for cadmium zinc tel...

Processing image data sets

System and non-transitory computer-readable medium for identifying...

Method and apparatus for monitoring edge bevel removal area in semi...

System using film thickness estimation from machine learning based...

Measurement map configuration method and apparatus

Segmentation of design care areas with a rendered design image

Optical diagnostics of semiconductor process using hyperspectral im...

System, method, and program product for manufacturing a photomask

Die system and method of comparing alignment vectors

Auto qualification device and auto qualification method

Defect inspecting system and defect inspecting method

Training a machine learning system to detect an excursion of a CMP...

Process condition estimating apparatus, method, and program

Wafer inspection system

Thickness measurement of substrate using color metrology

Substrate inspection device, substrate inspection method, and stora...

Defect inspection device

Methods and evaluation devices for analyzing three-dimensional data...

Detection of probabilistic process windows

Substrate testing with three-dimensional scanning

Method for overlay metrology and apparatus thereof

Wafer inspection method

Manufacturing process with atomic level inspection

Determination of a simulated image of a specimen

Enhanced cross sectional features measurement methodology

Method and apparatus for coating photoresist over a substrate

Patents Applicationslast 30 patents

SYSTEMS AND METHODS FOR AIR POCKET DEFECT DETECTION

OPTIMIZATION OF A METROLOGY ALGORITHM FOR EXAMINATION OF SEMICONDUC...

DEVICE LINE UNDERSTANDING USING COMPOSED TEMPLATES

PATTERN SHAPE MEASUREMENT METHOD, PATTERN SHAPE MEASUREMENT APPARAT...

CUTTING PATH PLANNING ALGORITHM FOR SEMICONDUCTOR WORKPIECE BASED O...

MACHINE LEARNING BASED DEFECT EXAMINATION FOR SEMICONDUCTOR SPECIMENS

SYSTEM AND METHOD FOR DETECTING SEMICONDUCTOR PROCESSING ERROR

PROFILE DETECTING METHOD AND PROFILE DETECTING APPARATUS

PROCESSING METHOD AND PROCESSING SYSTEM

SEMICONDUCTOR MANUFACTURING DEVICE AND CONTROL OF THE SAME

OBSERVATION SYSTEM AND ARTIFACT CORRECTION METHOD FOR SAME

PATTERN INSPECTION DEVICE AND PATTERN INSPECTION METHOD

THERMAL IMAGING FOR ANALYSIS OF DEVICE FABRICATION TOOLS

OPTICAL METROLOGY DEVICE

Metrology Apparatus And Method For Determining A Characteristic Of...

SHAPE CHARACTERISTIC VALUE ESTIMATION APPARATUS, SHAPE CHARACTERIST...

Image Processing Program, Image Processing Device, and Image Proces...

TEST SYSTEM AND TEST METHOD TO WAFERS

SYSTEM AND METHOD FOR CONTROLLING CHEMICAL MECHANICAL PLANARIZATION

DETECTION APPARATUS FOR SIMULTANEOUS ACQUISITION OF MULTIPLE DIVERS...

MULTI-DEVICE AUTOMATED OPTICAL INSPECTION

MOUNTING DEVICE AND MOUNTING METHOD

MACHINE LEARNING MODEL TRAINING

METHOD AND DEVICE FOR ANALYSING AN IMAGE OF A MICROLITHOGRAPHIC MIC...

IN-TOOL AUDIO AND VISUAL BEHAVIOR MONITORING FOR PROCESS CONTROL

AUTOMATIC TIME DELAY AND INTEGRATION (TDI) MASK INSPECTION SYSTEM C...

Method and Structures for Acoustic Wave Overlay Error Determination

METHOD AND APPARATUS FOR COATING PHOTORESIST OVER A SUBSTRATE

APPARATUS AND METHODS FOR THREE DIMENSIONAL RETICLE DEFECT SMART RE...

HOTSPOT AVOIDANCE METHOD OF MANUFACTURING INTEGRATED CIRCUITS