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G01J2003/0281

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GPHYSICS G01Measuring instruments G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY

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G01J2003/0281slitless

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Patents Grantslast 30 patents

Information Patent Grant
Optical probe of spectroradiometer
- Patent number 10,222,259
- Issue date Mar 5, 2019
- Apacer Technology Inc.
- Tzu-I Ma
- G02 - OPTICS
Information Patent Grant
Fourier transform spectroscopy method, spectroscopic device, and sp...
- Patent number 9,557,220
- Issue date Jan 31, 2017
- Osaka Univeristy
- Takeshi Yasui
- G01 - MEASURING TESTING
Information Patent Grant
High resolution slit-free direct-viewing multiplexing field spectro...
- Patent number 8,749,781
- Issue date Jun 10, 2014
- Ronald Anthony Masters
- G01 - MEASURING TESTING
Information Patent Grant
Spectrograph providing spectral reference marks
- Patent number 4,441,814
- Issue date Apr 10, 1984
- William T. Buchanan
- G01 - MEASURING TESTING
Information Patent Grant
Slit-less spectrometer
- Patent number 4,012,147
- Issue date Mar 15, 1977
- George Edouard Walrafen
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
FOURIER TRANSFORM SPECTROSCOPY METHOD, SPECTROSCOPIC DEVICE, AND SP...
- Publication number 20150204722
- Publication date Jul 23, 2015
- OSAKA UNIVERSITY
- Takeshi Yasui
- G01 - MEASURING TESTING
Information Patent Application
HIGH RESOLUTION SLIT-FREE DIRECT-VIEWING MULTIPLEXING FIELD SPECTRO...
- Publication number 20120287430
- Publication date Nov 15, 2012
- Ronald Anthony Masters
- G01 - MEASURING TESTING