STM [Scanning Tunnelling Microscopy] combined with AFM [Atomic Force Microscopy]

Industry

CPC
G01Q60/04

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GPHYSICS G01Measuring instruments G01QSCANNING-PROBE TECHNIQUES OR APPARATUS APPLICATIONS OF SCANNING-PROBE TECHNIQUES G01Q60/00Particular type of SPM [Scanning Probe Microscopy] or microscopes Essential components thereof

Current Industry

G01Q60/04STM [Scanning Tunnelling Microscopy] combined with AFM [Atomic Force Microscopy]

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Multiple integrated tips scanning probe microscope
- Patent number 10,895,585
- Issue date Jan 19, 2021
- Xallent, LLC
- Kwame Amponsah
- G01 - MEASURING TESTING
Information Patent Grant
Multiple integrated tips scanning probe microscope
- Patent number 10,613,115
- Issue date Apr 7, 2020
- Xallent, LLC
- Kwame Amponsah
- G01 - MEASURING TESTING
Information Patent Grant
Microscope having a multimode local probe, tip-enhanced raman micro...
- Patent number 9,366,694
- Issue date Jun 14, 2016
- Ecole Polytechnique
- Marc Chaigneau
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscopy inspection and modification system
- Patent number 8,499,621
- Issue date Aug 6, 2013
- Victor B. Kley
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Sensor for noncontact profiling of a surface
- Patent number 8,393,009
- Issue date Mar 5, 2013
- Franz Josef Giessibl
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Probe microscope and measurement method using the same
- Patent number 8,327,460
- Issue date Dec 4, 2012
- Hitachi, Ltd.
- Kyoko Honbo
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Local injector of spin-polarized electrons with semiconductor tip u...
- Patent number 7,841,016
- Issue date Nov 23, 2010
- Ecole Polytechnique
- Daniel Paget
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscope assembly and method for making spectropho...
- Patent number 7,615,738
- Issue date Nov 10, 2009
- General Nanotechnology, L.L.C.
- Victor B. Kley
- G11 - INFORMATION STORAGE
Information Patent Grant
Microcoaxial probes made from strained semiconductor bilayers
- Patent number 7,485,857
- Issue date Feb 3, 2009
- Wisconsin Alumni Research Foundation
- Robert H. Blick
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscopy inspection and modification system
- Patent number 7,485,856
- Issue date Feb 3, 2009
- General Nanotechnology LLP
- Victor B. Kley
- G11 - INFORMATION STORAGE
Information Patent Grant
Scanning probe characterization of surfaces
- Patent number 7,420,106
- Issue date Sep 2, 2008
- The University of Utah Research Foundation
- Clayton C. Williams
- G01 - MEASURING TESTING
Information Patent Grant
Probe for a scanning microscope
- Patent number 7,398,678
- Issue date Jul 15, 2008
- Daiken Chemical Co., Ltd.
- Yoshikazu Nakayama
- G01 - MEASURING TESTING
Information Patent Grant
Use of arrays of atomic force microscope/scanning tunneling microsc...
- Patent number 7,302,832
- Issue date Dec 4, 2007
- Intel Corporation
- Andrew Berlin
- G01 - MEASURING TESTING
Information Patent Grant
Object inspection and/or modification system and method
- Patent number 7,109,482
- Issue date Sep 19, 2006
- General Nanotechnology L.L.C.
- Victor B. Kley
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope assembly
- Patent number 7,091,476
- Issue date Aug 15, 2006
- General Nanotechnology L.L.C.
- Victor B. Kley
- G11 - INFORMATION STORAGE
Information Patent Grant
Scanning probe microscopy inspection and modification system
- Patent number 7,045,780
- Issue date May 16, 2006
- General Nanotechnology, L.L.C.
- Victor B. Kley
- G11 - INFORMATION STORAGE
Information Patent Grant
Scanning probe microscopy inspection and modification system
- Patent number 6,861,648
- Issue date Mar 1, 2005
- General Nanotechnology L.L.C.
- Victor B. Kley
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatus for evaluating electrical characteristics
- Patent number 6,833,719
- Issue date Dec 21, 2004
- Japan Science and Technology Corporation
- Tsuyoshi Hasegawa
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope assembly and method for making spectropho...
- Patent number 6,339,217
- Issue date Jan 15, 2002
- General Nanotechnology L.L.C.
- Victor B. Kley
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Object inspection and/or modification system and method
- Patent number 6,337,479
- Issue date Jan 8, 2002
- Victor B. Kley
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscope assembly and method for making spectropho...
- Patent number 6,265,711
- Issue date Jul 24, 2001
- General Nanotechnology L.L.C.
- Victor B. Kley
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscope and method of analyzing sample using same
- Patent number 6,127,682
- Issue date Oct 3, 2000
- Jeol Ltd.
- Keiichi Nakamoto
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method of making high aspect ratio probes with self-aligned control...
- Patent number 6,027,951
- Issue date Feb 22, 2000
- Noel C. MacDonald
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Probe formed of mono-crystalline SI, the manufacturing method there...
- Patent number 6,011,261
- Issue date Jan 4, 2000
- Canon Kabushiki Kaisha
- Tsutomu Ikeda
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Probe and a cantilever formed with same material
- Patent number 5,959,957
- Issue date Sep 28, 1999
- Canon Kabushiki Kaisha
- Tsutomu Ikeda
- B82 - NANO-TECHNOLOGY
Information Patent Grant
SPM cantilever and a method for manufacturing the same
- Patent number 5,883,387
- Issue date Mar 16, 1999
