Semiconductor IC Wafer

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CPC
G06T2207/30148

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GPHYSICS G06Computing G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL G06T2207/00Indexing scheme for image analysis or image enhancement

Current Industry

G06T2207/30148Semiconductor IC Wafer

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Method of processing a cleaved semiconductor wafer
- Patent number 12,270,768
- Issue date Apr 8, 2025
- GlobalWafers Co., Ltd.
- Benjamin Michael Meyer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Residue measurement from machine learning based processing of subst...
- Patent number 12,272,047
- Issue date Apr 8, 2025
- Applied Materials, Inc.
- Sivakumar Dhandapani
- B24 - GRINDING POLISHING
Information Patent Grant
Method for detecting objects and their state, apparatus and storage...
- Patent number 12,272,140
- Issue date Apr 8, 2025
- Hon Hai Precision Industry Co., Ltd.
- Yi-Chen Wang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for predicting substrate image
- Patent number 12,271,114
- Issue date Apr 8, 2025
- ASML Netherlands B.V.
- Scott Anderson Middlebrooks
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Positioning method
- Patent number 12,272,102
- Issue date Apr 8, 2025
- Disco Corporation
- Yoshimasa Kojima
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Positioning method, positioning device, and processing method for w...
- Patent number 12,272,098
- Issue date Apr 8, 2025
- SHENZHEN ROBOTVISIONTECHNOLOGY CO.,LTD.
- Yanchao Hu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Substrate inspection system and a method of use thereof
- Patent number 12,258,665
- Issue date Mar 25, 2025
- JNK TECH
- Youngjin Choi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Machine learning based examination of a semiconductor specimen and...
- Patent number 12,260,543
- Issue date Mar 25, 2025
- Applied Materials Israel Ltd.
- Tal Ben-Shlomo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
3D fiducial for precision 3D NAND channel tilt/shift analysis
- Patent number 12,260,583
- Issue date Mar 25, 2025
- FEI Company
- Mark Najarian
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Aligning a distorted image
- Patent number 12,259,659
- Issue date Mar 25, 2025
- ASML Netherlands B.V.
- Coen Adrianus Verschuren
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and method of measuring uniformity based on pupil image a...
- Patent number 12,260,539
- Issue date Mar 25, 2025
- Samsung Electronics Co., Ltd.
- Minho Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Sample observation device and method
- Patent number 12,260,545
- Issue date Mar 25, 2025
- HITACHI HIGH-TECH CORPORATION
- Yuki Doi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for inspection of IC devices
- Patent number 12,254,613
- Issue date Mar 18, 2025
- Battelle Memorial Institute
- Nicholas Darby
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and systems for real-time quality control of a film in a sp...
- Patent number 12,255,110
- Issue date Mar 18, 2025
- Samsung Electronics Co., Ltd.
- Gaurav Kumar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Numerically compensating SEM-induced charging using diffusion-based...
- Patent number 12,255,042
- Issue date Mar 18, 2025
- ASML Netherlands B.V.
- Thomas Jarik Huisman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method, electronic device and operating method of electronic device...
- Patent number 12,254,621
- Issue date Mar 18, 2025
- Samsung Electronics Co., Ltd.
- Do-Nyun Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Ingot growing apparatus and monitoring method thereof
- Patent number 12,247,939
- Issue date Mar 11, 2025
- SK SILTRON CO., LTD.
- Min Jae Yoon
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Navigation accuracy using camera coupled with detector assembly
- Patent number 12,249,059
- Issue date Mar 11, 2025
- BRUKER TECHNOLOGIES LTD.
- Alexander Krokhmal
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for scanning wafer
- Patent number 12,243,218
- Issue date Mar 4, 2025
- Taiwan Semiconductor Manufacturing Company Ltd.
- Pei-Hsuan Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Detection apparatus, detection method, exposure apparatus, exposure...
