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G06T2207/30148
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IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
G06T2207/00
Indexing scheme for image analysis or image enhancement
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G06T2207/30148
Semiconductor IC Wafer
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Patents Grants
last 30 patents
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Patent Grant
Fully automated SEM sampling system for e-beam image enhancement
Patent number
12,230,013
Issue date
Feb 18, 2025
ASML Netherlands B.V.
Wentian Zhou
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Inline wafer defect detection system and method
Patent number
12,230,522
Issue date
Feb 18, 2025
Texas Instruments Incorporated
Patrick David Noll
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Defect detection method of deep learning-based semiconductor device...
Patent number
12,229,944
Issue date
Feb 18, 2025
Samsung Electronics Co., Ltd.
Kyenhee Lee
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Semantic image segmentation for semiconductor-based applications
Patent number
12,229,935
Issue date
Feb 18, 2025
KLA Corporation
Bjorn Brauer
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Wafer bin map based root cause analysis
Patent number
12,229,945
Issue date
Feb 18, 2025
PDF Solutions, Inc.
Tomonori Honda
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Hotspot avoidance method of manufacturing integrated circuits
Patent number
12,229,487
Issue date
Feb 18, 2025
Taiwan Semiconductor Manufacturing Co., Ltd
I-Shuo Liu
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Super resolution SEM image implementing device and method thereof
Patent number
12,229,936
Issue date
Feb 18, 2025
Samsung Electronics Co., Ltd.
Ho Joon Lee
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Inspection apparatus and inspection method
Patent number
12,228,515
Issue date
Feb 18, 2025
Hamamatsu Photonics K.K.
Tomonori Nakamura
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Defect detection of a semiconductor specimen
Patent number
12,223,641
Issue date
Feb 11, 2025
Applied Materials Israel Ltd.
Boaz Dudovich
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Process recipe search apparatus, etching recipe search method and s...
Patent number
12,222,690
Issue date
Feb 11, 2025
HITACHI HIGH-TECH CORPORATION
Takashi Dobashi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and device for detecting placement of wafers in wafer cassette
Patent number
12,217,988
Issue date
Feb 4, 2025
Hon Hai Precision Industry Co., Ltd.
Yu-Ting Chou
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method for non-destructive inspection of cell etch redeposition
Patent number
12,218,014
Issue date
Feb 4, 2025
Taiwan Semiconductor Manufacturing Company, Ltd
I-Che Lee
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method for inspecting semiconductor and semiconductor inspecting de...
Patent number
12,211,199
Issue date
Jan 28, 2025
Hamamatsu Photonics K.K.
Tomochika Takeshima
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Edge defect detection via image analytics
Patent number
12,211,195
Issue date
Jan 28, 2025
Applied Materials, Inc.
Yash Chhabra
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Defect inspection with images of different synthesis ratios
Patent number
12,211,194
Issue date
Jan 28, 2025
HITACHI HIGH-TECH CORPORATION
Yasushi Ebizuka
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Ensemble of deep learning models for defect review in high volume m...
Patent number
12,211,196
Issue date
Jan 28, 2025
KLA Corp.
Kuljit S. Virk
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Component conveying instrument with an adjusting unit and method of...
Patent number
12,211,721
Issue date
Jan 28, 2025
Muehlbauer GmbH & Co. KG
Rainer Miehlich
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Optical measurement tool containing chromatic aberration enhancemen...
Patent number
12,211,724
Issue date
Jan 28, 2025
SanDisk Technologies LLC
Michio Ohi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Substrate processing apparatus and substrate processing method
Patent number
12,211,197
Issue date
Jan 28, 2025
SCREEN Holdings Co., Ltd.
Hideji Naohara
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Wafer inspection system method
Patent number
12,211,200
Issue date
Jan 28, 2025
NANYA TECHNOLOGY CORPORATION
Chia-Lin Tsai
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Apparatus and method for inspecting light-emitting diode dies
Patent number
12,203,971
Issue date
Jan 21, 2025
Industrial Technology Research Institute
Yan-Rung Lin
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Defect detection system
Patent number
12,205,360
Issue date
Jan 21, 2025
Nanotronics Imaging, Inc.
