STP [Scanning Tunnelling Potentiometry]

Industry

CPC
G01Q60/14

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Parent Industries

GPHYSICS G01Measuring instruments G01QSCANNING-PROBE TECHNIQUES OR APPARATUS APPLICATIONS OF SCANNING-PROBE TECHNIQUES G01Q60/00Particular type of SPM [Scanning Probe Microscopy] or microscopes Essential components thereof

Current Industry

G01Q60/14STP [Scanning Tunnelling Potentiometry]

Industries

Patents Grantslast 30 patents

Information Patent Grant
Integrated circuit with optical tunnel
- Patent number 11,239,152
- Issue date Feb 1, 2022
- International Business Machines Corporation
- Otto Andreas Torreiter
- G01 - MEASURING TESTING
Information Patent Grant
Scanning tunneling thermometer
- Patent number 11,215,636
- Issue date Jan 4, 2022
- Arizona Board of Regents on behalf of the University of Arizona
- Abhay Shankar Chinivaranahalli Shastry
- G01 - MEASURING TESTING
Information Patent Grant
System and method for performing scanning tunneling microscopy on c...
- Patent number 10,976,344
- Issue date Apr 13, 2021
- University of Maryland, College Park
- Ting Xie
- G01 - MEASURING TESTING
Information Patent Grant
Scanning tunneling thermometer
- Patent number 10,830,792
- Issue date Nov 10, 2020
- Arizona Board of Regents on behalf of the University of Arizona
- Abhay Shankar Chinivaranahalli Shastry
- G01 - MEASURING TESTING
Information Patent Grant
Frequency comb feedback control for scanning probe microscopy
- Patent number 10,401,383
- Issue date Sep 3, 2019
- Mark J. Hagmann
- G01 - MEASURING TESTING
Information Patent Grant
Computer-aided simulation method for atomic-resolution scanning see...
- Patent number 9,459,278
- Issue date Oct 4, 2016
- Korea Advanced Institute of Science and Technology
- Yong-Hyun Kim
- G01 - MEASURING TESTING
Information Patent Grant
Scanning frequency comb microscopy (SFCM) for carrier profiling in...
- Patent number 9,442,078
- Issue date Sep 13, 2016
- Mark J. Hagmann
- G01 - MEASURING TESTING
Information Patent Grant
Computer-aided simulation method for atomic-resolution scanning see...
- Patent number 9,081,030
- Issue date Jul 14, 2015
- Korea Advanced Institute of Science and Technology
- Yong-Hyun Kim
- G01 - MEASURING TESTING
Information Patent Grant
Measurement of depth and energy of buried trap states in dielectric...
- Patent number 9,052,339
- Issue date Jun 9, 2015
- The University of Utah Research Foundation
- Clayton Covey Williams
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Simultaneous topographic and elemental chemical and magnetic contra...
- Patent number 8,850,611
- Issue date Sep 30, 2014
- UChicago Argonne, LLC
- Volker Rose
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Signal coupling system for scanning microwave microscope
- Patent number 7,793,356
- Issue date Sep 7, 2010
- Agilent Technologies, Inc.
- Hassan Tanbakuchi
- G01 - MEASURING TESTING
Information Patent Grant
Electrical property evaluation apparatus
- Patent number 7,187,166
- Issue date Mar 6, 2007
- SII NanoTechnology Inc.
- Yoshiharu Sugano
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for removing and/or preventing surface contami...
- Patent number 7,007,408
- Issue date Mar 7, 2006
- Solid State Measurements, Inc.
- William H. Howland, Jr.
- B08 - CLEANING
Information Patent Grant
Scanning atom probe
- Patent number 6,797,952
- Issue date Sep 28, 2004
- SII NanoTechnology Inc.
- Takashi Kaito
- G01 - MEASURING TESTING
Information Patent Grant
Scanning tunneling charge transfer microscope
- Patent number 6,583,412
- Issue date Jun 24, 2003
- University of Utah Research Foundation
- Clayton C. Williams
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for tunnel microscopy
- Patent number 6,476,386
- Issue date Nov 5, 2002
- Max-Planck- Gesselschaft zur Forderung der Wissenschaften e.V.
- Jürgen Kirschner
- G11 - INFORMATION STORAGE
Information Patent Grant
Measuring device for measuring the intensity and/or polarization of...
- Patent number 5,796,102
- Issue date Aug 18, 1998
- Stichting Katholieke Universiteit Nijmegen
- Herman Van Kempen
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Apparatus for measuring physical properties of micro area
- Patent number 5,585,722
- Issue date Dec 17, 1996
- Hitachi, Ltd.
- Shigeyuki Hosoki
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscope for observing a sample surface while appl...
- Patent number 5,481,529
- Issue date Jan 2, 1996
- Canon Kabushiki Kaisha
- Kiyoshi Takimoto
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning tunneling potentio-spectroscopic microscope and a data det...
- Patent number 5,378,983
- Issue date Jan 3, 1995
- Olympus Optical Co., Ltd.
- Akira Yagi
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Magnetic STM with a non-magnetic tip
- Patent number 5,331,589
- Issue date Jul 19, 1994
- International Business Machines Corporation
- Richard J. Gambino
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscope having cantilever and detecting sample ch...
- Patent number 5,289,004
- Issue date Feb 22, 1994
- Olympus Optical Co., Ltd.
- Takao Okada
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning tunneling potentio-spectroscopic microscope and a data det...
- Patent number 5,185,572
- Issue date Feb 9, 1993
- Olympus Optical Co., Ltd.
- Akira Yagi
- B82 - NANO-TECHNOLOGY
Information Patent Grant
High speed waveform sampling with a tunneling microscope
- Patent number 5,019,707
- Issue date May 28, 1991
- International Business Machines Corporation
- George L. Chiu
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Contactless current probe based on electron tunneling
- Patent number 4,870,352
- Issue date Sep 26, 1989
- Fibertek, Inc.
- Walter Koechner
- G01 - MEASURING TESTING
Information Patent Grant
Tunneling susceptometry
- Patent number 4,861,990
- Issue date Aug 29, 1989
- California Institute of Technology
- Terry R. Coley
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
FREQUENCY COMB FEEDBACK CONTROL FOR SCANNING PROBE MICROSCOPY
- Publication number 20210302466
- Publication date Sep 30, 2021
- Mark J. Hagmann
- G01 - MEASURING TESTING
Information Patent Application
SCANNING TUNNELING THERMOMETER
- Publication number 20210072282
- Publication date Mar 11, 2021
- Arizona Board of Regents on behalf of The University of Arizona
- Abhay Shankar Chinivaranahalli Shastry
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT WITH OPTICAL TUNNEL
- Publication number 20210066183
- Publication date Mar 4, 2021
- International Business Machines Corporation
- Otto Andreas Torreiter
- G01 - MEASURING TESTING
Information Patent Application
Frequency Comb Feedback Control for Scanning Probe Microscopy
- Publication number 20180364278
- Publication date Dec 20, 2018
- Mark J. Hagmann
- G01 - MEASURING TESTING
Information Patent Application
Computer-Aided Simulation Method For Atomic-Resolution Scanning See...
- Publication number 20150309072
- Publication date Oct 29, 2015
- Korea Advanced Institute of Science and Technology
- Yong-Hyun KIM
- G01 - MEASURING TESTING
Information Patent Application
Computer-Aided Simulation Method For Atomic-Resolution Scanning See...
- Publication number 20140366229
- Publication date Dec 11, 2014
- Yong-Hyun KIM
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT OF DEPTH AND ENERGY OF BURIED TRAP STATES IN DIELECTRIC...
- Publication number 20140345007
- Publication date Nov 20, 2014
- Clayton Covey Williams
- B82 - NANO-TECHNOLOGY
Information Patent Application
SIMULTANEOUS TOPOGRAPHIC AND ELEMENTAL CHEMICAL AND MAGNETIC CONTRA...
- Publication number 20140259235
- Publication date Sep 11, 2014
- UChicago Argonne, LLC
- Volker Rose
- B82 - NANO-TECHNOLOGY
Information Patent Application
Signal Coupling System For Scanning Microwave Microscope
- Publication number 20100058846
- Publication date Mar 11, 2010
- Hassan Tanbakuchi
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for removing and/or preventing surface contami...
- Publication number 20050241175
- Publication date Nov 3, 2005
- Solid State Measurements, Inc.
- William H. Howland
- B08 - CLEANING
Information Patent Application
Electrical property evaluation apparatus
- Publication number 20040201378
- Publication date Oct 14, 2004
- Yoshiharu Sugano
- G01 - MEASURING TESTING
Information Patent Application
Scanning atom probe
- Publication number 20030066962
- Publication date Apr 10, 2003
- Takashi Kaito
- B82 - NANO-TECHNOLOGY
Information Patent Application
Scanning tunneling charge transfer microscope
- Publication number 20020005481
- Publication date Jan 17, 2002
- Clayton C. Williams
- B82 - NANO-TECHNOLOGY