- Patent number 12,241,846
- Issue date Mar 4, 2025
- Canon Kabushiki Kaisha
- Kazuya Kijima
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Substrate processing monitoring apparatus based on imaging video da...
- Patent number 12,244,972
- Issue date Mar 4, 2025
- Tokyo Electron Limited
- Yuichiro Kunugimoto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Substrate inspection device, substrate inspection system, and subst...
- Patent number 12,243,213
- Issue date Mar 4, 2025
- Tokyo Electron Limited
- Shuji Iwanaga
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern image detection method
- Patent number 12,243,286
- Issue date Mar 4, 2025
- Fourth Logic Incorporated
- Jong Hyun Song
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system of operating overlay measuring
- Patent number 12,242,246
- Issue date Mar 4, 2025
- NANYA TECHNOLOGY CORPORATION
- Chien-Hsien Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optical end-pointing for integrated circuit delayering; systems and...
- Patent number 12,236,573
- Issue date Feb 25, 2025
- Battelle Memorial Institute
- Jonathan Scholl
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Processing apparatus
- Patent number 12,236,619
- Issue date Feb 25, 2025
- Disco Corporation
- Hironari Ohkubo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Appearance inspection system and appearance inspection method for t...
- Patent number 12,236,570
- Issue date Feb 25, 2025
- Kabushika Kaisha Toshiba
- Ikuo Motonaga
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Area camera substrate pre-aligner
- Patent number 12,237,198
- Issue date Feb 25, 2025
- Onto Innovation Inc.
- Jason Paul Remillard
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Substrate treating apparatus and substrate treating method
- Patent number 12,236,574
- Issue date Feb 25, 2025
- Semes Co., Ltd.
- Ohyeol Kwon
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Fully automated SEM sampling system for e-beam image enhancement
- Patent number 12,230,013
- Issue date Feb 18, 2025
- ASML Netherlands B.V.
- Wentian Zhou
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL INSPECTION-BASED AUTOMATIC DEFECT CLASSIFICATION
- Publication number 20250117915
- Publication date Apr 10, 2025
- Applied Materials, Inc.
- Navneet Kumar Singh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR GENERATING PROXIMITY CORRECTION MODEL, METHOD FOR PROCES...
- Publication number 20250117924
- Publication date Apr 10, 2025
- Samsung Electronics Co., Ltd.
- Sang Chul YEO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT SYNTHESIS AND DETECTION VIA DEFECT GENERATIVE PRE-TRAINED TR...
- Publication number 20250117925
- Publication date Apr 10, 2025
- KLA Corporation
- Jing Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ACTIVE LEARNING TO IMPROVE WAFER DEFECT CLASSIFICATION
- Publication number 20250117921
- Publication date Apr 10, 2025
- ASML NETHERLANDS B.V.
- Blagorodna ILIEVSKA ALCHEVA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CONTOUR EXTRACTION OF IMAGES WITH SELECTION-BASED AUTO TUNING
- Publication number 20250111494
- Publication date Apr 3, 2025
- Siemens Industry Software Inc.
- Germain Louis Fenger
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SUBSTRATE PROCESSING APPARATUS AND MONITORING METHOD
- Publication number 20250111495
- Publication date Apr 3, 2025
- SCREEN Holdings Co., Ltd.
- Shinji SHIMIZU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF DETERMINING HYDROPHILICITY OF WAFER AND PROCESSING APPARATUS
- Publication number 20250104213
- Publication date Mar 27, 2025
- Disco Corporation
- Ryosuke KUROSAWA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD TO CALIBRATE, PREDICT, AND CONTROL STOCHASTIC DEFECTS IN EUV...
- Publication number 20250104216
- Publication date Mar 27, 2025
- KLA Corporation
- Pradeep Vukkadala
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM OF DEFECT DETECTION FOR INSPECTION SAMPLE BASED O...
- Publication number 20250104210
- Publication date Mar 27, 2025
- ASML NETHERLANDS B.V.
- Lingling PU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE-BASED PREDICTION METHOD FOR POTENTIAL RISK FACTORS IN SEMICON...
- Publication number 20250104217
- Publication date Mar 27, 2025
- Samsung Electronics Co., Ltd.
