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G01N2021/8825
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PHYSICS
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Measuring instruments
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INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
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G01N2021/8825
Separate detection of dark field and bright field
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Patents Grants
last 30 patents
Information
Patent Grant
Integrated measurement system
Patent number
11,994,374
Issue date
May 28, 2024
Nova Ltd.
Elad Dotan
G01 - MEASURING TESTING
Information
Patent Grant
Modular optical inspection station
Patent number
11,989,872
Issue date
May 21, 2024
Instrumental, Inc.
Samuel Bruce Weiss
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Semiconductor wafer evaluation method and semiconductor wafer manuf...
Patent number
11,955,390
Issue date
Apr 9, 2024
Sumco Corporation
Takahiro Nagasawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor inspection tool system and method for wafer edge insp...
Patent number
11,828,713
Issue date
Nov 28, 2023
Camtek Ltd.
Carmel Yehuda Drillman
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Information processing apparatus, determination method, imprint app...
Patent number
11,721,013
Issue date
Aug 8, 2023
Canon Kabushiki Kaisha
Shinichiro Koga
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Die bonding apparatus and manufacturing method for semiconductor de...
Patent number
11,692,947
Issue date
Jul 4, 2023
FASFORD TECHNOLOGY CO., LTD.
Yuta Ono
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and device for recognising and analysing surface defects in...
Patent number
11,674,907
Issue date
Jun 13, 2023
Dhruv Kasavala
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Methods of defect inspection
Patent number
11,624,985
Issue date
Apr 11, 2023
Taiwan Semiconductor Manufacturing Co., Ltd
Ta-Ching Yu
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Automatic optical inspection device and method
Patent number
11,549,891
Issue date
Jan 10, 2023
SHANGHAI MICRO ELECTRONICS EQUIPMENT (GROUP) CO., LTD.
Hailiang Lu
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for checking the coverslipping quality of samples for mic...
Patent number
11,519,863
Issue date
Dec 6, 2022
Leica Biosystems Nussloch GmbH
Bernhard Neef
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and apparatus for automated in-line inspection of optically...
Patent number
11,415,528
Issue date
Aug 16, 2022
WDI WISE DEVICE INC.
Adam Weiss
G01 - MEASURING TESTING
Information
Patent Grant
Simultaneous multi-directional laser wafer inspection
Patent number
11,366,069
Issue date
Jun 21, 2022
KLA-Tencor Corporation
Guoheng Zhao
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and device for locating the origin of a defect affecting a s...
Patent number
11,352,691
Issue date
Jun 7, 2022
Saint-Gobain Glass France
Bernard Nghiem
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method for checking a printing cylinder and a corresponding arrange...
Patent number
11,340,175
Issue date
May 24, 2022
MATTHEWS INTERNATIONAL GMBH
Konrad Klimmey
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Modular optical inspection station
Patent number
11,321,824
Issue date
May 3, 2022
Instrumental, Inc.
Samuel Bruce Weiss
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method for detecting lens cleanliness using spectral differential f...
Patent number
11,300,527
Issue date
Apr 12, 2022
MLOptic Corp.
Jiang He
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method of detecting lens cleanliness using out-of-focus differentia...
Patent number
11,255,798
Issue date
Feb 22, 2022
MLOptic Corp.
Jiang He
G01 - MEASURING TESTING
Information
Patent Grant
Adaptive diffuse illumination systems and methods
Patent number
11,181,483
Issue date
Nov 23, 2021
Radiant Vision Systems, LLC
Mark Michniewicz
F21 - LIGHTING
Information
Patent Grant
System, method and non-transitory computer readable medium for tuni...
Patent number
11,139,216
Issue date
Oct 5, 2021
KLA-Tencor Corporation
David Craig Oram
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Surface inspection system and surface inspection method
Patent number
11,022,553
Issue date
Jun 1, 2021
BOBST MEX SA
Matthieu Richard
G01 - MEASURING TESTING
Information
Patent Grant
Defect inspection device, pattern chip, and defect inspection method
Patent number
10,948,424
Issue date
Mar 16, 2021
HITACHI HIGH-TECH CORPORATION
Yuta Urano
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Optical inspection system
Patent number
10,887,500
Issue date
Jan 5, 2021
Hong Kong Applied Science and Technology Research Institute Co., Ltd.
