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G01N2201/061
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PHYSICS
G01
Measuring instruments
G01N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G01N2201/00
Features of devices classified in G01N21/00
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G01N2201/061
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Patents Grants
last 30 patents
Information
Patent Grant
Materials and methods for surface-enhanced Raman scattering (SERS)...
Patent number
12,313,553
Issue date
May 27, 2025
King Fahd University of Petroleum & Minerals
Abdulaziz Abdulrahman Al-Saadi
B22 - CASTING POWDER METALLURGY
Information
Patent Grant
Simultaneous ultrasonic vibration and gas sensing based on a tunabl...
Patent number
12,313,540
Issue date
May 27, 2025
United States Department of Energy
Nageswara Rao Lalam
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Fast multiphoton microscope
Patent number
12,313,548
Issue date
May 27, 2025
Applikate Technologies, Inc.
Michael Levene
G01 - MEASURING TESTING
Information
Patent Grant
System and method for detecting the presence of spores in fields
Patent number
12,313,559
Issue date
May 27, 2025
Universite de Geneve
Jean-Pierre Wolf
A01 - AGRICULTURE FORESTRY ANIMAL HUSBANDRY HUNTING TRAPPING FISHING
Information
Patent Grant
Finishing line automatic inspection system and method
Patent number
12,313,565
Issue date
May 27, 2025
Columbia Insurance Company
Richard Glassell
B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information
Patent Grant
Dual beam single spatial mode laser for handheld libs instruments a...
Patent number
12,316,066
Issue date
May 27, 2025
SciAps, Inc.
David Welford
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Foreign object debris discrimination with modulated laser light
Patent number
12,313,562
Issue date
May 27, 2025
RTX Corporation
Jose-Rodrigo Castillo-Garza
G01 - MEASURING TESTING
Information
Patent Grant
Seamless integrating cavity of monolithic fumed silica
Patent number
12,298,235
Issue date
May 13, 2025
Southwest Research Institute
Thomas Moore
G01 - MEASURING TESTING
Information
Patent Grant
Integrated circuit with improved charge transfer efficiency and ass...
Patent number
12,297,496
Issue date
May 13, 2025
Quantum-Si Incorporated
Eric A. G. Webster
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Miniature multispectral detection system having multiple spectromet...
Patent number
12,292,376
Issue date
May 6, 2025
LIGHTSENSE TECHNOLOGY, INC.
Wade Martin Poteet
G01 - MEASURING TESTING
Information
Patent Grant
Hollow waveguide for gas detection
Patent number
12,287,285
Issue date
Apr 29, 2025
Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
Arjen Boersma
C03 - GLASS MINERAL OR SLAG WOOL
Information
Patent Grant
Microscopic Raman device
Patent number
12,287,290
Issue date
Apr 29, 2025
Shimadzu Corporation
Tomoyo Tao
G01 - MEASURING TESTING
Information
Patent Grant
Ultrafast laser imaging with box lock-in
Patent number
12,281,982
Issue date
Apr 22, 2025
Monstr Sense Technologies, LLC
Eric W. Martin
G01 - MEASURING TESTING
Information
Patent Grant
Homogenized coherent excitation of a sample for determining molecul...
Patent number
12,281,987
Issue date
Apr 22, 2025
Indian Institute of Science
Siva Umapathy
G01 - MEASURING TESTING
Information
Patent Grant
Multi-track Raman well plate reader
Patent number
12,281,986
Issue date
Apr 22, 2025
Horiba Instruments Incorporated
Nicolas Vezard
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for voltage contrast imaging using photoreflect...
Patent number
12,281,992
Issue date
Apr 22, 2025
William W. Chism
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for detecting foodborne pathogens using spectra...
Patent number
12,276,600
Issue date
Apr 15, 2025
Hyperspectral Corp.
Euan Mowat
G01 - MEASURING TESTING
Information
Patent Grant
Temporal magnification spectrometer and performing spectroscopic te...
Patent number
12,276,599
Issue date
Apr 15, 2025
GOVERNMENT OF THE UNITED STATES OF AMERICA, AS REPRESENTED BY THE SECRETARY O...
David Francis Plusquellic
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for appraising genuine product using quantum dot
Patent number
12,276,611
Issue date
Apr 15, 2025
Pusan National University Industry-University Cooperation Foundation
Kwang Seuk Kyhm
G01 - MEASURING TESTING
Information
Patent Grant
Dark-field confocal microscopy measurement apparatus and method bas...
Patent number
12,276,615
Issue date
Apr 15, 2025
Harbin Institute of Technology
Jian Liu
G01 - MEASURING TESTING
Information
Patent Grant
Pulsed-light spectroscopic device
Patent number
12,270,704
Issue date
Apr 8, 2025
Ushio Denki Kabushiki Kaisha
Kazuki Shinoyama
G02 - OPTICS
Information
Patent Grant
Apparatus and method for assessing optical quality of gemstones
Patent number
12,270,765
Issue date
Apr 8, 2025
Gemological Institute of America, Inc.
