Step by step routines describing the use of the apparatus

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H01J49/0031

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HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J49/00Particle spectrometer or separator tubes

Current Industry

H01J49/0031Step by step routines describing the use of the apparatus

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Patents Grantslast 30 patents

Information Patent Grant
Charged particle detector
- Patent number 12,224,170
- Issue date Feb 11, 2025
- ADAPTAS SOLUTIONS PTY LTD
- Wayne Sheils
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system to align the firing of a laser ablation apparatus...
- Patent number 12,211,683
- Issue date Jan 28, 2025
- Nicholas Russell West
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test device and test method for isotope measurement of noble gases...
- Patent number 12,209,966
- Issue date Jan 28, 2025
- INSTITUTE OF GEOLOGY AND GEOPHYSICS, CHINESE ACADEMY OF SCIENCES
- Xuhang Zhang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Vitamin B2 detection by mass spectrometry
- Patent number 12,196,742
- Issue date Jan 14, 2025
- Quest Diagnostics Investments Incorporated
- Changming Yang
- G01 - MEASURING TESTING
Information Patent Grant
Ion guide geometry improvements
- Patent number 12,198,919
- Issue date Jan 14, 2025
- Thermo Finnigan LLC.
- Mikhail V Ugarov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion analyzer
- Patent number 12,198,920
- Issue date Jan 14, 2025
- Shimadzu Corporation
- Masaru Nishiguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometry assay for congenital adrenal hyperplasia
- Patent number 12,196,765
- Issue date Jan 14, 2025
- Quest Diagnostics Investments Incorporated
- Amit Ghoshal
- G01 - MEASURING TESTING
Information Patent Grant
Mass filter having reduced contamination
- Patent number 12,183,565
- Issue date Dec 31, 2024
- Micromass UK Limited
- Martin Raymond Green
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometry method for measuring vitamin B6 in body fluid
- Patent number 12,165,861
- Issue date Dec 10, 2024
- Quest Diagnostics Investments Incorporated
- Qibo Jiang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of characterization of visible and/or sub-visible particles...
- Patent number 12,158,474
- Issue date Dec 3, 2024
- REGENERON PHARMACEUTICALS, INC.
- Xiaobin Xu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Two-dimensional mass spectrometry using ion micropacket detection
- Patent number 12,159,777
- Issue date Dec 3, 2024
- Purdue Research Foundation
- Robert Graham Cooks
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inert non-adsorbing crimpable capillaries and devices for adjusting...
- Patent number 12,159,778
- Issue date Dec 3, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Michael Krummen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion trap array for high throughput charge detection mass spectrometry
- Patent number 12,159,780
- Issue date Dec 3, 2024
- The Trustees of Indiana University
- Martin F. Jarrold
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for agricultural contaminant detection
- Patent number 12,159,774
- Issue date Dec 3, 2024
- Arrowhead Center, Inc.
- Gary A. Eiceman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Decoding multiplexed mass spectral data
- Patent number 12,159,775
- Issue date Dec 3, 2024
- Micromass UK Limited
- Richard Denny
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Unbiased and high-throughput identification and quantification of h...
- Patent number 12,153,053
- Issue date Nov 26, 2024
- REGENERON PHARMACEUTICALS, INC.
- Haibo Qiu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for collision induced dissociation of ions in a...
- Patent number 12,154,773
- Issue date Nov 26, 2024
- Purdue Research Foundation
- Robert Graham Cooks
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for single particle analysis
- Patent number 12,154,777
- Issue date Nov 26, 2024
- SHANGHAI POLARIS BIOLOGY CO., LTD.
- Yupeng Cheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Analysis system, auxiliary analysis apparatus and analysis method
- Patent number 12,154,775
- Issue date Nov 26, 2024
- Materials Analysis Technology Inc.
- Yu-Teh Chung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device control to maximize system utilization
- Patent number 12,154,774
- Issue date Nov 26, 2024
- Thermo Finnigan LLC.
- Johnathan W. Smith
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for the acoustic loading of an analytical instrum...
- Patent number 12,154,776
- Issue date Nov 26, 2024
- Labcyte Inc.
- Sammy Datwani
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Complemented ion funnel for mass spectrometer
- Patent number 12,125,692
- Issue date Oct 22, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Alexander A. Makarov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Autofocus sample imaging apparatus and method
- Patent number 12,124,020
- Issue date Oct 22, 2024
- STANDARD BIOTOOLS CANADA INC.
- Daaf Sandkuijl
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dendritic detergents for the analysis of proteins by mass spectrometry
- Patent number 12,122,805
- Issue date Oct 22, 2024
- Oxford University Innovation Limited
- Carol V. Robinson
- C07 - ORGANIC CHEMISTRY
Information Patent Grant
Detection method of metal impurity in wafer
- Patent number 12,107,016
- Issue date Oct 1, 2024
- ZING SEMICONDUCTOR CORPORATION
- Lanlin Wen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wide range electron impact ion source for a mass spectrometer
- Patent number 12,106,953
- Issue date Oct 1, 2024
- Inficon, Inc.
- Norbert Mueller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for the analytical measurement of sample material on a sampl...
- Patent number 12,105,049
- Issue date Oct 1, 2024
- Andreas Haase
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus, system, and method for transferring ions
- Patent number 12,089,932
- Issue date Sep 17, 2024
- Trace Matters Scientific LLC
- Mazdak Taghioskoui
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for filtering ions defined by a targeted charge t...
- Patent number 12,087,570
- Issue date Sep 10, 2024
- Universite de Strasbourg
- Emil Traykov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Collection probe and methods for the use thereof
- Patent number 12,087,566
- Issue date Sep 10, 2024
- Board of Regents, The University of Texas System
- Livia Schiavinato Eberlin
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL

