synchrotron

Industry

CPC
G01N2223/203

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

Current Industry

G01N2223/203synchrotron

Industries

Patents Grantslast 30 patents

Information Patent Grant
Serial synchrotron crystallography sample holding system
- Patent number 12,007,342
- Issue date Jun 11, 2024
- MITEGEN, LLC
- Robert E. Thorne
- G01 - MEASURING TESTING
Information Patent Grant
Single piece droplet generation and injection device for serial cry...
- Patent number 11,624,718
- Issue date Apr 11, 2023
- Arizona Board of Regents on behalf of Arizona State University
- Alexandra Ros
- G01 - MEASURING TESTING
Information Patent Grant
Scintillation array apparatus and method of use thereof
- Patent number 10,279,198
- Issue date May 7, 2019
- W. Davis Lee
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Scintillation array apparatus and method of use thereof
- Patent number 9,974,978
- Issue date May 22, 2018
- W. Davis Lee
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Method of measuring crosslink densities in sulfur-containing polyme...
- Patent number 9,874,530
- Issue date Jan 23, 2018
- Sumitomo Rubber Industries, Ltd.
- Fusae Kaneko
- G01 - MEASURING TESTING
Information Patent Grant
Deterioration analyzing method
- Patent number 9,851,342
- Issue date Dec 26, 2017
- Sumitomo Rubber Industries, Ltd.
- Fusae Kaneko
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of detecting polymorphs using synchrotron radiation
- Patent number 9,513,237
- Issue date Dec 6, 2016
- ZETACUBE S.R.L.
- Roberto Brescello
- G01 - MEASURING TESTING
Information Patent Grant
Solid material characterization with X-ray spectra in both transmis...
- Patent number 8,693,626
- Issue date Apr 8, 2014
- UOP LLC
- Simon Russell Bare
- G01 - MEASURING TESTING
Information Patent Grant
Phase-sensitive X-ray imager
- Patent number 8,351,569
- Issue date Jan 8, 2013
- Lawrence Livermore National Security, LLC
- Kevin Louis Baker
- G01 - MEASURING TESTING
Information Patent Grant
Radiation phase contrast imaging apparatus
- Patent number 8,184,771
- Issue date May 22, 2012
- FUJIFILM Corporation
- Dai Murakoshi
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
X-ray tomographic image magnification process, system and apparatus...
- Patent number 5,245,648
- Issue date Sep 14, 1993
- The United States of America as represented by the United States Department o...
- John H. Kinney
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SERIAL SYNCHROTRON CRYSTALLOGRAPHY SAMPLE HOLDING SYSTEM
- Publication number 20240328969
- Publication date Oct 3, 2024
- MITEGEN, LLC
- Robert E. Thorne
- G01 - MEASURING TESTING
Information Patent Application
SERIAL SYNCHROTRON CRYSTALLOGRAPHY SAMPLE HOLDING SYSTEM
- Publication number 20240319120
- Publication date Sep 26, 2024
- MITEGEN, LLC
- Robert E. Thorne
- G01 - MEASURING TESTING
Information Patent Application
SINGLE PIECE DROPLET GENERATION AND INJECTION DEVICE FOR SERIAL CRY...
- Publication number 20230243765
- Publication date Aug 3, 2023
- Alexandra Ros
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
LIQUID SAMPLE DELIVERY DEVICE
- Publication number 20230234043
- Publication date Jul 27, 2023
- SERIAL X AB
- Richard NEUTZE
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Application
SERIAL SYNCHROTRON CRYSTALLOGRAPHY SAMPLE HOLDING SYSTEM
- Publication number 20220146441
- Publication date May 12, 2022
- MITEGEN, LLC
- Robert E. Thorne
- G01 - MEASURING TESTING
Information Patent Application
SCINTILLATION ARRAY APPARATUS AND METHOD OF USE THEREOF
- Publication number 20180133512
- Publication date May 17, 2018
- W. Davis Lee
- G01 - MEASURING TESTING
Information Patent Application
DETERIORATION ANALYZING METHOD
- Publication number 20140349407
- Publication date Nov 27, 2014
- Fusae Kaneko
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF DETECTING POLYMORPHS USING SYNCHROTRON RADIATION
- Publication number 20140185767
- Publication date Jul 3, 2014
- ZACH SYSTEM S.P.A.
- Roberto Brescello
- G01 - MEASURING TESTING
Information Patent Application
SOLID MATERIAL CHARACTERIZATION WITH X-RAY SPECTRA IN BOTH TRANSMIS...
- Publication number 20120321039
- Publication date Dec 20, 2012
- UOP LLC
- SIMON RUSSELL BARE
- G01 - MEASURING TESTING
Information Patent Application
PHASE-SENSITIVE X-RAY IMAGER
- Publication number 20100316190
- Publication date Dec 16, 2010
- Kevin Louis Baker
- G01 - MEASURING TESTING
Information Patent Application
RADIATION PHASE CONTRAST IMAGING APPARATUS
- Publication number 20100246765
- Publication date Sep 30, 2010
- FUJIFILM CORPORATION
- Dai MURAKOSHI
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE

synchrotron

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Serial synchrotron crystallography sample holding system

Single piece droplet generation and injection device for serial cry...

Scintillation array apparatus and method of use thereof

Scintillation array apparatus and method of use thereof

Method of measuring crosslink densities in sulfur-containing polyme...

Deterioration analyzing method

Method of detecting polymorphs using synchrotron radiation

Solid material characterization with X-ray spectra in both transmis...

Phase-sensitive X-ray imager

Radiation phase contrast imaging apparatus

X-ray tomographic image magnification process, system and apparatus...

Patents Applicationslast 30 patents

SERIAL SYNCHROTRON CRYSTALLOGRAPHY SAMPLE HOLDING SYSTEM

SERIAL SYNCHROTRON CRYSTALLOGRAPHY SAMPLE HOLDING SYSTEM

SINGLE PIECE DROPLET GENERATION AND INJECTION DEVICE FOR SERIAL CRY...

LIQUID SAMPLE DELIVERY DEVICE

SERIAL SYNCHROTRON CRYSTALLOGRAPHY SAMPLE HOLDING SYSTEM

SCINTILLATION ARRAY APPARATUS AND METHOD OF USE THEREOF

DETERIORATION ANALYZING METHOD

METHOD OF DETECTING POLYMORPHS USING SYNCHROTRON RADIATION

SOLID MATERIAL CHARACTERIZATION WITH X-RAY SPECTRA IN BOTH TRANSMIS...

PHASE-SENSITIVE X-RAY IMAGER

RADIATION PHASE CONTRAST IMAGING APPARATUS