Signal processing not specific to any of the devices covered by groups G01C19/5607 - G01C19/5719

Industry

CPC
G01C19/5776

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

GPHYSICS G01Measuring instruments G01CMEASURING DISTANCES, LEVELS OR BEARINGS SURVEYING NAVIGATION GYROSCOPIC INSTRUMENTS PHOTOGRAMMETRY OR VIDEOGRAMMETRY G01C19/00Gyroscopes Turn-sensitive devices using vibrating masses Turn-sensitive devices without moving masses Measuring angular rate using gyroscopic effects

Current Industry

G01C19/5776Signal processing not specific to any of the devices covered by groups G01C19/5607 - G01C19/5719

Industries

Patents Grantslast 30 patents

Information Patent Grant
Micromechanical clocking system with improved timing precision
- Patent number 11,959,747
- Issue date Apr 16, 2024
- Robert Bosch GmbH
- Gerhard Lammel
- G02 - OPTICS
Information Patent Grant
Synchronization of a gyroscope in a virtual-reality environment
- Patent number 11,946,744
- Issue date Apr 2, 2024
- Hewlett-Packard Development Company, L.P.
- Kevin David Kowalski
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Round robin sensor device for processing sensor data
- Patent number 11,913,788
- Issue date Feb 27, 2024
- Invensense, Inc.
- Vadim Tsinker
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Inertial measurement circuit, corresponding device and method
- Patent number 11,906,306
- Issue date Feb 20, 2024
- STMicroelectronics S.r.l.
- Giacomo Langfelder
- G01 - MEASURING TESTING
Information Patent Grant
Correction method for gyro sensor
- Patent number 11,906,307
- Issue date Feb 20, 2024
- Aichi Steel Corporation
- Michiharu Yamamoto
- G08 - SIGNALLING
Information Patent Grant
Gyroscope bias estimation
- Patent number 11,898,874
- Issue date Feb 13, 2024
- Matthew A. Gaskell
- G01 - MEASURING TESTING
Information Patent Grant
Inertia detection device
- Patent number 11,885,620
- Issue date Jan 30, 2024
- Denso Corporation
- Chao Chen
- G01 - MEASURING TESTING
Information Patent Grant
Motion sensor with sigma-delta analog-to-digital converter having r...
- Patent number 11,881,874
- Issue date Jan 23, 2024
- Invensense, Inc.
- Gabriele Pelli
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Electronic apparatus, angular velocity acquisition method and stora...
- Patent number RE49812
- Issue date Jan 23, 2024
- Casio Computer Co., Ltd.
- Takanori Ishihama
Information Patent Grant
Physical quantity detection circuit, physical quantity sensor, and...
- Patent number 11,855,653
- Issue date Dec 26, 2023
- Seiko Epson Corporation
- Hideyuki Yamada
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Driving circuit, method for driving a MEMS gyroscope and a correspo...
- Patent number 11,841,229
- Issue date Dec 12, 2023
- STMicroelectronics S.r.l.
- Stefano Facchinetti
- G01 - MEASURING TESTING
Information Patent Grant
Continuous online self-calibration for gyroscopes through modulatio...
- Patent number 11,835,339
- Issue date Dec 5, 2023
- HRL Laboratories, LLC
- Logan Sorenson
- G01 - MEASURING TESTING
Information Patent Grant
Vehicle traveling control method and vehicle control system
- Patent number 11,808,575
- Issue date Nov 7, 2023
- Aichi Steel Corporation
- Michiharu Yamamoto
- G08 - SIGNALLING
Information Patent Grant
Optical-inertial stabilization for electro-optical systems
- Patent number 11,789,252
- Issue date Oct 17, 2023
- Lockheed Martin Corporation
- Timothy Roland Hilby
- G01 - MEASURING TESTING
Information Patent Grant
Microelectromechanical systems (MEMS) gyroscope sense frequency tra...
- Patent number 11,754,397
- Issue date Sep 12, 2023
- Invensense, Inc.
- Sriraman Dakshinamurthy
- G01 - MEASURING TESTING
Information Patent Grant
MEMS inertial sensor, application method of MEMS inertial sensor, a...
- Patent number 11,740,089
- Issue date Aug 29, 2023
- SENODIA TECHNOLOGIES (SHAOXING) CO., LTD
- Bo Zou
- G01 - MEASURING TESTING
Information Patent Grant
Physical quantity detection circuit, physical quantity sensor, elec...
- Patent number 11,733,045
- Issue date Aug 22, 2023
- Seiko Epson Corporation
- Takashi Aoyama
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Angular speed derivation device and angular speed derivation method...
- Patent number 11,713,967
- Issue date Aug 1, 2023
- JVC Kenwood Corporation
- Takahiro Kondoh
- G01 - MEASURING TESTING
Information Patent Grant
Vibration-resistant gyrometer
- Patent number 11,692,824