Patents Applicationslast 30 patents

Information Patent Application
MASS SPECTROMETRY METHOD FOR MEASURING VITAMIN B6 IN BODY FLUID
- Publication number 20250054742
- Publication date Feb 13, 2025
- Quest Diagnostics Investments LLC
- Qibo Jiang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR MASS SPECTROMETRY
- Publication number 20250054744
- Publication date Feb 13, 2025
- Ohio State Innovation Foundation
- Abraham BADU-TAWIAH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AUTOFOCUS SAMPLE IMAGING APPARATUS AND METHOD
- Publication number 20250044571
- Publication date Feb 6, 2025
- Standard BioTools Canada Inc.
- Daaf Sandkuijl
- G01 - MEASURING TESTING
Information Patent Application
ION TRAP AND METHOD FOR DETECTING IONS IN AN ION TRAP
- Publication number 20250046591
- Publication date Feb 6, 2025
- Edwards Vacuum LLC
- Nicholai William Salovich
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COMPLEMENTED ION FUNNEL FOR MASS SPECTROMETER
- Publication number 20250037983
- Publication date Jan 30, 2025
- Thermo Fisher Scientific (Bremen) GmbH
- Alexander A. MAKAROV
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
UNBIASED AND HIGH-THROUGHPUT IDENTIFICATION AND QUANTIFICATION OF H...
- Publication number 20250035643
- Publication date Jan 30, 2025
- Regeneron Pharmaceuticals, Inc.
- Haibo Qiu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Integrated Sample Processing System with Multiple Detection Capability
- Publication number 20250027950
- Publication date Jan 23, 2025
- Beckman Coulter, Inc.
- Aaron Hudson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron-Based Fragmentation Method
- Publication number 20250029823
- Publication date Jan 23, 2025
- DH Technologies Development Pte. Ltd.
- John Lawrence CAMPBELL
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Surface Analysis Method and Surface Analysis Apparatus
- Publication number 20250020603
- Publication date Jan 16, 2025
- Shimadzu Corporation
- Osamu FURUHASHI
- G01 - MEASURING TESTING
Information Patent Application
VOLUMETRIC MEASUREMENT OF MICRO DROPLETS
- Publication number 20250018412
- Publication date Jan 16, 2025
- DH Technologies Development Pte. Ltd.
- Thomas R Covey
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Application
OPTIMISED TARGETED ANALYSIS
- Publication number 20250014879
- Publication date Jan 9, 2025
- Micromass UK Limited
- Martin Raymond GREEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NANO-LITER PHOTOIONIZATION MASS SPECTROMETRY ION SOURCE DEVICE AND...
- Publication number 20250006482
- Publication date Jan 2, 2025
- NATIONAL INSTITUTE OF METROLOGY, CHINA
- Xiaoyun GONG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ULTRA HIGH THROUGHPUT SCREENING COMBINED WITH DEFINITIVE TESTING IN...
- Publication number 20240420939
- Publication date Dec 19, 2024
- DH Technologies Development Pte. Ltd.
- Aaron Stella
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEMPERATURE CONTROL PLASMA SOURCE ANALYZER ARRANGEMENT AND TEMPERAT...
- Publication number 20240420941
- Publication date Dec 19, 2024
- GEOMAR Helmholtz Centre for Ocean Research Kiel
- Jan Fietzke
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION DETECTORS
- Publication number 20240420938
- Publication date Dec 19, 2024
- Micromass UK Limited
- David Gordon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS AND SYSTEMS FOR DETERMINING MOLECULAR MASS
- Publication number 20240412962
- Publication date Dec 12, 2024
