small angle scatter

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CPC
G01N2223/054

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

Current Industry

G01N2223/054small angle scatter

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Single piece droplet generation and injection device for serial cry...
- Patent number 12,287,299
- Issue date Apr 29, 2025
- Arizona Board of Regents on behalf of Arizona State University
- Alexandra Ros
- G01 - MEASURING TESTING
Information Patent Grant
Transmissive small-angle scattering device
- Patent number 12,222,303
- Issue date Feb 11, 2025
- Rigaku Corporation
- Naoki Matsushima
- G01 - MEASURING TESTING
Information Patent Grant
Transmissive small-angle scattering device
- Patent number 12,019,036
- Issue date Jun 25, 2024
- Rigaku Corporation
- Naoki Matsushima
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for compact, small spot size soft x-ray scatter...
- Patent number 12,013,355
- Issue date Jun 18, 2024
- KLA Corporation
- David Y. Wang
- G01 - MEASURING TESTING
Information Patent Grant
System and method to adjust a kinetics model of surface reactions d...
- Patent number 11,966,203
- Issue date Apr 23, 2024
- KLA Corporation
- Ankur Agarwal
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for measuring a sample by x-ray reflectance scatt...
- Patent number 11,874,237
- Issue date Jan 16, 2024
- NOVA MEASURING INSTRUMENTS INC.
- Heath Pois
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
X-ray scattering apparatus
- Patent number 11,835,474
- Issue date Dec 5, 2023
- XENOCS SAS
- Karsten Joensen
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray scattering apparatus
- Patent number 11,796,485
- Issue date Oct 24, 2023
- XENOCS SAS
- Peter Hoghoj
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Transmission X-ray critical dimension (T-XCD) characterization of s...
- Patent number 11,761,913
- Issue date Sep 19, 2023
- BRUKER TECHNOLOGIES LTD.
- Adam Ginsburg
- G01 - MEASURING TESTING
Information Patent Grant
Transmissive small-angle scattering device
- Patent number 11,754,515
- Issue date Sep 12, 2023
- Rigaku Corporation
- Naoki Matsushima
- G01 - MEASURING TESTING
Information Patent Grant
Small angle x-ray scattering methods for characterizing the iron co...
- Patent number 11,726,049
- Issue date Aug 15, 2023
- Amphastar Pharmaceuticals, Inc.
- Jack Yongfeng Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor metrology and inspection based on an x-ray source wit...
- Patent number 11,719,652
- Issue date Aug 8, 2023
- KLA Corporation
- Yung-Ho Alex Chuang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Single piece droplet generation and injection device for serial cry...
- Patent number 11,624,718
- Issue date Apr 11, 2023
- Arizona Board of Regents on behalf of Arizona State University
- Alexandra Ros
- G01 - MEASURING TESTING
Information Patent Grant
Substance identification device and method for extracting statistic...
- Patent number 11,619,599
- Issue date Apr 4, 2023
- Tsinghua University
- Zhi Zeng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Detection scheme for x-ray small angle scattering
- Patent number 11,592,406
- Issue date Feb 28, 2023
- Rensselaer Polytechnic Institute
- Ge Wang
- G01 - MEASURING TESTING
Information Patent Grant
Non-invasive and remote method to screen cancer
- Patent number 11,561,187
- Issue date Jan 24, 2023
- Council of Scientific and Industrial Research
- Amin Sagar
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for real time measurement control
- Patent number 11,519,869
- Issue date Dec 6, 2022
- KLA-Tencor Corporation
- Antonio Arion Gellineau
- G01 - MEASURING TESTING
Information Patent Grant
Analysis method for fine structure, and apparatus and program thereof
- Patent number 11,408,837
- Issue date Aug 9, 2022
- Rigaku Corporation
- Yoshiyasu Ito
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for semiconductor metrology based on polychroma...
- Patent number 11,333,621
- Issue date May 17, 2022
- KLA-Tencor Corporation
- Daniel Wack
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Detection scheme for x-ray small angle scattering
- Patent number 11,313,814
- Issue date Apr 26, 2022
- Rensselaer Polytechnic Institute
- Ge Wang
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Dual scan method for detecting a fibre misalignment in an elongated...