- Bo Gyeong Kang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
RADIO FREQUENCY INDUCED MICRO LED INSPECTION
- Publication number 20250105065
- Publication date Mar 27, 2025
- ORBOTECH LTD.
- Arie Glazer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE REGISTRATION METHODS AND SYSTEMS
- Publication number 20250104257
- Publication date Mar 27, 2025
- TECHINSIGHTS INC.
- Christopher Pawlowicz
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD TO CALIBRATE, PREDICT, AND CONTROL STOCHASTIC DEFECTS IN EUV...
- Publication number 20250104214
- Publication date Mar 27, 2025
- KLA Corporation
- Pradeep Vukkadala
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD TO CALIBRATE, PREDICT, AND CONTROL STOCHASTIC DEFECTS IN EUV...
- Publication number 20250104215
- Publication date Mar 27, 2025
- KLA Corporation
- Pradeep Vukkadala
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
AUTOMATIC METHOD TO FIND EXTENT OF REPEATING GEOMETRY IN AN INTEGRA...
- Publication number 20250095317
- Publication date Mar 20, 2025
- KLA Corporation
- Gordon Rouse
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF PROCESSING DATA DERIVED FROM A SAMPLE
- Publication number 20250095133
- Publication date Mar 20, 2025
- ASML NETHERLANDS B.V.
- Vincent Sylvester KUIPER
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE ENHANCEMENT IN CHARGED PARTICLE INSPECTION
- Publication number 20250095116
- Publication date Mar 20, 2025
- ASML NETHERLANDS B.V.
- Hairong LEI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LEARNING METHOD, LEARNING APPARATUS, LEARNING PROGRAM, CONTROL METH...
- Publication number 20250095128
- Publication date Mar 20, 2025
- Riken
- Toru UJIHARA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR DEFINING VALID DIE POSITIONS ON INSPECTION WAFER MAP
- Publication number 20250086829
- Publication date Mar 13, 2025
- United Microelectronics Corp.
- Hsiang-Yuan HU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CONCENTRICITY OFFSET MEASUREMENT FOR HYBRID BONDING
- Publication number 20250086780
- Publication date Mar 13, 2025
- KLA Corporation
- Hemang Ashvinbhai Bhatt
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MACHINE LEARNING BASED DEFECT EXAMINATION FOR SEMICONDUCTOR SPECIMENS
- Publication number 20250086781
- Publication date Mar 13, 2025
- APPLIED MATERIALS ISRAEL LTD.
- Boaz STURLESI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SUBSTRATE PRE-ALIGNER
- Publication number 20250079221
- Publication date Mar 6, 2025
- APPLIED MATERIALS ISRAEL LTD.
- Itamar Orenbuch
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
UTILIZE MACHINE LEARNING IN SELECTING HIGH QUALITY AVERAGED SEM IMA...
- Publication number 20250078244
- Publication date Mar 6, 2025
- ASML NETHERLANDS B.V.
- Chen ZHANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
NEW DESIGN OF EUV VESSEL PERIMETER FLOW AUTO ADJUSTMENT
- Publication number 20250076770
- Publication date Mar 6, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Che-Chang HSU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FULLY AUTOMATED SEM SAMPLING SYSTEM FOR E-BEAM IMAGE ENHANCEMENT
- Publication number 20250078478
- Publication date Mar 6, 2025
- ASML NETHERLANDS B.V.
- Wentian ZHOU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF INSPECTING A MARK ENGRAVED ON A SEMICONDUCTOR PACKAGE
- Publication number 20250078249
- Publication date Mar 6, 2025
- SAMSUNG ELECTRONICS CO., LTD.
- Minwoo JEON
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
EVALUATION METHOD, SEMICONDUCTOR DEVICE MANUFACTURING METHOD, AND E...
- Publication number 20250069215
- Publication date Feb 27, 2025
- KIOXIA Corporation
- Satoshi MITSUGI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Detection of Probabilistic Process Windows
- Publication number 20250069843
- Publication date Feb 27, 2025
- FRACTILIA, LLC
- Chris Mack
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
QUANTITATIVE LINEAR INDEPENDENT VECTOR BASED METHOD (QLIVBM) FOR IM...
- Publication number 20250069242
- Publication date Feb 27, 2025
- KLA Corporation
- Qilong Huang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPERATION MONITORING METHOD AND MANUFACTURING APPARATUS
- Publication number 20250069922
- Publication date Feb 27, 2025
- SCREEN Holdings Co., Ltd.
- Satoshi OKAMOTO
- G06 - COMPUTING CALCULATING COUNTING