- Issue date Jul 4, 2023
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Pierre Janioud
- G01 - MEASURING TESTING
Information Patent Grant
Sensor and electronic device
- Patent number 11,680,800
- Issue date Jun 20, 2023
- Kabushiki Kaisha Toshiba
- Ryunosuke Gando
- G01 - MEASURING TESTING
Information Patent Grant
Demodulation phase calibration using external input
- Patent number 11,650,078
- Issue date May 16, 2023
- Invensense, Inc.
- Doruk Senkal
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
MEMS gyroscope sensitivity compensation
- Patent number 11,650,055
- Issue date May 16, 2023
- Murata Manufacturing Co., Ltd.
- Lasse Aaltonen
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Physical quantity detection circuit, physical quantity sensor, elec...
- Patent number 11,650,056
- Issue date May 16, 2023
- Seiko Epson Corporation
- Hideyuki Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Sensor linearization based upon correction of static and frequency-...
- Patent number 11,619,492
- Issue date Apr 4, 2023
- Invensense, Inc.
- Vito Avantaggiati
- G01 - MEASURING TESTING
Information Patent Grant
Method for operating a capacitive MEMS sensor, and capacitive MEMS...
- Patent number 11,591,209
- Issue date Feb 28, 2023
- Robert Bosch GmbH
- Francesco Diazzi
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
MEMS rotation rate sensor
- Patent number 11,566,900
- Issue date Jan 31, 2023
- Purdue Research Foundation
- Sunil Bhave
- G01 - MEASURING TESTING
Information Patent Grant
Microelectromechanical inertial sensor including a substrate and an...
- Patent number 11,561,238
- Issue date Jan 24, 2023
- Robert Bosch GmbH
- Stefan Kiesel
- G01 - MEASURING TESTING
Information Patent Grant
Method for automatic frequency adaptation of a filter in a closed loop
- Patent number 11,513,135
- Issue date Nov 29, 2022
- Albert-Ludwigs-Universitat Freiburg
- Maximilian Marx
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Use of MEMS gyroscope for compensation of accelerometer stress indu...
- Patent number 11,473,909
- Issue date Oct 18, 2022
- Invensense, Inc.
- Pietro Scafidi
- G01 - MEASURING TESTING
Information Patent Grant
Physical quantity detection circuit and physical quantity detection...
- Patent number 11,467,176
- Issue date Oct 11, 2022
- Seiko Epson Corporation
- Noriyuki Murashima
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ELECTROMECHANICAL SYSTEM AND METHOD FOR OPERATING AN ELECTROMECHANI...
- Publication number 20240140784
- Publication date May 2, 2024
- ROBERT BOSCH GmbH
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Recording System and Methods of Using Same
- Publication number 20240114193
- Publication date Apr 4, 2024
- Eric Michael Adams
- G01 - MEASURING TESTING
Information Patent Application
OUTPUT CONSISTENCY CONTROL METHOD AND APPARATUS FOR MULTIPLE VIBRAT...
- Publication number 20240077313
- Publication date Mar 7, 2024
- AAC Acoustic Technologies (Shanghai)Co., Ltd.
- Xueni Cao
- G01 - MEASURING TESTING
Information Patent Application
CONTINUOUS MONITORING OF GYROSCOPE SENSOR FORCED-TO-REBALANCE LOOP...
- Publication number 20240068812
- Publication date Feb 29, 2024
- Panasonic Intellectual Property Management Co., Ltd.
- Mohammad MAYMANDI NEJAD
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
MEMS DEVICE
- Publication number 20240025734
- Publication date Jan 25, 2024
- Zhunmao (Hangzhou) Technology Co.
- Haitao Ding
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Physical Quantity Sensor And Electronic Device
- Publication number 20230417550
- Publication date Dec 28, 2023
- SEIKO EPSON CORPORATION
- Hideyuki YAMADA
- G01 - MEASURING TESTING
Information Patent Application
Physical Quantity Sensor And Electronic Device
- Publication number 20230417549
- Publication date Dec 28, 2023
- SEIKO EPSON CORPORATION
- Hideyuki YAMADA
- G01 - MEASURING TESTING
Information Patent Application
VIBRATING SENSOR WITH HYBRIDISATION UNIT
- Publication number 20230341227
- Publication date Oct 26, 2023
- SAFRAN ELECTRONICS & DEFENSE
- Vincent RAGOT
- G01 - MEASURING TESTING
Information Patent Application
Physical Quantity Detection Circuit, Physical Quantity Sensor, Elec...
- Publication number 20230332891
- Publication date Oct 19, 2023
- SEIKO EPSON CORPORATION
- Takashi AOYAMA
- G01 - MEASURING TESTING
Information Patent Application
INERTIAL FORCE SENSOR
- Publication number 20230324174
