Signal processing

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CPC
G01C19/5614

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GPHYSICS G01Measuring instruments G01CMEASURING DISTANCES, LEVELS OR BEARINGS SURVEYING NAVIGATION GYROSCOPIC INSTRUMENTS PHOTOGRAMMETRY OR VIDEOGRAMMETRY G01C19/00Gyroscopes Turn-sensitive devices using vibrating masses Turn-sensitive devices without moving masses Measuring angular rate using gyroscopic effects

Current Industry

G01C19/5614Signal processing

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Physical quantity detection circuit, physical quantity sensor, and...
- Patent number 11,855,653
- Issue date Dec 26, 2023
- Seiko Epson Corporation
- Hideyuki Yamada
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Vibration rectification error correction circuit, physical quantity...
- Patent number 11,808,572
- Issue date Nov 7, 2023
- Seiko Epson Corporation
- Masayoshi Todorokihara
- G01 - MEASURING TESTING
Information Patent Grant
Physical quantity detection circuit and physical quantity detection...
- Patent number 11,467,176
- Issue date Oct 11, 2022
- Seiko Epson Corporation
- Noriyuki Murashima
- G01 - MEASURING TESTING
Information Patent Grant
Method for calibrating sensor or azimuth information obtained throu...
- Patent number 11,435,187
- Issue date Sep 6, 2022
- Samsung Electronics Co., Ltd.
- Jinik Kim
- G01 - MEASURING TESTING
Information Patent Grant
Vibratory error compensation in a tuning fork gyroscope such as a C...
- Patent number 11,333,499
- Issue date May 17, 2022
- Honeywell International Inc.
- Daniel Endean
- G01 - MEASURING TESTING
Information Patent Grant
Accelerometer system enclosing gas
- Patent number 11,079,227
- Issue date Aug 3, 2021
- Honeywell International Inc.
- Chad Fertig
- G01 - MEASURING TESTING
Information Patent Grant
Physical quantity sensor, method of manufacturing physical quantity...
- Patent number 11,079,226
- Issue date Aug 3, 2021
- Seiko Epson Corporation
- Keiichi Yamaguchi
- G01 - MEASURING TESTING
Information Patent Grant
Physical quantity measurement device, electronic apparatus, and veh...
- Patent number 11,014,571
- Issue date May 25, 2021
- Seiko Epson Corporation
- Noriyuki Murashima
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Electronic reliability enhancement of a physical quantity sensor
- Patent number 10,948,311
- Issue date Mar 16, 2021
- PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Keisuke Kuroda
- G01 - MEASURING TESTING
Information Patent Grant
Detection device for detecting dynamic quantity exerted on mechanic...
- Patent number 10,928,198
- Issue date Feb 23, 2021
- Kabushiki Kaisha Toshiba
- Yohei Hatakeyama
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Sensor and method for diagnosing sensor
- Patent number 10,921,347
- Issue date Feb 16, 2021
- PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Keisuke Kuroda
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Drive circuit, physical quantity sensor, and electronic device
- Patent number 10,848,159
- Issue date Nov 24, 2020
- PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Hideyuki Murakami
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Physical quantity detecting device, electronic apparatus, and movin...
- Patent number 10,794,778
- Issue date Oct 6, 2020
- Seiko Epson Corporation
- Ryuta Nishizawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Physical quantity measurement device, electronic apparatus, and veh...
