Membership
Tour
Register
Log in
Single beam
Follow
Industry
CPC
G01J2003/421
This industry / category may be too specific. Please go to a parent level for more data
Parent Industries
G
PHYSICS
G01
Measuring instruments
G01J
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY
Current Industry
G01J2003/421
Single beam
Industries
Overview
Organizations
People
Information
Impact
Please log in for detailed analytics
Patents Grants
last 30 patents
Information
Patent Grant
System, apparatus and methods for detecting methane leak
Patent number
11,774,355
Issue date
Oct 3, 2023
UNITED STATES OF AMERICA AS REPRESENTED BY THE ADMINISTRATOR OF NASA.
Shahid Aslam
G01 - MEASURING TESTING
Information
Patent Grant
Terahertz spectroscopy and imaging in dynamic environments
Patent number
11,513,004
Issue date
Nov 29, 2022
Apple Inc.
Chia-Chi Chen
G01 - MEASURING TESTING
Information
Patent Grant
Gas measurement system
Patent number
11,327,008
Issue date
May 10, 2022
Mettler-Toledo GmbH
Francesca Venturini
G01 - MEASURING TESTING
Information
Patent Grant
Terahertz spectroscopy and imaging in dynamic environments with spe...
Patent number
11,099,072
Issue date
Aug 24, 2021
Apple Inc.
Sireesha Ramisetti
G01 - MEASURING TESTING
Information
Patent Grant
Far-infrared spectroscopic device and far-infrared spectroscopic me...
Patent number
11,016,023
Issue date
May 25, 2021
Hitachi High-Technologies Corporation
Mizuki Mohara
G01 - MEASURING TESTING
Information
Patent Grant
Gas analyzer
Patent number
10,871,398
Issue date
Dec 22, 2020
Yokogawa Electric Corporation
Yoshitaka Kobayashi
G01 - MEASURING TESTING
Information
Patent Grant
Spectrometer with active beam steering
Patent number
10,620,045
Issue date
Apr 14, 2020
SpectraSensors, Inc.
Alfred Feitisch
G01 - MEASURING TESTING
Information
Patent Grant
Terahertz time-domain spectroscopy system
Patent number
10,408,679
Issue date
Sep 10, 2019
Shenzhen Institute of Terahertz Technology and Innovation
Shichang Peng
G01 - MEASURING TESTING
Information
Patent Grant
Method, device and apparatus for monitoring halogen levels in a bod...
Patent number
10,371,685
Issue date
Aug 6, 2019
Gecko Alliance Group Inc.
Benoit Laflamme
C02 - TREATMENT OF WATER, WASTE WATER, SEWAGE, OR SLUDGE
Information
Patent Grant
Terahertz wave spectrometry system
Patent number
10,345,150
Issue date
Jul 9, 2019
PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
Seiji Fujihara
G01 - MEASURING TESTING
Information
Patent Grant
Spectrometer with active beam steering
Patent number
10,309,828
Issue date
Jun 4, 2019
SpectraSensors, Inc.
Alfred Feitisch
G01 - MEASURING TESTING
Information
Patent Grant
Intergration of fluorescence detection capability into light absorb...
Patent number
10,274,428
Issue date
Apr 30, 2019
GE Healthcare Bio-Sciences AB
Hanno Ehring
G01 - MEASURING TESTING
Information
Patent Grant
Thermal infrared sensor and gas measuring apparatus
Patent number
10,107,743
Issue date
Oct 23, 2018
MURATA MANUFACTURING CO., LTD.
Junya Komoda
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
System and method for using hollow core photonic crystal fibers
Patent number
9,964,699
Issue date
May 8, 2018
The United States of America, as represented by the Administrator of the Nati...
Jeffrey R. Chen
G02 - OPTICS
Information
Patent Grant
Spectrometer with active beam steering
Patent number
9,816,860
Issue date
Nov 14, 2017
SpectraSensors, Inc.
Alfred Feitisch
G01 - MEASURING TESTING
Information
Patent Grant
Fiber optic coupled multipass gas minicell, design assembly thereof
Patent number
9,234,794
Issue date
Jan 12, 2016
Lawrence Livermore National Security, LLC
Tiziana C. Bond
G01 - MEASURING TESTING
Information
Patent Grant
Multispectral reflectometer
Patent number
5,517,302
Issue date
May 14, 1996
Thornton Stearns
G01 - MEASURING TESTING
Information
Patent Grant
Multispectral reflectometer
Patent number
5,262,840
Issue date
Nov 16, 1993
Sequa Corporation
Thornton Stearns
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and a method for high numerical aperture microscopic exam...
Patent number
5,220,403
Issue date
Jun 15, 1993
International Business Machines Corporation
John S. Batchelder
G02 - OPTICS
Information
Patent Grant
Apparatus and a method for high numerical aperture microscopic exam...
Patent number
5,208,648
Issue date
May 4, 1993
International Business Machines Corporation
John S. Batchelder
G02 - OPTICS
Information
Patent Grant
Monochromator for single and multiplexed dual wavelength spectroscopy
Patent number
5,030,006
Issue date
Jul 9, 1991
SLM Instruments, Inc.
George W. Mitchell
G01 - MEASURING TESTING
Information
Patent Grant
Concentration determination with multiple wavelength flash photometers
Patent number
5,014,216
Issue date
May 7, 1991
Beckman Instruments, Inc.