- DH Technologies Development Pte. Ltd.
- Eva DUCHOSLAV
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR ENHANCING INFORMATION IN DDA MASS SPECTROMETRY
- Publication number 20240404813
- Publication date Dec 5, 2024
- DH Technologies Development Pte. Ltd.
- Stephen A. TATE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AUTOMATIC GAIN CONTROL
- Publication number 20240404808
- Publication date Dec 5, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Hamish Stewart
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and Apparatus for Rapid Mass Spectrometric Calibration
- Publication number 20240395521
- Publication date Nov 28, 2024
- Queen's University at Kingston
- Richard D. Oleschuk
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS FILTER HAVING REDUCED CONTAMINATION
- Publication number 20240395534
- Publication date Nov 28, 2024
- Micromass UK Limited
- Martin Raymond Green
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
System and method for mass spectrometry imaging
- Publication number 20240389905
- Publication date Nov 28, 2024
- Trace Matters Scientific LLC
- Mazdak Taghioskoui
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Systems and Methods for Background Ion Detection in Mass Spectrometry
- Publication number 20240395522
- Publication date Nov 28, 2024
- DH Technologies Development Pte. Ltd.
- Gordana IVOSEV
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF OPERATING A MULTIPOLE DEVICE
- Publication number 20240395533
- Publication date Nov 28, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Hamish Stewart
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGE DETECTION MASS SPECTROMETRY UTILIZING HARMONIC OSCILLATION A...
- Publication number 20240387159
- Publication date Nov 21, 2024
- Thermo Finnigan LLC
- Michael W. Senko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COLLECTION PROBE AND METHODS FOR THE USE THEREOF
- Publication number 20240387161
- Publication date Nov 21, 2024
- Board of Regents, The University of Texas System
- Livia Schiavinato EBERLIN
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
METHOD FOR CORRECTING AGE OF COLUMBITE-TANTALITE BY USING DOUBLE-RE...
- Publication number 20240377344
- Publication date Nov 14, 2024
- INSTITUTE OF GEOLOGY AND GEOPHYSICS CHINESE ACADEMY OF SCIENCES
- Xiaoxiao LING
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION SCREENING METHOD AND SYSTEM FOR MASS SPECTROMETER, HIGH-VOLTAGE...
- Publication number 20240371620
- Publication date Nov 7, 2024
- AUTOBIO LABTEC INSTRUMENTS CO., LTD.
- Keya CAI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH RESOLUTION IMAGING APPARATUS AND METHOD
- Publication number 20240371622
- Publication date Nov 7, 2024
- Standard BioTools Canada Inc.
- Paul Corkum
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS FOR PERFORMING CHARGE DETECTION MASS SPECTROMETRY WITH TEMP...
- Publication number 20240371621
- Publication date Nov 7, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Dmitry Grinfeld
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WAVEFORMS IN AN ION MOBILITY SPECTROMETER
- Publication number 20240361274
- Publication date Oct 31, 2024
- Battelle Memorial Institute
- Adam L. Hollerbach
- H01 - BASIC ELECTRIC ELEMENTS

Step by step routines describing the use of the apparatus

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Charged particle detector

Method and system to align the firing of a laser ablation apparatus...

