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G01C19/5649
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PHYSICS
G01
Measuring instruments
G01C
MEASURING DISTANCES, LEVELS OR BEARINGS SURVEYING NAVIGATION GYROSCOPIC INSTRUMENTS PHOTOGRAMMETRY OR VIDEOGRAMMETRY
G01C19/00
Gyroscopes Turn-sensitive devices using vibrating masses Turn-sensitive devices without moving masses Measuring angular rate using gyroscopic effects
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G01C19/5649
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Patents Grants
last 30 patents
Information
Patent Grant
Motion sensor with sigma-delta analog-to-digital converter having r...
Patent number
11,881,874
Issue date
Jan 23, 2024
Invensense, Inc.
Gabriele Pelli
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Angular velocity sensor, electronic apparatus, and vehicle
Patent number
11,852,652
Issue date
Dec 26, 2023
Seiko Epson Corporation
Kazuyuki Nagata
G01 - MEASURING TESTING
Information
Patent Grant
Piezoelectric frequency-modulated gyroscope
Patent number
11,781,867
Issue date
Oct 10, 2023
Murata Manufacturing Co., Ltd.
Ville Kaajakari
G01 - MEASURING TESTING
Information
Patent Grant
Angular velocity sensor, electronic apparatus, and vehicle
Patent number
11,747,358
Issue date
Sep 5, 2023
Seiko Epson Corporation
Kazuyuki Nagata
G01 - MEASURING TESTING
Information
Patent Grant
Physical quantity detection circuit, physical quantity sensor, elec...
Patent number
11,650,056
Issue date
May 16, 2023
Seiko Epson Corporation
Hideyuki Yamada
G01 - MEASURING TESTING
Information
Patent Grant
Necrosis inhibitors
Patent number
11,478,438
Issue date
Oct 25, 2022
National Institute of Biological Sciences, Beijing
Zhiyuan Zhang
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Physical quantity detection circuit and physical quantity detection...
Patent number
11,467,176
Issue date
Oct 11, 2022
Seiko Epson Corporation
Noriyuki Murashima
G01 - MEASURING TESTING
Information
Patent Grant
Angular velocity sensor, electronic apparatus, and vehicle
Patent number
11,378,584
Issue date
Jul 5, 2022
Seiko Epson Corporation
Kazuyuki Nagata
G01 - MEASURING TESTING
Information
Patent Grant
Low power inertial sensor architecture and methods
Patent number
11,236,999
Issue date
Feb 1, 2022
MCube, Inc.
Sanjay Bhandari
G01 - MEASURING TESTING
Information
Patent Grant
MEMS gyroscope start-up process and circuit
Patent number
11,162,790
Issue date
Nov 2, 2021
STMicroelectronics, Inc.
Deyou Fang
G01 - MEASURING TESTING
Information
Patent Grant
Sensor element, inertial sensor, and electronic apparatus
Patent number
11,137,248
Issue date
Oct 5, 2021
SONY SEMICONDUCTOR SOLUTIONS CORPORATION
Hidetoshi Kabasawa
G01 - MEASURING TESTING
Information
Patent Grant
Physical quantity sensor, composite sensor, inertial measurement un...
Patent number
11,105,629
Issue date
Aug 31, 2021
Seiko Epson Corporation
Tatsuro Torimoto
G01 - MEASURING TESTING
Information
Patent Grant
Physical quantity sensor, inertia measurement device, vehicle posit...
Patent number
11,105,631
Issue date
Aug 31, 2021
Seiko Epson Corporation
Kazuyuki Nagata
G01 - MEASURING TESTING
Information
Patent Grant
Physical quantity sensor, physical quantity sensor device, composit...
Patent number
10,969,224
Issue date
Apr 6, 2021
Seiko Epson Corporation
Makoto Furuhata
G01 - MEASURING TESTING
Information
Patent Grant
Multiple axis sensing device based on frequency modulation and meth...
