Membership
Tour
Register
Log in
Semiconductor IC Wafer
Follow
Industry
CPC
G06T2207/30148
This industry / category may be too specific. Please go to a parent level for more data
Parent Industries
G
PHYSICS
G06
Computing
G06T
IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
G06T2207/00
Indexing scheme for image analysis or image enhancement
Current Industry
G06T2207/30148
Semiconductor IC Wafer
Industries
Overview
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Determination method, determination device, exposure device, and pr...
Patent number
11,972,325
Issue date
Apr 30, 2024
Nikon Corporation
Yosuke Okudaira
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Imaging ellipsometry (IE)-based inspection method and method of fab...
Patent number
11,972,960
Issue date
Apr 30, 2024
Samsung Electronics Co., Ltd.
Myungjun Lee
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Abnormal wafer image classification
Patent number
11,972,552
Issue date
Apr 30, 2024
PDF Solutions, Inc.
Tomonori Honda
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Semiconductor apparatus examination method and semiconductor appara...
Patent number
11,967,061
Issue date
Apr 23, 2024
Hamamatsu Photonics K.K.
Hirotoshi Terada
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Wafer level spatial signature grouping using transfer learning
Patent number
11,967,060
Issue date
Apr 23, 2024
KLA Corporation
Narayani Narasimhan
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method of measuring variation, inspection system, computer program,...
Patent number
11,966,168
Issue date
Apr 23, 2024
ASML Netherlands B.V.
Antoine Gaston Marie Kiers
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method for producing overlay results with absolute reference for se...
Patent number
11,966,171
Issue date
Apr 23, 2024
Tokyo Electron Limited
Anton J. deVilliers
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Semiconductor overlay measurements using machine learning
Patent number
11,967,058
Issue date
Apr 23, 2024
KLA Corporation
Arpit Yati
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Apparatus and method for gray field imaging
Patent number
11,965,835
Issue date
Apr 23, 2024
KLA Corporation
Xiumei Liu
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and apparatus for automatically processing wafers
Patent number
11,961,772
Issue date
Apr 16, 2024
CHANGXIN MEMORY TECHNOLOGIES, INC.
Peng Yang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
SiC epitaxial wafer, production method therefor, and defect identif...
Patent number
11,961,736
Issue date
Apr 16, 2024
Resonac Corporation
Ling Guo
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Grant
Defect examination on a semiconductor specimen
Patent number
11,961,221
Issue date
Apr 16, 2024
Applied Materials Israel Ltd.
Dror Shemesh
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Generative adversarial networks (GANs) for simulating specimen images
Patent number
11,961,219
Issue date
Apr 16, 2024
KLA Corp.
Bjorn Brauer
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Imaging device, bump inspection device, and imaging method
Patent number
11,953,314
Issue date
Apr 9, 2024
NIDEC READ CORPORATION
Alexsandr Juk
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Optical inspection of a wafer
Patent number
11,954,841
Issue date
Apr 9, 2024
Taiwan Semiconductor Manufacturing Company, Ltd
Chih-Lieh Chen
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and apparatus to determine a patterning process parameter
Patent number
11,947,269
Issue date
Apr 2, 2024
ASML Netherlands B.V.
Anagnostis Tsiatmas
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Metrology of semiconductor devices in electron micrographs using fa...
Patent number
11,947,270
Issue date
Apr 2, 2024
FEI Company
Umesh Adiga
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Systems and methods for inspection of IC devices
Patent number
11,941,797
Issue date
Mar 26, 2024
Battelle Memorial Institute
Nicholas Darby
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and apparatus for improving sensitivity of wafer detection,...
Patent number
11,935,244
Issue date
Mar 19, 2024
CHANGXIN MEMORY TECHNOLOGIES, INC.
Ran Du
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method to acquire a 3D image of a sample structure
Patent number
11,935,228
Issue date
Mar 19, 2024
Carl Zeiss SMT GmbH
Ramani Pichumani
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Sensitive optical metrology in scanning and static modes
Patent number
11,933,717
Issue date
Mar 19, 2024
KLA Corporation
Andrew V. Hill
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
User interface for judgment concerning quality classification of di...
