Spiral scan

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CPC
G01N2201/1045

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2201/00Features of devices classified in G01N21/00

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G01N2201/1045Spiral scan

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Patents Grantslast 30 patents

Information Patent Grant
Multi-spectral microparticle-fluorescence photon cytometry
- Patent number 11,835,525
- Issue date Dec 5, 2023
- MIFTEK CORPORATION
- Masanobu Yamamoto
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Method of observing objects using a spinning localized observation
- Patent number 11,460,527
- Issue date Oct 4, 2022
- Vassili Peidous
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Recording dynamics of cellular processes
- Patent number 11,255,837
- Issue date Feb 22, 2022
- University of Vienna
- Alipasha Vaziri
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Method and apparatus for characterizing objects
- Patent number 11,041,714
- Issue date Jun 22, 2021
- Vassili Peidous
- G01 - MEASURING TESTING
Information Patent Grant
Transmission Raman spectroscopy
- Patent number 10,876,894
- Issue date Dec 29, 2020
- Renishaw plc
- Timothy Smith
- G02 - OPTICS
Information Patent Grant
Multi-spectral microparticle-fluorescence photon cytometry
- Patent number 10,613,096
- Issue date Apr 7, 2020
- CAPTL LLC
- Masanobu Yamamoto
- G01 - MEASURING TESTING
Information Patent Grant
Recording dynamics of cellular processes
- Patent number 10,317,390
- Issue date Jun 11, 2019
- University of Vienna
- Alipasha Vaziri
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
System and method for surface inspection
- Patent number 10,126,248
- Issue date Nov 13, 2018
- General Electric Company
- Manuel Kenneth Bueno
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection method and defect inspection apparatus
- Patent number 8,922,764
- Issue date Dec 30, 2014
- Hitachi High-Technologies Corporation
- Yuta Urano
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection apparatus
- Patent number 8,477,302
- Issue date Jul 2, 2013
- Hitachi High-Technologies Corporation
- Yuta Urano
- G01 - MEASURING TESTING
Information Patent Grant
System and method of two-stepped laser scattering defect inspection
- Patent number 8,339,593
- Issue date Dec 25, 2012
- Sumco Corporation
- Eiji Kamiyama
- G01 - MEASURING TESTING
Information Patent Grant
Inspection system and method for high-speed serial data transfer
- Patent number 8,139,840
- Issue date Mar 20, 2012
- KLA-Tencor Corporation
- Yunxian Chu
- G01 - MEASURING TESTING
Information Patent Grant
Method of condensed cell slide preparation and detection of rarely...
- Patent number 7,595,874
- Issue date Sep 29, 2009
- Sciperio, Inc.
- Vladimir M. Pelekhaty
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for detecting foreign body on object surface,...
- Patent number 7,239,588
- Issue date Jul 3, 2007
- Matsushita Electric Industrial Co., Ltd.
- Yasuhiro Gotoh
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for inspecting pattern defects
- Patent number 7,218,389
- Issue date May 15, 2007
- Hitachi, Ltd.
- Sachio Uto
- G01 - MEASURING TESTING
Information Patent Grant
Double sided optical inspection of thin film disks or wafers
- Patent number 7,190,447
- Issue date Mar 13, 2007
- KLA-Tencor Technologies Corporation
- Steven W. Meeks
- G01 - MEASURING TESTING
Information Patent Grant
System for detecting anomalies and/or features of a surface
- Patent number 7,088,443
- Issue date Aug 8, 2006
- KLA-Tencor Technologies Corporation
- Mehdi Vaez-Iravani
- G01 - MEASURING TESTING
Information Patent Grant
System and method for double sided optical inspection of thin film...
- Patent number 7,061,601
- Issue date Jun 13, 2006
- KLA-Tencor Technologies Corporation
- Steven W. Meeks
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for surface inspection by specular interferome...
- Patent number 5,875,029
- Issue date Feb 23, 1999
- Phase Metrics, Inc.
- Peter C. Jann
- G01 - MEASURING TESTING
Information Patent Grant
Egg candling system
- Patent number 5,615,777
- Issue date Apr 1, 1997
- FPS Food Processing Systems
- Frank L. Weichman
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for surface inspection
- Patent number 5,377,001
- Issue date Dec 27, 1994
- Tet Techno Trust Investment Settlement
- Cosmas Malin
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for surface inspections
- Patent number 5,377,002
- Issue date Dec 27, 1994
- Tet Techno Trust Investment Settlement
- Comas Malin
- G01 - MEASURING TESTING
Information Patent Grant
Method for testing components of transparent material for surface i...
- Patent number 4,841,139
- Issue date Jun 20, 1989
- Battelle-Institut e.V.
- Harald Schmalfuss
- G01 - MEASURING TESTING
Information Patent Grant
Test system for optical disks
- Patent number 4,832,487
- Issue date May 23, 1989
- Yokogawa Electric Corporation
- Kenta Mikuriya
- G11 - INFORMATION STORAGE
Information Patent Grant
Device for illuminating components of transparent material in testi...
- Patent number 4,822,165
- Issue date Apr 18, 1989
- Battelle-Institut e.V.
- Harald Schmalfuss
- G01 - MEASURING TESTING
Information Patent Grant
Device for testing components of transparent material for surface i...
- Patent number 4,815,844
- Issue date Mar 28, 1989
- Battelle-Institut e.V.
- Harald Schmalfuss
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for scanning a laser beam to examine the surfa...
- Patent number 4,800,268
- Issue date Jan 24, 1989
- Kabushiki Kaisha Toshiba
- Motosuke Miyoshi
- G01 - MEASURING TESTING
Information Patent Grant
Method of and apparatus for real-time crystallographic axis orienta...
- Patent number 4,747,684
- Issue date May 31, 1988
- The United States of America as represented by the Secretary of the Army
- Sidney Weiser
- G01 - MEASURING TESTING
Information Patent Grant
Surface defect inspecting apparatus
- Patent number 4,626,101
- Issue date Dec 2, 1986
- Kabushiki Kaisha Toshiba
- Shigeru Ogawa
- G01 - MEASURING TESTING
Information Patent Grant
System for checking defects on a flat surface of an object
- Patent number 4,508,450
- Issue date Apr 2, 1985
- Olympus Optical Co., Ltd.
- Ken Ohshima
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
RECORDING DYNAMICS OF CELLULAR PROCESSES
- Publication number 20190277827
- Publication date Sep 12, 2019
- UNIVERSITY OF VIENNA
- Alipasha Vaziri
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
TRANSMISSION RAMAN SPECTROSCOPY
- Publication number 20180045570
- Publication date Feb 15, 2018
- RENISHAW PLC
- Timothy SMITH
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR SURFACE INSPECTION
- Publication number 20170234806
- Publication date Aug 17, 2017
- GENERAL ELECTRIC COMPANY
- Manuel Kenneth Bueno
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTION METHOD AND DEFECT INSPECTION APPARATUS
- Publication number 20130301042
- Publication date Nov 14, 2013
- Hitachi High-Technologies Corporation
- Yuta Urano
- G01 - MEASURING TESTING
Information Patent Application
LASER SCATTERING DEFECT INSPECTION SYSTEM AND LASER SCATTERING DEFE...
- Publication number 20100085561
- Publication date Apr 8, 2010
- SUMCO CORPORATION
- Eiji KAMIYAMA
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTION APPARATUS
- Publication number 20090279081
- Publication date Nov 12, 2009
- Yuta Urano
- G01 - MEASURING TESTING
Information Patent Application
SYNCHRONIZED WAFER MAPPING
- Publication number 20080151259
- Publication date Jun 26, 2008
- Woo Sik Yoo
- G01 - MEASURING TESTING
Information Patent Application
System for Detecting Anomalies and/or Features of a Surface
- Publication number 20060256327
- Publication date Nov 16, 2006
- KLA-Tencor Technologies Corporation
- Mehdi Vaez-Iravani
- G01 - MEASURING TESTING
Information Patent Application
Double sided optical inspection of thin film disks or wafers
- Publication number 20060152716
- Publication date Jul 13, 2006
- Steven W. Meeks
- G01 - MEASURING TESTING
Information Patent Application
System for detecting anomalies and/or features of a surface
- Publication number 20060038984
- Publication date Feb 23, 2006
- Mehdi Vaez-Iravani
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for detecting foriegn body on object surface,...
- Publication number 20050230647
- Publication date Oct 20, 2005
- Yasuhiro Gotoh
- G01 - MEASURING TESTING
Information Patent Application
System and method for double sided optical inspection of thin film...
- Publication number 20040169850
- Publication date Sep 2, 2004
- Steven W. Meeks
- G01 - MEASURING TESTING
Information Patent Application
System for detecting anomalies and/or features of a surface
- Publication number 20040156042
- Publication date Aug 12, 2004
- Mehdi Vaez-Iravani
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for inspecting pattern defects
- Publication number 20030210391
- Publication date Nov 13, 2003
- Sachio Uto
- G01 - MEASURING TESTING

