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G01J2003/042
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PHYSICS
G01
Measuring instruments
G01J
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY
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G01J2003/042
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Patents Grants
last 30 patents
Information
Patent Grant
Variable laser energy multi-spectrometer for gas and particulate ch...
Patent number
11,359,963
Issue date
Jun 14, 2022
The United States of America, as represented by the Secretary of the Navy
Kin Chiu Ng
G01 - MEASURING TESTING
Information
Patent Grant
Control apparatus and control method having a slit selection based...
Patent number
9,404,798
Issue date
Aug 2, 2016
NEC Corporation
Hideya Tomita
G01 - MEASURING TESTING
Information
Patent Grant
Hyperspectral imaging systems and methods for imaging a remote object
Patent number
9,341,514
Issue date
May 17, 2016
Corning Incorporated
Lovell Elgin Comstock
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Hyperspectral imaging systems and methods for imaging a remote object
Patent number
9,267,843
Issue date
Feb 23, 2016
Corning Incorporated
Lovell Elgin Comstock
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Hyperspectral imaging systems and methods for imaging a remote object
Patent number
9,200,958
Issue date
Dec 1, 2015
Corning Incorporated
Lovell Elgin Comstock
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Hyperspectral imaging systems and methods for imaging a remote object
Patent number
8,599,374
Issue date
Dec 3, 2013
Corning Incorporated
Lovell Elgin Comstock
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Correlational gas analyzer
Patent number
4,964,725
Issue date
Oct 23, 1990
Viktor L. Goldovsky
G01 - MEASURING TESTING
Information
Patent Grant
Correlational gas analyzer
Patent number
4,963,023
Issue date
Oct 16, 1990
Viktor L. Goldovsky
G01 - MEASURING TESTING
Information
Patent Grant
Spectrofluorophotometer with monitor detector for light source
Patent number
4,779,982
Issue date
Oct 25, 1988
Hitachi, Ltd.
Hiroyuki Koshi
G01 - MEASURING TESTING
Information
Patent Grant
Spectroanalysis system
Patent number
4,545,680
Issue date
Oct 8, 1985
Allied Corporation
Stanley B. Smith
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Variable Laser Energy Multi-Spectrometer for Gas and Particulate Ch...
Publication number
20210018366
Publication date
Jan 21, 2021
The United States of America, as represented by the Secretary of the Navy
Kin Chiu Ng
G01 - MEASURING TESTING
Information
Patent Application
HYPERSPECTRAL IMAGING SYSTEMS AND METHODS FOR IMAGING A REMOTE OBJECT
Publication number
20140132819
Publication date
May 15, 2014
Corning Incorporated
Lovell Elgin Comstock
G01 - MEASURING TESTING
Information
Patent Application
HYPERSPECTRAL IMAGING SYSTEMS AND METHODS FOR IMAGING A REMOTE OBJECT
Publication number
20140132811
Publication date
May 15, 2014
Corning Incorporated
Lovell Elgin Comstock II
G01 - MEASURING TESTING