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Y10S977/878
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GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
Y10
USPC classification
Y10S
TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
Y10S977/00
Nanotechnology
Current Industry
Y10S977/878
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Patents Grants
last 30 patents
Information
Patent Grant
Evanescent wave based optical profiler array
Patent number
11,307,144
Issue date
Apr 19, 2022
Waymo LLC
John Simpson
Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information
Patent Grant
Polymer pen lithography
Patent number
10,474,029
Issue date
Nov 12, 2019
Northwestern University
Chad A. Mirkin
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Polymer pen lithography
Patent number
10,222,694
Issue date
Mar 5, 2019
Northwestern University
Chad A. Mirkin
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Gas-phase functionalization of carbon nanotubes
Patent number
8,951,444
Issue date
Feb 10, 2015
President and Fellows of Harvard College
Roy G. Gordon
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Nanocarbon aggregate and method for manufacturing the same
Patent number
8,202,817
Issue date
Jun 19, 2012
NEC Corporation
Ryota Yuge
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Tapered probe structures and fabrication
Patent number
8,020,216
Issue date
Sep 13, 2011
The Regents of the University of California
Sungho Jin
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Near-field optical probe based on SOI substrate and fabrication met...
Patent number
7,871,530
Issue date
Jan 18, 2011
Electronics and Telecommunications Research Institute
Eunkyoung Kim
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Gas-phase functionalization of carbon nanotubes
Patent number
7,767,114
Issue date
Aug 3, 2010
President and Fellows of Harvard College
Roy G. Gordon
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Nanolithography methods and products therefor and produced thereby
Patent number
7,744,963
Issue date
Jun 29, 2010
Northwestern University
Chad A. Mirkin
B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information
Patent Grant
Nanolithography methods and products therefor and produced thereby
Patent number
7,722,928
Issue date
May 25, 2010
Northwestern University
Chad A. Mirkin
B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information
Patent Grant
Systems and methods for utilizing scanning probe shape characteriza...
Patent number
7,578,176
Issue date
Aug 25, 2009
Veeco Metrology, Inc.
Tianming Bao
G01 - MEASURING TESTING
Information
Patent Grant
Near-field optical probe based on SOI substrate and fabrication met...
Patent number
7,550,311
Issue date
Jun 23, 2009
Electronics and Telecommunications Research Institute
Eunkyoung Kim
G01 - MEASURING TESTING
Information
Patent Grant
Microcoaxial probes made from strained semiconductor bilayers
Patent number
7,485,857
Issue date
Feb 3, 2009
Wisconsin Alumni Research Foundation
Robert H. Blick
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor probe with resistive tip and method of fabricating th...
Patent number
7,319,224
Issue date
Jan 15, 2008
Samsung Electronics Co., Ltd.
Hong-sik Park
G11 - INFORMATION STORAGE
Information
Patent Grant
Atomic force microscopy measurements of contact resistance and curr...
Patent number
6,981,407
Issue date
Jan 3, 2006
Fidelica Microsystems, Inc.
Shiva Prakash
G01 - MEASURING TESTING
Information
Patent Grant
Atomic force microscopy measurements of contact resistance and curr...
Patent number
6,912,894
Issue date
Jul 5, 2005
Fidelica Microsystems, Inc.
Shiva Prakash
G01 - MEASURING TESTING
Information
Patent Grant
Atomic force microscopy measurements of contact resistance and curr...
Patent number
6,871,559
Issue date
Mar 29, 2005
Fidelica Microsystems, Inc.
Shiva Prakash
G01 - MEASURING TESTING
Information
Patent Grant
Atomic force microscopy measurements of contact resistance and curr...
Patent number
6,832,508
Issue date
Dec 21, 2004
Fidelica Microsystems Inc.
Shiva Prakash
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for tool and tip design for nanomachining and...
Patent number
6,787,768
Issue date
Sep 7, 2004
General Nanotechnology L.L.C.
Victor B. Kley
G01 - MEASURING TESTING
Information
Patent Grant
Atomic force microscopy measurements of contact resistance and curr...
Patent number
6,761,074
Issue date
Jul 13, 2004
Fidelica Microsystems, Inc.
Shiva Prakash
G01 - MEASURING TESTING
Information
Patent Grant
Atomic force microscopy measurements of contact resistance and curr...
Patent number
6,612,161
Issue date
Sep 2, 2003
Fidelica Microsystems, Inc.
Shiva Prakash
G01 - MEASURING TESTING
Information
Patent Grant
Wear coating applied to an atomic force probe tip
Patent number
6,504,151
Issue date
Jan 7, 2003
FEI Company
Thomas Owen Mitchell
G01 - MEASURING TESTING
Information
Patent Grant
Cantilever for use in a scanning probe microscope
Patent number
6,415,653
Issue date
Jul 9, 2002
Olympus Optical Co., Ltd.
Katsuhiro Matsuyama
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Probe for scanning probe microscopy and related methods
Patent number
6,405,584
Issue date
Jun 18, 2002
Agere Systems Guardian Corp.