Patent number
10,823,569
Issue date
Nov 3, 2020
NXP USA, INC.
Peng Shao
G01 - MEASURING TESTING
Information
Patent Grant
Demodulation phase calibration
Patent number
10,746,565
Issue date
Aug 18, 2020
Invensense, Inc.
Doruk Senkal
G01 - MEASURING TESTING
Information
Patent Grant
Reducing a gyroscope-bias component in a determined value of angula...
Patent number
10,718,615
Issue date
Jul 21, 2020
Honeywell International Inc.
Mikulas Jandak
G01 - MEASURING TESTING
Information
Patent Grant
Circuit device, electronic apparatus, moving object and method of m...
Patent number
10,704,907
Issue date
Jul 7, 2020
Seiko Epson Corporation
Teppei Higuchi
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Data processing circuit, physical quantity detection circuit, physi...
Patent number
10,291,215
Issue date
May 14, 2019
Seiko Epson Corporation
Hideo Haneda
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Demodulation phase calibration
Patent number
10,267,650
Issue date
Apr 23, 2019
Invensense, Inc.
Doruk Senkal
G01 - MEASURING TESTING
Information
Patent Grant
Device and method for processing of residual values when controllin...
Patent number
10,254,116
Issue date
Apr 9, 2019
Northrop Grumman Litef GmbH
Guenter Spahlinger
G01 - MEASURING TESTING
Information
Patent Grant
Circuit for physical quantity sensor, physical quantity sensor, and...
Patent number
10,101,158
Issue date
Oct 16, 2018
Seiko Epson Corporation
Masahiro Oshio
G01 - MEASURING TESTING
Information
Patent Grant
Circuit device, electronic apparatus, moving object and method of m...
Patent number
10,072,929
Issue date
Sep 11, 2018
Seiko Epson Corporation
Teppei Higuchi
G01 - MEASURING TESTING
Information
Patent Grant
Circuit device, physical quantity detection device, electronic appa...
Patent number
10,031,176
Issue date
Jul 24, 2018
Seiko Epson Corporation
Takashi Aoyama
G01 - MEASURING TESTING
Information
Patent Grant
Micromachined cross-hatch vibratory gyroscopes
Patent number
9,927,239
Issue date
Mar 27, 2018
Analog Devices, Inc.
Eugene Oh Hwang
G01 - MEASURING TESTING
Information
Patent Grant
Gyroscope that compensates for fluctuations in sensitivity
Patent number
9,869,552
Issue date
Jan 16, 2018
Analog Devices, Inc.
Jeffrey A. Gregory
G01 - MEASURING TESTING
Information
Patent Grant
Detection device, sensor, electronic apparatus, and moving object
Patent number
9,813,037
Issue date
Nov 7, 2017
Seiko Epson Corporation
Katsuhiko Maki
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Method for calibrating vibratory gyroscope
Patent number
9,671,247
Issue date
Jun 6, 2017
Innalabs Limited
Isaak Markovich Okon
G01 - MEASURING TESTING
Information
Patent Grant
MEMS gyro motor loop filter
Patent number
9,581,447
Issue date
Feb 28, 2017
Honeywell International Inc.
John F. Ackerman
G01 - MEASURING TESTING
Information
Patent Grant
Accelerometers
Patent number
9,470,527
Issue date
Oct 18, 2016
The Secretary of State for Defence
David George
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Angular Velocity Sensor, Electronic Apparatus, And Vehicle
Publication number
20240053375
Publication date
Feb 15, 2024
SEIKO EPSON CORPORATION
Kazuyuki NAGATA
G01 - MEASURING TESTING
Information
Patent Application
Quantum Weak-Value Birefringent Coriolis Vibratory Gyroscope
Publication number
20240044648
Publication date
Feb 8, 2024
United States of America, as Represented by the Secretary of the Navy
Garrett K. Josemans
G01 - MEASURING TESTING
Information
Patent Application
Angular Velocity Sensor, Electronic Apparatus, And Vehicle
Publication number
20230204618
Publication date
Jun 29, 2023
SEIKO EPSON CORPORATION
Kazuyuki NAGATA
G01 - MEASURING TESTING
Information
Patent Application
4-POINTS PHASE AND SENSITIVITY ESTIMATION ALGORITHM AND RELATED ARC...