Semiconductor IC Wafer

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method of processing a cleaved semiconductor wafer

Residue measurement from machine learning based processing of subst...

Method for detecting objects and their state, apparatus and storage...

Method and apparatus for predicting substrate image

Positioning method

Positioning method, positioning device, and processing method for w...

Substrate inspection system and a method of use thereof

Machine learning based examination of a semiconductor specimen and...

3D fiducial for precision 3D NAND channel tilt/shift analysis

Aligning a distorted image

Apparatus and method of measuring uniformity based on pupil image a...

Sample observation device and method

Systems and methods for inspection of IC devices

Methods and systems for real-time quality control of a film in a sp...

Numerically compensating SEM-induced charging using diffusion-based...

Method, electronic device and operating method of electronic device...

Ingot growing apparatus and monitoring method thereof

Navigation accuracy using camera coupled with detector assembly

Method and system for scanning wafer

Detection apparatus, detection method, exposure apparatus, exposure...

Substrate processing monitoring apparatus based on imaging video da...

Substrate inspection device, substrate inspection system, and subst...

Pattern image detection method

Method and system of operating overlay measuring

Optical end-pointing for integrated circuit delayering; systems and...

Processing apparatus

Appearance inspection system and appearance inspection method for t...

Area camera substrate pre-aligner

Substrate treating apparatus and substrate treating method

Fully automated SEM sampling system for e-beam image enhancement

Patents Applicationslast 30 patents

OPTICAL INSPECTION-BASED AUTOMATIC DEFECT CLASSIFICATION

METHOD FOR GENERATING PROXIMITY CORRECTION MODEL, METHOD FOR PROCES...

DEFECT SYNTHESIS AND DETECTION VIA DEFECT GENERATIVE PRE-TRAINED TR...

ACTIVE LEARNING TO IMPROVE WAFER DEFECT CLASSIFICATION

CONTOUR EXTRACTION OF IMAGES WITH SELECTION-BASED AUTO TUNING

SUBSTRATE PROCESSING APPARATUS AND MONITORING METHOD

METHOD OF DETERMINING HYDROPHILICITY OF WAFER AND PROCESSING APPARATUS

METHOD TO CALIBRATE, PREDICT, AND CONTROL STOCHASTIC DEFECTS IN EUV...

METHOD AND SYSTEM OF DEFECT DETECTION FOR INSPECTION SAMPLE BASED O...

IMAGE-BASED PREDICTION METHOD FOR POTENTIAL RISK FACTORS IN SEMICON...

RADIO FREQUENCY INDUCED MICRO LED INSPECTION

IMAGE REGISTRATION METHODS AND SYSTEMS

METHOD TO CALIBRATE, PREDICT, AND CONTROL STOCHASTIC DEFECTS IN EUV...

METHOD TO CALIBRATE, PREDICT, AND CONTROL STOCHASTIC DEFECTS IN EUV...

AUTOMATIC METHOD TO FIND EXTENT OF REPEATING GEOMETRY IN AN INTEGRA...

METHOD OF PROCESSING DATA DERIVED FROM A SAMPLE

IMAGE ENHANCEMENT IN CHARGED PARTICLE INSPECTION

LEARNING METHOD, LEARNING APPARATUS, LEARNING PROGRAM, CONTROL METH...

METHOD FOR DEFINING VALID DIE POSITIONS ON INSPECTION WAFER MAP

CONCENTRICITY OFFSET MEASUREMENT FOR HYBRID BONDING

MACHINE LEARNING BASED DEFECT EXAMINATION FOR SEMICONDUCTOR SPECIMENS

SUBSTRATE PRE-ALIGNER

UTILIZE MACHINE LEARNING IN SELECTING HIGH QUALITY AVERAGED SEM IMA...

NEW DESIGN OF EUV VESSEL PERIMETER FLOW AUTO ADJUSTMENT

FULLY AUTOMATED SEM SAMPLING SYSTEM FOR E-BEAM IMAGE ENHANCEMENT

METHOD OF INSPECTING A MARK ENGRAVED ON A SEMICONDUCTOR PACKAGE

EVALUATION METHOD, SEMICONDUCTOR DEVICE MANUFACTURING METHOD, AND E...

Detection of Probabilistic Process Windows

QUANTITATIVE LINEAR INDEPENDENT VECTOR BASED METHOD (QLIVBM) FOR IM...

OPERATION MONITORING METHOD AND MANUFACTURING APPARATUS