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G01J2003/2873
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PHYSICS
G01
Measuring instruments
G01J
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY
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G01J2003/2873
Storing reference spectrum
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Patents Grants
last 30 patents
Information
Patent Grant
Compact spectral analyzer
Patent number
12,061,116
Issue date
Aug 13, 2024
Si-Ware Systems
Yasser M. Sabry
G01 - MEASURING TESTING
Information
Patent Grant
Carbon fiber classification using raman spectroscopy
Patent number
11,982,624
Issue date
May 14, 2024
Battelle Savannah River Alliance, LLC
Amanda L. Houk
G01 - MEASURING TESTING
Information
Patent Grant
Field calibration for near real-time Fabry Perot spectral measurements
Patent number
11,867,615
Issue date
Jan 9, 2024
TruTag Technologies, Inc.
Guocai Shu
G01 - MEASURING TESTING
Information
Patent Grant
Transfer of a calibration model using a sparse transfer set
Patent number
11,378,452
Issue date
Jul 5, 2022
VIAVI Solutions Inc.
Changmeng Hsiung
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method of phase quality control for glass ceramics in manufacturing
Patent number
11,204,280
Issue date
Dec 21, 2021
Corning Incorporated
Chong Pyung An
G01 - MEASURING TESTING
Information
Patent Grant
Optical measuring device, malfunction determination system, malfunc...
Patent number
11,169,023
Issue date
Nov 9, 2021
Konica Minolta, Inc.
Koji Yamamoto
G01 - MEASURING TESTING
Information
Patent Grant
Spectroscopic characterization of seafood
Patent number
10,976,246
Issue date
Apr 13, 2021
VIAVI Solutions Inc.
Nada A. O'Brien
G01 - MEASURING TESTING
Information
Patent Grant
Advanced lighting effects investigation system and computerized method
Patent number
10,948,348
Issue date
Mar 16, 2021
Research Triangle Institute
Kelley Jo Rountree
G01 - MEASURING TESTING
Information
Patent Grant
Spectral properties-based system and method for feeding masterbatch...
Patent number
10,703,018
Issue date
Jul 7, 2020
Ampacet Corporation
Vadim (Dan) Regelman
B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information
Patent Grant
Multispectral or hyperspectral imaging and imaging system based on...
Patent number
10,642,056
Issue date
May 5, 2020
Luc Dümpelmann
G02 - OPTICS
Information
Patent Grant
Optical signal processing method and apparatus
Patent number
10,545,050
Issue date
Jan 28, 2020
Samsung Electronics Co., Ltd.
Youngzoon Yoon
G01 - MEASURING TESTING
Information
Patent Grant
Spectroscopic device and method for sample characterization
Patent number
10,444,142
Issue date
Oct 15, 2019
GREENTROPISM
Antoine Laborde
G01 - MEASURING TESTING
Information
Patent Grant
Spectral properties-based system and method for feeding masterbatch...
Patent number
10,427,326
Issue date
Oct 1, 2019
O.E.D.A. Liad Holdings (2006) Ltd.
Vadim (Dan) Regelman
B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information
Patent Grant
Transfer of a calibration model using a sparse transfer set
Patent number
10,429,240
Issue date
Oct 1, 2019
VIAVI Solutions Inc.
Changmeng Hsiung
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Spectroscopic characterization of seafood
Patent number
10,401,284
Issue date
Sep 3, 2019
VIAVI Solutions Inc.
Nada A. O'Brien
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for measuring reference spectrum for sample an...
Patent number
9,885,607
Issue date
Feb 6, 2018
Samsung Electronics Co., Ltd.
Kun Sun Eom
G01 - MEASURING TESTING
Information
Patent Grant
Calibration curve formation method, impurity concentration measurem...
Patent number
9,541,452
Issue date
Jan 10, 2017
GlobalWafers Japan Co., Ltd.
Satoko Nakagawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Spectrometry device, liquid chromatograph, and wavelength calibrati...
Patent number
9,476,767
Issue date
Oct 25, 2016
Shimadzu Corporation
Shinji Tsuji
G01 - MEASURING TESTING
Information
Patent Grant
Spectroscopic characterization of seafood
Patent number
9,316,628
Issue date
Apr 19, 2016
Viavi Solutions Inc.
Nada A. O'Brien
G01 - MEASURING TESTING
Information
Patent Grant
Device and method for analyzing kernel component
Patent number
9,091,643
Issue date
Jul 28, 2015
Hiroshima University
Kensuke Kawamura
G01 - MEASURING TESTING
Information
Patent Grant
Method of analyzing and controlling a combustion process in a gas t...
Patent number
8,825,214
Issue date
Sep 2, 2014
Alstom Technology Ltd
Ken Yves Haffner
G01 - MEASURING TESTING
Information
Patent Grant
Wavelength calibration method and wavelength calibration apparatus
Patent number
7,649,627
Issue date
Jan 19, 2010
Yokogawa Electric Corporation
Toshikazu Yamamoto
G01 - MEASURING TESTING
Information
Patent Grant
Fraction purity measuring apparatus for chromatogram peak
Patent number
6,002,986
Issue date
Dec 14, 1999
Shimadzu Corporation
Yasuhiro Mito
G01 - MEASURING TESTING
Information
Patent Grant
Spectrophotometer for accurately measuring light intensity in a spe...