Tonislav Ivanov
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Pattern inspection device and pattern inspection method
Patent number
12,205,272
Issue date
Jan 21, 2025
NuFlare Technology, Inc.
Hiromu Inoue
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Vision-based wafer pre-alignment platform and alignment method
Patent number
12,205,325
Issue date
Jan 21, 2025
WUXI XIVI SCIENCE AND TECHNOLOGY CO., LTD.
Minjie Lu
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Pattern inspection method using pattern model
Patent number
12,205,267
Issue date
Jan 21, 2025
Samsung Electronics Co., Ltd.
Nohong Kwak
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Recessed structure capable of being conveniently monitored online a...
Patent number
12,205,268
Issue date
Jan 21, 2025
Shanghai IC R&D Center Co., Ltd.
Xiaoxu Kang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Deep learning based sample localization
Patent number
12,205,318
Issue date
Jan 21, 2025
FEI Company
Sven Beunen
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
X-ray based measurements in patterned structure
Patent number
12,196,691
Issue date
Jan 14, 2025
Nova Ltd.
Gilad Barak
G01 - MEASURING TESTING
Information
Patent Grant
Syclops
Patent number
12,198,319
Issue date
Jan 14, 2025
Ronald Baker
G01 - MEASURING TESTING
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Patent Grant
ML-enabled assured microelectronics manufacturing: a technique to m...
Patent number
12,198,325
Issue date
Jan 14, 2025
University of Southern California
Ajey Poovannummoottil Jacob
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
Large Format Continuous Imaging System
Publication number
20250062145
Publication date
Feb 20, 2025
Applied Materials, Inc.
Venkatakaushik VOLETI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD FOR IMAGE-BASED SENSOR TRACE ANALYSIS
Publication number
20250061557
Publication date
Feb 20, 2025
Applied Materials, Inc.
Varoujan Chakarian
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
COMPUTER IMPLEMENTED METHOD FOR DEFECT DETECTION IN IMAGING DATASET...
Publication number
20250061563
Publication date
Feb 20, 2025
Carl Zeiss SMT GMBH
Bjoern Barz
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
IMAGE INSPECTION EQUIPMENT AND IMAGE PROCESSING METHOD
Publication number
20250061559
Publication date
Feb 20, 2025
Hitachi High-Tech Corporation
Kosuke FUKUDA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
IMAGE PROCESSING FOR ON-CELL OVERLAY MEASUREMENT
Publication number
20250061560
Publication date
Feb 20, 2025
Samsung Electronics Co., Ltd.
Minsu Kang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
RARE EVENT TRAINING DATA SETS FOR ROBUST TRAINING OF SEMICONDUCTOR...
Publication number
20250061692
Publication date
Feb 20, 2025
KLA Corporation
Jan Lauber
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SUBSTRATE PROCESSING APPARATUS AND SUBSTRATE PROCESSING METHOD
Publication number
20250061565
Publication date
Feb 20, 2025
SCREEN Holdings Co., Ltd.
Hideji NAOHARA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Wafer Map Recognition Method Using Artificial Intelligence AND Comp...
Publication number
20250054130
Publication date
Feb 13, 2025
MEDIATEK INC.
En Jen
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SHELF STATUS DETERMINATION
Publication number
20250054795
Publication date
Feb 13, 2025
Taiwan Semiconductor Manufacturing Company Limited
Guancyun LI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
LABELED TRAINING DATA CREATION ASSISTANCE DEVICE AND LABELED TRAINI...
Publication number
20250054270
Publication date
Feb 13, 2025
Hitachi High-Tech Corporation
Toshinori YAMAUCHI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SUBSTRATE PROCESSING APPARATUS AND MONITORING METHOD
Publication number
20250054133
Publication date
Feb 13, 2025
SCREEN Holdings Co., Ltd.
Shinji SHIMIZU
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SYSTEM FOR CONSTRUCTING DEFECT LEVEL CLASSIFICATION MODEL
Publication number
20250054277
Publication date
Feb 13, 2025
Jade Bird Display (Shanghai) Limited
Chenchao XU
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD AND SYSTEM FOR OPTIMIZING OPTICAL INSPECTION OF PATTERNED ST...
