Semiconductor IC Wafer

Industry

CPC
G06T2207/30148

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Parent Industries

GPHYSICS G06Computing G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL G06T2207/00Indexing scheme for image analysis or image enhancement

Current Industry

G06T2207/30148Semiconductor IC Wafer

Industries

Patents Grantslast 30 patents

Information Patent Grant
Automatic optical inspection system and method
- Patent number 12,367,569
- Issue date Jul 22, 2025
- Taiwan Semiconductor Manufacturing Co., Ltd
- I-Hsuan Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Wafer taping apparatus and method
- Patent number 12,368,063
- Issue date Jul 22, 2025
- Taiwan Semiconductor Manufacturing Co., Ltd
- Chien-Yi Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Wafer processing apparatus
- Patent number 12,368,065
- Issue date Jul 22, 2025
- Samsung Electronics Co., Ltd.
- Seungbeom Park
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Information processing apparatus for teaching transfer position of...
- Patent number 12,367,602
- Issue date Jul 22, 2025
- Tokyo Electron Limited
- Tadashi Enomoto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for correcting non-ideal wafer topography
- Patent number 12,368,066
- Issue date Jul 22, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd
- Cheng-Mu Lin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Mask inspection for semiconductor specimen fabrication
- Patent number 12,361,535
- Issue date Jul 15, 2025
- Applied Materials Israel Ltd.
- Ronen Madmon
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Identification of hot spots or defects by machine learning
- Patent number 12,360,461
- Issue date Jul 15, 2025
- ASML Netherlands B.V.
- Jing Su
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electronic device including processor executing defect detection mo...
- Patent number 12,361,537
- Issue date Jul 15, 2025
- Samsung Electronics Co., Ltd.
- Min-Cheol Kang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Reconstruction of a distorted image of an array of structural eleme...
- Patent number 12,361,526
- Issue date Jul 15, 2025
- Applied Materials Israel Ltd.
- Yehuda Cohen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
EUV mask inspection device, EUV mask inspection method, non-transit...
- Patent number 12,361,536
- Issue date Jul 15, 2025
- Lasertec Corporation
- Yoshihiro Kato
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Machine learning-based classification of defects in a semiconductor...
- Patent number 12,361,531
- Issue date Jul 15, 2025
- Applied Materials Israel Ltd.
- Ohad Shaubi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Bonding apparatus and bonding method
- Patent number 12,362,314
- Issue date Jul 15, 2025
- Tokyo Electron Limited
- Yuhei Matsuo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Low contrast non-referential defect detection
- Patent number 12,354,254
- Issue date Jul 8, 2025
- Onto Innovation Inc.
- Roman S. Basistyy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Computer system, dimension measurement method, and storage medium
- Patent number 12,345,522
- Issue date Jul 1, 2025
- HITACHI HIGH-TECH CORPORATION
- Yutaka Okuyama
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for fault isolation, computer device, medium a...
- Patent number 12,347,093
- Issue date Jul 1, 2025
- China Electronics Reliability And Environmental Testing Institute
- Chao Pang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor measurement apparatus
- Patent number 12,347,096
- Issue date Jul 1, 2025
- Samsung Electronics Co., Ltd.
- Myungjun Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern measurement system, pattern measurement method, and program...
- Patent number 12,347,074
- Issue date Jul 1, 2025
- HITACHI HIGH-TECH CORPORATION
- Toshimasa Kameda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Examination of a hole formed in a semiconductor specimen
- Patent number 12,347,734
- Issue date Jul 1, 2025
- Applied Materials Israel Ltd.
- Rafael Bistritzer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Simultaneous back and/or front and/or bulk defect detection
- Patent number 12,339,235
- Issue date Jun 24, 2025
- Onto Innovation Inc.
- Felix Moellmann
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor inspecting method and semiconductor inspecting device
