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Stereoscopic measurements and/or imaging
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H01J2237/2611
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H
ELECTRICITY
H01
Electric elements
H01J
ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
H01J2237/00
Discharge tubes exposing object to beam
Current Industry
H01J2237/2611
Stereoscopic measurements and/or imaging
Industries
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Impact
Patents Grants
last 30 patents
Information
Patent Grant
Systems and methods for real time stereo imaging using multiple ele...
Patent number
11,942,303
Issue date
Mar 26, 2024
ASML Netherlands B.V.
Yan Ren
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Atom probe inspection device, field ion microscope, and distortion...
Patent number
10,916,405
Issue date
Feb 9, 2021
TOSHIBA MEMORY CORPORATION
Takahiro Ikeda
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Tomographic imaging method
Patent number
10,593,068
Issue date
Mar 17, 2020
FEI Company
Remco Schoenmakers
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Nondestructive sample imaging
Patent number
10,468,230
Issue date
Nov 5, 2019
BAE Systems Information and Electronic Systems Integration Inc.
Eugene M. Lavely
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and device for testing samples by means of an electron or io...
Patent number
10,319,559
Issue date
Jun 11, 2019
Tim Dahmen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of constructing 3D image, image processor, and electron micr...
Patent number
10,132,761
Issue date
Nov 20, 2018
Jeol Ltd.
Yoshitaka Aoyama
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Cross-section processing and observation method and cross-section p...
Patent number
9,966,226
Issue date
May 8, 2018
Hitachi High-Tech Science Corporation
Atsushi Uemoto
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Disparity computation method through stereo matching based on censu...
Patent number
9,786,063
Issue date
Oct 10, 2017
Kyungpook National University Industry-Academic Cooperation Foundation
Byung In Moon
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Charged particle-beam device
Patent number
9,653,256
Issue date
May 16, 2017
Hitachi High-Technologies Corporation
Akira Ikegami
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of performing tomographic imaging of a sample in a charged-p...
Patent number
9,618,460
Issue date
Apr 11, 2017
FEI Company
Remco Schoenmakers
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Alignment and registration targets for multiple-column charged part...
Patent number
9,595,419
Issue date
Mar 14, 2017
Multibeam Corporation
Kevin M. Monahan
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Automated slice milling for viewing a feature
Patent number
9,412,559
Issue date
Aug 9, 2016
FEI Company
Ryan Tanner
G01 - MEASURING TESTING
Information
Patent Grant
Three-dimensional semiconductor image reconstruction apparatus and...
Patent number
9,324,178
Issue date
Apr 26, 2016
Taiwan Semiconductor Manufacturing Company, Ltd.
Wen-Hao Cheng
G01 - MEASURING TESTING
Information
Patent Grant
Charged particle beam device
Patent number
9,287,083
Issue date
Mar 15, 2016
Hitachi High-Technologies Corporation
Shinichi Tomita
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor circuit
Patent number
9,287,088
Issue date
Mar 15, 2016
Kabushiki Kaisha Toshiba
Takahiro Ikeda
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Charged particle beam device and image display method for stereosco...
Patent number
9,202,669
Issue date
Dec 1, 2015
Hitachi High-Technologies Corporation
Tatsuya Hirato
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Charged particle radiation apparatus, and method for displaying thr...
Patent number
9,099,281
Issue date
Aug 4, 2015
Hitachi High-Technologies Corporation
Toshie Yaguchi
G01 - MEASURING TESTING
Information
Patent Grant
Cross-section processing and observation method and cross-section p...
Patent number
9,080,945
Issue date
Jul 14, 2015
Hitachi High-Tech Science Corporation
Atsushi Uemoto
G01 - MEASURING TESTING
Information
Patent Grant
Scanning electron microscope and scanning transmission electron mic...
Patent number
8,878,130
Issue date
Nov 4, 2014
Hitachi High-Technologies Corporation
Hiromi Inada
G01 - MEASURING TESTING
Information
Patent Grant
Electron beam device with tilting and dispersion compensation, and...
Patent number
8,866,102
Issue date
Oct 21, 2014
ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
Jürgen Frosien
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and system for 4D tomography and ultrafast scanning electron...