Patent number
5,305,233
Issue date
Apr 19, 1994
Minolta Camera Kabushiki Kaisha
Nobukazu Kawagoe
G01 - MEASURING TESTING
Information
Patent Grant
Rapid scanning spectrographic analyzer
Patent number
5,210,590
Issue date
May 11, 1993
L. T. Industries, Inc.
Isaac J. Landa
G01 - MEASURING TESTING
Information
Patent Grant
Spectrophotometer for accurately measuring light intensity in a spe...
Patent number
5,175,697
Issue date
Dec 29, 1992
Minolta Camera Kabushiki Kaisha
Nobukazu Kawagoe
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for automatically identifying chemical species...
Patent number
5,014,217
Issue date
May 7, 1991
S C Technology, Inc.
Richard N. Savage
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Grant
Device for analyzing fluorescent light signals
Patent number
5,003,977
Issue date
Apr 2, 1991
Agency of Industrial Science and Technology
Susumu Suzuki
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Method of and apparatus for spectroscopically analyzing samples
Patent number
4,832,491
Issue date
May 23, 1989
U.S. Philips Corporation
Michael R. Sharpe
G01 - MEASURING TESTING
Information
Patent Grant
Spectrofluorophotometer with monitor detector for light source
Patent number
4,779,982
Issue date
Oct 25, 1988
Hitachi, Ltd.
Hiroyuki Koshi
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
SELF-CALIBRATING SPECTROMETER
Publication number
20230085600
Publication date
Mar 16, 2023
Arizona Board of Regents on behalf of The University of Arizona
Richard John Koshel
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD FOR CONFIGURING A SPECTROMETRY DEVICE
Publication number
20220196476
Publication date
Jun 23, 2022
GREENTROPISM
Antoine LABORDE
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL MEASURING DEVICE, MALFUNCTION DETERMINATION SYSTEM, MALFUNC...
Publication number
20200326237
Publication date
Oct 15, 2020
Konica Minolta, Inc.
Koji YAMAMOTO
G01 - MEASURING TESTING
Information
Patent Application
ADVANCED LIGHTING EFFECTS INVESTIGATION SYSTEM AND COMPUTERIZED METHOD
Publication number
20200072669
Publication date
Mar 5, 2020
Research Triangle Institute
Kelley Jo Rountree
G01 - MEASURING TESTING
Information
Patent Application
TRANSFER OF A CALIBRATION MODEL USING A SPARSE TRANSFER SET
Publication number
20200018648
Publication date
Jan 16, 2020
VIAVI Solutions Inc.
Changmeng HSIUNG
G01 - MEASURING TESTING
Information
Patent Application
SPECTRAL PROPERTIES-BASED SYSTEM AND METHOD FOR FEEDING MASTERBATCH...
Publication number
20190193301
Publication date
Jun 27, 2019
O.E.D.A. LIAD HOLDINGS (2006) LTD.
Vadim (Dan) REGELMAN
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL SIGNAL PROCESSING METHOD AND APPARATUS
Publication number
20190154503
Publication date
May 23, 2019
Samsung Electronics Co., Ltd.
Youngzoon YOON
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS AND METHOD FOR MEASURING REFERENCE SPECTRUM FOR SAMPLE AN...
Publication number
20170059409
Publication date
Mar 2, 2017
Samsung Electronics Co., Ltd.
Kun Sun EOM
G01 - MEASURING TESTING
Information
Patent Application
Spectroscopic Analysis System and Method
Publication number
20160131526
Publication date
May 12, 2016
KONICA MINOLTA, INC.
Koji Harada
G01 - MEASURING TESTING
Information
Patent Application
SPECTROMETRY DEVICE, LIQUID CHROMATOGRAPH, AND WAVELENGTH CALIBRATI...
Publication number
20150362366
Publication date
Dec 17, 2015
Shimadzu Corporation
Shinji Tsuji
G01 - MEASURING TESTING
Information
Patent Application
CALIBRATION CURVE FORMATION METHOD, IMPURITY CONCENTRATION MEASUREM...
Publication number
20150338276
Publication date
Nov 26, 2015
GLOBALWAFERS JAPAN CO., LTD.
Satoko NAKAGAWA
G01 - MEASURING TESTING
Information
Patent Application
Pixel-Shifting Spectrometer on Chip
Publication number
20140085632
Publication date
Mar 27, 2014
Kyle Preston
G01 - MEASURING TESTING
Information
Patent Application
DEVICE AND METHOD FOR ANALYZING KERNEL COMPONENT
Publication number
20130278919
Publication date
Oct 24, 2013
SATAKE CORPORATION
Kensuke Kawamura
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF ANALYZING AND CONTROLLING A COMBUSTION PROCESS IN A GAS T...
Publication number
20120136483
Publication date
May 31, 2012
ALSTOM Technology Ltd.
Ken Yves HAFFNER
G01 - MEASURING TESTING
Information
Patent Application
Wavelength calibration method and wavelength calibration apparatus
Publication number
20070195318
Publication date
Aug 23, 2007
YOKOGAWA ELECTRIC CORPORATION
Toshikazu Yamamoto
G01 - MEASURING TESTING