Changli Wu
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
System and method for inspecting a wafer
Patent number
10,876,975
Issue date
Dec 29, 2020
SEMICONDUCTOR TECHNOLOGIES & INSTRUMENTS PTE. LTD.
Ajharali Amanullah
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Methods of defect inspection
Patent number
10,795,270
Issue date
Oct 6, 2020
Taiwan Semiconductor Manufacturing Co., Ltd
Ta-Ching Yu
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Modular optical inspection station
Patent number
10,783,624
Issue date
Sep 22, 2020
Instrumental, Inc.
Samuel Bruce Weiss
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Simultaneous multi-directional laser wafer inspection
Patent number
10,739,275
Issue date
Aug 11, 2020
KLA-Tencor Corporation
Guoheng Zhao
G01 - MEASURING TESTING
Information
Patent Grant
Scanning differential interference contrast in an imaging system de...
Patent number
10,705,026
Issue date
Jul 7, 2020
KLA Corporation
Andrew Zeng
G02 - OPTICS
Information
Patent Grant
System, method and non-transitory computer readable medium for tuni...
Patent number
10,679,909
Issue date
Jun 9, 2020
KLA-Tencor Corporation
David Craig Oram
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for defect material classification
Patent number
10,670,537
Issue date
Jun 2, 2020
KLA-Tencor Corporation
Guoheng Zhao
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and a method for inspecting a light transmissible optical...
Patent number
10,634,618
Issue date
Apr 28, 2020
Hong Kong Applied Science and Technology Research Institute Company Limited
Vladislav Nikitin
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Apparatus and Method for Automatic Monitoring of Lids of Beverage a...
Publication number
20240369496
Publication date
Nov 7, 2024
QUISS QUALITÄTS-INSPEKTIONSSYSTEME UND SERVICE GMBH
Bernhard Gruber
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
OPTICAL INSPECTION METHOD AND STORAGE MEDIUM, AND OPTICAL INSPECTIO...
Publication number
20240319111
Publication date
Sep 26, 2024
Kabushiki Kaisha Toshiba
Hiroshi OHNO
G01 - MEASURING TESTING
Information
Patent Application
MODULAR OPTICAL INSPECTION STATION
Publication number
20240265518
Publication date
Aug 8, 2024
Instrumental, Inc.
Samuel Bruce Weiss
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SEMICONDUCTOR INSPECTION TOOL SYSTEM AND METHOD FOR WAFER EDGE INSP...
Publication number
20240003826
Publication date
Jan 4, 2024
CAMTEK LTD
Carmel Yehuda DRILLMAN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
DEFECT INSPECTION APPARATUS AND DEFECT INSPECTION METHOD
Publication number
20230060883
Publication date
Mar 2, 2023
HITACHI HIGH-TECH CORPORATION
Takeru UTSUGI
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR DETECTING LENS CLEANLINESS USING SPECTRAL DIFFERENTIAL F...
Publication number
20220099595
Publication date
Mar 31, 2022
MLOptic Corp
Jiang He
G01 - MEASURING TESTING
Information
Patent Application
Die Bonding Apparatus and Manufacturing Method for Semiconductor De...
Publication number
20220034823
Publication date
Feb 3, 2022
Fasford Technology Co., Ltd.
Yuta ONO
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD AND APPARATUS FOR AUTOMATED IN-LINE INSPECTION OF OPTICALLY...
Publication number
20210372945
Publication date
Dec 2, 2021
WDI Wise Device Inc.
Adam WEISS
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR CHECKING A PRINTING CYLINDER AND A CORRESPONDING ARRANGE...
Publication number
20210333221
Publication date
Oct 28, 2021
MATTHEWS INTERNATIONAL GMBH
Konrad KLIMMEY
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD AND DEVICE FOR RECOGNISING AND ANALYSING SURFACE DEFECTS IN...
Publication number
20210325313
Publication date
Oct 21, 2021
Dhruv Kasavala
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
INFORMATION PROCESSING APPARATUS, DETERMINATION METHOD, IMPRINT APP...
Publication number
20210097675
Publication date
Apr 1, 2021
Canon Kabushiki Kaisha
Shinichiro Koga
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHODS OF DEFECT INSPECTION
Publication number
20210018848
Publication date
Jan 21, 2021
Taiwan Semiconductor Manufacturing Co., Ltd.
Ta-Ching YU
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SEMICONDUCTOR WAFER EVALUATION METHOD AND SEMICONDUCTOR WAFER MANUF...
