SNOM [Scanning Near-field Optical Microscopy] combined with AFM [Atomic Force Microscopy]

Industry

CPC
G01Q60/06

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Parent Industries

GPHYSICS G01Measuring instruments G01QSCANNING-PROBE TECHNIQUES OR APPARATUS APPLICATIONS OF SCANNING-PROBE TECHNIQUES G01Q60/00Particular type of SPM [Scanning Probe Microscopy] or microscopes Essential components thereof

Current Industry

G01Q60/06SNOM [Scanning Near-field Optical Microscopy] combined with AFM [Atomic Force Microscopy]

Industries

Patents Grantslast 30 patents

Information Patent Grant
Integrated III-V/silicon atomic force microscopy active optical probe
- Patent number 12,072,351
- Issue date Aug 27, 2024
- ACTOPROBE LLC
- Alexander A. Ukhanov
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
System and method for a non-tapping mode scattering-type scanning n...
- Patent number 12,000,861
- Issue date Jun 4, 2024
- Lehigh University
- Haomin Wang
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for scanning probe sample property measurement...
- Patent number 11,994,533
- Issue date May 28, 2024
- The Regents of the University of Colorado, a Body Corporate
- Rafael Piestun
- G01 - MEASURING TESTING
Information Patent Grant
System and method for a non-tapping mode scattering-type scanning n...
- Patent number 11,415,597
- Issue date Aug 16, 2022
- Lehigh University
- Haomin Wang
- G01 - MEASURING TESTING
Information Patent Grant
VCSEL-based resonant-cavity-enhanced atomic force microscopy active...
- Patent number 10,663,485
- Issue date May 26, 2020
- ACTOPROBE LLC
- Alexander A. Ukhanov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Compact probe for atomic-force microscopy and atomic-force microsco...
- Patent number 10,527,645
- Issue date Jan 7, 2020
- VMICRO
- Benjamin Walter
- G01 - MEASURING TESTING
Information Patent Grant
Scanning resonator microscopy
- Patent number 10,261,107
- Issue date Apr 16, 2019
- University of Kansas
- Robert Conley Dunn
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for chemical and optical imaging with a broadb...
- Patent number 10,241,131
- Issue date Mar 26, 2019
- Bruker Nano, Inc.
- Craig Prater
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for infrared scattering scanning near-field op...
- Patent number 10,228,389
- Issue date Mar 12, 2019
- Bruker Nano, Inc.
- Honghua Yang
- G01 - MEASURING TESTING
Information Patent Grant
Evaluation system and a method for evaluating a substrate
- Patent number 9,835,563
- Issue date Dec 5, 2017
- Applied Materials Israel Ltd.
- Yoram Uziel
- G01 - MEASURING TESTING
Information Patent Grant
Near-field optical probe manufacturing using organo-mineral materia...
- Patent number 9,043,947
- Issue date May 26, 2015
- Centre National de la Recherche Scientifique
- Pascal Falgayrettes
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and apparatus for inspecting thermal assist type magnetic head
- Patent number 8,787,132
- Issue date Jul 22, 2014
- Hitachi High-Technologies Corporation
- Naoya Saito
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Cantilever of scanning probe microscope and method for manufacturin...
- Patent number 8,713,710
- Issue date Apr 29, 2014
- Hitachi High-Technologies Corporation
- Kaifeng Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Method to obtain absorption spectra from near-field infrared scatte...
- Patent number 8,646,110
- Issue date Feb 4, 2014
- Xiaoji Xu
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscope and method of observing sample using the...
- Patent number 8,635,710
- Issue date Jan 21, 2014
- Hitachi, Ltd.
- Toshihiko Nakata
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Cantilever for scanning probe microscope and scanning probe microsc...
- Patent number 8,601,608
- Issue date Dec 3, 2013
- Japan Science and Technology Agency
- Kenichi Maruyama
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Device and method for an atomic force microscope for the study and...
- Patent number 8,479,311
- Issue date Jul 2, 2013
- Technische Universitat Ilmenau
- Stefan Kubsky
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Non-destructive wafer-scale sub-surface ultrasonic microscopy emplo...
- Patent number 8,322,220
- Issue date Dec 4, 2012
- Veeco Instruments Inc.
- Craig Prater
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscope and method of observing sample using the...
- Patent number 8,181,268
- Issue date May 15, 2012
- Hitachi, Ltd.
- Toshihiko Nakata