Hiroshi Takahashi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Gas detection device
Patent number
12,270,759
Issue date
Apr 8, 2025
Kabushiki Kaisha Toshiba
Masatoshi Hirono
G01 - MEASURING TESTING
Information
Patent Grant
Wearable device for differential measurement on pulse rate and bloo...
Patent number
12,268,475
Issue date
Apr 8, 2025
Omni MedSci, Inc.
Mohammed N. Islam
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Opto-fluidic array for radical protein foot-printing
Patent number
12,263,477
Issue date
Apr 1, 2025
GenNext Technologies, Inc.
Scot Randy Weinberger
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
Compact imaging-based sensors
Patent number
12,265,019
Issue date
Apr 1, 2025
ESSENLIX CORPORATION
Stephen Y. Chou
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Hybrid multi-photon microscopy
Patent number
12,265,030
Issue date
Apr 1, 2025
The Rockefeller University
Alipasha Vaziri
G01 - MEASURING TESTING
Information
Patent Grant
Broadband pulsed light source apparatus and spectroscopic measureme...
Patent number
12,259,317
Issue date
Mar 25, 2025
Ushio Denki Kabushiki Kaisha
Junki Sahara
G01 - MEASURING TESTING
Information
Patent Grant
Biological sample image collection device and gene sequencer
Patent number
12,259,310
Issue date
Mar 25, 2025
BGI SHENZHEN
Zhonghai Wang
G01 - MEASURING TESTING
Information
Patent Grant
Time-of-flight sensors co-registered with camera systems
Patent number
12,251,194
Issue date
Mar 18, 2025
Omni MedSci, Inc.
Mohammed N. Islam
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
METHOD FOR LOCALIZING OR TRACKING EMITTERS IN A SAMPLE
Publication number
20250172499
Publication date
May 29, 2025
Abberior Instruments GmbH
Roman Schmidt
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR ENHANCED ROCK WEATHERING MONITORING, REPORTIN...
Publication number
20250164404
Publication date
May 22, 2025
Impossible Sensing LLC
Pablo Sobron
G01 - MEASURING TESTING
Information
Patent Application
SLIM ATR SENSOR WITH A MEASURING AND REFERENCE SIGNAL
Publication number
20250164395
Publication date
May 22, 2025
HAMILTON BONADUZ AG
Christa Flühmann
G01 - MEASURING TESTING
Information
Patent Application
POSITION FEEDBACK SENSOR USING OUT-OF-BAND WAVELENGTHS
Publication number
20250164408
Publication date
May 22, 2025
KLA Corporation
Florian Melsheimer
G05 - CONTROLLING REGULATING
Information
Patent Application
SYSTEMS AND METHODS FOR PHOTOACOUSTIC MICROSCOPY
Publication number
20250164387
Publication date
May 22, 2025
DUKE UNIVERSITY
Junjie YAO
G01 - MEASURING TESTING
Information
Patent Application
Tunable laser spectroscopy system with gas line resolution
Publication number
20250164392
Publication date
May 22, 2025
KineoLabs, Inc.
Walid A. Atia
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Scanning Analyzer for Single Molecule Detection and Methods of Use
Publication number
20250155372
Publication date
May 15, 2025
NOVILUX, LLC
Richard Livingston
G01 - MEASURING TESTING
Information
Patent Application
TECHNOLOGIES FOR PHOTOTHERMAL ACTION-BASED TWO-DIMENSIONAL INFRARED...
Publication number
20250155471
Publication date
May 15, 2025
LEHIGH UNIVERSITY
Xiaoji XU
G01 - MEASURING TESTING
Information
Patent Application
WAFER METROLOGY TECHNOLOGIES
Publication number
20250155486
Publication date
May 15, 2025
FemtoMetrix, Inc.
Viktor Koldiaev
G01 - MEASURING TESTING
Information
Patent Application
CONFOCAL LASER TECHNOLOGY -BASED FULLY AUTOMATIC IMMUNOASSAY ANALYZ...
Publication number
20250155459
Publication date
May 15, 2025
SHANGHAI SAGA BIOTECH CO., LTD.
Xu ZHANG
G01 - MEASURING TESTING
Information
Patent Application
Fluorescence Imaging Flow Cytometry With Enhanced Image Resolution
Publication number
20250155353
Publication date
May 15, 2025
Becton, Dickinson and Company
Eric D. Diebold
G01 - MEASURING TESTING
Information
Patent Application
Apparatus and Methods for Fluorescence Imaging Using Radiofrequency...