Publication number
20200411391
Publication date
Dec 31, 2020
SUMCO CORPORATION
Takahiro NAGASAWA
G01 - MEASURING TESTING
Information
Patent Application
SIMULTANEOUS MULTI-DIRECTIONAL LASER WAFER INSPECTION
Publication number
20200333262
Publication date
Oct 22, 2020
KLA-Tencor Corporation
Guoheng Zhao
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SYSTEM, METHOD AND NON-TRANSITORY COMPUTER READABLE MEDIUM FOR TUNI...
Publication number
20200258792
Publication date
Aug 13, 2020
KLA-Tencor Corporation
David Craig Oram
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SCANNING DIFFERENTIAL INTERFERENCE CONTRAST IN AN IMAGING SYSTEM DE...
Publication number
20200132608
Publication date
Apr 30, 2020
KLA Corporation
Raymond Chu
G02 - OPTICS
Information
Patent Application
ADAPTIVE DIFFUSE ILLUMINATION SYSTEMS AND METHODS
Publication number
20200103352
Publication date
Apr 2, 2020
Radiant Vision Systems
Mark Michniewicz
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATIC OPTICAL INSPECTION DEVICE AND METHOD
Publication number
20190293566
Publication date
Sep 26, 2019
SHANGHAI MICRO ELECTRONICS EQUIPMENT (GROUP) CO., LTD.
Hailiang LU
G01 - MEASURING TESTING
Information
Patent Application
Apparatus and A Method For Inspecting A Light Transmissible Optical...
Publication number
20190226997
Publication date
Jul 25, 2019
Hong Kong Applied Science and Technology Research Institute Co. Ltd.
Vladislav Nitikin
G01 - MEASURING TESTING
Information
Patent Application
Systems and Methods for Defect Material Classification
Publication number
20190212277
Publication date
Jul 11, 2019
KLA-Tencor Corporation
Guoheng Zhao
G01 - MEASURING TESTING
Information
Patent Application
ADAPTIVE DIFFUSE ILLUMINATION SYSTEMS AND METHODS
Publication number
20190204236
Publication date
Jul 4, 2019
Radiant Vision Systems, LLC
Mark Michniewicz
F21 - LIGHTING
Information
Patent Application
OPTICAL INSPECTION SYSTEM AND IMAGE PROCESSING METHOD THEREOF
Publication number
20190162673
Publication date
May 30, 2019
Creative Sensor Inc.
Li-Cheng HSU
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHODS OF DEFECT INSPECTION
Publication number
20190064675
Publication date
Feb 28, 2019
Taiwan Semiconductor Manufacturing Co., Ltd.
Ta-Ching YU
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SYSTEM AND METHOD FOR INSPECTING A WAFER
Publication number
20190033233
Publication date
Jan 31, 2019
Semiconductor Technologies & Instruments Pte Ltd
Ajharali AMANULLAH
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SYSTEM, METHOD AND NON-TRANSITORY COMPUTER READABLE MEDIUM FOR TUNI...
Publication number
20180144996
Publication date
May 24, 2018
KLA-Tencor Corporation
David Craig Oram
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SIMULTANEOUS MULTI-DIRECTIONAL LASER WAFER INSPECTION
Publication number
20180073993
Publication date
Mar 15, 2018
KLA-Tencor Corporation
Guoheng Zhao
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR SURFACE INSPECTION
Publication number
20180017501
Publication date
Jan 18, 2018
SIGHTLINE INNOVATION INC.
Wallace TRENHOLM
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS AND METHODS FOR COMBINED BRIGHTFIELD, DARKFIELD, AND PHOT...
Publication number
20180003648
Publication date
Jan 4, 2018
KLA-Tencor Corporation
Lena Nicolaides
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL METHOD AND SYSTEM FOR DEFECTS DETECTION IN THREE-DIMENSIONA...
Publication number
20170138868
Publication date
May 18, 2017
NOVA MEASURING INSTRUMENTS LTD.
Gilad Barak
G01 - MEASURING TESTING
Information
Patent Application
DEFECT OBSERVATION METHOD AND DEVICE AND DEFECT DETECTION DEVICE
Publication number
20170108444
Publication date
Apr 20, 2017
Hitachi High-Technologies Corporation
Yuko OTANI
G02 - OPTICS