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Switches for altering the measuring range or for multitesters
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G01R15/002
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PHYSICS
G01
Measuring instruments
G01R
MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES
G01R15/00
Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00 and G01R33/00 - G01R35/00
Current Industry
G01R15/002
Switches for altering the measuring range or for multitesters
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Patents Grants
last 30 patents
Information
Patent Grant
Multi-level voltage detector
Patent number
11,808,792
Issue date
Nov 7, 2023
Texas Instruments Incorporated
Keliu Shu
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Grant
AC impedance measurement circuit with calibration function
Patent number
11,567,113
Issue date
Jan 31, 2023
Hycon Technology Corporation
Po-Yin Chao
G01 - MEASURING TESTING
Information
Patent Grant
AC impedance measurement circuit with calibration function
Patent number
11,280,818
Issue date
Mar 22, 2022
Hycon Technology Corporation
Po-Yin Chao
G01 - MEASURING TESTING
Information
Patent Grant
Current detection circuit and power converter
Patent number
11,209,464
Issue date
Dec 28, 2021
Silergy Semiconductor Technology (Hangzhou) Ltd.
Kaiwei Yao
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Grant
Assembly with at least two redundant analog input units for a measu...
Patent number
11,079,409
Issue date
Aug 3, 2021
Siemens Aktiengesellschaft
Willi Maier
G01 - MEASURING TESTING
Information
Patent Grant
Electronic amplification device, measurement apparatus and associat...
Patent number
10,845,391
Issue date
Nov 24, 2020
Commissariat a l'Energie Atomique et Aux Energies Alternatives
Hassen Hamrita
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Tracking energy consumption using a sepic-converter technique
Patent number
10,802,058
Issue date
Oct 13, 2020
Texas Instruments Incorporated
Horst Diewald
G01 - MEASURING TESTING
Information
Patent Grant
Voltage sensing device
Patent number
10,429,447
Issue date
Oct 1, 2019
Denso Corporation
Kazutaka Honda
G01 - MEASURING TESTING
Information
Patent Grant
Multiple channel capacitive voltage divider scanning method and app...
Patent number
10,408,862
Issue date
Sep 10, 2019
Microchip Technology Incorporated
Xiang Gao
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Tracking energy consumption using a sepic-converter technique
Patent number
9,885,740
Issue date
Feb 6, 2018
Texas Instruments Incorporated
Horst Diewald
G01 - MEASURING TESTING
Information
Patent Grant
Multiple channel capacitive voltage divider scanning method and app...
Patent number
9,857,394
Issue date
Jan 2, 2018
Microchip Technology Incorporated
Xiang Gao
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Dual-function switch and lead set for electrical instrument probes
Patent number
9,618,538
Issue date
Apr 11, 2017
Paul Nicholas Chait
G01 - MEASURING TESTING
Information
Patent Grant
Disaggregation apparatus for identifying an appliance in an electri...
Patent number
9,523,718
Issue date
Dec 20, 2016
Philips Lighting Holding B.V.
Ronald Rietman
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Grant
Method and arrangement for determining an electrical characteristic...
Patent number
9,442,137
Issue date
Sep 13, 2016
Siemens Aktiengesellschaft
Kaj Skov Nielsen
F03 - MACHINES OR ENGINES FOR LIQUIDS WIND, SPRING WEIGHT AND MISCELLANEOUS M...
Information
Patent Grant
System for measuring current and method of making same
Patent number
9,063,178
Issue date
Jun 23, 2015
Eaton Corporation
James H. Woelfel
G01 - MEASURING TESTING
Information
Patent Grant
Multimeter
Patent number
8,981,759
Issue date
Mar 17, 2015
Hioki E.E. Corporation
Toshio Heishi
G01 - MEASURING TESTING
Information
Patent Grant
Digital multimeter having improved rotary switch assembly
Patent number
8,946,571
Issue date
Feb 3, 2015
Fluke Corporation
Jeffrey E. Worones
G01 - MEASURING TESTING
Information
Patent Grant
Dual-range measurement of electrical current
Patent number
8,143,880
Issue date
Mar 27, 2012
Agilent Technologies, Inc.
Marko Vulovic
G01 - MEASURING TESTING
Information
Patent Grant
System and method utilizing virtual switching for upgrading multifu...
Patent number
8,116,996
Issue date
Feb 14, 2012
Electro Industries/ Gauge Tech
Erran Kagan
G01 - MEASURING TESTING
Information
Patent Grant
Digital multimeter having improved rotary switch assembly
Patent number
8,093,516
Issue date
Jan 10, 2012
Fluke Corporation
Jeffrey E. Worones
G01 - MEASURING TESTING
Information
Patent Grant
Rotary switch memory for digital multimeter
Patent number
8,076,926
Issue date
Dec 13, 2011
Fluke Corporation
Anthony Garland
G01 - MEASURING TESTING
Information
Patent Grant
Measurement apparatus, test apparatus and measurement method
Patent number
7,973,543
Issue date
Jul 5, 2011
Advantest Corporation
Hiroki Andoh
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for measuring the amount of the current in bat...
