sensing means for gap between source and detector

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G01N2223/34

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

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G01N2223/34sensing means for gap between source and detector

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Patents Grantslast 30 patents

Information Patent Grant
Abnormality detection device and fixing structure
- Patent number 12,012,988
- Issue date Jun 18, 2024
- Nippon Telegraph and Telephone Corporation
- Masahito Nakamura
- G01 - MEASURING TESTING
Information Patent Grant
Determining atomic coordinates from X-ray diffraction data
- Patent number 11,860,114
- Issue date Jan 2, 2024
- David Hurwitz
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for material characterization
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- Issue date Oct 24, 2023
- Southern Innovation International Pty Ltd
- Paul Scoullar
- E21 - EARTH DRILLING MINING
Information Patent Grant
Method and device for acquiring tomographic image data by oversampl...
- Patent number 11,307,153
- Issue date Apr 19, 2022
- Riken
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Information Patent Grant
System and method for material characterization
- Patent number 11,243,327
- Issue date Feb 8, 2022
- Southern Innovation International Pty Ltd
- Paul Scoullar
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Information Patent Grant
System and method for material characterization
- Patent number 10,962,485
- Issue date Mar 30, 2021
- Southern Innovation International Pty Ltd
- Paul Scoullar
- E21 - EARTH DRILLING MINING
Information Patent Grant
Method for operating an x-ray device
- Patent number 10,578,459
- Issue date Mar 3, 2020
- Siemens Healthcare GmbH
- Susanne Dornberger
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Material identification method
- Patent number 10,564,113
- Issue date Feb 18, 2020
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Caroline Paulus
- G01 - MEASURING TESTING
Information Patent Grant
Method for evaluating crosslink concentration in crosslinked rubber
- Patent number 10,168,289
- Issue date Jan 1, 2019
- Sumitomo Rubber Industries, Ltd.
- Tomomi Masui
- G01 - MEASURING TESTING
Information Patent Grant
Depth determination in X-ray backscatter system using frequency mod...
- Patent number 9,329,300
- Issue date May 3, 2016
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- Steven W. Pauly
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Information Patent Grant
Imaging apparatus and image processing method
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- Kentaro Nagai
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Back-projection of a projection image data set with depth-dependent...
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- Issue date Jan 14, 2014
- Siemens Aktiengesellschaft
- Frank Dennerlein
- G01 - MEASURING TESTING
Information Patent Grant
Device for processing a measured signal corresponding to the intens...
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- Issue date Oct 10, 1995
- U.S. Philips Corporation
- Peter Frijlink
- G01 - MEASURING TESTING
Information Patent Grant
Method of determining a given characteristic of a material sample
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- Issue date Aug 15, 1995
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Information Patent Grant
Method and installation for the analysis by neutron activation of a...
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- Issue date Nov 10, 1992
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- Rene Alegre
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Information Patent Grant
Surface analysis method and apparatus
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- Issue date Oct 8, 1991
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- Ken Ninomiya
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Information Patent Grant
Thermal wave microscopy using areal infrared detection
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- Issue date Mar 25, 1986
- International Business Machines Corporation
- Thomas Baumann
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Information Patent Grant
Apparatus for analyzing the spectral data in an elemental analyzer...
- Patent number 4,171,485
- Issue date Oct 16, 1979
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- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
X-RAY COMPUTED TOMOGRAPHY (CT) SCANNER
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- Publication date May 2, 2024
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- Nathan HERMONY
- G01 - MEASURING TESTING
Information Patent Application
CORRECTION APPARATUS, SYSTEM, METHOD, AND PROGRAM
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- Rigaku Corporation
- Masatsugu YOSHIMOTO
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Information Patent Application
DETERMINING WEATHERING INDICES BY X-RAY DIFFRACTION
- Publication number 20230105649
- Publication date Apr 6, 2023
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- Mohamed Soua
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DETERMINING ATOMIC COORDINATES FROM X-RAY DIFFRACTION DATA
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- Publication date Sep 30, 2021
- David HURWITZ
- G06 - COMPUTING CALCULATING COUNTING
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METHOD AND DEVICE FOR ACQUIRING TOMOGRAPHIC IMAGE DATA BY OVERSAMPL...
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SYSTEM AND METHOD FOR MATERIAL CHARACTERIZATION
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- Publication date Jul 1, 2021
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CHARACTERISATION OF AMPORPHOUS CONTENT OF COMPLEX FORMULATIONS BASE...
- Publication number 20210020272
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- Oxford University Innovation Limited
- Andrew Leslie GODWIN
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SYSTEM AND METHOD FOR MATERIAL CHARACTERIZATION
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- Paul SCOULLAR
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SYSTEM AND METHOD FOR MATERIAL CHARACTERIZATION
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MATERIAL IDENTIFICATION METHOD
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- Publication date Jul 12, 2018
- Commissariat A L'Energie Atomique et Aux Energies Alternatives
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METHOD FOR EVALUATING CROSSLINK CONCENTRATION IN CROSSLINKED RUBBER
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- Publication date Dec 1, 2016
- Sumitomo Rubber Industries, Ltd.
- Tomomi MASUI
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METHOD OF COLLECTING AND PROCESSING ELECTRON DIFFRACTION DATA
- Publication number 20140306108
- Publication date Oct 16, 2014
- THE TRUSTEES OF COLUMBIA UNIVERSITY IN THE CITY OF NEW YORK
- Simon Billinge
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- Kromek Limited
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IMAGING APPARATUS AND IMAGE PROCESSING METHOD
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IMAGING APPARATUS AND PROGRAM AND METHOD FOR ANALYZING INTERFERENCE...
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AUGER ELEMENTAL IDENTIFICATION ALGORITHM
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- KLA -TENCOR CORPORATION,
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BACK-PROJECTION OF A PROJECTION IMAGE DATA SET WITH DEPTH-DEPENDENT...
- Publication number 20130028498
- Publication date Jan 31, 2013
- Frank Dennerlein
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sensing means for gap between source and detector