- Patent number 11,054,373
- Issue date Jul 6, 2021
- LM WIND POWER US TECHNOLOGY APS
- Klavs Jespersen
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
X-ray scattering method and system for non-destructively inspecting...
- Patent number 11,022,571
- Issue date Jun 1, 2021
- The Boeing Company
- Morteza Safai
- G01 - MEASURING TESTING
Information Patent Grant
X-ray metrology system with broadband laser produced plasma illumin...
- Patent number 10,959,318
- Issue date Mar 23, 2021
- KLA-Tencor Corporation
- Oleg Khodykin
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for measuring periodic structures using multi-a...
- Patent number 10,859,519
- Issue date Dec 8, 2020
- NOVA MEASURING INSTRUMENTS, INC.
- Heath A. Pois
- G01 - MEASURING TESTING
Information Patent Grant
Method of analyzing an object in two stages using a transmission sp...
- Patent number 10,605,749
- Issue date Mar 31, 2020
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Caroline Paulus
- G01 - MEASURING TESTING
Information Patent Grant
Calibration of a small angle X-ray scatterometry based metrology sy...
- Patent number 10,481,111
- Issue date Nov 19, 2019
- KLA-Tencor Corporation
- John Hench
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Methods and systems for measuring periodic structures using multi-a...
- Patent number 10,481,112
- Issue date Nov 19, 2019
- Nova Measuring Instruments Inc.
- Heath A. Pois
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
X-ray small angle optical system
- Patent number 10,429,325
- Issue date Oct 1, 2019
- Rigaku Corporation
- Kazuki Ito
- G01 - MEASURING TESTING
Information Patent Grant
Method, system, and equipment for glass material processing as a fu...
- Patent number 10,399,882
- Issue date Sep 3, 2019
- Corning Incorporated
- Sara Ann Cole
- C03 - GLASS MINERAL OR SLAG WOOL
Information Patent Grant
Sample holder for X-ray analysis
- Patent number 10,359,376
- Issue date Jul 23, 2019
- Malvern Panalytical B.V.
- Vladimir Kogan
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD FOR MEASURING A SAMPLE BY X-RAY REFLECTANCE SCATT...
- Publication number 20240345006
- Publication date Oct 17, 2024
- NOVA MEASURING INSTRUMENTS INC.
- Heath POIS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ANALYSIS APPARATUS, ANALYSIS METHOD, AND ANALYSIS PROGRAM
- Publication number 20240319121
- Publication date Sep 26, 2024
- Rigaku Corporation
- Yoshiyasu ITO
- G01 - MEASURING TESTING
Information Patent Application
HIGH-THROUGHPUT HIGH-PRESSURE SMALL-ANGLE NEUTRON SCATTERING SAMPLE...
- Publication number 20240272096
- Publication date Aug 15, 2024
- STF Technologies LLC
- Norman J. Wagner
- G01 - MEASURING TESTING
Information Patent Application
INFORMATION PROCESSING DEVICE, INFORMATION PROCESSING METHOD, AND C...
- Publication number 20240159690
- Publication date May 16, 2024
- Toyota Jidosha Kabushiki Kaisha
- Hanae SHIRATORI
- G01 - MEASURING TESTING
Information Patent Application
TRANSMISSIVE SMALL-ANGLE SCATTERING DEVICE
- Publication number 20230384248
- Publication date Nov 30, 2023
- Rigaku Corporation
- Naoki Matsushima
- G01 - MEASURING TESTING
Information Patent Application
TRANSMISSIVE SMALL-ANGLE SCATTERING DEVICE
- Publication number 20230375485
- Publication date Nov 23, 2023
- Rigaku Corporation
- Naoki Matsushima
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION DEVICE AND INSPECTION METHOD
- Publication number 20230324317
- Publication date Oct 12, 2023
- KIOXIA Corporation
- Takahiro IKEDA
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF EVALUATING ANISOTROPY AND ANISOTROPY EVALUATION APPARATUS
- Publication number 20230288348
- Publication date Sep 14, 2023
- Rigaku Corporation
- Masashi KAGEYAMA
- G01 - MEASURING TESTING
Information Patent Application
SINGLE PIECE DROPLET GENERATION AND INJECTION DEVICE FOR SERIAL CRY...
- Publication number 20230243765
- Publication date Aug 3, 2023
- Alexandra Ros
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
SMALL ANGLE X-RAY SCATTERING METHODS FOR CHARACTERIZING THE IRON CO...
- Publication number 20230124114
- Publication date Apr 20, 2023
- Amphastar Pharmaceuticals, Inc.
- Jack Yongfeng ZHANG
- G01 - MEASURING TESTING
Information Patent Application
DETECTION SCHEME FOR X-RAY SMALL ANGLE SCATTERING
