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  • H03M2201/4212
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HELECTRICITY H03Electronic circuits H03MCODING DECODING CODE CONVERSION IN GENERAL H03M2201/00Indexing scheme relating to A/D or D/A conversion

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H03M2201/4212Serial
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Patents Grantslast 30 patents

  • Information Patent Grant

    Semiconductor device and method therein
    • Patent number 10,211,845
    • Issue date Feb 19, 2019
    • Renesas Electronics Corporation
    • Wataru Naito
    • H04 - ELECTRIC COMMUNICATION TECHNIQUE
  • Information Patent Grant

    Digital-analog converter
    • Patent number 4,862,170
    • Issue date Aug 29, 1989
    • Mori; Ryoichi
    • Youichi Hashimoto
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Grant

    Charge-transfer coded-voltage generator for use in analog-digital c...
    • Patent number 4,350,976
    • Issue date Sep 21, 1982
    • Thomson-CSF
    • Roger Benoit-Gonin
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Grant

    Transmitter for forming non-linear pulse code modulated samples of...
    • Patent number 4,010,422
    • Issue date Mar 1, 1977
    • U.S. Philips Corporation
    • Kornelis Jan Wouda
    • H04 - ELECTRIC COMMUNICATION TECHNIQUE
  • Information Patent Grant

    Amplifier for analogue signal samples with automatic gain control,...
    • Patent number 3,936,819
    • Issue date Feb 3, 1976
    • Societe D'Etudes, Recherches Et Constructions Electroniques Sercel
    • Philippe Angelle
    • G11 - INFORMATION STORAGE
  • Information Patent Grant

    3911225
    • Patent number 3,911,225
    • Issue date Oct 7, 1975
    • H04 - ELECTRIC COMMUNICATION TECHNIQUE
  • Information Patent Grant

    3896431
    • Patent number 3,896,431
    • Issue date Jul 22, 1975
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Grant

    3895376
    • Patent number 3,895,376
    • Issue date Jul 15, 1975
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Grant

    3889254
    • Patent number 3,889,254
    • Issue date Jun 10, 1975
    • G01 - MEASURING TESTING
  • Information Patent Grant

    3872726
    • Patent number 3,872,726
    • Issue date Mar 25, 1975
    • G01 - MEASURING TESTING
  • Information Patent Grant

    3872288
    • Patent number 3,872,288
    • Issue date Mar 18, 1975
    • G01 - MEASURING TESTING
  • Information Patent Grant

    3865305
    • Patent number 3,865,305
    • Issue date Feb 11, 1975
    • G01 - MEASURING TESTING
  • Information Patent Grant

    3851976
    • Patent number 3,851,976
    • Issue date Dec 3, 1974
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Grant

    3843872
    • Patent number 3,843,872
    • Issue date Oct 22, 1974
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Grant

    3840807
    • Patent number 3,840,807
    • Issue date Oct 8, 1974
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Grant

    3838413
    • Patent number 3,838,413
    • Issue date Sep 24, 1974
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Grant

    3829785
    • Patent number 3,829,785
    • Issue date Aug 13, 1974
    • G01 - MEASURING TESTING
  • Information Patent Grant

    3816825
    • Patent number 3,816,825
    • Issue date Jun 11, 1974
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Grant

    3815126
    • Patent number 3,815,126
    • Issue date Jun 4, 1974
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Grant

    3812481
    • Patent number 3,812,481
    • Issue date May 21, 1974
    • G01 - MEASURING TESTING
  • Information Patent Grant

    3809864
    • Patent number 3,809,864
    • Issue date May 7, 1974
    • G01 - MEASURING TESTING
  • Information Patent Grant

    3810151
    • Patent number 3,810,151
    • Issue date May 7, 1974
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Grant

    3805149
    • Patent number 3,805,149
    • Issue date Apr 16, 1974
    • G01 - MEASURING TESTING
  • Information Patent Grant

    3803591
    • Patent number 3,803,591
    • Issue date Apr 9, 1974
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Grant

    3790886
    • Patent number 3,790,886
    • Issue date Feb 5, 1974
    • G01 - MEASURING TESTING
  • Information Patent Grant

    3787835
    • Patent number 3,787,835
    • Issue date Jan 22, 1974
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Grant

    3774018
    • Patent number 3,774,018
    • Issue date Nov 20, 1973
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Grant

    3768022
    • Patent number 3,768,022
    • Issue date Oct 23, 1973
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Grant

    3754233
    • Patent number 3,754,233
    • Issue date Aug 21, 1973
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Grant

    3750156
    • Patent number 3,750,156
    • Issue date Jul 31, 1973
    • H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

  • Information Patent Application

    SEMICONDUCTOR DEVICE AND METHOD THEREIN
    • Publication number 20180367157
    • Publication date Dec 20, 2018
    • RENESAS ELECTRONICS CORPORATION
    • Wataru NAITO
    • H03 - BASIC ELECTRONIC CIRCUITRY