Patent number
7,696,727
Issue date
Apr 13, 2010
LG Chem, Ltd.
Jin Ho Choi
G01 - MEASURING TESTING
Information
Patent Grant
Digital multimeter having improved recording functionality
Patent number
7,679,356
Issue date
Mar 16, 2010
Fluke Corporation
Anthony C. Garland
G01 - MEASURING TESTING
Information
Patent Grant
System and method utilizing virtual switching for substation automa...
Patent number
7,660,684
Issue date
Feb 9, 2010
Electro Industries/Gauge Tech
Erran Kagan
G01 - MEASURING TESTING
Information
Patent Grant
System and method for configuring a display for a digital multimeter
Patent number
7,626,375
Issue date
Dec 1, 2009
Fluke Corporation
Anthony C. Garland
G01 - MEASURING TESTING
Information
Patent Grant
Multimeter
Patent number
7,439,725
Issue date
Oct 21, 2008
GMC-I Gossen- Metrawatt GmbH
Günter Fischer
G01 - MEASURING TESTING
Information
Patent Grant
System and method utilizing virtual switching for electrical panel...
Patent number
7,313,489
Issue date
Dec 25, 2007
Electro Industries/GaugeTech
Erran Kagan
G01 - MEASURING TESTING
Information
Patent Grant
System and method utilizing virtual switching for electrical panel...
Patent number
7,155,350
Issue date
Dec 26, 2006
Erran Kagan
G01 - MEASURING TESTING
Information
Patent Grant
Switching circuit for current measurement range resistor and curren...
Patent number
7,141,984
Issue date
Nov 28, 2006
Agilent Technologies, Inc.
Shinichi Tanida
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
CIRCUIT FOR IMPEDANCE MEASUREMENTS
Publication number
20240418757
Publication date
Dec 19, 2024
Mettler-Toledo GmbH
Stefan Olejiniczak
G01 - MEASURING TESTING
Information
Patent Application
MULTI-LEVEL VOLTAGE DETECTOR
Publication number
20240069073
Publication date
Feb 29, 2024
TEXAS INSTRUMENTS INCORPORATED
Keliu Shu
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Application
AC Impedance Measurement Circuit with Calibration Function
Publication number
20220074980
Publication date
Mar 10, 2022
Hycon Technology Corporation
Po-Yin Chao
G01 - MEASURING TESTING
Information
Patent Application
AC Impedance Measurement Circuit with Calibration Function
Publication number
20210382100
Publication date
Dec 9, 2021
Hycon Technology Corporation
Po-Yin Chao
G01 - MEASURING TESTING
Information
Patent Application
CURRENT DETECTION CIRCUIT AND POWER CONVERTER
Publication number
20200333379
Publication date
Oct 22, 2020
SILERGY SEMICONDUCTOR TECHNOLOGY (HANGZHOU) LTD
Kaiwei Yao
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Application
Assembly With at Least Two Redundant Analog Input Units for a Measu...
Publication number
20200309821
Publication date
Oct 1, 2020
SIEMENS AKTIENGESELISCHAFT
Willi MAIER
G01 - MEASURING TESTING
Information
Patent Application
ELECTRONIC AMPLIFICATION DEVICE, MEASUREMENT APPARATUS AND ASSOCIAT...
Publication number
20190204360
Publication date
Jul 4, 2019
Commissariat A L'Energie Atomique et Aux Energies Alternatives
Hassen Hamrita
G01 - MEASURING TESTING
Information
Patent Application
TRACKING ENERGY CONSUMPTION USING A SEPIC-CONVERTER TECHNIQUE
Publication number
20190041435
Publication date
Feb 7, 2019
Texas Instruments Deutschland GmbH
Horst Diewald
G01 - MEASURING TESTING
Information
Patent Application
Multiple Channel Capacitive Voltage Divider Scanning Method And App...
Publication number
20180120355
Publication date
May 3, 2018
MICROCHIP TECHNOLOGY INCORPORATED
Xiang Gao
G01 - MEASURING TESTING
Information
Patent Application
POWER DETECTION CIRCUIT
Publication number
20170276705
Publication date
Sep 28, 2017
Apple Inc.
