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G01N2201/0635
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PHYSICS
G01
Measuring instruments
G01N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G01N2201/00
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G01N2201/0635
Structured illumination
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Patents Grants
last 30 patents
Information
Patent Grant
Inspecting apparatus
Patent number
12,181,691
Issue date
Dec 31, 2024
Disco Corporation
Nobuyuki Kimura
G01 - MEASURING TESTING
Information
Patent Grant
Image acquisition device, image acquisition method, and spatial lig...
Patent number
12,174,120
Issue date
Dec 24, 2024
Hamamatsu Photonics K.K.
Yuu Takiguchi
G01 - MEASURING TESTING
Information
Patent Grant
Spectrometry device
Patent number
12,158,417
Issue date
Dec 3, 2024
National University Corporation Kagawa University
Ichiro Ishimaru
G01 - MEASURING TESTING
Information
Patent Grant
Vibration measurement device
Patent number
12,111,266
Issue date
Oct 8, 2024
Shimadzu Corporation
Takahide Hatahori
G01 - MEASURING TESTING
Information
Patent Grant
Spectral confocal measurement device and measurement method thereof
Patent number
12,085,501
Issue date
Sep 10, 2024
ALEADER VISION TECHNOLOGY CO., LTD.
Jinfeng Wang
G01 - MEASURING TESTING
Information
Patent Grant
Mid-infrared gas sensor based on tapered sub-wavelength grating slo...
Patent number
12,078,592
Issue date
Sep 3, 2024
Ningbo University
Weiwei Chen
G01 - MEASURING TESTING
Information
Patent Grant
Hyperspectral imaging with a spatial heterodyne spectrometer
Patent number
12,072,290
Issue date
Aug 27, 2024
University of South Carolina
Stanley Michael Angel
G01 - MEASURING TESTING
Information
Patent Grant
Optofluidic analyte detection systems using multi-mode interference...
Patent number
12,044,623
Issue date
Jul 23, 2024
The Regents of the University of California
Holger Schmidt
G02 - OPTICS
Information
Patent Grant
Method, system and application for 3D molecular diffusion tensor me...
Patent number
12,038,382
Issue date
Jul 16, 2024
Clemson University Research Foundation
Hai Yao
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Optical system, and imaging apparatus and imaging system including...
Patent number
12,019,029
Issue date
Jun 25, 2024
Canon Kabushiki Kaisha
Genichiro Kudo
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Systems and methods for stochastically modulated Raman spectroscopy
Patent number
11,977,030
Issue date
May 7, 2024
Massachusetts Institute of Technology
Michael Zervas
G01 - MEASURING TESTING
Information
Patent Grant
Detection device for detecting contamination
Patent number
11,946,873
Issue date
Apr 2, 2024
Robert Bosch GmbH
Annette Frederiksen
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Spectrometer device
Patent number
11,913,880
Issue date
Feb 27, 2024
trinamiX GmbH
Sebastian Valouch
G01 - MEASURING TESTING
Information
Patent Grant
Optical densitometer and optical waveguide
Patent number
11,892,438
Issue date
Feb 6, 2024
Asahi Kasei Microdevices Corporation
Takaaki Furuya
G01 - MEASURING TESTING
Information
Patent Grant
Diffractive device for chemical and biological analysis
Patent number
11,815,455
Issue date
Nov 14, 2023
Universitat Politecnica de Valencia
José Miguel Avellá Oliver
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for carrying out Raman spectroscopy
Patent number
11,788,967
Issue date
Oct 17, 2023
Danmarks Tekniske Universitet
Oleksii Ilchenko
G01 - MEASURING TESTING
Information
Patent Grant
Raman spectroscopy method and apparatus
Patent number
11,774,364
Issue date
Oct 3, 2023
The University of Nottingham
Ioan Notingher
G01 - MEASURING TESTING
Information
Patent Grant
Inspection device and method of measuring wavefront aberration
Patent number
11,733,176
Issue date
Aug 22, 2023
Samsung Electronics Co., Ltd.
Akihiro Komatsu
G01 - MEASURING TESTING
Information
Patent Grant
Assembly for spectrophotometric measurements
Patent number
11,725,987
Issue date
Aug 15, 2023
Spec-Imaging AB
Edouard Jean Jacques Berrocal
G01 - MEASURING TESTING
Information
Patent Grant
Biosensor with grating array
Patent number
11,703,445
Issue date
Jul 18, 2023
VisEra Technologies Company Limited
Hsin-Yi Hsieh
G01 - MEASURING TESTING
Information
Patent Grant
Multichannel angular spectrometer
Patent number
11,656,172
Issue date
May 23, 2023
Photonics Automation Specialties LLC
Gerard Knight-Rubino
G01 - MEASURING TESTING
Information
Patent Grant
Metrology methods and optical schemes for measurement of misregistr...