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and system for near-field spectroscopy using targeted deposi...
- Patent number 8,108,943
- Issue date Jan 31, 2012
- California Institute of Technology
- Mark S. Anderson
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Microscope probe having an ultra-tall tip
- Patent number 7,861,316
- Issue date Dec 28, 2010
- Wisconsin Alumni Research Foundation
- Daniel Warren van der Weide
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Optical microcantilever
- Patent number 7,496,250
- Issue date Feb 24, 2009
- Seiko Instruments Inc.
- Takashi Niwa
- G01 - MEASURING TESTING
Information Patent Grant
High aspect ratio micromechanical probe tips and methods of fabrica...
- Patent number 7,368,305
- Issue date May 6, 2008
- Wisconsin Alumni Research Foundation
- Daniel W. van der Weide
- G01 - MEASURING TESTING
Information Patent Grant
Optical microcantilever, manufacturing method thereof, and optical...
- Patent number 7,240,541
- Issue date Jul 10, 2007
- Seiko Instruments Inc.
- Takashi Niwa
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for evanescent filed measuring of particle-sol...
- Patent number 7,234,343
- Issue date Jun 26, 2007
- Virginia Tech Intellectual Properties, Inc.
- William Ducker
- G01 - MEASURING TESTING
Information Patent Grant
Optical microcantilever
- Patent number 7,150,185
- Issue date Dec 19, 2006
- Seiko Instruments Inc.
- Takashi Niwa
- G01 - MEASURING TESTING
Information Patent Grant
Object inspection and/or modification system and method
- Patent number 7,109,482
- Issue date Sep 19, 2006
- General Nanotechnology L.L.C.
- Victor B. Kley
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for scanning apertureless fluorescence microscope
- Patent number 6,953,927
- Issue date Oct 11, 2005
- California Institute of Technology
- Stephen R. Quake
- G01 - MEASURING TESTING
Information Patent Grant
Optical microcantilever
- Patent number 6,834,537
- Issue date Dec 28, 2004
- Seiko Instruments Inc.
- Takashi Niwa
- G01 - MEASURING TESTING
Information Patent Grant
Aperture in a semiconductor material, and the production and use th...
- Patent number 6,794,296
- Issue date Sep 21, 2004
- Universitat Gesamthochschule Kassel
- Rainer Kassing
- B81 - MICRO-STRUCTURAL TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
SCATTERING-TYPE SCANNING NEAR-FIELD OPTICAL MICROSCOPY WITH AKIYAMA...
- Publication number 20240272196
- Publication date Aug 15, 2024
- The Research Foundation for the State University of New York
- Michael DAPOLITO
- G01 - MEASURING TESTING
Information Patent Application
System and Method for a Non-Tapping Mode Scattering-Type Scanning N...
- Publication number 20220390485
- Publication date Dec 8, 2022
- LEHIGH UNIVERSITY
- Haomin Wang
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR SCANNING PROBE MICROSCOPY APPLICATIONS AND METHOD FOR OB...
- Publication number 20210318352
- Publication date Oct 14, 2021
- Consejo Superior de Investigaciones Cientificas (CSIC)
- Lidia MARTINEZ ORELLANA
- G01 - MEASURING TESTING
Information Patent Application
Methods And Systems For Scanning Probe Sample Property Measurement...
- Publication number 20210080484
- Publication date Mar 18, 2021
- The Regents of the University of Colorado, a Body Corporate
- Rafael Piestun
- G01 - MEASURING TESTING
Information Patent Application
System and Method for a Non-Tapping Mode Scattering-Type Scanning N...
- Publication number 20210041477
- Publication date Feb 11, 2021
- LEHIGH UNIVERSITY
- Haomin Wang
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR SUPERIMPOSING AT LEAST TWO IMAGES OF A PHOTOL...
- Publication number 20200409255
- Publication date Dec 31, 2020
- Carl Zeiss SMT GMBH
- Gilles Tabbone
- G01 - MEASURING TESTING
Information Patent Application
COMPACT PROBE FOR ATOMIC-FORCE MICROSCOPY AND ATOMIC-FORCE MICROSCO...
- Publication number 20180203037
- Publication date Jul 19, 2018
- CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE
- Benjamin WALTER
- G01 - MEASURING TESTING
Information Patent Application
SCANNING RESONATOR MICROSCOPY
- Publication number 20180095107
- Publication date Apr 5, 2018
- Robert Conley Dunn
- G01 - MEASURING TESTING
Information Patent Application
SNOM SYSTEM WITH LASER-DRIVEN PLASMA SOURCE
- Publication number 20170067934
- Publication date Mar 9, 2017
- Xiaoji Xu
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus of Physical Property Measurement Using a Probe...
- Publication number 20140259234