- Patent number 12,340,504
- Issue date Jun 24, 2025
- Hamamatsu Photonics K.K.
- Akira Shimase
- G01 - MEASURING TESTING
Information Patent Grant
Measurement apparatus, lithography apparatus, and article manufactu...
- Patent number 12,339,595
- Issue date Jun 24, 2025
- Canon Kabushiki Kaisha
- Satoru Jimbo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Photolithographic mask optimization method and system without borde...
- Patent number 12,339,581
- Issue date Jun 24, 2025
- Wuhan Yuwei Optical Software Co., Ltd.
- Haiqing Wei
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for computational metrology and inspection for patterns to b...
- Patent number 12,340,495
- Issue date Jun 24, 2025
- D2S, Inc.
- Linyong Pang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Fast and fuzzy pattern grouping
- Patent number 12,333,701
- Issue date Jun 17, 2025
- KLA Corporation
- Kangjia Liao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and devices for detecting surface defects based on perceptu...
- Patent number 12,333,704
- Issue date Jun 17, 2025
- XI'AN MICROELECTRONICS TECHNOLOGY INSTITUTE
- Shuaibing Guo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Chemical-dose substrate deposition monitoring
- Patent number 12,333,700
- Issue date Jun 17, 2025
- Applied Materials, Inc.
- Albert Barrett Hicks
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for inspecting semiconductor wafer and method of...
- Patent number 12,332,186
- Issue date Jun 17, 2025
- Samsung Electronics Co., Ltd.
- Q-Han Park
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for determining defectiveness of pattern based on after deve...
- Patent number 12,332,573
- Issue date Jun 17, 2025
- ASML Netherlands B.V.
- Marleen Kooiman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Die bonding apparatus and manufacturing method for semiconductor ap...
- Patent number 12,327,739
- Issue date Jun 10, 2025
- FASFORD TECHNOLOGY CO., LTD.
- Hideharu Kobashi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Dimension measurement apparatus, semiconductor manufacturing appara...
- Patent number 12,320,630
- Issue date Jun 3, 2025
- HITACHI HIGH-TECH CORPORATION
- Pushe Zhao
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD WITH MACHINE LEARNING FOR SEMICONDUCTOR WAFER DEF...
- Publication number 20250238919
- Publication date Jul 24, 2025
- Samsung Electronics Co., Ltd.
- Priyadarshini Panemangalore PAI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DETERMINING CONTOUR EDGES FOR AN IMAGE
- Publication number 20250238916
- Publication date Jul 24, 2025
- NVIDIA Corporation
- Selim Dogru
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CONTACT AREA SIZE DETERMINATION BETWEEN 3D STRUCTURES IN AN INTEGRA...
- Publication number 20250239474
- Publication date Jul 24, 2025
- Carl Zeiss SMT GMBH
- Alex Buxbaum
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MONITORING APPARATUS, SUBSTRATE PROCESSING APPARATUS, MONITORING ME...
- Publication number 20250240390
- Publication date Jul 24, 2025
- TOKYO ELECTRON LIMITED
- Yuichiro KUNUGIMOTO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR DETERMINING DEFECTIVENESS OF PATTERN BASED ON AFTER DEVE...
- Publication number 20250237967
- Publication date Jul 24, 2025
- ASML NETHERLANDS B.V.
- Marleen KOOIMAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CORESET BASED MASK INSPECTION FOR SEMICONDUCTOR SPECIMEN FABRICATION
- Publication number 20250232431
- Publication date Jul 17, 2025
- APPLIED MATERIALS ISRAEL LTD.
- Evgeny BAL
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DETERMINATION OF UNDERCUT SIDEWALLS BASED ON AN IMAGE OF A SEMICOND...
- Publication number 20250232424
- Publication date Jul 17, 2025
- APPLIED MATERIALS ISRAEL LTD.
- Roman KRIS
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ANALYSIS METHOD AND EVALUATION METHOD
- Publication number 20250232427
- Publication date Jul 17, 2025
- SCREEN Holdings Co., Ltd.
- Satoshi OKAMOTO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TRAINING A MACHINE LEARNING PROCESS FOR USE IN EVALUATING A SUBSTRATE
- Publication number 20250232430
- Publication date Jul 17, 2025
- APPLIED MATERIALS ISRAEL LTD.
- Boaz Dudovich
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGING METHOD AND METROLOGY DEVICE
- Publication number 20250231498