Patent number
11,935,221
Issue date
Mar 19, 2024
AT&S (Chongqing) Company Limited
Amin Nickkholgh
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Notch detecting method
Patent number
11,935,227
Issue date
Mar 19, 2024
Disco Corporation
Yasukuni Nomura
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Analysis method and analysis system of voltage contrast defect
Patent number
11,927,625
Issue date
Mar 12, 2024
Powerchip Semiconductor Manufacturing Corporation
Yue-Ying Yen
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Wafer detection method, device, apparatus, and storage medium
Patent number
11,928,808
Issue date
Mar 12, 2024
CHANGXIN MEMORY TECHNOLOGIES, INC.
Deqing Qu
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
OPC operation method and OPC operation device
Patent number
11,927,887
Issue date
Mar 12, 2024
United Microelectronics Corp.
Guo-Xin Hu
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Wafer defect tracing method and apparatus, electronic device and co...
Patent number
11,927,544
Issue date
Mar 12, 2024
CHANGXIN MEMORY TECHNOLOGIES, INC.
Yui-Lang Chen
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Learning device, inference device, and learned model
Patent number
11,922,307
Issue date
Mar 5, 2024
PREFERRED NETWORKS, INC.
Kosuke Nakago
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Context-based defect inspection
Patent number
11,922,619
Issue date
Mar 5, 2024
KLA Corporation
Brian Duffy
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Apparatuses and methods for determining wafer defects
Patent number
11,922,613
Issue date
Mar 5, 2024
Micron Technology, Inc.
Yutao Gong
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
HOT SPOT DEFECT DETECTING METHOD AND HOT SPOT DEFECT DETECTING SYSTEM
Publication number
20240144467
Publication date
May 2, 2024
Taiwan Semiconductor Manufacturing Company, Ltd.
Chien-Huei Chen
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD OF CORRECTING LAYOUT FOR SEMICONDUCTOR PROCESS USING MACHINE...
Publication number
20240143886
Publication date
May 2, 2024
Samsung Electronics Co., Ltd.
Kyeonghwan Kang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD FOR ANALYZING LAYOUT PATTERN DENSITY
Publication number
20240145280
Publication date
May 2, 2024
SHANGHAI HUALI MICROELECTRONICS CORPORATION
Wei CHENG
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
OVERLAY MARK FORMING MOIRE PATTERN, OVERLAY MEASUREMENT METHOD USIN...
Publication number
20240136300
Publication date
Apr 25, 2024
AUROS TECHNOLOGY, INC.
Hyun Chul LEE
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
MAPPING DEVICE AND SUBSTRATE ACCOMMODATION STATE DETERMINATION METHOD
Publication number
20240137628
Publication date
Apr 25, 2024
SINFONIA TECHNOLOGY CO., LTD.
Keigo Sato
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SEMICONDUCTOR YIELD PREDICTION METHOD AND APPARATUS
Publication number
20240135523
Publication date
Apr 25, 2024
Samsung Electronics Co., Ltd.
Taesoo SHIN
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
WAFER POSITION STATUS INSPECTION APPARATUS
Publication number
20240129632
Publication date
Apr 18, 2024
JUN-FU TECHNOLOGY INC
Yu-Hsin Liu
B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information
Patent Application
Defect Classification Device and Defect Classification Program
Publication number
20240127421
Publication date
Apr 18, 2024
Hitachi High-Tech Corporation
Yohei MINEKAWA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
DEFECT DETECTING DEVICE AND METHOD
Publication number
20240127426
Publication date
Apr 18, 2024
Samsung Electronics Co., Ltd.
Sungwook HWANG
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
ENDPOINT OPTIMIZATION FOR SEMICONDUCTOR PROCESSES
Publication number
20240128131
Publication date
Apr 18, 2024
Applied Materials, Inc.
Avishay Vaxman
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Inspection System and Non-Transitory Computer-Readable Medium
Publication number
20240127417
Publication date
Apr 18, 2024
HITACHI HIGH-TECH CORPORATION
Takehiro HIRAI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
MANUFACTURING APPARATUS OF SEMICONDUCTOR DEVICE AND MANUFACTURING M...
Publication number
20240127423
Publication date
Apr 18, 2024
SHINKAWA LTD.
