Membership
Tour
Register
Log in
Strip illuminator
Follow
Industry
CPC
G01N2021/8908
This industry / category may be too specific. Please go to a parent level for more data
Parent Industries
G
PHYSICS
G01
Measuring instruments
G01N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
Current Industry
G01N2021/8908
Strip illuminator
Industries
Overview
Organizations
People
Information
Impact
Please log in for detailed analytics
Patents Grants
last 30 patents
Information
Patent Grant
Optical detection device and detection method thereof
Patent number
12,044,628
Issue date
Jul 23, 2024
Aspect Microsystems Corp.
Mingshun Shih
G05 - CONTROLLING REGULATING
Information
Patent Grant
Forming a homogenized illumination line which can be imaged as a lo...
Patent number
11,598,973
Issue date
Mar 7, 2023
Cognex Corporation
Andrew Parrett
G01 - MEASURING TESTING
Information
Patent Grant
Image capturing system and a method for determining the position of...
Patent number
11,448,501
Issue date
Sep 20, 2022
BOBST MEX SA
Matthieu Richard
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Forming a homogenized illumination line which can be imaged as a lo...
Patent number
11,314,100
Issue date
Apr 26, 2022
Cognex Corporation
Andrew Parrett
G02 - OPTICS
Information
Patent Grant
Device for inspecting printed images
Patent number
11,295,428
Issue date
Apr 5, 2022
ELEXIS AG
Stephan Krebs
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Substance testing system and method
Patent number
11,275,021
Issue date
Mar 15, 2022
Alcolizer Pty Ltd.
Roger Alan Hunt
G01 - MEASURING TESTING
Information
Patent Grant
Arrangement and method for contactless determination of a dimension...
Patent number
11,243,174
Issue date
Feb 8, 2022
IMS Messsysteme GmbH
Horst Krauthäuser
G01 - MEASURING TESTING
Information
Patent Grant
Method for producing an OSB
Patent number
10,955,357
Issue date
Mar 23, 2021
SWISS KRONO TEC AG
Norbert Kalwa
G01 - MEASURING TESTING
Information
Patent Grant
Shape inspection apparatus and shape inspection method
Patent number
10,890,441
Issue date
Jan 12, 2021
Nippon Steel Corporation
Takayuki Sonoda
G01 - MEASURING TESTING
Information
Patent Grant
Inspection and/or web observation apparatus, use of an arrangement...
Patent number
10,809,204
Issue date
Oct 20, 2020
Texmag GmbH Vertriebsgesellschaft
Lars Zwerger
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Shape measurement apparatus and shape measurement method
Patent number
10,605,591
Issue date
Mar 31, 2020
Nippon Steel Corporation
Yusuke Konno
G01 - MEASURING TESTING
Information
Patent Grant
Quality control station for a sheet element processing machine and...
Patent number
10,571,405
Issue date
Feb 25, 2020
BOBST MEX SA
Matthieu Richard
G01 - MEASURING TESTING
Information
Patent Grant
Optical inspection apparatus and optical sorting apparatus
Patent number
9,347,892
Issue date
May 24, 2016
VISYS NV
Bert Dirix
B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information
Patent Grant
Devices for determining layer thickness and/or contamination level...
Patent number
9,250,062
Issue date
Feb 2, 2016
Carl Zeiss SMT GmbH
Bernd Doerband
G01 - MEASURING TESTING
Information
Patent Grant
Prepreg production method
Patent number
9,180,653
Issue date
Nov 10, 2015
Toray Industries, Inc.
Daiki Minamida
B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information
Patent Grant
Spectrometer, and image evaluating unit and image forming device in...
Patent number
8,755,046
Issue date
Jun 17, 2014
Ricoh Company, Ltd.
Kohei Shimbo
G01 - MEASURING TESTING
Information
Patent Grant
Substrate-check equipment
Patent number
8,111,899
Issue date
Feb 7, 2012
Hui-Hsiung Lee
G01 - MEASURING TESTING
Information
Patent Grant
Method for inspecting defect of hollow fiber porous membrane, defec...
Patent number
7,940,382
Issue date
May 10, 2011
ASAHI KASEI CHEMICALS CORPORATION
Makoto Ikeda
G01 - MEASURING TESTING
Information
Patent Grant
Defect inspection method and apparatus for transparent plate-like m...
Patent number
7,796,248
Issue date
Sep 14, 2010
Asahi Glass Company, Limited
Yoshiyuki Sonda
G01 - MEASURING TESTING
Information
Patent Grant
Automated product profiling apparatus and product slicing system us...
Patent number
7,623,249
Issue date
Nov 24, 2009
Formax, Inc.