Patent number
8,841,613
Issue date
Sep 23, 2014
California Institute of Technology
Ahmed H. Zewail
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Pattern evaluation method, device therefor, and electron beam device
Patent number
8,816,277
Issue date
Aug 26, 2014
Hitachi High-Technologies Corporation
Hiromasa Yamanashi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Automated slice milling for viewing a feature
Patent number
8,759,802
Issue date
Jun 24, 2014
FEI Company
Ryan Tanner
G01 - MEASURING TESTING
Information
Patent Grant
Clustering of multi-modal data
Patent number
8,748,816
Issue date
Jun 10, 2014
FEI Company
Cornelis Sander Kooijman
G01 - MEASURING TESTING
Information
Patent Grant
Charged-particle microscopy with occlusion detection
Patent number
8,698,078
Issue date
Apr 15, 2014
FEI Company
Daniel Woodrow Phifer
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Deconvolution of time-gated cathodoluminescence images
Patent number
8,674,320
Issue date
Mar 18, 2014
Attolight SA
Jean Berney
G01 - MEASURING TESTING
Information
Patent Grant
3D atomic scale imaging methods
Patent number
8,670,608
Issue date
Mar 11, 2014
Cameca Instruments, Inc.
Thomas F. Kelly
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Method of electron diffraction tomography
Patent number
8,476,588
Issue date
Jul 2, 2013
FEI Company
Haifeng He
G01 - MEASURING TESTING
Information
Patent Grant
Automated slice milling for viewing a feature
Patent number
8,350,237
Issue date
Jan 8, 2013
FEI Company
Ryan Tanner
G01 - MEASURING TESTING
Information
Patent Grant
SEM imaging method
Patent number
8,232,523
Issue date
Jul 31, 2012
FEI Company
Faysal Boughorbel
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
SYSTEMS AND METHODS FOR SIGNAL ELECTRON DETECTION IN AN INSPECTION...
Publication number
20230298851
Publication date
Sep 21, 2023
ASML NETHERLANDS B.V.
Chih-Yu JEN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SYSTEMS AND METHODS FOR REAL TIME STEREO IMAGING USING MULTIPLE ELE...
Publication number
20230154723
Publication date
May 18, 2023
ASML NETHERLANDS B.V.
Yan REN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ATOM PROBE INSPECTION DEVICE, FIELD ION MICROSCOPE, AND DISTORTION...
Publication number
20200286711
Publication date
Sep 10, 2020
Toshiba Memory Corporation
Takahiro IKEDA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
NONDESTRUCTIVE SAMPLE IMAGING
Publication number
20190311881
Publication date
Oct 10, 2019
BAE SYSTEMS INFORMATION AND ELECTRONIC SYSTEMS INTEGRATION INC
Eugene M. Lavely
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Electron Microscope and Method of Operating Same
Publication number
20160189924
Publication date
Jun 30, 2016
JEOL Ltd.
Takashi Suzuki
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
APPARATUS OF PLURAL CHARGED PARTICLE BEAMS WITH MULTI-AXIS MAGNETIC...
Publication number
20150060662
Publication date
Mar 5, 2015
HERMES MICROVISION, INC.
Zhongwei Chen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SCANNING ELECTRON MICROSCOPE AND SCANNING TRANSMISSION ELECTRON MIC...
Publication number
20140138542
Publication date
May 22, 2014
Hitachi High-Technologies Corporation
Hiromi Inada
G01 - MEASURING TESTING
Information
Patent Application
CROSS-SECTION PROCESSING AND OBSERVATION METHOD AND CROSS-SECTION P...
Publication number
20140131575
Publication date
May 15, 2014
HITACHI HIGH-TECH SCIENCE CORPORATION
Atsushi UEMOTO
G01 - MEASURING TESTING
Information
Patent Application
Method of Performing Tomographic Imaging of a Sample in a Charged-P...
Publication number
20140070095
Publication date
Mar 13, 2014
FEI Company
Remco Schoenmakers
G01 - MEASURING TESTING
Information
Patent Application
CHARGED PARTICLE BEAM DEVICE AND IMAGE DISPLAY METHOD
Publication number
20140001355
Publication date
Jan 2, 2014
Hitachi High-Technologies Corporation
Tatsuya Hirato
G02 - OPTICS
Information
Patent Application
METHOD OF PREPARING AND IMAGING A LAMELLA IN A PARTICLE-OPTICAL APP...