- Publication date Oct 12, 2023
- KABUSHIKI KAISHA TOYOTA CHUO KENKYUSHO
- Teruhisa AKASHI
- G01 - MEASURING TESTING
Information Patent Application
PRECISION GYROSCOPE MODE-MATCHING INSENSITIVE TO RATE INPUT
- Publication number 20230304799
- Publication date Sep 28, 2023
- The Regents of the University of California
- Bernhard E. Boser
- G01 - MEASURING TESTING
Information Patent Application
READOUT CIRCUIT FOR A MEMS SENSOR UNIT
- Publication number 20230288205
- Publication date Sep 14, 2023
- ROBERT BOSCH GmbH
- Ishita Mukhopadhyay
- G01 - MEASURING TESTING
Information Patent Application
ROUND ROBIN SENSOR DEVICE FOR PROCESSING SENSOR DATA
- Publication number 20230273025
- Publication date Aug 31, 2023
- Vadim Tsinker
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
DOOR FAULT IDENTIFICATION
- Publication number 20230258611
- Publication date Aug 17, 2023
- SCHLAGE LOCK COMPANY LLC
- Daniel Langenberg
- G01 - MEASURING TESTING
Information Patent Application
INERTIAL SENSOR
- Publication number 20230258456
- Publication date Aug 17, 2023
- Panasonic Intellectual Property Management Co., Ltd.
- Shinichi KISHIMOTO
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MANUFACTURING MULTI-AXIAL INERTIAL FORCE SENSOR
- Publication number 20230243656
- Publication date Aug 3, 2023
- DENSO CORPORATION
- Teruhisa AKASHI
- G01 - MEASURING TESTING
Information Patent Application
SENSOR AND ELECTRONIC DEVICE
- Publication number 20230152099
- Publication date May 18, 2023
- Kabushiki Kaisha Toshiba
- Ryunosuke GANDO
- G01 - MEASURING TESTING
Information Patent Application
Vibration-Type Angular Velocity Sensor
- Publication number 20230140998
- Publication date May 11, 2023
- Sumitomo Precision Products Co., Ltd.
- Takafumi MORIGUCHI
- G01 - MEASURING TESTING
Information Patent Application
ATTITUDE ANGLE DERIVATION DEVICE AND ATTITUDE ANGLE SENSOR
- Publication number 20230143243
- Publication date May 11, 2023
- Kabushiki Kaisha Toshiba
- Daiki ONO
- G01 - MEASURING TESTING
Information Patent Application
Vibration-Type Angular Velocity Sensor
- Publication number 20230123765
- Publication date Apr 20, 2023
- Sumitomo Precision Products Co., Ltd.
- Takafumi MORIGUCHI
- G01 - MEASURING TESTING
Information Patent Application
CONTROL CIRCUIT OF A MEMS GYROSCOPE, MEMS GYROSCOPE AND CONTROL METHOD
- Publication number 20230102160
- Publication date Mar 30, 2023
- STMicroelectronics S.r.l.
- Angelo GRANATA
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
MEMS INERTIAL SENSOR, APPLICATION METHOD OF MEMS INERTIAL SENSOR, A...
- Publication number 20230088805
- Publication date Mar 23, 2023
- SENODIA TECHNOLOGIES (SHAOXING) CO., LTD.
- Bo ZOU
- G01 - MEASURING TESTING
Information Patent Application
DRIVE CONTROL DEVICE, DRIVE CONTROL METHOD, AND PROGRAM
- Publication number 20230016337
- Publication date Jan 19, 2023
- SONY GROUP CORPORATION
- Haruto TAKEDA
- G01 - MEASURING TESTING
Information Patent Application
COMPENSATING A TEMPERATURE-DEPENDENT QUADRATURE-INDUCED ZERO RATE O...
- Publication number 20230009227
- Publication date Jan 12, 2023
- ROBERT BOSCH GmbH
- Andrea Visconti
- G01 - MEASURING TESTING
Information Patent Application
PHASE-LOCKED LOOP FOR A DRIVER CIRCUIT FOR OPERATING A MEMS GYROSCOPE
- Publication number 20230003525
- Publication date Jan 5, 2023
- ROBERT BOSCH GmbH
- Francesco Diazzi
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SENSOR LINEARIZATION BASED UPON CORRECTION OF STATIC AND FREQUENCY-...
- Publication number 20220397395
- Publication date Dec 15, 2022
- InvenSense, Inc.
- Vito Avantaggiati
- G01 - MEASURING TESTING
Information Patent Application
SENSOR ARRAY AND METHOD FOR OPERATING A SENSOR ARRAY
- Publication number 20220390235
- Publication date Dec 8, 2022
- ROBERT BOSCH GmbH
- Andrea Visconti
- G01 - MEASURING TESTING
Information Patent Application
Inertial Measurement Circuit, Corresponding Device and Method
- Publication number 20220390234
- Publication date Dec 8, 2022
- STMicroelectronics S.r.l.
- Giacomo Langfelder
- G01 - MEASURING TESTING
Information Patent Application
INERTIA DETECTION DEVICE
- Publication number 20220381562
- Publication date Dec 1, 2022
- DENSO CORPORATION
- CHAO CHEN
- G01 - MEASURING TESTING
Information Patent Application
Gyroscope Bias Estimation
- Publication number 20220364882
- Publication date Nov 17, 2022
- McLaren Applied Technologies Limited
- Matthew A. Gaskell
- G01 - MEASURING TESTING