Spiral scan

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Multi-spectral microparticle-fluorescence photon cytometry

Method of observing objects using a spinning localized observation

Recording dynamics of cellular processes

Method and apparatus for characterizing objects

Transmission Raman spectroscopy

Multi-spectral microparticle-fluorescence photon cytometry

Recording dynamics of cellular processes

System and method for surface inspection

Defect inspection method and defect inspection apparatus

Defect inspection apparatus

System and method of two-stepped laser scattering defect inspection

Inspection system and method for high-speed serial data transfer

Method of condensed cell slide preparation and detection of rarely...

Method and apparatus for detecting foreign body on object surface,...

Method and apparatus for inspecting pattern defects

Double sided optical inspection of thin film disks or wafers

System for detecting anomalies and/or features of a surface

System and method for double sided optical inspection of thin film...

Apparatus and method for surface inspection by specular interferome...

Egg candling system

Apparatus for surface inspection

Apparatus for surface inspections

Method for testing components of transparent material for surface i...

Test system for optical disks

Device for illuminating components of transparent material in testi...

Device for testing components of transparent material for surface i...

Method and apparatus for scanning a laser beam to examine the surfa...

Method of and apparatus for real-time crystallographic axis orienta...

Surface defect inspecting apparatus

System for checking defects on a flat surface of an object

Patents Applicationslast 30 patents

RECORDING DYNAMICS OF CELLULAR PROCESSES

TRANSMISSION RAMAN SPECTROSCOPY

SYSTEM AND METHOD FOR SURFACE INSPECTION

DEFECT INSPECTION METHOD AND DEFECT INSPECTION APPARATUS

LASER SCATTERING DEFECT INSPECTION SYSTEM AND LASER SCATTERING DEFE...

DEFECT INSPECTION APPARATUS

SYNCHRONIZED WAFER MAPPING

System for Detecting Anomalies and/or Features of a Surface

Double sided optical inspection of thin film disks or wafers

System for detecting anomalies and/or features of a surface

Method and apparatus for detecting foriegn body on object surface,...

System and method for double sided optical inspection of thin film...

System for detecting anomalies and/or features of a surface

Method and apparatus for inspecting pattern defects