superlattices

Follow

Industry

CPC
G01N2223/603

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

Current Industry

G01N2223/603superlattices

Industries

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Methods for in situ monitoring and control of defect formation or h...
- Patent number 10,203,295
- Issue date Feb 12, 2019
- Lockheed Martin Corporation
- Jacob L. Swett
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND DEVICE FOR DETERMINING STRUCTURE OF MULTI-ELEMENT CRYSTAL
- Publication number 20170097310
- Publication date Apr 6, 2017
- Samsung Electronics Co., Ltd.
- You Young SONG
- G01 - MEASURING TESTING