- Publication date Jul 17, 2025
- ASML NETHERLANDS B.V.
- Willem Marie Julia Marcel COENE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS AND METHODS FOR REGISTRATION BETWEEN IMAGES INFORMATIVE OF...
- Publication number 20250225646
- Publication date Jul 10, 2025
- APPLIED MATERIALS ISRAEL LTD.
- Ishai SCHWARZBAND
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DIGITAL NONLINEAR NEURAL NETWORK BASED IMAGE FILTERING FOR SEMICOND...
- Publication number 20250225638
- Publication date Jul 10, 2025
- KLA Corporation
- Pavel Kolchin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS WITH ANOMALY DETECTION USING ANOMALY MAP
- Publication number 20250225649
- Publication date Jul 10, 2025
- Samsung Electronics Co., Ltd.
- Saehyun AHN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR MEASUREMENT METHOD
- Publication number 20250225674
- Publication date Jul 10, 2025
- Samsung Electronics Co., Ltd.
- Inho SHIN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MONITORING SUBSTRATE AND MONITORING METHOD
- Publication number 20250227361
- Publication date Jul 10, 2025
- TOKYO ELECTRON LIMITED
- Isamu TAODA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEGMENTATION-BASED CARE AREA SETUP FOR INSPECTION OF A SPECIMEN USI...
- Publication number 20250225640
- Publication date Jul 10, 2025
- KLA Corporation
- Raja Barnwal
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
STABILIZATION OF A MANUFACTURING PROCESS OF A SPECIMEN BY SHAPE ANA...
- Publication number 20250225642
- Publication date Jul 10, 2025
- APPLIED MATERIALS ISRAEL LTD.
- Einat FRISHMAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method for manufacturing and inspecting a factory joint during inst...
- Publication number 20250217961
- Publication date Jul 3, 2025
- NEXANS
- Espen DOEDENS
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20250216341
- Publication date Jul 3, 2025
- Mitsubishi Electric Corporation
- Hiroshi UEDA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Inspection Layer to Improve The Detection of Defects Through Optica...
- Publication number 20250216342
- Publication date Jul 3, 2025
- Taiwan Semiconductor Manufacturing Company Limited
- I-Che Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR WAFER COOLING
- Publication number 20250216841
- Publication date Jul 3, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yung-Yao LEE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS WITH SCANNING ELECTRON MICROSCOPE IMAGE CORREC...
- Publication number 20250218041
- Publication date Jul 3, 2025
- Samsung Electronics Co., Ltd.
- Sungun PARK
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SUBSTRATE PROCESSING APPARATUS, PHOTOGRAPHING UNIT AND LIQUID PROCE...
- Publication number 20250218812
- Publication date Jul 3, 2025
- SEMES CO., LTD.
- Oh Yeol KWON
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS AND APPARATUS TO DETECT DEFECTS IN GATE-ALL-AROUND TRANSIST...
- Publication number 20250217962
- Publication date Jul 3, 2025
- Intel Corporation
- Manish Sharma
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE PROCESSING DEVICE AND IMAGE PROCESSING METHOD
- Publication number 20250217966
- Publication date Jul 3, 2025
- Samsung Electronics Co., Ltd.
- Young Eun YOO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
QUALITY CONTROL METHOD FOR IMPRINT LITHOGRAPHY
- Publication number 20250217964
- Publication date Jul 3, 2025
- Koninklijke Philips N.V.
- REMCO VAN BRAKEL
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
COMPUTER IMPLEMENTED METHOD FOR DEFECT RECOGNITION IN AN IMAGING DA...
- Publication number 20250209603
- Publication date Jun 26, 2025
- Carl Zeiss SMT GMBH
- Abhilash SRIKANTHA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
K-DISTANCE TREE METROLOGY
- Publication number 20250209647
- Publication date Jun 26, 2025
- FEI Company
- Spencer Forell
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SUBSTRATE INSPECTING APPARATUS AND METHOD OF INSPECTING SUBSTRATE
- Publication number 20250209597
- Publication date Jun 26, 2025
- SAMSUNG DISPLAY CO., LTD.
- MYOUNGCHUL KIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CROSSTALK CORRECTION FOR IMAGES OF SEMICONDUCTOR SPECIMENS
- Publication number 20250209604
- Publication date Jun 26, 2025
- APPLIED MATERIALS ISRAEL LTD.
- Lior AKERMAN
- G06 - COMPUTING CALCULATING COUNTING