- Patent number 10,746,809
- Issue date Aug 18, 2020
- Seiko Epson Corporation
- Yutaka Takada
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Demodulation phase calibration
- Patent number 10,746,565
- Issue date Aug 18, 2020
- Invensense, Inc.
- Doruk Senkal
- G01 - MEASURING TESTING
Information Patent Grant
Sensor element control device, physical quantity sensor, electronic...
- Patent number 10,731,985
- Issue date Aug 4, 2020
- Seiko Epson Corporation
- Norihito Matsukawa
- G01 - MEASURING TESTING
Information Patent Grant
Circuit device, electronic apparatus, moving object and method of m...
- Patent number 10,704,907
- Issue date Jul 7, 2020
- Seiko Epson Corporation
- Teppei Higuchi
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Sensor and method for diagnosing sensor
- Patent number 10,534,015
- Issue date Jan 14, 2020
- PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Keisuke Kuroda
- G01 - MEASURING TESTING
Information Patent Grant
Physical quantity sensor
- Patent number 10,393,523
- Issue date Aug 27, 2019
- Denso Corporation
- Kiyomasa Sugimoto
- G01 - MEASURING TESTING
Information Patent Grant
Physical quantity detection circuit, electronic device, and moving...
- Patent number 10,302,431
- Issue date May 28, 2019
- Seiko Epson Corporation
- Takashi Aoyama
- G01 - MEASURING TESTING
Information Patent Grant
Demodulation phase calibration
- Patent number 10,267,650
- Issue date Apr 23, 2019
- Invensense, Inc.
- Doruk Senkal
- G01 - MEASURING TESTING
Information Patent Grant
Circuit device, physical quantity detection device, electronic appa...
- Patent number 10,254,115
- Issue date Apr 9, 2019
- Seiko Epson Corporation
- Hideo Haneda
- G01 - MEASURING TESTING
Information Patent Grant
Circuit device, physical quantity detection device, electronic appa...
- Patent number 10,175,044
- Issue date Jan 8, 2019
- Seiko Epson Corporation
- Hideo Haneda
- G01 - MEASURING TESTING
Information Patent Grant
Angular velocity sensor
- Patent number 10,132,631
- Issue date Nov 20, 2018
- Denso Corporation
- Minekazu Sakai
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Circuit device, electronic apparatus, moving object and method of m...
- Patent number 10,072,929
- Issue date Sep 11, 2018
- Seiko Epson Corporation
- Teppei Higuchi
- G01 - MEASURING TESTING
Information Patent Grant
Physical quantity detection vibrator element, physical quantity det...
- Patent number 10,072,928
- Issue date Sep 11, 2018
- Seiko Epson Corporation
- Masahiro Ishii
- G01 - MEASURING TESTING
Information Patent Grant
Circuit device, physical quantity detection device, electronic appa...
- Patent number 10,031,176
- Issue date Jul 24, 2018
- Seiko Epson Corporation
- Takashi Aoyama
- G01 - MEASURING TESTING
Information Patent Grant
Physical-quantity detection circuit, physical-quantity sensor, and...
- Patent number 10,018,468
- Issue date Jul 10, 2018
- PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Hideyuki Murakami
- G01 - MEASURING TESTING
Information Patent Grant
Physical quantity sensor, electronic apparatus, and moving object
- Patent number 9,927,238
- Issue date Mar 27, 2018
- Seiko Epson Corporation
- Yutaka Takada
- G01 - MEASURING TESTING
Information Patent Grant
Physical quantity sensor
- Patent number 9,885,586
- Issue date Feb 6, 2018
- PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Sho Shimada