Publication number
20250054128
Publication date
Feb 13, 2025
NOVA LTD
Boaz BRILL
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD AND APPARATUS TO DETERMINE OVERLAY
Publication number
20250044709
Publication date
Feb 6, 2025
ASML NETHERLANDS B.V.
Willem Louis VAN MIERLO
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
ROBOTIC ARM WITH VIBRATION DETECTION AND IMAGE RECOGNITION
Publication number
20250046636
Publication date
Feb 6, 2025
JUN-FU TECHNOLOGY INC
Cheng-Hsiang LU
B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information
Patent Application
SUBSTRATE INSPECTION DEVICE, SUBSTRATE INSPECTION SYSTEM, AND SUBST...
Publication number
20250045903
Publication date
Feb 6, 2025
TOKYO ELECTRON LIMITED
Shuji IWANAGA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
OVERLAY MEASUREMENT DEVICE AND OVERLAY MEASUREMENT METHOD
Publication number
20250045909
Publication date
Feb 6, 2025
Samsung Electronics Co.,Ltd.
Junyeob KIM
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD FOR IMAGE ENHANCEMENT IN AN IMAGING DATASET OF AN OBJECT COM...
Publication number
20250045885
Publication date
Feb 6, 2025
Carl Zeiss SMT GMBH
Martin Van Driel
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
IMAGE SEGMENTATION FOR EXAMINING A SEMICONDUCTOR SPECIMEN
Publication number
20250045904
Publication date
Feb 6, 2025
APPLIED MATERIALS ISRAEL LTD.
Gilad VERED
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
COMPUTER IMPLEMENTED METHOD FOR DEFECT DETECTION IN AN IMAGING DATA...
Publication number
20250045907
Publication date
Feb 6, 2025
Carl Zeiss SMT GMBH
Bjoern Froehlich
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
OVERLAY METROLOGY BASED ON TEMPLATE MATCHING WITH ADAPTIVE WEIGHTING
Publication number
20250044710
Publication date
Feb 6, 2025
ASML NETHERLANDS B.V.
Jiyou FU
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
EDGE DEFECT DETECTION VIA IMAGE ANALYTICS
Publication number
20250045900
Publication date
Feb 6, 2025
Applied Materials, Inc.
Yash Chhabra
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
INFORMATION PROCESSING METHOD, INFORMATION PROCESSING APPARATUS, AN...
Publication number
20250045906
Publication date
Feb 6, 2025
TOKYO ELECTRON LIMITED
Shuji IWANAGA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
COMPUTER IMPLEMENTED METHOD FOR DEFECT DETECTION IN AN OBJECT COMPR...
Publication number
20250045911
Publication date
Feb 6, 2025
Carl Zeiss SMT GMBH
Alexander Freytag
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
AUTO PARAMETER TUNING FOR CHARGED PARTICLE INSPECTION IMAGE ALIGNMENT
Publication number
20250036030
Publication date
Jan 30, 2025
ASML NETHERLANDS B.V.
Haoyi LIANG
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SUBSTRATE INSPECTION METHOD, SUBSTRATE INSPECTION PROGRAM, AND SUBS...
Publication number
20250037267
Publication date
Jan 30, 2025
TOKYO ELECTRON LIMITED
Tatsuya Tokumaru
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD OF GENERATING DEFECT CLASSIFICATION MODEL
Publication number
20250037486
Publication date
Jan 30, 2025
Samsung Electronics Co., Ltd.
Jinwoo LEE
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
INSPECTION APPARATUS AND METHOD FOR GENERATING INSPECTION IMAGE
Publication number
20250037269
Publication date
Jan 30, 2025
NuFlare Technology, Inc.
Shinji SUGIHARA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
INTERFACE DETECTION IN RECIPROCAL SPACE
Publication number
20250037286
Publication date
Jan 30, 2025
FEI Company
John Francis Flanagan
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
HIGH-QUALITY WIDE-SPECTRUM DATA BY GENERATIVE AI
Publication number
20250037261
Publication date
Jan 30, 2025
ORBOTECH LTD.
Hagit Schechter
G06 - COMPUTING CALCULATING COUNTING