STS [Scanning Tunnelling Spectroscopy]

Industry

CPC
G01Q60/12

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GPHYSICS G01Measuring instruments G01QSCANNING-PROBE TECHNIQUES OR APPARATUS APPLICATIONS OF SCANNING-PROBE TECHNIQUES G01Q60/00Particular type of SPM [Scanning Probe Microscopy] or microscopes Essential components thereof

Current Industry

G01Q60/12STS [Scanning Tunnelling Spectroscopy]

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Method of carrier profiling in semiconductors
- Patent number 10,401,382
- Issue date Sep 3, 2019
- Mark J. Hagmann
- G01 - MEASURING TESTING
Information Patent Grant
Frequency comb feedback control for scanning probe microscopy
- Patent number 10,401,383
- Issue date Sep 3, 2019
- Mark J. Hagmann
- G01 - MEASURING TESTING
Information Patent Grant
Quantum molecular sequencing (QM-SEQ): identification of unique nan...
- Patent number 10,364,461
- Issue date Jul 30, 2019
- The Regents of the University of Colorado
- Prashant Nagpal
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
Method of carrier profiling utilizing dielectric relaxation
- Patent number 10,006,933
- Issue date Jun 26, 2018
- Mark J. Hagmann
- G01 - MEASURING TESTING
Information Patent Grant
Scanning tunneling microscope and method of displaying observation...
- Patent number 9,335,342
- Issue date May 10, 2016
- Japan Science and Technology Agency
- Akira Saito
- G01 - MEASURING TESTING
Information Patent Grant
Single-contact tunneling thermometry
- Patent number 9,267,851
- Issue date Feb 23, 2016
- UT-Battelle, LLC
- Petro Maksymovych
- G01 - MEASURING TESTING
Information Patent Grant
Method for height control for single electron tunneling force spect...
- Patent number 9,052,337
- Issue date Jun 9, 2015
- The University of Utah Research Foundation
- Clayton Covey Williams
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Measurement of depth and energy of buried trap states in dielectric...
- Patent number 9,052,339
- Issue date Jun 9, 2015
- The University of Utah Research Foundation
- Clayton Covey Williams
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Pump probe measuring device
- Patent number 8,982,451
- Issue date Mar 17, 2015
- Japan Science and Technology Agency
- Hidemi Shigekawa
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Generation of a frequency comb and applications thereof
- Patent number 8,601,607
- Issue date Dec 3, 2013
- LOS ALAMOS NATIONAL SECURITY, LLC
- Mark J. Hagmann
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Photon-emission scanning tunneling microscopy
- Patent number 8,006,315
- Issue date Aug 23, 2011
- Commissariat a l'Energie Atomique
- Fabrice Charra
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscope system
- Patent number 7,770,232
- Issue date Aug 3, 2010
- Riken
- Akira Saito
- G01 - MEASURING TESTING
Information Patent Grant
Scanning microscopy using resonant quantum tunneling
- Patent number 7,531,795
- Issue date May 12, 2009
- Agilent Technologies, Inc.
- Curt A. Flory
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe characterization of surfaces
- Patent number 7,420,106
- Issue date Sep 2, 2008
- The University of Utah Research Foundation
- Clayton C. Williams
- G01 - MEASURING TESTING
Information Patent Grant
Field induced THz wave emission microscope
- Patent number 7,230,245
- Issue date Jun 12, 2007
- Rensselaer Polytechnic Institute
- Xi-Cheng Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Integrated EWP-STM spin resonance microscope
- Patent number 7,109,706
- Issue date Sep 19, 2006
- Intematix Corporation
- Xiao-Dong Xiang
- G01 - MEASURING TESTING
Information Patent Grant
Delay time modulation femtosecond time-resolved scanning probe micr...
- Patent number 7,002,149
- Issue date Feb 21, 2006
- Japan Science and Technology Agency
- Hidemi Shigekawa
- G01 - MEASURING TESTING
Information Patent Grant
Scanning tunneling microscope light emitting/condensing device
- Patent number 6,746,144
- Issue date Jun 8, 2004
- Japan Science and Technology Corporation
- Ryuichi Arafune
- G01 - MEASURING TESTING
Information Patent Grant
Difference frequency imaging and spectroscopy to measure dopants us...
- Patent number 6,597,194
- Issue date Jul 22, 2003
- The Penn State Research Foundation
- Paul S. Weiss
- G01 - MEASURING TESTING
Information Patent Grant
Measuring device for measuring the intensity and/or polarization of...
- Patent number 5,796,102
- Issue date Aug 18, 1998
- Stichting Katholieke Universiteit Nijmegen
- Herman Van Kempen
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and apparatus for dynamic observation of specimen
- Patent number 5,698,798
- Issue date Dec 16, 1997
- Hitachi, Ltd.
- Makiko Kohno
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Spectroscopy and mapping of atoms, molecules and surface features v...
- Patent number 5,661,301
- Issue date Aug 26, 1997
- The Penn State Research Foundation
- Paul S. Weiss
- B82 - NANO-TECHNOLOGY
Information Patent Grant
System for analyzing surfaces of samples
- Patent number 5,619,035
- Issue date Apr 8, 1997
- Biotechnology Research and Development Corporation
- Paul S. Weiss
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Small cavity analytical instruments
- Patent number 5,559,328
- Issue date Sep 24, 1996
- Biotechnology Research and Development Corporation
- Paul S. Weiss
- B82 - NANO-TECHNOLOGY
Information Patent Grant
System for analyzing surfaces of samples
- Patent number 5,504,366
- Issue date Apr 2, 1996