- Publication date Sep 11, 2014
- Bruker Nano, Inc.
- Markus B. Raschke
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR INSPECTING THERMAL ASSIST TYPE MAGNETIC HEAD
- Publication number 20140092716
- Publication date Apr 3, 2014
- Hitachi High-Technologies Corporation
- Naoya SAITO
- B82 - NANO-TECHNOLOGY
Information Patent Application
NEAR-FIELD OPTICAL PROBE MANUFACTURING USING ORGANO-MINERAL MATERIA...
- Publication number 20130298295
- Publication date Nov 7, 2013
- UNIVERSITE MONTPELLIER 2 SCIENCES ET TECHNIQUES
- Pascal Falgayrettes
- B82 - NANO-TECHNOLOGY
Information Patent Application
NEAR FIELD OPTICAL MICROSCOPE WITH OPTICAL IMAGING SYSTEM
- Publication number 20130145505
- Publication date Jun 6, 2013
- Neaspec GmbH
- Nenad Ocelic
- B82 - NANO-TECHNOLOGY
Information Patent Application
Cantilever of Scanning Probe Microscope and Method for Manufacturin...
- Publication number 20130097739
- Publication date Apr 18, 2013
- Kaifeng Zhang
- B82 - NANO-TECHNOLOGY
Information Patent Application
Scanning Probe Microscope and Method of Observing Sample Using the...
- Publication number 20120204297
- Publication date Aug 9, 2012
- HITACHI, LTD.
- Toshihiko Nakata
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR AN ATOMIC FORCE MICROSCOPE FOR THE STUDY AND...
- Publication number 20110055985
- Publication date Mar 3, 2011
- TECHNISCHE UNIVERSITÄT ILMENAU
- Stefan Kubsky
- G01 - MEASURING TESTING
Information Patent Application
Scanning Probe Microscope and Method of Observing Sample Using the...
- Publication number 20100325761
- Publication date Dec 23, 2010
- Hitachi, Ltd
- Toshihiko Nakata
- G01 - MEASURING TESTING
Information Patent Application
Cantilever for Scanning Probe Microscope and Scanning Probe Microsc...
- Publication number 20100154085
- Publication date Jun 17, 2010
- Kenichi Maruyama
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR NEAR-FIELD SPECTROSCOPY USING TARGETED DEPOSI...
- Publication number 20090249520
- Publication date Oct 1, 2009
- California Institute of Technology
- Mark S. Anderson
- G01 - MEASURING TESTING
Information Patent Application
Scanning device with a probe having an organic material
- Publication number 20090134025
- Publication date May 28, 2009
- Max Shtein
- G01 - MEASURING TESTING
Information Patent Application
NON-DESTRUCTIVE WAFER-SCALE SUB-SURFACE ULTRASONIC MICROSCOPY EMPLO...
- Publication number 20080276695
- Publication date Nov 13, 2008
- VEECO INSTRUMENTS INC.
- Craig Prater
- G01 - MEASURING TESTING
Information Patent Application
MICROSCOPE PROBE HAVING AN ULTRA-TALL TIP
- Publication number 20080135749
- Publication date Jun 12, 2008
- WISCONSIN ALUMNI RESEARCH FOUNDATION
- Daniel Warren van der Weide
- G01 - MEASURING TESTING
Information Patent Application
Optical microcantilever, manufacturing method thereof, and optical...
- Publication number 20070211986
- Publication date Sep 13, 2007
- Takashi Niwa
- G01 - MEASURING TESTING
Information Patent Application
Object inspection and/or modification system and method
- Publication number 20070114402
- Publication date May 24, 2007
- General Nanotechnology LLC
- Victor B. Kley
- G01 - MEASURING TESTING
Information Patent Application
Optical microcantilever, manufacturing method thereof, and optical...
- Publication number 20070062266
- Publication date Mar 22, 2007
- Takashi Niwa
- G01 - MEASURING TESTING
Information Patent Application
High aspect ratio micromechanical probe tips and methods of fabrica...
- Publication number 20060278825
- Publication date Dec 14, 2006
- Daniel W. van der Weide
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for evanescent field measuring of particle-sol...
- Publication number 20060005615
- Publication date Jan 12, 2006
- Virginia Tech Intellectual Properties, Inc.
- William Ducker
- G01 - MEASURING TESTING
Information Patent Application
Object inspection and/or modification system and method
- Publication number 20050056783
- Publication date Mar 17, 2005
- General Nanotechnology, LLC
- Victor B. Kley
- G01 - MEASURING TESTING
Information Patent Application
Optical microcantilever, manufacturing method thereof, and optical...
- Publication number 20050039523
- Publication date Feb 24, 2005
- Seiko Instruments Inc.
- Takashi Niwa
- G01 - MEASURING TESTING
Information Patent Application
Method and system for scanning apertureless fluorescence microscope
- Publication number 20040089816
- Publication date May 13, 2004
- California Institute of Technology
- Stephen R. Quake
- G02 - OPTICS