- Publication number 20220221413
- Publication date Jul 14, 2022
- Rensselaer Polytechnic Institute
- Ge Wang
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
Methods And Systems For Compact, Small Spot Size Soft X-Ray Scatter...
- Publication number 20220196576
- Publication date Jun 23, 2022
- KLA Corporation
- David Y. Wang
- G01 - MEASURING TESTING
Information Patent Application
TRANSMISSIVE SMALL-ANGLE SCATTERING DEVICE
- Publication number 20220170869
- Publication date Jun 2, 2022
- Rigaku Corporation
- Naoki Matsushima
- G01 - MEASURING TESTING
Information Patent Application
DETECTION SCHEME FOR X-RAY SMALL ANGLE SCATTERING
- Publication number 20210080409
- Publication date Mar 18, 2021
- Rensselaer Polytechnic Institute
- Ge Wang
- G01 - MEASURING TESTING
Information Patent Application
SUBSTANCE IDENTIFICATION DEVICE AND METHOD FOR EXTRACTING STATISTIC...
- Publication number 20210025836
- Publication date Jan 28, 2021
- TSINGHUA UNIVERSITY
- Zhi ZENG
- G01 - MEASURING TESTING
Information Patent Application
X-Ray Scattering Method and System for Non-Destructively Inspecting...
- Publication number 20200378905
- Publication date Dec 3, 2020
- The Boeing Company
- Morteza Safai
- G01 - MEASURING TESTING
Information Patent Application
DUAL SCAN METHOD FOR DETECTING A FIBRE MISALIGNMENT IN AN ELONGATED...
- Publication number 20200158664
- Publication date May 21, 2020
- LM WIND POWER US TECHNOLOGY APS
- Klavs JESPERSEN
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR MEASURING PERIODIC STRUCTURES USING MULTI-A...
- Publication number 20200088656
- Publication date Mar 19, 2020
- Nova Measuring Instruments, Inc.
- Heath A. Pois
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS AND SYSTEMS FOR MEASURING PERIODIC STRUCTURES USING MULTI-A...
- Publication number 20190086342
- Publication date Mar 21, 2019
- Nova Measuring Instruments, Inc.
- Heath A. Pois
- G01 - MEASURING TESTING
Information Patent Application
Calibration Of A Small Angle X-Ray Scatterometry Based Metrology Sy...
- Publication number 20180113084
- Publication date Apr 26, 2018
- KLA-Tencor Corporation
- John Hench
- G01 - MEASURING TESTING
Information Patent Application
Sample Holder for X-ray Analysis
- Publication number 20180024081
- Publication date Jan 25, 2018
- PANALYTICAL B.V.
- Vladimir Kogan
- G01 - MEASURING TESTING
Information Patent Application
Beam Shaping Slit For Small Spot Size Transmission Small Angle X-Ra...
- Publication number 20170307548
- Publication date Oct 26, 2017
- KLA-Tencor Corporation
- Alexander Bykanov
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR MEASURING PERIODIC STRUCTURES USING MULTI-A...
- Publication number 20170176354
- Publication date Jun 22, 2017
- Heath A. Pois
- G01 - MEASURING TESTING
Information Patent Application
A Method Of Analyzing An Object In Two Stages Using A Transmission...
- Publication number 20170131224
- Publication date May 11, 2017
- Commissariat A L'Energie Atomique et Aux Energies Alternatives
- Caroline PAULUS
- G01 - MEASURING TESTING
Information Patent Application
X-RAY SMALL ANGLE OPTICAL SYSTEM
- Publication number 20170074809
- Publication date Mar 16, 2017
- Rigaku Corporation
- Kazuki ITO
- G01 - MEASURING TESTING
Information Patent Application
BEAM GENERATION UNIT AND X-RAY SMALL-ANGLE SCATTERING APPARATUS
- Publication number 20170010226
- Publication date Jan 12, 2017
- Rigaku Corporation
- Kazuhiko Omote
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR EVALUATING CROSSLINK CONCENTRATION IN CROSSLINKED RUBBER
- Publication number 20160349196
- Publication date Dec 1, 2016
- Sumitomo Rubber Industries, Ltd.
- Tomomi MASUI
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR ALIGNING TWO PLATES DURING TRANSMISSION SM...
- Publication number 20160187267
- Publication date Jun 30, 2016
- Industrial Technology Research Institute
- Wen-Li Wu
- G01 - MEASURING TESTING
Information Patent Application
ONE-DIMENSIONAL X-RAY DETECTOR WITH CURVED READOUT STRIPS
- Publication number 20140264046
- Publication date Sep 18, 2014
- Bruker AXS, Inc.
- Roger D. Durst
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR INVESTIGATING THE X-RAY RADIOGRAPHIC PROPE...
- Publication number 20140098940
- Publication date Apr 10, 2014
- ANTON PAAR GMBH
- Heimo Schnablegger
- G01 - MEASURING TESTING