Semiconductor IC Wafer

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Automatic optical inspection system and method

Wafer taping apparatus and method

Wafer processing apparatus

Information processing apparatus for teaching transfer position of...

System and method for correcting non-ideal wafer topography

Mask inspection for semiconductor specimen fabrication

Identification of hot spots or defects by machine learning

Electronic device including processor executing defect detection mo...

Reconstruction of a distorted image of an array of structural eleme...

EUV mask inspection device, EUV mask inspection method, non-transit...

Machine learning-based classification of defects in a semiconductor...

Bonding apparatus and bonding method

Low contrast non-referential defect detection

Computer system, dimension measurement method, and storage medium

Method and apparatus for fault isolation, computer device, medium a...

Semiconductor measurement apparatus

Pattern measurement system, pattern measurement method, and program...

Examination of a hole formed in a semiconductor specimen

Simultaneous back and/or front and/or bulk defect detection

Semiconductor inspecting method and semiconductor inspecting device

Measurement apparatus, lithography apparatus, and article manufactu...

Photolithographic mask optimization method and system without borde...

Method for computational metrology and inspection for patterns to b...

Fast and fuzzy pattern grouping

Methods and devices for detecting surface defects based on perceptu...

Chemical-dose substrate deposition monitoring

Method and system for inspecting semiconductor wafer and method of...

Method for determining defectiveness of pattern based on after deve...

Die bonding apparatus and manufacturing method for semiconductor ap...

Dimension measurement apparatus, semiconductor manufacturing appara...

Patents Applicationslast 30 patents

SYSTEM AND METHOD WITH MACHINE LEARNING FOR SEMICONDUCTOR WAFER DEF...

DETERMINING CONTOUR EDGES FOR AN IMAGE

CONTACT AREA SIZE DETERMINATION BETWEEN 3D STRUCTURES IN AN INTEGRA...

MONITORING APPARATUS, SUBSTRATE PROCESSING APPARATUS, MONITORING ME...

METHOD FOR DETERMINING DEFECTIVENESS OF PATTERN BASED ON AFTER DEVE...

CORESET BASED MASK INSPECTION FOR SEMICONDUCTOR SPECIMEN FABRICATION

DETERMINATION OF UNDERCUT SIDEWALLS BASED ON AN IMAGE OF A SEMICOND...

ANALYSIS METHOD AND EVALUATION METHOD

TRAINING A MACHINE LEARNING PROCESS FOR USE IN EVALUATING A SUBSTRATE

IMAGING METHOD AND METROLOGY DEVICE

SYSTEMS AND METHODS FOR REGISTRATION BETWEEN IMAGES INFORMATIVE OF...

DIGITAL NONLINEAR NEURAL NETWORK BASED IMAGE FILTERING FOR SEMICOND...

METHOD AND APPARATUS WITH ANOMALY DETECTION USING ANOMALY MAP

SEMICONDUCTOR MEASUREMENT METHOD

MONITORING SUBSTRATE AND MONITORING METHOD

SEGMENTATION-BASED CARE AREA SETUP FOR INSPECTION OF A SPECIMEN USI...

STABILIZATION OF A MANUFACTURING PROCESS OF A SPECIMEN BY SHAPE ANA...

Method for manufacturing and inspecting a factory joint during inst...

INSPECTION APPARATUS AND INSPECTION METHOD

Inspection Layer to Improve The Detection of Defects Through Optica...

SEMICONDUCTOR WAFER COOLING

METHOD AND APPARATUS WITH SCANNING ELECTRON MICROSCOPE IMAGE CORREC...

SUBSTRATE PROCESSING APPARATUS, PHOTOGRAPHING UNIT AND LIQUID PROCE...

METHODS AND APPARATUS TO DETECT DEFECTS IN GATE-ALL-AROUND TRANSIST...

IMAGE PROCESSING DEVICE AND IMAGE PROCESSING METHOD

QUALITY CONTROL METHOD FOR IMPRINT LITHOGRAPHY

COMPUTER IMPLEMENTED METHOD FOR DEFECT RECOGNITION IN AN IMAGING DA...

K-DISTANCE TREE METROLOGY

SUBSTRATE INSPECTING APPARATUS AND METHOD OF INSPECTING SUBSTRATE

CROSSTALK CORRECTION FOR IMAGES OF SEMICONDUCTOR SPECIMENS