Jeffrey Bruce Bindell
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Method of fabricating probe force atomic force microscope
Patent number
6,358,426
Issue date
Mar 19, 2002
Seiko Instruments Inc.
Hiroshi Muramatsu
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Method of mapping a surface using a probe for stylus nanoprofilomet...
Patent number
6,250,143
Issue date
Jun 26, 2001
Agere Systems Guardian Corp.
Jeffrey B. Bindell
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Scanning probe microscope suitable for observing the sidewalls of s...
Patent number
6,246,054
Issue date
Jun 12, 2001
Olympus Optical Co., Ltd.
Akitoshi Toda
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Optical fiber probe and manufacturing method therefor
Patent number
6,236,783
Issue date
May 22, 2001
Kanagawa Academy of Science and Technology
Shuji Mononobe
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Method of forming ultrasmall structures and apparatus therefor
Patent number
6,218,086
Issue date
Apr 17, 2001
International Business Machines Corporation
Gerd K. Binnig
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Method of producing a calibration standard for 2-D and 3-D profilom...
Patent number
6,218,264
Issue date
Apr 17, 2001
International Business Machines Corporation
Johann W. Bartha
B82 - NANO-TECHNOLOGY
Patents Applications
last 30 patents
Information
Patent Application
Gas-Phase Functionalization of Carbon Nanotubes
Publication number
20100260927
Publication date
Oct 14, 2010
President and Fellows of Harvard College
Roy G. Gordon
B82 - NANO-TECHNOLOGY
Information
Patent Application
NANOCARBON AGGREGATE AND METHOD FOR MANUFACTURING THE SAME
Publication number
20100075835
Publication date
Mar 25, 2010
NEC Corporation
Ryota Yuge
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
NEAR-FIELD OPTICAL PROBE BASED ON SOI SUBSTRATE AND FABRICATION MET...
Publication number
20090218648
Publication date
Sep 3, 2009
Eunkyoung KIM
G01 - MEASURING TESTING
Information
Patent Application
Tapered probe structures and fabrication
Publication number
20090133171
Publication date
May 21, 2009
The Regents of the University of California
Sungho Jin
G01 - MEASURING TESTING
Information
Patent Application
Gas-phase functionalization of carbon nanotubes
Publication number
20080296537
Publication date
Dec 4, 2008
President and Fellows of Harvard College
Roy G. Gordon
B82 - NANO-TECHNOLOGY
Information
Patent Application
Systems and methods for utilizing scanning probe shape characteriza...
Publication number
20080154521
Publication date
Jun 26, 2008
Tianming Bao
G01 - MEASURING TESTING
Information
Patent Application
NANOLITHOGRAPHY METHODS AND PRODUCTS THEREFOR AND PRODUCED THEREBY
Publication number
20080113099
Publication date
May 15, 2008
Northwestern University
Chad Mirkin
G01 - MEASURING TESTING
Information
Patent Application
Microcoaxial probes made from strained semiconductor bilayers
Publication number
20080061798
Publication date
Mar 13, 2008
Robert H. Blick
G01 - MEASURING TESTING
Information
Patent Application
Near-field optical probe based on SOI substrate and fabrication met...
Publication number
20070128854
Publication date
Jun 7, 2007
Eunkyoung Kim
G01 - MEASURING TESTING
Information
Patent Application
Semiconductor probe with resistive tip and method of fabricating th...
Publication number
20060060779
Publication date
Mar 23, 2006
SAMSUNG ELECTRONICS CO., LTD.
Hong-sik Park
G01 - MEASURING TESTING
Information
Patent Application
Nanolithography methods and products therefor and produced thereby
Publication number
20050191434
Publication date
Sep 1, 2005
Northwestern University
Chad A. Mirkin
G01 - MEASURING TESTING
Information
Patent Application
Atomic force microscopy measurements of contact resistance and curr...
Publication number
20040069052
Publication date
Apr 15, 2004
Shiva Prakash
G01 - MEASURING TESTING
Information
Patent Application
Atomic force microscopy measurements of contact resistance and curr...
Publication number
20040020284
Publication date
Feb 5, 2004
Shiva Prakash
G01 - MEASURING TESTING
Information
Patent Application
Atomic force microscopy measurements of contact resistance and curr...
Publication number
20040016291
Publication date
Jan 29, 2004
Shiva Prakash
G01 - MEASURING TESTING
Information
Patent Application
Atomic force microscopy measurements of contact resistance and curr...
Publication number
20040016285
Publication date
Jan 29, 2004
Shiva Prakash
G01 - MEASURING TESTING
Information
Patent Application
Atomic force microscopy measurements of contact resistance and curr...
Publication number
20040016286
Publication date
Jan 29, 2004
Shiva Prakash
G01 - MEASURING TESTING
Information
Patent Application
Nanolithography methods and products therefor and produced thereby
Publication number
20020122873
Publication date
Sep 5, 2002
Chad A. Mirkin
B82 - NANO-TECHNOLOGY