Yoshiyuki OGATA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
DEFECT DETECTION DEVICE AND METHOD THEREOF
Publication number
20240127425
Publication date
Apr 18, 2024
Samsung Electronics Co., Ltd.
Sungwook HWANG
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
A MACHINE LEARNING MODEL USING TARGET PATTERN AND REFERENCE LAYER P...
Publication number
20240119582
Publication date
Apr 11, 2024
ASML NETHERLANDS B.V.
Quan ZHANG
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
DEFECT DETECTION AND REMOVAL APPARATUS AND METHOD
Publication number
20240118222
Publication date
Apr 11, 2024
PlayNitride Display Co., Ltd.
Chang-Rong Lin
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
MATCHING PRE-PROCESSING AND POST-PROCESSING SUBSTRATE SAMPLES
Publication number
20240112961
Publication date
Apr 4, 2024
LAM RESEARCH CORPORATION
Yu Lu
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD FOR DETECTING DEFECTS ON WAFERS, SYSTEM FOR DETECTING DEFECT...
Publication number
20240112323
Publication date
Apr 4, 2024
United Semiconductor (Xiamen) Co., Ltd.
Yu Peng Hong
G01 - MEASURING TESTING
Information
Patent Application
Semiconductor Observation System and Overlay Measurement Method
Publication number
20240112322
Publication date
Apr 4, 2024
HITACHI HIGH-TECH CORPORATION
Takahiro NISHIHATA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
INSPECTION OF ADAPTIVE PATTERNED WORKPIECES WITH DYNAMIC DESIGN AND...
Publication number
20240112326
Publication date
Apr 4, 2024
KLA Corporation
Pavan Kumar Perali
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SUBSTRATE INSPECTION SYSTEM AND A METHOD OF USE THEREOF
Publication number
20240102169
Publication date
Mar 28, 2024
JNK TECH
Youngjin Choi
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Application
Automatic Alignment Of Overhead Transport Vehicles To Load Ports Of...
Publication number
20240096676
Publication date
Mar 21, 2024
Skylla Technologies, Inc.
Kota Weaver
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
EDGE DEFECT DETECTION VIA IMAGE ANALYTICS
Publication number
20240095899
Publication date
Mar 21, 2024
Applied Materials, Inc.
Yash Chhabra
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
DEEP LEARNING MODEL-BASED ALIGNMENT FOR SEMICONDUCTOR APPLICATIONS
Publication number
20240095935
Publication date
Mar 21, 2024
KLA Corporation
Hong Chen
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
IMAGE AUGMENTATION FOR MACHINE LEARNING BASED DEFECT EXAMINATION
Publication number
20240095903
Publication date
Mar 21, 2024
APPLIED MATERIALS ISRAEL LTD.
Boris SHERMAN
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Wafer Positioning Method and Apparatus
Publication number
20240096677
Publication date
Mar 21, 2024
Taiwan Semiconductor Manufacturing Co., Ltd.
Chia-Cheng Chen
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SEGMENTATION OR CROSS SECTIONS OF HIGH ASPECT RATIO STRUCTURES
Publication number
20240087134
Publication date
Mar 14, 2024
Carl Zeiss SMT GMBH
Dmitry Klochkov
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
DEFECT EXAMINATION ON A SEMICONDUCTOR SPECIMEN
Publication number
20240078659
Publication date
Mar 7, 2024
APPLIED MATERIALS ISRAEL LTD.
Yehonatan Hai OFIR
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
RADIOGRAPHIC IMAGING APPARATUS AND MAINTENANCE MANAGEMENT SYSTEM
Publication number
20240078655
Publication date
Mar 7, 2024
Konica Minolta, Inc.
Junichiro OTAKI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
RNA MOLECULES, METHODS OF PRODUCING CIRCULAR RNA, AND TREATMENT MET...
Publication number
20240078661
Publication date
Mar 7, 2024
Cornell University
Samie R. JAFFREY
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
EDGE CENTER POINT-BASED CHARACTERIZATION OF SEMICONDUCTOR LAYOUT DE...
Publication number
20240071038
Publication date
Feb 29, 2024
Siemens Industry Software Inc.
Hazem Hegazy
G06 - COMPUTING CALCULATING COUNTING