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MULTI-MODE, MODE-MATCHED, MEMS-BASED CORIOLIS VIBRATORY GYROSCOPE
- Publication number 20240263944
- Publication date Aug 8, 2024
- The United States of America as represented by the Secretary of the Navy
- Kari Moran
- G01 - MEASURING TESTING
Information Patent Application
Quantum Weak-Value Birefringent Coriolis Vibratory Gyroscope
- Publication number 20240044648
- Publication date Feb 8, 2024
- United States of America, as Represented by the Secretary of the Navy
- Garrett K. Josemans
- G01 - MEASURING TESTING
Information Patent Application
Physical Quantity Detection Circuit And Physical Quantity Detection...
- Publication number 20230304796
- Publication date Sep 28, 2023
- SEIKO EPSON CORPORATION
- Takashi AOYAMA
- G01 - MEASURING TESTING
Information Patent Application
ACCELEROMETER SYSTEM ENCLOSING GAS
- Publication number 20200309524
- Publication date Oct 1, 2020
- HONEYWELL INTERNATIONAL INC.
- Chad Fertig
- G01 - MEASURING TESTING
Information Patent Application
VIBRATORY ERROR COMPENSATION IN A TUNING FORK GYROSCOPE SUCH AS A C...
- Publication number 20200088518
- Publication date Mar 19, 2020
- HONEYWELL INTERNATIONAL INC.
- Daniel Endean
- G01 - MEASURING TESTING
Information Patent Application
VIBRATION RECTIFICATION ERROR CORRECTION CIRCUIT, PHYSICAL QUANTITY...
- Publication number 20190331491
- Publication date Oct 31, 2019
- SEIKO EPSON CORPORATION
- Masayoshi TODOROKIHARA
- G01 - MEASURING TESTING
Information Patent Application
PHYSICAL QUANTITY SENSOR, METHOD OF MANUFACTURING PHYSICAL QUANTITY...
- Publication number 20190301865
- Publication date Oct 3, 2019
- SEIKO EPSON CORPORATION
- Keiichi YAMAGUCHI
- G01 - MEASURING TESTING
Information Patent Application
DEMODULATION PHASE CALIBRATION
- Publication number 20190226871
- Publication date Jul 25, 2019
- InvenSense, Inc.
- Doruk Senkal
- G01 - MEASURING TESTING
Information Patent Application
SENSOR
- Publication number 20190120655
- Publication date Apr 25, 2019
- Panasonic Intellectual Property Management Co., Ltd.
- KEISUKE KURODA
- G01 - MEASURING TESTING
Information Patent Application
Physical Quantity Measurement Device, Electronic Apparatus, And Veh...
- Publication number 20190094284
- Publication date Mar 28, 2019
- SEIKO EPSON CORPORATION
- Yutaka TAKADA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CIRCUIT DEVICE, ELECTRONIC APPARATUS, MOVING OBJECT AND METHOD OF M...
- Publication number 20180347983
- Publication date Dec 6, 2018
- SEIKO EPSON CORPORATION
- Teppei HIGUCHI
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Circuit Apparatus, Physical Quantity Measuring Apparatus, Electroni...
- Publication number 20180348277
- Publication date Dec 6, 2018
- SEIKO EPSON CORPORATION
- Hideo HANEDA
- B60 - VEHICLES IN GENERAL
Information Patent Application
PHYSICAL QUANTITY DETECTION APPARATUS, ELECTRONIC DEVICE, AND MOBIL...
- Publication number 20180328731
- Publication date Nov 15, 2018
- SEIKO EPSON CORPORATION
- Kiminori NAKAJIMA
- G01 - MEASURING TESTING
Information Patent Application
CIRCUIT DEVICE, PHYSICAL QUANTITY MEASUREMENT DEVICE, ELECTRONIC DE...
- Publication number 20180278259
- Publication date Sep 27, 2018
- SEIKO EPSON CORPORATION
- Naoki II
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
ANGULAR VELOCITY SENSOR
- Publication number 20170016724
- Publication date Jan 19, 2017
- Denso Corporation
- Minekazu SAKAI
- G01 - MEASURING TESTING