- Olympus Optical Co., Ltd.
- Katsuhiro Matsuyama
- B82 - NANO-TECHNOLOGY
Information Patent Grant
High aspect ratio probes with self-aligned control electrodes
- Patent number 5,844,251
- Issue date Dec 1, 1998
- Cornell Research Foundation, Inc.
- Noel C. MacDonald
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Cantilever deflection sensor and use thereof
- Patent number 5,804,709
- Issue date Sep 8, 1998
- International Business Machines Corporation
- Jean-Philippe M. Bourgoin
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method for identifying biochemical and chemical reactions and micro...
- Patent number 5,620,854
- Issue date Apr 15, 1997
- Regents of the University of California
- John F. Holzrichter
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Apparatus for measuring physical properties of micro area
- Patent number 5,585,722
- Issue date Dec 17, 1996
- Hitachi, Ltd.
- Shigeyuki Hosoki
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
A METHOD OF EXAMINING A SAMPLE IN A SCANNING TUNNELING MICROSCOPE U...
- Publication number 20240264198
- Publication date Aug 8, 2024
- CESKE VYSOKE UCENI TECHNICKE V PRAZE
- Bohuslav REZEK
- G01 - MEASURING TESTING
Information Patent Application
DEVICE FOR MEASURING AND/OR MODIFYING A SURFACE
- Publication number 20240118310
- Publication date Apr 11, 2024
- Paris Sciences et Lettres
- Antoine Niguès
- G01 - MEASURING TESTING
Information Patent Application
MULTIPLE INTEGRATED TIPS SCANNING PROBE MICROSCOPE
- Publication number 20200191827
- Publication date Jun 18, 2020
- Xallent, LLC
- Kwame Amponsah
- G01 - MEASURING TESTING
Information Patent Application
MULTIPLE INTEGRATED TIPS SCANNING PROBE MICROSCOPE
- Publication number 20190128919
- Publication date May 2, 2019
- Xallent, LLC
- Kwame Amponsah
- G01 - MEASURING TESTING
Information Patent Application
SENSOR FOR NONCONTACT PROFILING OF A SURFACE
- Publication number 20120131704
- Publication date May 24, 2012
- Franz Josef GIESSIBL
- G01 - MEASURING TESTING
Information Patent Application
Probe microscope and measurement method using the same
- Publication number 20100257642
- Publication date Oct 7, 2010
- Kyoko Honbo
- G01 - MEASURING TESTING
Information Patent Application
Scanning probe microscopy inspection and modification system
- Publication number 20080315092
- Publication date Dec 25, 2008
- General Nanotechnology LLC
- Victor B. Kley
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Local Injector of Spin-Polarized Electrons with Semiconductor Tip U...
- Publication number 20080210864
- Publication date Sep 4, 2008
- ECOLE POLYTECHNIQUE
- Daniel Paget
- G01 - MEASURING TESTING
Information Patent Application
Scanning Probe Microscopy Inspection and Modification System
- Publication number 20080121028
- Publication date May 29, 2008
- General Nanotechnology LLC
- Victor B. Kley
- G02 - OPTICS
Information Patent Application
Tip structure for scanning devices, method of its preparation and d...
- Publication number 20080073520
- Publication date Mar 27, 2008
- Michail Evgen'evich Givargizov
- G01 - MEASURING TESTING
Information Patent Application
Microcoaxial probes made from strained semiconductor bilayers
- Publication number 20080061798
- Publication date Mar 13, 2008
- Robert H. Blick
- G01 - MEASURING TESTING
Information Patent Application
Object inspection and/or modification system and method
- Publication number 20070114402
- Publication date May 24, 2007
- General Nanotechnology LLC
- Victor B. Kley
- G01 - MEASURING TESTING
Information Patent Application
Scanning probe microscopy inspection and modification system
- Publication number 20070022804
- Publication date Feb 1, 2007
- General Nanotechnology LLC
- Victor B. Kley
- G02 - OPTICS
Information Patent Application
Scanning probe microscope assembly and method for making spectropho...
- Publication number 20060237639
- Publication date Oct 26, 2006
- General Nanotechnology LLC
- Victor B. Kley
- G02 - OPTICS
Information Patent Application
Scanning probe characterization of surfaces
- Publication number 20060225164
- Publication date Oct 5, 2006
- The University of Utah
- Clayton C. Williams
- G01 - MEASURING TESTING
Information Patent Application
Probe for a scanning microscope
- Publication number 20060150720
- Publication date Jul 13, 2006
- YOSHIKAZU NAKAYAMA
- Yoshikazu Nakayama
- G01 - MEASURING TESTING
Information Patent Application
Scanning probe microscopy inspection and modification system
- Publication number 20050172703
- Publication date Aug 11, 2005
- General Nanotechnology LLC
- Victor B. Kley
- G02 - OPTICS
Information Patent Application
Use of arrays of atomic force microscope/scanning tunneling microsc...
- Publication number 20050138996
- Publication date Jun 30, 2005
- Intel Corporation
- Andrew Berlin
- G01 - MEASURING TESTING
Information Patent Application
Object inspection and/or modification system and method
- Publication number 20050056783
- Publication date Mar 17, 2005
- General Nanotechnology, LLC
- Victor B. Kley
- G01 - MEASURING TESTING
Information Patent Application
Apparatus for evaluating electrical characteristics
- Publication number 20020178800
- Publication date Dec 5, 2002
- Tsuyoshi Hasegawa
- B82 - NANO-TECHNOLOGY
Information Patent Application
Scanning probe microscope assembly
- Publication number 20020135755
- Publication date Sep 26, 2002
- Victor B. Kley
- B82 - NANO-TECHNOLOGY
Information Patent Application
Object inspection and/or modification system and method
- Publication number 20020117611
- Publication date Aug 29, 2002
- Victor B. Kley
- B82 - NANO-TECHNOLOGY