Publication number
20250155371
Publication date
May 15, 2025
The Regents of the University of California
Eric D. Diebold
G01 - MEASURING TESTING
Information
Patent Application
DEVICE AND METHOD FOR DETECTION OF ALKALI-SILICA REACTIVITY ON CONC...
Publication number
20250146946
Publication date
May 8, 2025
Board of Trustees of Western Michigan University
Upul Attanayake
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF GENERATING A FLUORESCENT PROPERTY IN A MATERIAL USING A L...
Publication number
20250146936
Publication date
May 8, 2025
GIESECKE+DEVRIENT EPAYMENTS GMBH
Cristina Fabian
G01 - MEASURING TESTING
Information
Patent Application
INSPECTION TOOL AND BARRIER FOR USE THEREIN
Publication number
20250146948
Publication date
May 8, 2025
ASML NETHERLANDS B.V.
Alexander Ludwig KLEIN
G01 - MEASURING TESTING
Information
Patent Application
IMAGE-SENSOR-BASED SCATTERING MEASUREMENT SYSTEM AND METHOD
Publication number
20250137927
Publication date
May 1, 2025
Meta Platforms Technologies, LLC
Jian XU
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR IDENTIFYING DEFECTS IN MATERIALLY INTEGRAL CONNECTIONS
Publication number
20250137937
Publication date
May 1, 2025
Beatrice BENDJUS
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
ACCURATE RAMAN SPECTROSCOPY
Publication number
20250130172
Publication date
Apr 24, 2025
NOVA LTD
Elad Schleifer
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS AND METHODS FOR THE ESTIMATION OF SOIL UNCONFINED COMPRES...
Publication number
20250123214
Publication date
Apr 17, 2025
KING FAHD UNIVERSITY OF PETROLEUM AND MINERALS
Yakubu Sani WUDIL
G01 - MEASURING TESTING
Information
Patent Application
SQUEEZED LIGHT GENERATION WITH A TRIPLY-COUPLED OPTICAL RESONATOR A...
Publication number
20250123205
Publication date
Apr 17, 2025
RTX BBN Technologies, Inc.
Moe D. Soltani
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS AND METHOD FOR SHORTWAVE INFRARED PHOTOTHERMAL (SWIP) MIC...
Publication number
20250116852
Publication date
Apr 10, 2025
Trustees of Boston University
Ji-Xin Cheng
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR MONITORING DEFECT OF SEMICONDUCTOR STRUCTURE
Publication number
20250116612
Publication date
Apr 10, 2025
UNIVERSITY-INDUSTRY FOUNDATION(UIF), YONSEI UNIVERSITY
Mann Ho CHO
G01 - MEASURING TESTING
Information
Patent Application
ACCURATE RAMAN SPECTROSCOPY
Publication number
20250116605
Publication date
Apr 10, 2025
NOVA LTD
Eyal Hollander
G01 - MEASURING TESTING
Information
Patent Application
RAMAN MICROSCOPE AND METHOD FOR ADJUSTING SAME
Publication number
20250110324
Publication date
Apr 3, 2025
Shimadzu Corporation
Yuka MORITANI
G01 - MEASURING TESTING
Information
Patent Application
Spectroscopic Ellipsometry With Detector Resolved Numerical Apertur...
Publication number
20250110042
Publication date
Apr 3, 2025
KLA Corporation
Zhengquan Tan
G01 - MEASURING TESTING
Information
Patent Application
Device and Method for Detecting and Removing Contaminants on a Moul...
Publication number
20250100190
Publication date
Mar 27, 2025
BESI NETHERLANDS B.V.
Albertus Franciscus Gerardus van Driel
B08 - CLEANING
Information
Patent Application
ULTRABROADBAND PHOTOCONDUCTION METHOD AND APPARATUS FOR DEFECT DENS...
Publication number
20250102448
Publication date
Mar 27, 2025
Oregon State University
Kyle Timothy Vogt
G01 - MEASURING TESTING
Information
Patent Application
FIBER OPTIC PROFILER FOR EARLY DAMAGE WARNING
Publication number
20250102444
Publication date
Mar 27, 2025
Honeywell International Inc.
Chen FENG
G01 - MEASURING TESTING
Information
Patent Application
OPEN-TOP TWO-PHOTON LIGHT SHEET MICROSCOPE AND OPERATING METHOD THE...
Publication number
20250102786
Publication date
Mar 27, 2025
POSTECH Research and Business Development Foundation
Ki Hean KIM
G01 - MEASURING TESTING
Information
Patent Application
Electronic Devices With Relative Humidity Sensors
Publication number
20250102425
Publication date
Mar 27, 2025
Apple Inc.
Fehmi Civitci
G01 - MEASURING TESTING