Information Patent Application
INERTIAL SENSOR WITH COUPLE SPRING FOR COMMON MODE REJECTION
- Publication number 20160370180
- Publication date Dec 22, 2016
- FREESCALE SEMICONDUCTOR, INC.
- MICHAEL NAUMANN
- G01 - MEASURING TESTING
Information Patent Application
CIRCUIT DEVICE, PHYSICAL QUANTITY DETECTION DEVICE, ELECTRONIC APPA...
- Publication number 20160245652
- Publication date Aug 25, 2016
- SEIKO EPSON CORPORATION
- Hideo HANEDA
- G01 - MEASURING TESTING
Information Patent Application
CIRCUIT DEVICE, ELECTRONIC APPARATUS, MOVING OBJECT AND METHOD OF M...
- Publication number 20160216113
- Publication date Jul 28, 2016
- SEIKO EPSON CORPORATION
- Teppei Higuchi
- G01 - MEASURING TESTING
Information Patent Application
PHYSICAL-QUANTITY DETECTION CIRCUIT, PHYSICAL-QUANTITY SENSOR, AND...
- Publication number 20160187136
- Publication date Jun 30, 2016
- Panasonic Intellectual Property Management Co., Ltd.
- HIDEYUKI MURAKAMI
- G01 - MEASURING TESTING
Information Patent Application
OSCILLATING VOLTAGE OF SENSE ELECTRODES IN A MEMS TUNING FORK GYROS...
- Publication number 20150253138
- Publication date Sep 10, 2015
- Honeywell International Inc.
- Michael S. Sutton
- G01 - MEASURING TESTING
Information Patent Application
DETECTION DEVICE, SENSOR, ELECTRONIC APPARATUS, AND MOVING OBJECT
- Publication number 20150122022
- Publication date May 7, 2015
- SEIKO EPSON CORPORATION
- Katsuhiko Maki
- G01 - MEASURING TESTING
Information Patent Application
PHYSICAL QUANTITY DETECTION CIRCUIT, PHYSICAL QUANTITY DETECTION DE...
- Publication number 20140318244
- Publication date Oct 30, 2014
- SEIKO EPSON CORPORATION
- Akio TSUTSUMI
- G01 - MEASURING TESTING
Information Patent Application
DETECTION DEVICE, SENSOR, ELECTRONIC APPARATUS, AND MOVING OBJECT
- Publication number 20140305206
- Publication date Oct 16, 2014
- SEIKO EPSON CORPORATION
- Katsuhiko Maki
- G01 - MEASURING TESTING
Information Patent Application
DETECTION DEVICE, SENSOR, ELECTRONIC APPARATUS, AND MOVING OBJECT
- Publication number 20140305185
- Publication date Oct 16, 2014
- SEIKO EPSON CORPORATION
- Katsuhiko Maki
- G01 - MEASURING TESTING
Information Patent Application
INERTIAL FORCE SENSOR AND ZERO POINT CORRECTION MEHTOD USED THEREIN
- Publication number 20140007645
- Publication date Jan 9, 2014
- PANASONIC CORPORATION
- Takeshi Uemura
- G01 - MEASURING TESTING
Information Patent Application
ELECTRODES AND ASSOCIATED ELECTRONIC CIRCUITS FOR A PIEZOELECTRIC V...
- Publication number 20120279303
- Publication date Nov 8, 2012
- Office National D'Etudes et de Recherches Aerospatiales (Onera)
- Olivier Le Traon
- G01 - MEASURING TESTING
Information Patent Application
ANGULAR SPEED SENSOR
- Publication number 20120111111
- Publication date May 10, 2012
- PANASONIC CORPORATION
- Hideyuki Murakami
- G01 - MEASURING TESTING
Information Patent Application
ANGULAR VELOCITY SENSOR
- Publication number 20120024057
- Publication date Feb 2, 2012
- PANASONIC CRPORATION
- Takeshi Sasaki
- G01 - MEASURING TESTING
Information Patent Application
OSCILLATOR CIRCUIT, METHOD FOR MANUFACTURING OSCILLATOR CIRCUIT, IN...
- Publication number 20110285444
- Publication date Nov 24, 2011
- PANASONIC CORPORATION
- Takeshi Uemura
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Angular Velocity Sensor
- Publication number 20110252886
- Publication date Oct 20, 2011
- Hitachi Automotive Systems, Ltd.
- Satoshi Asano
- G01 - MEASURING TESTING