Publication number
20140007307
Publication date
Jan 2, 2014
Brian Roberts Routh
B82 - NANO-TECHNOLOGY
Information
Patent Application
AUTOMATED SLICE MILLING FOR VIEWING A FEATURE
Publication number
20130306862
Publication date
Nov 21, 2013
FEI Company
RYAN TANNER
G01 - MEASURING TESTING
Information
Patent Application
CHARGED PARTICLE BEAM DEVICE
Publication number
20130299715
Publication date
Nov 14, 2013
Hitachi High-Technologies Corporation
Shinichi Tomita
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Deconvolution of Time-Gated Cathodoluminescence Images
Publication number
20130193342
Publication date
Aug 1, 2013
ATTOLIGHT SA
Jean Berney
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR SAMPLE ANALYSIS BY THREE DIMENSIONAL CATHODOL...
Publication number
20130140459
Publication date
Jun 6, 2013
GATAN, INC.
Simon Galloway
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF CHARACTERIZING A MATERIAL USING THREE DIMENSIONAL RECONST...
Publication number
20130081882
Publication date
Apr 4, 2013
DIAMOND INNOVATIONS, INC.
Yuanbo Lin
G01 - MEASURING TESTING
Information
Patent Application
PATTERN EVALUATION METHOD, DEVICE THEREFOR, AND ELECTRON BEAM DEVICE
Publication number
20130026361
Publication date
Jan 31, 2013
Hitachi High-Technologies Corporation
Hiromasa Yamanashi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
CLUSTERING OF MULTI-MODAL DATA
Publication number
20130015351
Publication date
Jan 17, 2013
FEI Company
Cornelis Sander Kooijman
G01 - MEASURING TESTING
Information
Patent Application
CHARGED-PARTICLE MICROSCOPY WITH OCCLUSION DETECTION
Publication number
20120292503
Publication date
Nov 22, 2012
FEI Company
Daniel Woodrow Phifer, JR.
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SCANNING ELECTRON MICROSCOPE AND INSPECTION METHOD USING SAME
Publication number
20120286158
Publication date
Nov 15, 2012
Yasunari Sohda
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Charged Particle Radiation Apparatus, and Method for Displaying Thr...
Publication number
20120212583
Publication date
Aug 23, 2012
Hitachi High-Technologies Corporation
Toshie Yaguchi
G01 - MEASURING TESTING
Information
Patent Application
Method of Processing of an Object
Publication number
20120145895
Publication date
Jun 14, 2012
CARL ZEISS NTS GMBH
Josef BIBERGER
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
CHARGED PARTICLE BEAM DEVICE AND IMAGE DISPLAY METHOD
Publication number
20120132803
Publication date
May 31, 2012
Hitachi High-Technologies Corporation
Tatsuya Hirato
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Application
ELECTRON BEAM DEVICE WITH TILTING AND DISPERSION COMPENSATION, AND...
Publication number
20120006997
Publication date
Jan 12, 2012
ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik GmbH
Jürgen Frosien
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method of Electron Diffraction Tomography
Publication number
20120001068
Publication date
Jan 5, 2012
FEI Company
Haifeng He
G01 - MEASURING TESTING
Information
Patent Application
Movable Detector for Charged Particle Beam Inspection or Review
Publication number
20110291007
Publication date
Dec 1, 2011
Hermes Microvision, Inc.
YI-XIANG WANG
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD AND SYSTEM FOR 4D TOMOGRAPHY AND ULTRAFAST SCANNING ELECTRON...
Publication number
20110284744
Publication date
Nov 24, 2011
California Institute of Technology
Ahmed H. Zewail
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEM Imaging Method
Publication number
20110266440
Publication date
Nov 3, 2011
FEI Company
Faysal Boughorbel
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
AUTOMATED SLICE MILLING FOR VIEWING A FEATURE
Publication number
20110240852
Publication date
Oct 6, 2011
FEI Company
RYAN TANNER
G01 - MEASURING TESTING
Information
Patent Application
3D atomic scale imaging methods
Publication number
20110103681
Publication date
May 5, 2011
Thomas F. Kelly
B82 - NANO-TECHNOLOGY