Publication number
20230160696
Publication date
May 25, 2023
InvenSense, Inc.
Vito Avantaggiati
G01 - MEASURING TESTING
Information
Patent Application
Angular Velocity Sensor, Electronic Apparatus, And Vehicle
Publication number
20220268802
Publication date
Aug 25, 2022
SEIKO EPSON CORPORATION
Kazuyuki NAGATA
G01 - MEASURING TESTING
Information
Patent Application
VIBROMETER AND METHOD FOR DETECTING VIBRATION
Publication number
20220268582
Publication date
Aug 25, 2022
KYOCERA CORPORATION
Munetaka SOEJIMA
G01 - MEASURING TESTING
Information
Patent Application
PIEZOELECTRIC FREQUENCY-MODULATED GYROSCOPE
Publication number
20220178696
Publication date
Jun 9, 2022
Murata Manufacturing Co., Ltd.
Ville KAAJAKARI
G01 - MEASURING TESTING
Information
Patent Application
PHYSICAL QUANTITY DETECTION CIRCUIT, PHYSICAL QUANTITY SENSOR, ELEC...
Publication number
20200240785
Publication date
Jul 30, 2020
SEIKO EPSON CORPORATION
Hideyuki YAMADA
G01 - MEASURING TESTING
Information
Patent Application
Necrosis Inhibitors
Publication number
20200182617
Publication date
Jun 11, 2020
NATIONAL INSTITUTE OF BIOLOGICAL SCIENCES, BEIJING
Zhiyuan Zhang
G01 - MEASURING TESTING
Information
Patent Application
VIBRATORY GYROSCOPE UTILIZING THE NONLINEAR MODAL INTERACTION
Publication number
20200011666
Publication date
Jan 9, 2020
SIMON FRASER UNIVERSITY
Farid Golnaraghi
G01 - MEASURING TESTING
Information
Patent Application
GYROSENSOR, SIGNAL PROCESSING DEVICE, ELECTRONIC APPARATUS, AND MET...
Publication number
20190310086
Publication date
Oct 10, 2019
SONY CORPORATION
KAZUO TAKAHASHI
G01 - MEASURING TESTING
Information
Patent Application
ANGULAR VELOCITY SENSOR, ELECTRONIC APPARATUS, AND VEHICLE
Publication number
20190265266
Publication date
Aug 29, 2019
SEIKO EPSON CORPORATION
Kazuyuki NAGATA
G01 - MEASURING TESTING
Information
Patent Application
SENSOR ELEMENT, INERTIAL SENSOR, AND ELECTRONIC APPARATUS
Publication number
20190265034
Publication date
Aug 29, 2019
Sony Semiconductor Solutions Corporation
HIDETOSHI KABASAWA
G01 - MEASURING TESTING
Information
Patent Application
Physical Quantity Sensor, Physical Quantity Sensor Device, Composit...
Publication number
20190234734
Publication date
Aug 1, 2019
SEIKO EPSON CORPORATION
Makoto FURUHATA
G01 - MEASURING TESTING
Information
Patent Application
DEMODULATION PHASE CALIBRATION
Publication number
20190226871
Publication date
Jul 25, 2019
InvenSense, Inc.
Doruk Senkal
G01 - MEASURING TESTING
Information
Patent Application
PHYSICAL QUANTITY SENSOR, INERTIA MEASUREMENT DEVICE, VEHICLE POSIT...
Publication number
20190101391
Publication date
Apr 4, 2019
SEIKO EPSON CORPORATION
Kazuyuki NAGATA
G01 - MEASURING TESTING
Information
Patent Application
CIRCUIT DEVICE, ELECTRONIC APPARATUS, MOVING OBJECT AND METHOD OF M...