- Biotechnology Research and Development Corp.
- Paul S. Weiss
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Surface measuring apparatus using a probe microscope
- Patent number 5,431,055
- Issue date Jul 11, 1995
- Hitachi, Ltd.
- Keiji Takata
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Ultrafast scanning probe microscopy
- Patent number 5,416,327
- Issue date May 16, 1995
- Regents of the University of California
- Shimon Weiss
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning tunneling potentio-spectroscopic microscope and a data det...
- Patent number 5,378,983
- Issue date Jan 3, 1995
- Olympus Optical Co., Ltd.
- Akira Yagi
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscope having cantilever and detecting sample ch...
- Patent number 5,289,004
- Issue date Feb 22, 1994
- Olympus Optical Co., Ltd.
- Takao Okada
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Tunnelling acoustic microscope
- Patent number 5,222,396
- Issue date Jun 29, 1993
- Hitachi, Ltd.
- Keiji Takata
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
FREQUENCY COMB FEEDBACK CONTROL FOR SCANNING PROBE MICROSCOPY
- Publication number 20210302466
- Publication date Sep 30, 2021
- Mark J. Hagmann
- G01 - MEASURING TESTING
Information Patent Application
Frequency Comb Feedback Control for Scanning Probe Microscopy
- Publication number 20180364278
- Publication date Dec 20, 2018
- Mark J. Hagmann
- G01 - MEASURING TESTING
Information Patent Application
Method of carrier profiling in semiconductors
- Publication number 20180275164
- Publication date Sep 27, 2018
- Mark J. Hagmann
- G01 - MEASURING TESTING
Information Patent Application
QUANTUM MOLECULAR SEQUENCING (QM-SEQ): IDENTIFICATION OF UNIQUE NAN...
- Publication number 20180087102
- Publication date Mar 29, 2018
- The Regents of the University of Colorado
- Prashant Nagpal
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Application
QUANTUM MOLECULAR SEQUENCING (QM-SEQ): IDENTIFICATION OF UNIQUE NAN...
- Publication number 20160222445
- Publication date Aug 4, 2016
- The Regents of the University of Colorado, a Body Corporate
- Prashant Nagpal
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Application
SCANNING TUNNELING MICROSCOPE AND METHOD OF DISPLAYING OBSERVATION...
- Publication number 20150260756
- Publication date Sep 17, 2015
- Japan Science and Technology Agency
- Akira Saito
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR HEIGHT CONTROL FOR SINGLE ELECTRON TUNNELING FORCE SPECT...
- Publication number 20140366228
- Publication date Dec 11, 2014
- Clayton Covey Williams
- B82 - NANO-TECHNOLOGY
Information Patent Application
MEASUREMENT OF DEPTH AND ENERGY OF BURIED TRAP STATES IN DIELECTRIC...
- Publication number 20140345007
- Publication date Nov 20, 2014
- Clayton Covey Williams
- B82 - NANO-TECHNOLOGY
Information Patent Application
PUMP PROBE MEASURING DEVICE
- Publication number 20140240710
- Publication date Aug 28, 2014
- Japan Science and Technology Agency
- Hidemi Shigekawa
- B82 - NANO-TECHNOLOGY
Information Patent Application
SINGLE-CONTACT TUNNELING THERMOMETRY
- Publication number 20140003466
- Publication date Jan 2, 2014
- UT-Battelle, LLC
- Petro Maksymovych
- G01 - MEASURING TESTING
Information Patent Application
GENERATION OF A FREQUENCY COMB AND APPLICATIONS THEREOF
- Publication number 20130212751
- Publication date Aug 15, 2013
- LOS ALAMOS NATIONAL SECURITY, LLC
- Mark J. Hagmann
- B82 - NANO-TECHNOLOGY
Information Patent Application
Photon-Emission Scanning Tunneling Microscopy
- Publication number 20090300805
- Publication date Dec 3, 2009
- COMMISSARIAT A L'ENERGIE ATOMIQUE
- Fabrice Charra
- G01 - MEASURING TESTING
Information Patent Application
Scanning Probe Microscope System
- Publication number 20080258059
- Publication date Oct 23, 2008
- Riken
- Akira Saito
- G01 - MEASURING TESTING
Information Patent Application
Method of Determining Base Sequence of Nucleic Acid and Apparatus T...
- Publication number 20080215252
- Publication date Sep 4, 2008
- Tomoji Kawai
- G01 - MEASURING TESTING
Information Patent Application
SCANNING MICROSCOPY USING RESONANT QUANTUM TUNNELING
- Publication number 20080179516
- Publication date Jul 31, 2008
- Curt A. Flory
- G01 - MEASURING TESTING
Information Patent Application
Coherent electron junction scanning probe interference microscope,...
- Publication number 20070194225
- Publication date Aug 23, 2007
- Miguel Delmar Zorn
- G01 - MEASURING TESTING
Information Patent Application
Scanning probe characterization of surfaces
- Publication number 20060225164
- Publication date Oct 5, 2006
- The University of Utah
- Clayton C. Williams
- G01 - MEASURING TESTING
Information Patent Application
Integrated EWP-STM spin resonance microscope
- Publication number 20060071662
- Publication date Apr 6, 2006
- Intematix Corporation
- Xiao-Dong Xiang
- G01 - MEASURING TESTING
Information Patent Application
Field induced THz wave emission microscope
- Publication number 20060022141
- Publication date Feb 2, 2006
- Xi-Cheng Zhang
- G01 - MEASURING TESTING
Information Patent Application
Delay time modulation femtosecond time-resolved scanning probe micr...
- Publication number 20050035288
- Publication date Feb 17, 2005
- Hidemi Shigekawa
- G01 - MEASURING TESTING
Information Patent Application
Difference frequency imaging and spectroscopy to measure dopants us...
- Publication number 20020033708
- Publication date Mar 21, 2002
- Paul S. Weiss
- B82 - NANO-TECHNOLOGY

