Supply to maintain constant beam intensity

Industry

CPC
G01N2201/0695

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2201/00Features of devices classified in G01N21/00

Current Industry

G01N2201/0695Supply to maintain constant beam intensity

Industries

Patents Grantslast 30 patents

Information Patent Grant
Systems and methods for an absorbance detector with optical reference
- Patent number 11,513,006
- Issue date Nov 29, 2022
- Phoseon Technology, Inc.
- Lowell Brunson
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for an absorbance detector with optical reference
- Patent number 10,876,893
- Issue date Dec 29, 2020
- Phoseon Technology, Inc.
- Lowell Brunson
- G02 - OPTICS
Information Patent Grant
Automatic analysis apparatus including a reaction container holding...
- Patent number 10,753,870
- Issue date Aug 25, 2020
- HITACHI HIGH-TECH CORPORATION
- Yuya Matsuoka
- G01 - MEASURING TESTING
Information Patent Grant
Container inspection device and container inspection method for ins...
- Patent number 10,261,029
- Issue date Apr 16, 2019
- Krones AG
- Christof Will
- G01 - MEASURING TESTING
Information Patent Grant
Optical analyzer
- Patent number 9,877,368
- Issue date Jan 23, 2018
- Shimadzu Corporation
- Yusuke Nagai
- G01 - MEASURING TESTING
Information Patent Grant
Method and system to compensate for lamp intensity differences in a...
- Patent number 7,680,321
- Issue date Mar 16, 2010
- Tokyo Electron Limited
- David Dixon
- G01 - MEASURING TESTING
Information Patent Grant
Body fluid constituents measurement device
- Patent number 7,551,282
- Issue date Jun 23, 2009
- Terumo Kabushiki Kaisha
- Yoshihisa Sugawara
- G01 - MEASURING TESTING
Information Patent Grant
Method and system to compensate for lamp intensity differences in a...
- Patent number 7,359,545
- Issue date Apr 15, 2008
- Tokyo Electron Limited
- David Dixon
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for determining a material's characteristics b...
- Patent number 5,270,797
- Issue date Dec 14, 1993
- Brooklyn College Foundation
- Fred H. Pollak
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for determining a material's characteristics b...
- Patent number 5,260,772
- Issue date Nov 9, 1993
- Fred H. Pollak
- G01 - MEASURING TESTING
Information Patent Grant
Photoreflectance method and apparatus utilizing acousto-optic modul...
- Patent number 5,255,071
- Issue date Oct 19, 1993
- Fred H. Pollak
- G01 - MEASURING TESTING
Information Patent Grant
Color monitoring with data storage means
- Patent number 5,239,175
- Issue date Aug 24, 1993
- The Secretary of State for Defence in Her Britannic Majesty's Government of t...
- Sajad M. Jawad
- G01 - MEASURING TESTING
Information Patent Grant
Method for in-situ determination of the fermi level in GaAs and sim...
- Patent number 5,159,410
- Issue date Oct 27, 1992
- Fred H. Pollak
- G01 - MEASURING TESTING
Information Patent Grant
Particle concentration measuring method and device
- Patent number 4,981,362
- Issue date Jan 1, 1991
- Xerox Corporation
- Joannes N. M. deJong
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEMS AND METHODS FOR AN ABSORBANCE DETECTOR WITH OPTICAL REFERENCE
- Publication number 20230055025
- Publication date Feb 23, 2023
- PHOSEON TECHNOLOGY, INC.
- Lowell Brunson
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYZING APPARATUS
- Publication number 20130243657
- Publication date Sep 19, 2013
- Keiko Yoshikawa
- G01 - MEASURING TESTING
Information Patent Application
BODY FLUID CONSTITUENTS MEASUREMENT DEVICE
- Publication number 20080309939
- Publication date Dec 18, 2008
- Terumo Kabushiki Kaisha
- Yoshihisa SUGAWARA
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM TO COMPENSATE FOR LAMP INTENSITY DIFFERENCES IN A...
- Publication number 20080218745
- Publication date Sep 11, 2008
- TOKYO ELECTRON LIMITED
- David Dixon
- G01 - MEASURING TESTING
Information Patent Application
Method and system to compensate for lamp intensity differences in a...
- Publication number 20050146716
- Publication date Jul 7, 2005
- TOKYO ELECTRON LIMITED
- David Dixon
- G01 - MEASURING TESTING

Supply to maintain constant beam intensity

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Systems and methods for an absorbance detector with optical reference

Systems and methods for an absorbance detector with optical reference

Automatic analysis apparatus including a reaction container holding...

Container inspection device and container inspection method for ins...

Optical analyzer

Method and system to compensate for lamp intensity differences in a...

Body fluid constituents measurement device

Method and system to compensate for lamp intensity differences in a...

Method and apparatus for determining a material's characteristics b...

Method and apparatus for determining a material's characteristics b...

Photoreflectance method and apparatus utilizing acousto-optic modul...

Color monitoring with data storage means

Method for in-situ determination of the fermi level in GaAs and sim...

Particle concentration measuring method and device

Patents Applicationslast 30 patents

SYSTEMS AND METHODS FOR AN ABSORBANCE DETECTOR WITH OPTICAL REFERENCE

AUTOMATIC ANALYZING APPARATUS

BODY FLUID CONSTITUENTS MEASUREMENT DEVICE

METHOD AND SYSTEM TO COMPENSATE FOR LAMP INTENSITY DIFFERENCES IN A...

Method and system to compensate for lamp intensity differences in a...