small angle scatter

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Single piece droplet generation and injection device for serial cry...

Transmissive small-angle scattering device

Transmissive small-angle scattering device

Methods and systems for compact, small spot size soft x-ray scatter...

System and method to adjust a kinetics model of surface reactions d...

System and method for measuring a sample by x-ray reflectance scatt...

X-ray scattering apparatus

X-ray scattering apparatus

Transmission X-ray critical dimension (T-XCD) characterization of s...

Transmissive small-angle scattering device

Small angle x-ray scattering methods for characterizing the iron co...

Semiconductor metrology and inspection based on an x-ray source wit...

Single piece droplet generation and injection device for serial cry...

Substance identification device and method for extracting statistic...

Detection scheme for x-ray small angle scattering

Non-invasive and remote method to screen cancer

Methods and systems for real time measurement control

Analysis method for fine structure, and apparatus and program thereof

Methods and systems for semiconductor metrology based on polychroma...

Detection scheme for x-ray small angle scattering

Dual scan method for detecting a fibre misalignment in an elongated...

X-ray scattering method and system for non-destructively inspecting...

X-ray metrology system with broadband laser produced plasma illumin...

Methods and systems for measuring periodic structures using multi-a...

Method of analyzing an object in two stages using a transmission sp...

Calibration of a small angle X-ray scatterometry based metrology sy...

Methods and systems for measuring periodic structures using multi-a...

X-ray small angle optical system

Method, system, and equipment for glass material processing as a fu...

Sample holder for X-ray analysis

Patents Applicationslast 30 patents

SYSTEM AND METHOD FOR MEASURING A SAMPLE BY X-RAY REFLECTANCE SCATT...

ANALYSIS APPARATUS, ANALYSIS METHOD, AND ANALYSIS PROGRAM

HIGH-THROUGHPUT HIGH-PRESSURE SMALL-ANGLE NEUTRON SCATTERING SAMPLE...

INFORMATION PROCESSING DEVICE, INFORMATION PROCESSING METHOD, AND C...

TRANSMISSIVE SMALL-ANGLE SCATTERING DEVICE

TRANSMISSIVE SMALL-ANGLE SCATTERING DEVICE

INSPECTION DEVICE AND INSPECTION METHOD

METHOD OF EVALUATING ANISOTROPY AND ANISOTROPY EVALUATION APPARATUS

SINGLE PIECE DROPLET GENERATION AND INJECTION DEVICE FOR SERIAL CRY...

SMALL ANGLE X-RAY SCATTERING METHODS FOR CHARACTERIZING THE IRON CO...

DETECTION SCHEME FOR X-RAY SMALL ANGLE SCATTERING

Methods And Systems For Compact, Small Spot Size Soft X-Ray Scatter...

TRANSMISSIVE SMALL-ANGLE SCATTERING DEVICE

DETECTION SCHEME FOR X-RAY SMALL ANGLE SCATTERING

SUBSTANCE IDENTIFICATION DEVICE AND METHOD FOR EXTRACTING STATISTIC...

X-Ray Scattering Method and System for Non-Destructively Inspecting...

DUAL SCAN METHOD FOR DETECTING A FIBRE MISALIGNMENT IN AN ELONGATED...

METHODS AND SYSTEMS FOR MEASURING PERIODIC STRUCTURES USING MULTI-A...

METHODS AND SYSTEMS FOR MEASURING PERIODIC STRUCTURES USING MULTI-A...

Calibration Of A Small Angle X-Ray Scatterometry Based Metrology Sy...

Sample Holder for X-ray Analysis

Beam Shaping Slit For Small Spot Size Transmission Small Angle X-Ra...

METHODS AND SYSTEMS FOR MEASURING PERIODIC STRUCTURES USING MULTI-A...

A Method Of Analyzing An Object In Two Stages Using A Transmission...

X-RAY SMALL ANGLE OPTICAL SYSTEM

BEAM GENERATION UNIT AND X-RAY SMALL-ANGLE SCATTERING APPARATUS

METHOD FOR EVALUATING CROSSLINK CONCENTRATION IN CROSSLINKED RUBBER

APPARATUS AND METHOD FOR ALIGNING TWO PLATES DURING TRANSMISSION SM...

ONE-DIMENSIONAL X-RAY DETECTOR WITH CURVED READOUT STRIPS

METHOD AND APPARATUS FOR INVESTIGATING THE X-RAY RADIOGRAPHIC PROPE...