STS [Scanning Tunnelling Spectroscopy]

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method of carrier profiling in semiconductors

Frequency comb feedback control for scanning probe microscopy

Quantum molecular sequencing (QM-SEQ): identification of unique nan...

Method of carrier profiling utilizing dielectric relaxation

Scanning tunneling microscope and method of displaying observation...

Single-contact tunneling thermometry

Method for height control for single electron tunneling force spect...

Measurement of depth and energy of buried trap states in dielectric...

Pump probe measuring device

Generation of a frequency comb and applications thereof

Photon-emission scanning tunneling microscopy

Scanning probe microscope system

Scanning microscopy using resonant quantum tunneling

Scanning probe characterization of surfaces

Field induced THz wave emission microscope

Integrated EWP-STM spin resonance microscope

Delay time modulation femtosecond time-resolved scanning probe micr...

Scanning tunneling microscope light emitting/condensing device

Difference frequency imaging and spectroscopy to measure dopants us...

Measuring device for measuring the intensity and/or polarization of...

Method and apparatus for dynamic observation of specimen

Spectroscopy and mapping of atoms, molecules and surface features v...

System for analyzing surfaces of samples

Small cavity analytical instruments

System for analyzing surfaces of samples

Surface measuring apparatus using a probe microscope

Ultrafast scanning probe microscopy

Scanning tunneling potentio-spectroscopic microscope and a data det...

Scanning probe microscope having cantilever and detecting sample ch...

Tunnelling acoustic microscope

Patents Applicationslast 30 patents

FREQUENCY COMB FEEDBACK CONTROL FOR SCANNING PROBE MICROSCOPY

Frequency Comb Feedback Control for Scanning Probe Microscopy

Method of carrier profiling in semiconductors

QUANTUM MOLECULAR SEQUENCING (QM-SEQ): IDENTIFICATION OF UNIQUE NAN...

QUANTUM MOLECULAR SEQUENCING (QM-SEQ): IDENTIFICATION OF UNIQUE NAN...

SCANNING TUNNELING MICROSCOPE AND METHOD OF DISPLAYING OBSERVATION...

METHOD FOR HEIGHT CONTROL FOR SINGLE ELECTRON TUNNELING FORCE SPECT...

MEASUREMENT OF DEPTH AND ENERGY OF BURIED TRAP STATES IN DIELECTRIC...

PUMP PROBE MEASURING DEVICE

SINGLE-CONTACT TUNNELING THERMOMETRY

GENERATION OF A FREQUENCY COMB AND APPLICATIONS THEREOF

Photon-Emission Scanning Tunneling Microscopy

Scanning Probe Microscope System

Method of Determining Base Sequence of Nucleic Acid and Apparatus T...

SCANNING MICROSCOPY USING RESONANT QUANTUM TUNNELING

Coherent electron junction scanning probe interference microscope,...

Scanning probe characterization of surfaces

Integrated EWP-STM spin resonance microscope

Field induced THz wave emission microscope

Delay time modulation femtosecond time-resolved scanning probe micr...

Difference frequency imaging and spectroscopy to measure dopants us...