SNOM [Scanning Near-field Optical Microscopy] combined with AFM [Atomic Force Microscopy]

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Integrated III-V/silicon atomic force microscopy active optical probe

System and method for a non-tapping mode scattering-type scanning n...

Methods and systems for scanning probe sample property measurement...

System and method for a non-tapping mode scattering-type scanning n...

VCSEL-based resonant-cavity-enhanced atomic force microscopy active...

Compact probe for atomic-force microscopy and atomic-force microsco...

Scanning resonator microscopy

Method and apparatus for chemical and optical imaging with a broadb...

Method and apparatus for infrared scattering scanning near-field op...

Evaluation system and a method for evaluating a substrate

Near-field optical probe manufacturing using organo-mineral materia...

Method and apparatus for inspecting thermal assist type magnetic head

Cantilever of scanning probe microscope and method for manufacturin...

Method to obtain absorption spectra from near-field infrared scatte...

Scanning probe microscope and method of observing sample using the...

Cantilever for scanning probe microscope and scanning probe microsc...

Device and method for an atomic force microscope for the study and...

Non-destructive wafer-scale sub-surface ultrasonic microscopy emplo...

Scanning probe microscope and method of observing sample using the...

Method and system for near-field spectroscopy using targeted deposi...

Microscope probe having an ultra-tall tip

Optical microcantilever

High aspect ratio micromechanical probe tips and methods of fabrica...

Optical microcantilever, manufacturing method thereof, and optical...

Method and apparatus for evanescent filed measuring of particle-sol...

Optical microcantilever

Object inspection and/or modification system and method

Method and system for scanning apertureless fluorescence microscope

Optical microcantilever

Aperture in a semiconductor material, and the production and use th...

Patents Applicationslast 30 patents

SCATTERING-TYPE SCANNING NEAR-FIELD OPTICAL MICROSCOPY WITH AKIYAMA...

System and Method for a Non-Tapping Mode Scattering-Type Scanning N...

SYSTEM FOR SCANNING PROBE MICROSCOPY APPLICATIONS AND METHOD FOR OB...

Methods And Systems For Scanning Probe Sample Property Measurement...

System and Method for a Non-Tapping Mode Scattering-Type Scanning N...

METHOD AND DEVICE FOR SUPERIMPOSING AT LEAST TWO IMAGES OF A PHOTOL...

COMPACT PROBE FOR ATOMIC-FORCE MICROSCOPY AND ATOMIC-FORCE MICROSCO...

SCANNING RESONATOR MICROSCOPY

SNOM SYSTEM WITH LASER-DRIVEN PLASMA SOURCE

Method and Apparatus of Physical Property Measurement Using a Probe...

METHOD AND APPARATUS FOR INSPECTING THERMAL ASSIST TYPE MAGNETIC HEAD

NEAR-FIELD OPTICAL PROBE MANUFACTURING USING ORGANO-MINERAL MATERIA...

NEAR FIELD OPTICAL MICROSCOPE WITH OPTICAL IMAGING SYSTEM

Cantilever of Scanning Probe Microscope and Method for Manufacturin...

Scanning Probe Microscope and Method of Observing Sample Using the...

DEVICE AND METHOD FOR AN ATOMIC FORCE MICROSCOPE FOR THE STUDY AND...

Scanning Probe Microscope and Method of Observing Sample Using the...

Cantilever for Scanning Probe Microscope and Scanning Probe Microsc...

METHOD AND SYSTEM FOR NEAR-FIELD SPECTROSCOPY USING TARGETED DEPOSI...

Scanning device with a probe having an organic material

NON-DESTRUCTIVE WAFER-SCALE SUB-SURFACE ULTRASONIC MICROSCOPY EMPLO...

MICROSCOPE PROBE HAVING AN ULTRA-TALL TIP

Optical microcantilever, manufacturing method thereof, and optical...

Object inspection and/or modification system and method

Optical microcantilever, manufacturing method thereof, and optical...

High aspect ratio micromechanical probe tips and methods of fabrica...

Method and apparatus for evanescent field measuring of particle-sol...

Object inspection and/or modification system and method

Optical microcantilever, manufacturing method thereof, and optical...

Method and system for scanning apertureless fluorescence microscope