Glenn Sandberg
A22 - BUTCHERING MEAT TREATMENT PROCESSING POULTRY OR FISH
Information
Patent Grant
Automated product profiling apparatus and product slicing system us...
Patent number
7,450,247
Issue date
Nov 11, 2008
Fermax, Inc.
Glenn Sandberg
A22 - BUTCHERING MEAT TREATMENT PROCESSING POULTRY OR FISH
Information
Patent Grant
Apparatus and method for inspecting film defect
Patent number
7,428,049
Issue date
Sep 23, 2008
FUJIFILM Corporation
Kazuhiro Shimoda
G01 - MEASURING TESTING
Information
Patent Grant
Defect inspection method and apparatus for transparent plate-like m...
Patent number
7,420,671
Issue date
Sep 2, 2008
Asahi Glass Company, Limited
Yoshiyuki Sonda
G01 - MEASURING TESTING
Information
Patent Grant
Appearance inspection apparatus and method of image capturing using...
Patent number
7,221,443
Issue date
May 22, 2007
Saki Corporation
Yoshihiro Akiyama
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Automated product profiling apparatus and product slicing system us...
Patent number
6,882,434
Issue date
Apr 19, 2005
Formax, Inc.
Glenn Sandberg
A22 - BUTCHERING MEAT TREATMENT PROCESSING POULTRY OR FISH
Information
Patent Grant
Diode light source for a line scan camera
Patent number
6,563,576
Issue date
May 13, 2003
Binder + Co. Aktiengesellschaft
Karlheinz Gschweitl
G01 - MEASURING TESTING
Information
Patent Grant
Linear integrating cavity light source for infra-red illumination o...
Patent number
5,548,120
Issue date
Aug 20, 1996
Eastman Kodak Company
H. Galen Parker
G01 - MEASURING TESTING
Information
Patent Grant
Continuous two dimensional monitoring of thin webs of textile mater...
Patent number
5,533,145
Issue date
Jul 2, 1996
Zellweger Uster, Inc.
Frederick M. Shofner
G01 - MEASURING TESTING
Information
Patent Grant
Method of and apparatus for detecting defect of transparent sheet a...
Patent number
5,452,079
Issue date
Sep 19, 1995
Central Glass Company, Limited
Shinya Okugawa
G01 - MEASURING TESTING
Information
Patent Grant
Inspecting device for inspecting printed state of cream solder
Patent number
5,450,204
Issue date
Sep 12, 1995
Sharp Kabushiki Kaisha
Yoshihide Shigeyama
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
OPTICAL DETECTION DEVICE AND DETECTION METHOD THEREOF
Publication number
20220268708
Publication date
Aug 25, 2022
Aspect Microsystems Corp.
Mingshun Shih
G01 - MEASURING TESTING
Information
Patent Application
Forming a Homogenized Illumination Line Which Can Be Imaged As A Lo...
Publication number
20220236580
Publication date
Jul 28, 2022
COGNEX CORPORATION
Andrew Parrett
G01 - MEASURING TESTING
Information
Patent Application
MACHINE DIRECTION LINE FILM INSPECTION
Publication number
20210278347
Publication date
Sep 9, 2021
3M Innovative Properties Company
Steven P. Floeder
G01 - MEASURING TESTING
Information
Patent Application
Arrangement and Method for Contactless Determination of a Dimension...
Publication number
20210164913
Publication date
Jun 3, 2021
IMS Messsysteme GmbH
Horst Krauthäuser
G01 - MEASURING TESTING
Information
Patent Application
SUBSTANCE TESTING SYSTEM AND METHOD
Publication number
20190204211
Publication date
Jul 4, 2019
Alcolizer Pty Ltd
Roger Alan Hunt
G01 - MEASURING TESTING
Information
Patent Application
AN IMAGE CAPTURING SYSTEM AND A METHOD FOR DETERMINING THE POSITION...
Publication number
20190145760
Publication date
May 16, 2019
BOBST MEX SA
Matthieu RICHARD
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Device for Inspecting Printed Images
Publication number
20190122352
Publication date
Apr 25, 2019
Stephan Krebs
G01 - MEASURING TESTING
Information
Patent Application
SHAPE MEASUREMENT APPARATUS AND SHAPE MEASUREMENT METHOD
Publication number
20180180405
Publication date
Jun 28, 2018
NIPPON STEEL & SUMITOMO METAL CORPORATION
Yusuke KONNO
G01 - MEASURING TESTING
Information
Patent Application
Optical Inspection Apparatus and Optical Sorting Apparatus
Publication number
20150219570
Publication date
Aug 6, 2015
VISYS NV
Bert Dirix
G01 - MEASURING TESTING
Information
Patent Application
PREPREG PRODUCTION METHOD
Publication number
20140299253
Publication date
Oct 9, 2014
TORAY INDUSTRIES INC.