Patent number
11,604,149
Issue date
Mar 14, 2023
KLA Corporation
Yoel Feler
G01 - MEASURING TESTING
Information
Patent Grant
High-throughput hyperspectral imaging systems
Patent number
11,598,725
Issue date
Mar 7, 2023
Verily Life Sciences LLC
Supriyo Sinha
G01 - MEASURING TESTING
Information
Patent Grant
Device for luminescent imaging
Patent number
11,585,757
Issue date
Feb 21, 2023
Illumina, Inc.
Dajun Yuan
C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information
Patent Grant
Multifocal photoacoustic microscopy through an ergodic relay
Patent number
11,530,979
Issue date
Dec 20, 2022
California Institute of Technology
Lihong Wang
G01 - MEASURING TESTING
Information
Patent Grant
Optical component for generating a periodic light pattern
Patent number
11,454,791
Issue date
Sep 27, 2022
UNIVERSITETET I TROMSØ—NORGES ARKTISKE UNIVERSITET
Balpreet Singh Ahluwalia
G01 - MEASURING TESTING
Information
Patent Grant
Image reconstruction method, device and microscopic imaging device
Patent number
11,449,964
Issue date
Sep 20, 2022
SUZHOU MICROVIEW MEDICAL TECHNOLOGIES CO., LTD.
Jinhua Shao
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Prism-coupling systems and methods with improved intensity transiti...
Patent number
11,448,595
Issue date
Sep 20, 2022
Corning Incorporated
Ryan Claude Andrews
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for determining spectral information
Patent number
11,415,507
Issue date
Aug 16, 2022
The University of Manchester
Charles Marcel Henry Veys
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Snapshot ellipsometer
Patent number
11,391,666
Issue date
Jul 19, 2022
J. A. Woollam Co., Inc.
Griffin A. P. Hovorka
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
METHOD OF DETERMINING SATURATES, AROMATICS, RESINS, AND ASPHALTENE...
Publication number
20240418698
Publication date
Dec 19, 2024
SCHLUMBERGER TECHNOLOGY CORPORATION
Shahnawaz Hossain Molla
G01 - MEASURING TESTING
Information
Patent Application
SPECTROMETRY DEVICE
Publication number
20240385107
Publication date
Nov 21, 2024
National University Corporation Kagawa University
Ichiro Ishimaru
G01 - MEASURING TESTING
Information
Patent Application
HYPERSPECTRAL IMAGING WITH A SPATIAL HETERODYNE SPECTROMETER
Publication number
20240377330
Publication date
Nov 14, 2024
University of South Carolina
STANLEY MICHAEL ANGEL
G01 - MEASURING TESTING
Information
Patent Application
DETERMINING AND RECONSTRUCTING A SHAPE AND A MATERIAL PROPERTY OF A...
Publication number
20240369352
Publication date
Nov 7, 2024
Meta Platforms Technologies, LLC
Salim BOUTAMI
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
IDENTIFYING SUBSTANCES STORED IN CONTAINERS UTILIZING A PORTABLE RA...
Publication number
20240353335
Publication date
Oct 24, 2024
Wasatch Photonics, Inc.
David John Creasey
G01 - MEASURING TESTING
Information
Patent Application
IDENTIFYING SUBSTANCES STORED IN CONTAINERS UTILIZING A PORTABLE RA...
Publication number
20240353336
Publication date
Oct 24, 2024
Wasatch Photonics, Inc.
David John Creasey
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
LIGHT SOURCE FOR GENERATING ILLUMINATION LIGHT
Publication number
20240337598
Publication date
Oct 10, 2024
Roche Diagnostics Operations, Inc.
Wenzel Salzmann
G01 - MEASURING TESTING
Information
Patent Application
A GRATING FOR OPTICAL MEASUREMENTS, AN ASSEMBLY FOR MEASUREMENTS OF...
Publication number
20240255417
Publication date
Aug 1, 2024
Spec-Imaging AB
Edouard Jean Jacques BERROCAL
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL MEASUREMENT APPARATUS
Publication number
20240201072
Publication date
Jun 20, 2024
National University Corporation Nagaoka University of Technology
MORITSUGU SAKAMOTO
G01 - MEASURING TESTING
Information
Patent Application
SPECTROMETER WITH ROTATED VOLUME BRAGG GRATING
Publication number
20240192129
Publication date
Jun 13, 2024
University of Central Florida Research Foundation, Inc.
Ivan Divliansky
G01 - MEASURING TESTING
Information
Patent Application
Multi-Order Spectroscopy
Publication number
20240167944
Publication date
May 23, 2024
OneLight Sensing, LLC
Michael G. Solonenko
G01 - MEASURING TESTING
Information
Patent Application
METHODS AND APPARATUS FOR HIGH-RESOLUTION MICROSCOPY
Publication number
20240126058
Publication date
Apr 18, 2024
Arizona Board of Regents on behalf of The University of Arizona
Dongkyun Kang
G01 - MEASURING TESTING
Information
Patent Application
INFORMATION PROCESSING DEVICE, INFORMATION PROCESSING METHOD, AND P...