Roger A. Stafford
G01 - MEASURING TESTING
Information
Patent Grant
Method of and apparatus for spectroscopically analyzing samples
Patent number
4,832,491
Issue date
May 23, 1989
U.S. Philips Corporation
Michael R. Sharpe
G01 - MEASURING TESTING
Information
Patent Grant
Spectrograph for evaluating contamination of optical components in...
Patent number
4,815,842
Issue date
Mar 28, 1989
Acton Research Corporation
Bruce K. Flint
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for optically analyzing a sample
Patent number
4,540,282
Issue date
Sep 10, 1985
Landa; Isaac
Isaac J. Landa
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Far-Infrared Spectroscopic Device and Far-Infrared Spectroscopic Me...
Publication number
20210131957
Publication date
May 6, 2021
Hitachi High-Technologies Corporation
Mizuki MOHARA
G01 - MEASURING TESTING
Information
Patent Application
TERAHERTZ SENSOR MODULE FOR SPECTROSCOPY AND IMAGING
Publication number
20210041295
Publication date
Feb 11, 2021
Apple Inc.
Sireesha Ramisetti
G01 - MEASURING TESTING
Information
Patent Application
TERAHERTZ SPECTROSCOPY AND IMAGING IN DYNAMIC ENVIRONMENTS
Publication number
20210041292
Publication date
Feb 11, 2021
Apple Inc.
Chia-Chi Chen
G01 - MEASURING TESTING
Information
Patent Application
TERAHERTZ SPECTROSCOPY AND IMAGING IN DYNAMIC ENVIRONMENTS WITH SPE...
Publication number
20210041293
Publication date
Feb 11, 2021
Apple Inc.
Sireesha Ramisetti
G01 - MEASURING TESTING
Information
Patent Application
GAS MEASUREMENT SYSTEM
Publication number
20200072740
Publication date
Mar 5, 2020
Mettler-Toledo GmbH
Francesca VENTURINI
G01 - MEASURING TESTING
Information
Patent Application
GAS ANALYZER
Publication number
20190316965
Publication date
Oct 17, 2019
YOKOGAWA ELECTRIC CORPORATION
Yoshitaka Kobayashi
G01 - MEASURING TESTING
Information
Patent Application
IMAGE GENERATION DEVICE
Publication number
20190310464
Publication date
Oct 10, 2019
Fraunhofer-Gesellschaft zur Forderung der angewandten Forschung e.V.
Joachim Janes
G02 - OPTICS
Information
Patent Application
METHOD, DEVICE AND APPARATUS FOR MONITORING HALOGEN LEVELS IN A BOD...
Publication number
20190302084
Publication date
Oct 3, 2019
GECKO ALLIANCE GROUP INC.
Benoit LAFLAMME
G01 - MEASURING TESTING
Information
Patent Application
SPECTROMETER WITH ACTIVE BEAM STEERING
Publication number
20190277691
Publication date
Sep 12, 2019
SPECTRASENSORS, INC.
Alfred Feitisch
G01 - MEASURING TESTING
Information
Patent Application
DEVICE AND METHOD FOR TISSUE DIAGNOSIS IN REAL-TIME
Publication number
20190277755
Publication date
Sep 12, 2019
PIMS- Passive Imaging Medical Systems Ltd
Yaniv COHEN
G01 - MEASURING TESTING
Information
Patent Application
TERAHERTZ REFLECTION IMAGING SYSTEM USING ROTATING POLYHEDRAL MIRRO...
Publication number
20190120756
Publication date
Apr 25, 2019
ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE
Kiwon MOON
G01 - MEASURING TESTING
Information
Patent Application
SPECTROMETER WITH ACTIVE BEAM STEERING
Publication number
20180128678
Publication date
May 10, 2018
SPECTRASENSORS, INC.
Alfred Feitisch
G01 - MEASURING TESTING
Information
Patent Application
Intergration of Fluorescence Detection Capability into Light Absorb...
Publication number
20170356848
Publication date
Dec 14, 2017
GE HEALTHCARE BIO-SCIENCES AB
HANNO EHRING
G01 - MEASURING TESTING
Information
Patent Application
TERAHERTZ WAVE SPECTROMETRY SYSTEM
Publication number
20170336261
Publication date
Nov 23, 2017
Panasonic Intellectual Property Management Co., Ltd.
SEIJI FUJIHARA
G01 - MEASURING TESTING
Information
Patent Application
Spectrometer With Active Beam Steering
Publication number
20160054177
Publication date
Feb 25, 2016
Alfred Feitisch
G01 - MEASURING TESTING
Information
Patent Application
FIBER OPTIC COUPLED MULTIPASS GAS MINICELL, DESIGN ASSEMBLY THEREOF
Publication number
20150316412
Publication date
Nov 5, 2015
Lawrence Livermore National Security, LLC
Tiziana C. Bond
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND METER FOR DETERMINING GAS QUALITY
Publication number
20140077083
Publication date
Mar 20, 2014
Michael J. Birnkrant
G01 - MEASURING TESTING
Information
Patent Application
Concentration detection system
Publication number
20020153490
Publication date
Oct 24, 2002
Robert O'Leary
G01 - MEASURING TESTING