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Abnormality detection device and fixing structure

Determining atomic coordinates from X-ray diffraction data

System and method for material characterization

Method and device for acquiring tomographic image data by oversampl...

System and method for material characterization

System and method for material characterization

Method for operating an x-ray device

Material identification method

Method for evaluating crosslink concentration in crosslinked rubber

Depth determination in X-ray backscatter system using frequency mod...

Imaging apparatus and image processing method

Back-projection of a projection image data set with depth-dependent...

Device for processing a measured signal corresponding to the intens...

Method of determining a given characteristic of a material sample

Method and installation for the analysis by neutron activation of a...

Surface analysis method and apparatus

Thermal wave microscopy using areal infrared detection

Apparatus for analyzing the spectral data in an elemental analyzer...

Patents Applicationslast 30 patents

X-RAY COMPUTED TOMOGRAPHY (CT) SCANNER

CORRECTION APPARATUS, SYSTEM, METHOD, AND PROGRAM

DETERMINING WEATHERING INDICES BY X-RAY DIFFRACTION

DETERMINING ATOMIC COORDINATES FROM X-RAY DIFFRACTION DATA

METHOD AND DEVICE FOR ACQUIRING TOMOGRAPHIC IMAGE DATA BY OVERSAMPL...

SYSTEM AND METHOD FOR MATERIAL CHARACTERIZATION

CHARACTERISATION OF AMPORPHOUS CONTENT OF COMPLEX FORMULATIONS BASE...

SYSTEM AND METHOD FOR MATERIAL CHARACTERIZATION

SYSTEM AND METHOD FOR MATERIAL CHARACTERIZATION

MATERIAL IDENTIFICATION METHOD

METHOD FOR EVALUATING CROSSLINK CONCENTRATION IN CROSSLINKED RUBBER

METHOD OF COLLECTING AND PROCESSING ELECTRON DIFFRACTION DATA

DETECTOR APPARATUS AND METHOD

IMAGING APPARATUS AND IMAGE PROCESSING METHOD

IMAGING APPARATUS AND PROGRAM AND METHOD FOR ANALYZING INTERFERENCE...

AUGER ELEMENTAL IDENTIFICATION ALGORITHM

BACK-PROJECTION OF A PROJECTION IMAGE DATA SET WITH DEPTH-DEPENDENT...