STM [Scanning Tunnelling Microscopy] combined with AFM [Atomic Force Microscopy]

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Multiple integrated tips scanning probe microscope

Multiple integrated tips scanning probe microscope

Microscope having a multimode local probe, tip-enhanced raman micro...

Scanning probe microscopy inspection and modification system

Sensor for noncontact profiling of a surface

Probe microscope and measurement method using the same

Local injector of spin-polarized electrons with semiconductor tip u...

Scanning probe microscope assembly and method for making spectropho...

Microcoaxial probes made from strained semiconductor bilayers

Scanning probe microscopy inspection and modification system

Scanning probe characterization of surfaces

Probe for a scanning microscope

Use of arrays of atomic force microscope/scanning tunneling microsc...

Object inspection and/or modification system and method

Scanning probe microscope assembly

Scanning probe microscopy inspection and modification system

Scanning probe microscopy inspection and modification system

Apparatus for evaluating electrical characteristics

Scanning probe microscope assembly and method for making spectropho...

Object inspection and/or modification system and method

Scanning probe microscope assembly and method for making spectropho...

Scanning probe microscope and method of analyzing sample using same

Method of making high aspect ratio probes with self-aligned control...

Probe formed of mono-crystalline SI, the manufacturing method there...

Probe and a cantilever formed with same material

SPM cantilever and a method for manufacturing the same

High aspect ratio probes with self-aligned control electrodes

Cantilever deflection sensor and use thereof

Method for identifying biochemical and chemical reactions and micro...

Apparatus for measuring physical properties of micro area

Patents Applicationslast 30 patents

A METHOD OF EXAMINING A SAMPLE IN A SCANNING TUNNELING MICROSCOPE U...

DEVICE FOR MEASURING AND/OR MODIFYING A SURFACE

MULTIPLE INTEGRATED TIPS SCANNING PROBE MICROSCOPE

MULTIPLE INTEGRATED TIPS SCANNING PROBE MICROSCOPE

SENSOR FOR NONCONTACT PROFILING OF A SURFACE

Probe microscope and measurement method using the same

Scanning probe microscopy inspection and modification system

Local Injector of Spin-Polarized Electrons with Semiconductor Tip U...

Scanning Probe Microscopy Inspection and Modification System

Tip structure for scanning devices, method of its preparation and d...

Microcoaxial probes made from strained semiconductor bilayers

Object inspection and/or modification system and method

Scanning probe microscopy inspection and modification system

Scanning probe microscope assembly and method for making spectropho...

Scanning probe characterization of surfaces

Probe for a scanning microscope

Scanning probe microscopy inspection and modification system

Use of arrays of atomic force microscope/scanning tunneling microsc...

Object inspection and/or modification system and method

Apparatus for evaluating electrical characteristics

Scanning probe microscope assembly

Object inspection and/or modification system and method