STP [Scanning Tunnelling Potentiometry]

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Integrated circuit with optical tunnel

Scanning tunneling thermometer

System and method for performing scanning tunneling microscopy on c...

Scanning tunneling thermometer

Frequency comb feedback control for scanning probe microscopy

Computer-aided simulation method for atomic-resolution scanning see...

Scanning frequency comb microscopy (SFCM) for carrier profiling in...

Computer-aided simulation method for atomic-resolution scanning see...

Measurement of depth and energy of buried trap states in dielectric...

Simultaneous topographic and elemental chemical and magnetic contra...

Signal coupling system for scanning microwave microscope

Electrical property evaluation apparatus

Method and apparatus for removing and/or preventing surface contami...

Scanning atom probe

Scanning tunneling charge transfer microscope

Method and device for tunnel microscopy

Measuring device for measuring the intensity and/or polarization of...

Apparatus for measuring physical properties of micro area

Scanning probe microscope for observing a sample surface while appl...

Scanning tunneling potentio-spectroscopic microscope and a data det...

Magnetic STM with a non-magnetic tip

Scanning probe microscope having cantilever and detecting sample ch...

Scanning tunneling potentio-spectroscopic microscope and a data det...

High speed waveform sampling with a tunneling microscope

Contactless current probe based on electron tunneling

Tunneling susceptometry

Patents Applicationslast 30 patents

FREQUENCY COMB FEEDBACK CONTROL FOR SCANNING PROBE MICROSCOPY

SCANNING TUNNELING THERMOMETER

INTEGRATED CIRCUIT WITH OPTICAL TUNNEL

Frequency Comb Feedback Control for Scanning Probe Microscopy

Computer-Aided Simulation Method For Atomic-Resolution Scanning See...

Computer-Aided Simulation Method For Atomic-Resolution Scanning See...

MEASUREMENT OF DEPTH AND ENERGY OF BURIED TRAP STATES IN DIELECTRIC...

SIMULTANEOUS TOPOGRAPHIC AND ELEMENTAL CHEMICAL AND MAGNETIC CONTRA...

Signal Coupling System For Scanning Microwave Microscope

Method and apparatus for removing and/or preventing surface contami...

Electrical property evaluation apparatus

Scanning atom probe

Scanning tunneling charge transfer microscope