Michael R. Seningen
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATED TEST PLATFORM
Publication number
20160291057
Publication date
Oct 6, 2016
XCERRA CORPORATION
Wai-Kong Chen
G01 - MEASURING TESTING
Information
Patent Application
Circuit for Determining Load Type of a Serially Connected Electrica...
Publication number
20160178669
Publication date
Jun 23, 2016
David Rothenberger
G01 - MEASURING TESTING
Information
Patent Application
TRACKING ENERGY CONSUMPTION USING A SEPIC-COVERTER TECHNIQUE
Publication number
20160077138
Publication date
Mar 17, 2016
Texas Instruments Deutschland GmbH
Horst Diewald
G01 - MEASURING TESTING
Information
Patent Application
Dual-Function Switch and Lead Set for Electrical Instrument Probes
Publication number
20150309077
Publication date
Oct 29, 2015
Paul Nicholas Chait
G01 - MEASURING TESTING
Information
Patent Application
TRANSFORMER CONNECTION PHASE DETERMINATION DEVICE, METHOD, AND PROGRAM
Publication number
20150134281
Publication date
May 14, 2015
Fujitsu Limited
Hironobu KITAJIMA
G01 - MEASURING TESTING
Information
Patent Application
MULTIPLE CHANNEL CAPACITIVE VOLTAGE DIVIDER SCANNING METHOD AND APP...
Publication number
20150097583
Publication date
Apr 9, 2015
MICROCHIP TECHNOLOGY INCORPORATED
Xiang Gao
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND ARRANGEMENT FOR DETERMINING AN ELECTRICAL CHARACTERISTIC...
Publication number
20140327430
Publication date
Nov 6, 2014
Kaj Skov Nielsen
G01 - MEASURING TESTING
Information
Patent Application
TRACKING ENERGY CONSUMPTION USING A SEPIC-CONVERTER TECHNIQUE
Publication number
20140300343
Publication date
Oct 9, 2014
TEXAS INSTRUMENTS INCORPORATED
Horst Diewald
G01 - MEASURING TESTING
Information
Patent Application
MULTIMETER
Publication number
20140002059
Publication date
Jan 2, 2014
HIOKI E.E. CORPORATION
Toshio HEISHI
G01 - MEASURING TESTING
Information
Patent Application
DISAGGREGATION APPARATUS FOR IDENTIFYING AN APPLIANCE IN AN ELECTRI...
Publication number
20130187665
Publication date
Jul 25, 2013
Koninklijke Philips Electronics N.V.
Ronald Rietman
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM FOR MEASURING CURRENT AND METHOD OF MAKING SAME
Publication number
20130027022
Publication date
Jan 31, 2013
James H. Woelfel
G01 - MEASURING TESTING
Information
Patent Application
ELECTRIC METER WITH BACKLIGHT INDICATOR
Publication number
20120307478
Publication date
Dec 6, 2012
SHAW-LIN LIU
G01 - MEASURING TESTING
Information
Patent Application
Voltage Conversion and/or Electrical Measurements from 400 Volts Up...
Publication number
20120176103
Publication date
Jul 12, 2012
VERIVOLT, LLC
Juan Lizarazo
G01 - MEASURING TESTING
Information
Patent Application
DIGITAL MULTIMETER HAVING IMPROVED ROTARY SWITCH ASSEMBLY
Publication number
20120103765
Publication date
May 3, 2012
FLUKE CORPORATION
Jeffrey E. Worones
G01 - MEASURING TESTING
Information
Patent Application
DUAL-RANGE MEASUREMENT OF ELECTRICAL CURRENT
Publication number
20110025299
Publication date
Feb 3, 2011
Marko Vulovic
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD UTILIZING VIRTUAL SWITCHING FOR UPGRADING MULTIFU...
Publication number
20100138001
Publication date
Jun 3, 2010
Electro Industries/Gauge Tech.
Erran Kagan
G01 - MEASURING TESTING
Information
Patent Application
MEASUREMENT APPARATUS, TEST APPARATUS AND MEASUREMENT METHOD
Publication number
20100007327
Publication date
Jan 14, 2010
Advantest Corporation
HIROKI ANDOH
G01 - MEASURING TESTING
Information
Patent Application
ROTARY SWITCH MEMORY FOR DIGITAL MULTIMETER
Publication number
20090128126
Publication date
May 21, 2009
FLUKE CORPORATION
Anthony GARLAND
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR CONFIGURING A DISPLAY FOR A DIGITAL MULTIMETER
Publication number
20090045800
Publication date
Feb 19, 2009
FLUKE CORPORATION
Anthony C. GARLAND
G01 - MEASURING TESTING
Information
Patent Application
Digital multimeter having improved rotary switch assembly
Publication number
20090045038
Publication date
Feb 19, 2009
Jeffrey E. Worones
G01 - MEASURING TESTING