Signal processing not specific to any of the devices covered by groups G01C19/5607 - G01C19/5719

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Micromechanical clocking system with improved timing precision

Synchronization of a gyroscope in a virtual-reality environment

Round robin sensor device for processing sensor data

Inertial measurement circuit, corresponding device and method

Correction method for gyro sensor

Gyroscope bias estimation

Inertia detection device

Motion sensor with sigma-delta analog-to-digital converter having r...

Electronic apparatus, angular velocity acquisition method and stora...

Physical quantity detection circuit, physical quantity sensor, and...

Driving circuit, method for driving a MEMS gyroscope and a correspo...

Continuous online self-calibration for gyroscopes through modulatio...

Vehicle traveling control method and vehicle control system

Optical-inertial stabilization for electro-optical systems

Microelectromechanical systems (MEMS) gyroscope sense frequency tra...

MEMS inertial sensor, application method of MEMS inertial sensor, a...

Physical quantity detection circuit, physical quantity sensor, elec...

Angular speed derivation device and angular speed derivation method...

Vibration-resistant gyrometer

Sensor and electronic device

Demodulation phase calibration using external input

MEMS gyroscope sensitivity compensation

Physical quantity detection circuit, physical quantity sensor, elec...

Sensor linearization based upon correction of static and frequency-...

Method for operating a capacitive MEMS sensor, and capacitive MEMS...

MEMS rotation rate sensor

Microelectromechanical inertial sensor including a substrate and an...

Method for automatic frequency adaptation of a filter in a closed loop

Use of MEMS gyroscope for compensation of accelerometer stress indu...

Physical quantity detection circuit and physical quantity detection...

Patents Applicationslast 30 patents

ELECTROMECHANICAL SYSTEM AND METHOD FOR OPERATING AN ELECTROMECHANI...

Recording System and Methods of Using Same

OUTPUT CONSISTENCY CONTROL METHOD AND APPARATUS FOR MULTIPLE VIBRAT...

CONTINUOUS MONITORING OF GYROSCOPE SENSOR FORCED-TO-REBALANCE LOOP...

MEMS DEVICE

Physical Quantity Sensor And Electronic Device

Physical Quantity Sensor And Electronic Device

VIBRATING SENSOR WITH HYBRIDISATION UNIT

Physical Quantity Detection Circuit, Physical Quantity Sensor, Elec...

INERTIAL FORCE SENSOR

PRECISION GYROSCOPE MODE-MATCHING INSENSITIVE TO RATE INPUT

READOUT CIRCUIT FOR A MEMS SENSOR UNIT

ROUND ROBIN SENSOR DEVICE FOR PROCESSING SENSOR DATA

DOOR FAULT IDENTIFICATION

INERTIAL SENSOR

METHOD FOR MANUFACTURING MULTI-AXIAL INERTIAL FORCE SENSOR

SENSOR AND ELECTRONIC DEVICE

Vibration-Type Angular Velocity Sensor

ATTITUDE ANGLE DERIVATION DEVICE AND ATTITUDE ANGLE SENSOR

Vibration-Type Angular Velocity Sensor

CONTROL CIRCUIT OF A MEMS GYROSCOPE, MEMS GYROSCOPE AND CONTROL METHOD

MEMS INERTIAL SENSOR, APPLICATION METHOD OF MEMS INERTIAL SENSOR, A...

DRIVE CONTROL DEVICE, DRIVE CONTROL METHOD, AND PROGRAM

COMPENSATING A TEMPERATURE-DEPENDENT QUADRATURE-INDUCED ZERO RATE O...

PHASE-LOCKED LOOP FOR A DRIVER CIRCUIT FOR OPERATING A MEMS GYROSCOPE

SENSOR LINEARIZATION BASED UPON CORRECTION OF STATIC AND FREQUENCY-...

SENSOR ARRAY AND METHOD FOR OPERATING A SENSOR ARRAY

Inertial Measurement Circuit, Corresponding Device and Method

INERTIA DETECTION DEVICE

Gyroscope Bias Estimation