Test device and test method for isotope measurement of noble gases...

Vitamin B2 detection by mass spectrometry

Ion guide geometry improvements

Ion analyzer

Mass spectrometry assay for congenital adrenal hyperplasia

Mass filter having reduced contamination

Mass spectrometry method for measuring vitamin B6 in body fluid

Method of characterization of visible and/or sub-visible particles...

Two-dimensional mass spectrometry using ion micropacket detection

Inert non-adsorbing crimpable capillaries and devices for adjusting...

Ion trap array for high throughput charge detection mass spectrometry

Apparatus and method for agricultural contaminant detection

Decoding multiplexed mass spectral data

Unbiased and high-throughput identification and quantification of h...

Systems and methods for collision induced dissociation of ions in a...

Systems and methods for single particle analysis

Analysis system, auxiliary analysis apparatus and analysis method

Device control to maximize system utilization

System and method for the acoustic loading of an analytical instrum...

Complemented ion funnel for mass spectrometer

Autofocus sample imaging apparatus and method

Dendritic detergents for the analysis of proteins by mass spectrometry

Detection method of metal impurity in wafer

Wide range electron impact ion source for a mass spectrometer

Method for the analytical measurement of sample material on a sampl...

Apparatus, system, and method for transferring ions

Method and system for filtering ions defined by a targeted charge t...

Collection probe and methods for the use thereof

Patents Applicationslast 30 patents

MASS SPECTROMETRY METHOD FOR MEASURING VITAMIN B6 IN BODY FLUID

METHOD AND APPARATUS FOR MASS SPECTROMETRY

AUTOFOCUS SAMPLE IMAGING APPARATUS AND METHOD

ION TRAP AND METHOD FOR DETECTING IONS IN AN ION TRAP

COMPLEMENTED ION FUNNEL FOR MASS SPECTROMETER

UNBIASED AND HIGH-THROUGHPUT IDENTIFICATION AND QUANTIFICATION OF H...

Integrated Sample Processing System with Multiple Detection Capability

Electron-Based Fragmentation Method

Surface Analysis Method and Surface Analysis Apparatus

VOLUMETRIC MEASUREMENT OF MICRO DROPLETS

OPTIMISED TARGETED ANALYSIS

NANO-LITER PHOTOIONIZATION MASS SPECTROMETRY ION SOURCE DEVICE AND...

ULTRA HIGH THROUGHPUT SCREENING COMBINED WITH DEFINITIVE TESTING IN...

TEMPERATURE CONTROL PLASMA SOURCE ANALYZER ARRANGEMENT AND TEMPERAT...

ION DETECTORS

METHODS AND SYSTEMS FOR DETERMINING MOLECULAR MASS

METHOD FOR ENHANCING INFORMATION IN DDA MASS SPECTROMETRY

AUTOMATIC GAIN CONTROL

Method and Apparatus for Rapid Mass Spectrometric Calibration

MASS FILTER HAVING REDUCED CONTAMINATION

System and method for mass spectrometry imaging

Systems and Methods for Background Ion Detection in Mass Spectrometry

METHOD OF OPERATING A MULTIPOLE DEVICE

CHARGE DETECTION MASS SPECTROMETRY UTILIZING HARMONIC OSCILLATION A...

COLLECTION PROBE AND METHODS FOR THE USE THEREOF

METHOD FOR CORRECTING AGE OF COLUMBITE-TANTALITE BY USING DOUBLE-RE...

ION SCREENING METHOD AND SYSTEM FOR MASS SPECTROMETER, HIGH-VOLTAGE...

HIGH RESOLUTION IMAGING APPARATUS AND METHOD

METHODS FOR PERFORMING CHARGE DETECTION MASS SPECTROMETRY WITH TEMP...

WAVEFORMS IN AN ION MOBILITY SPECTROMETER