Daiki Minamida
B32 - LAYERED PRODUCTS
Information
Patent Application
APPARATUS AND METHOD FOR SCANNING A SURFACE OF AN ARTICLE
Publication number
20140218504
Publication date
Aug 7, 2014
CENTRE DE RECHERCHE INDUSTRIELLE DU Quebec
Jean-Pierre COUTURIER
G01 - MEASURING TESTING
Information
Patent Application
DEVICES FOR DETERMINING LAYER THICKNESS AND/OR CONTAMINATION LEVEL...
Publication number
20140185060
Publication date
Jul 3, 2014
Bernd Doerband
G01 - MEASURING TESTING
Information
Patent Application
SPECTROMETER, AND IMAGE EVALUATING UNIT AND IMAGE FORMING DEVICE IN...
Publication number
20130235249
Publication date
Sep 12, 2013
RICOH COMPANY, LTD.
Kohei Shimbo
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR THIN FILM QUALITY CONTROL
Publication number
20110089348
Publication date
Apr 21, 2011
Moshe Finarov
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR THIN FILM QUALITY CONTROL
Publication number
20100220316
Publication date
Sep 2, 2010
Moshe Finarov
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR INSPECTING DEFECT OF HOLLOW FIBER POROUS MEMBRANE, DEFEC...
Publication number
20100117250
Publication date
May 13, 2010
ASAHI KASEI CHEMICALS CORPORATION
Makoto Ikeda
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
Substrate-check Equipment
Publication number
20100008560
Publication date
Jan 14, 2010
Race Ahead Technology Limited
Hui-Hsiung Lee
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR THIN FILM QUALITY CONTROL
Publication number
20100006785
Publication date
Jan 14, 2010
Moshe Finarov
G01 - MEASURING TESTING
Information
Patent Application
Automated Product Profiling Apparatus and Product Slicing System Us...
Publication number
20090064833
Publication date
Mar 12, 2009
Glenn Sandberg
A22 - BUTCHERING MEAT TREATMENT PROCESSING POULTRY OR FISH
Information
Patent Application
DEFECT INSPECTION METHOD AND APPARATUS FOR TRANSPARENT PLATE-LIKE M...
Publication number
20080278718
Publication date
Nov 13, 2008
Asahi Glass Co., LTD.
Yoshiyuki SONDA
G01 - MEASURING TESTING
Information
Patent Application
OBJECTIVE EVALUATION OF FABRIC PILLING USING STEREOVISION AND MEASU...
Publication number
20080063261
Publication date
Mar 13, 2008
Seoul National University Industry Foundation
Tae-Jin KANG
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
APPARATUS AND METHOD FOR INSPECTING FILM DEFECT
Publication number
20070285665
Publication date
Dec 13, 2007
FUJIFILM CORPORATION
Kazuhiro SHIMODA
G01 - MEASURING TESTING
Information
Patent Application
DEFECT INSPECTION METHOD AND APPARATUS FOR TRANSPARENT PLATE-LIKE M...
Publication number
20070216897
Publication date
Sep 20, 2007
Asahi Glass Co., LTD.
Yoshiyuki SONDA
G01 - MEASURING TESTING
Information
Patent Application
Apparatus for measuring uniformity of a laminar material
Publication number
20070078557
Publication date
Apr 5, 2007
Commonwealth Scientific and Industrial Research Organisation
Niall Finn
G01 - MEASURING TESTING
Information
Patent Application
System and method for detecting an object on a moving web
Publication number
20060145100
Publication date
Jul 6, 2006
KIMBERLY-CLARK WORLDWIDE, INC.
John H. Sorebo
G01 - MEASURING TESTING
Information
Patent Application
Automated product profiling apparatus and product slicing system us...
Publication number
20050199111
Publication date
Sep 15, 2005
Formax, Inc.
Glenn Sandberg
A22 - BUTCHERING MEAT TREATMENT PROCESSING POULTRY OR FISH
Information
Patent Application
Objective evaluation of fabric pilling using stereovision and measu...
Publication number
20050094853
Publication date
May 5, 2005
Tae-Jin Kang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Appearance inspection apparatus and method of image capturing using...
Publication number
20040218040
Publication date
Nov 4, 2004
Yoshihiro Akiyama
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
Diode light source for a line scan camera
Publication number
20020054286
Publication date
May 9, 2002
BINDER + CO. AKTIENGESELLSCHAFT
Karlheinz Gschweitl
G01 - MEASURING TESTING