Signal processing

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Physical quantity detection circuit, physical quantity sensor, and...

Vibration rectification error correction circuit, physical quantity...

Physical quantity detection circuit and physical quantity detection...

Method for calibrating sensor or azimuth information obtained throu...

Vibratory error compensation in a tuning fork gyroscope such as a C...

Accelerometer system enclosing gas

Physical quantity sensor, method of manufacturing physical quantity...

Physical quantity measurement device, electronic apparatus, and veh...

Electronic reliability enhancement of a physical quantity sensor

Detection device for detecting dynamic quantity exerted on mechanic...

Sensor and method for diagnosing sensor

Drive circuit, physical quantity sensor, and electronic device

Physical quantity detecting device, electronic apparatus, and movin...

Physical quantity measurement device, electronic apparatus, and veh...

Demodulation phase calibration

Sensor element control device, physical quantity sensor, electronic...

Circuit device, electronic apparatus, moving object and method of m...

Sensor and method for diagnosing sensor

Physical quantity sensor

Physical quantity detection circuit, electronic device, and moving...

Demodulation phase calibration

Circuit device, physical quantity detection device, electronic appa...

Circuit device, physical quantity detection device, electronic appa...

Angular velocity sensor

Circuit device, electronic apparatus, moving object and method of m...

Physical quantity detection vibrator element, physical quantity det...

Circuit device, physical quantity detection device, electronic appa...

Physical-quantity detection circuit, physical-quantity sensor, and...

Physical quantity sensor, electronic apparatus, and moving object

Physical quantity sensor

Patents Applicationslast 30 patents

MULTI-MODE, MODE-MATCHED, MEMS-BASED CORIOLIS VIBRATORY GYROSCOPE

Quantum Weak-Value Birefringent Coriolis Vibratory Gyroscope

Physical Quantity Detection Circuit And Physical Quantity Detection...

ACCELEROMETER SYSTEM ENCLOSING GAS

VIBRATORY ERROR COMPENSATION IN A TUNING FORK GYROSCOPE SUCH AS A C...

VIBRATION RECTIFICATION ERROR CORRECTION CIRCUIT, PHYSICAL QUANTITY...

PHYSICAL QUANTITY SENSOR, METHOD OF MANUFACTURING PHYSICAL QUANTITY...

DEMODULATION PHASE CALIBRATION

SENSOR

Physical Quantity Measurement Device, Electronic Apparatus, And Veh...

CIRCUIT DEVICE, ELECTRONIC APPARATUS, MOVING OBJECT AND METHOD OF M...

Circuit Apparatus, Physical Quantity Measuring Apparatus, Electroni...

PHYSICAL QUANTITY DETECTION APPARATUS, ELECTRONIC DEVICE, AND MOBIL...

CIRCUIT DEVICE, PHYSICAL QUANTITY MEASUREMENT DEVICE, ELECTRONIC DE...

ANGULAR VELOCITY SENSOR

INERTIAL SENSOR WITH COUPLE SPRING FOR COMMON MODE REJECTION

CIRCUIT DEVICE, PHYSICAL QUANTITY DETECTION DEVICE, ELECTRONIC APPA...

CIRCUIT DEVICE, ELECTRONIC APPARATUS, MOVING OBJECT AND METHOD OF M...

PHYSICAL-QUANTITY DETECTION CIRCUIT, PHYSICAL-QUANTITY SENSOR, AND...

OSCILLATING VOLTAGE OF SENSE ELECTRODES IN A MEMS TUNING FORK GYROS...

DETECTION DEVICE, SENSOR, ELECTRONIC APPARATUS, AND MOVING OBJECT

PHYSICAL QUANTITY DETECTION CIRCUIT, PHYSICAL QUANTITY DETECTION DE...

DETECTION DEVICE, SENSOR, ELECTRONIC APPARATUS, AND MOVING OBJECT

DETECTION DEVICE, SENSOR, ELECTRONIC APPARATUS, AND MOVING OBJECT

INERTIAL FORCE SENSOR AND ZERO POINT CORRECTION MEHTOD USED THEREIN

ELECTRODES AND ASSOCIATED ELECTRONIC CIRCUITS FOR A PIEZOELECTRIC V...

ANGULAR SPEED SENSOR

ANGULAR VELOCITY SENSOR

OSCILLATOR CIRCUIT, METHOD FOR MANUFACTURING OSCILLATOR CIRCUIT, IN...

Angular Velocity Sensor