Publication number
20240110863
Publication date
Apr 4, 2024
SONY GROUP CORPORATION
TUO ZHUANG
G01 - MEASURING TESTING
Information
Patent Application
PORTABLE MULTIFUNCTION SPECTROSCOPY ANALYZER
Publication number
20240035960
Publication date
Feb 1, 2024
Ivan Araujo Dayrell
G01 - MEASURING TESTING
Information
Patent Application
MID-INFRARED GAS SENSOR BASED ON TAPERED SUB-WAVELENGTH GRATING SLO...
Publication number
20230393060
Publication date
Dec 7, 2023
Ningbo University
Weiwei CHEN
G01 - MEASURING TESTING
Information
Patent Application
HIGH SPECTRAL AND TEMPORAL RESOLUTION GLOW DISCHARGE SPECTROMETRY D...
Publication number
20230349832
Publication date
Nov 2, 2023
HORIBA FRANCE SAS
Patrick CHAPON
G01 - MEASURING TESTING
Information
Patent Application
SPECTROSCOPE AND ANALYSIS SYSTEM
Publication number
20230304922
Publication date
Sep 28, 2023
Tetsuroh TATEBE
G01 - MEASURING TESTING
Information
Patent Application
DEVICE FOR DISTRIBUTING LIGHT BASED ON DIFFRACTION GRATINGS
Publication number
20230221245
Publication date
Jul 13, 2023
Commissariat A L'Energie Atomique et Aux Energies Alternatives
Cyrielle MONPEURT
G02 - OPTICS
Information
Patent Application
MULTI-TRACK RAMAN WELL PLATE READER
Publication number
20230204515
Publication date
Jun 29, 2023
HORIBA INSTRUMENTS INCORPORATED
Nicolas VEZARD
G01 - MEASURING TESTING
Information
Patent Application
ELECTRIC POWER ASSET HEALTH MONITORING
Publication number
20230175954
Publication date
Jun 8, 2023
Qualitrol Company LLC
Sri Krishna Bukya
G01 - MEASURING TESTING
Information
Patent Application
SPECTRAL CONFOCAL MEASUREMENT DEVICE AND MEASUREMENT METHOD THEREOF
Publication number
20230087237
Publication date
Mar 23, 2023
ALEADER VISION TECHNOLOGY CO., LTD.
Jinfeng Wang
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL DISCRIMINATION APPARATUS AND METHODS ADAPTED TO MONITOR REA...
Publication number
20230064409
Publication date
Mar 2, 2023
Siemens Healthcare Diagnostics Inc.
Mohiudeen Azhar
C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information
Patent Application
HYPERSPECTRAL IMAGING WITH A SPATIAL HETERODYNE SPECTROMETER
Publication number
20220397531
Publication date
Dec 15, 2022
University of South Carolina
STANLEY MICHAEL ANGEL
G01 - MEASURING TESTING
Information
Patent Application
BIOSENSOR WITH GRATING ARRAY
Publication number
20220381679
Publication date
Dec 1, 2022
VisEra Technologies Company Limited
Hsin-Yi HSIEH
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR ILLUMINATING A SUBSTRATE USING MULTIPLE ACOUTSO OPTICAL...
Publication number
20220373858
Publication date
Nov 24, 2022
APPLIED MATERIALS ISRAEL LTD.
Menachem Lapid
G02 - OPTICS
Information
Patent Application
DIFFRACTIVE DEVICE FOR CHEMICAL AND BIOLOGICAL ANALYSIS
Publication number
20220349819
Publication date
Nov 3, 2022
Universitat Politècnica de València
José Miguel AVELLÁ OLIVER
G01 - MEASURING TESTING
Information
Patent Application
BROADBAND PULSED LIGHT SOURCE APPARATUS AND SPECTROSCOPIC MEASUREME...
Publication number
20220276153
Publication date
Sep 1, 2022
USHIO DENKI KABUSHIKI KAISHA
Junki SAHARA
G01 - MEASURING TESTING
Information
Patent Application
INSPECTION DEVICE AND METHOD OF MEASURING WAVEFRONT ABERRATION
Publication number
20220268709
Publication date
Aug 25, 2022
Samsung Electronics Co., Ltd.
AKIHIRO KOMATSU
G01 - MEASURING TESTING
Information
Patent Application
HIGH-THROUGHPUT HYPERSPECTRAL IMAGING SYSTEMS
Publication number
20220260494
Publication date
Aug 18, 2022
Verily Life Sciences LLC
Supriyo Sinha
G01 - MEASURING TESTING
Information
Patent Application
Optical Sensor for Inspecting Pattern Collapse Defects
Publication number
20220139743
Publication date
May 5, 2022
TOKYO ELECTRON LIMITED
Ivan MALEEV
H01 - BASIC ELECTRIC ELEMENTS