Publication number
20180347983
Publication date
Dec 6, 2018
SEIKO EPSON CORPORATION
Teppei HIGUCHI
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
PHYSICAL QUANTITY DETECTION APPARATUS, ELECTRONIC DEVICE, AND MOBIL...
Publication number
20180328731
Publication date
Nov 15, 2018
SEIKO EPSON CORPORATION
Kiminori NAKAJIMA
G01 - MEASURING TESTING
Information
Patent Application
DEVICE AND METHOD FOR PROCESSING OF RESIDUAL VALUES WHEN CONTROLLIN...
Publication number
20180252525
Publication date
Sep 6, 2018
NORTHROP GRUMMAN LITEF GMBH
GUENTER SPAHLINGER
G01 - MEASURING TESTING
Information
Patent Application
VIBRATORY GYROSCOPE UTILIZING A NONLINEAR MODAL INTERACTION
Publication number
20180143021
Publication date
May 24, 2018
SIMON FRASER UNIVERSITY
Farid Golnaraghi
G01 - MEASURING TESTING
Information
Patent Application
REDUCING A GYROSCOPE-BIAS COMPONENT IN A DETERMINED VALUE OF ANGULA...
Publication number
20180128613
Publication date
May 10, 2018
HONEYWELL INTERNATIONAL INC.
Mikulas Jandak
G01 - MEASURING TESTING
Information
Patent Application
ACCELEROMETERS
Publication number
20140352432
Publication date
Dec 4, 2014
David George
G01 - MEASURING TESTING
Information
Patent Application
ELECTRO-MECHANICAL RESONANCE LOOP
Publication number
20140300425
Publication date
Oct 9, 2014
Maxim Integrated Products, Inc.
Gabriele Cazzaniga
G01 - MEASURING TESTING
Information
Patent Application
ANGULAR VELOCITY DETECTION CIRCUIT AND ANGULAR VELOCITY DETECTION A...
Publication number
20130069621
Publication date
Mar 21, 2013
SEIKO EPSON CORPORATION
Kenji SATO
G01 - MEASURING TESTING
Information
Patent Application
SIGNAL PROCESSING CIRCUIT, PHYSICAL QUANTITY DETECTION APPARATUS, A...
Publication number
20130055815
Publication date
Mar 7, 2013
SEIKO NPC CORPORATION
Yoshinao YANAGISAWA
G01 - MEASURING TESTING
Information
Patent Application
VIBRATION GYRO SENSOR, CONTROL CIRCUIT, AND ELECTRONIC APPARATUS
Publication number
20120160028
Publication date
Jun 28, 2012
SONY CORPORATION
Kazuo Kurihara
G01 - MEASURING TESTING
Information
Patent Application
VIBRATORY GYRO-SENSOR AND VIBRATORY GYRO CIRCUIT
Publication number
20120137782
Publication date
Jun 7, 2012
SONY CORPORATION
Toshihisa Sameshima
G01 - MEASURING TESTING
Information
Patent Application
GYROSCOPE SENSOR CIRCUIT
Publication number
20110314911
Publication date
Dec 29, 2011
SAMSUNG ELECTRO-MECHANICS CO., LTD.
Chang Hyun KIM
G01 - MEASURING TESTING
Information
Patent Application
Vibration compensation for yaw-rate sensors
Publication number
20100199763
Publication date
Aug 12, 2010
Steffen Zunft
G01 - MEASURING TESTING
Information
Patent Application
SIGMA-DELTA TYPE ANALOG-TO-DIGITAL (AD) CONVERTER AND ANGULAR VELOC...
Publication number
20100013688
Publication date
Jan 21, 2010
PANASONIC ELECTRIC DEVICE CO., LTD.
Hideyuki Murakami
H03 - BASIC ELECTRONIC CIRCUITRY