System of scan mirrors for composite motion of beam

Industry

CPC
G01N2201/1053

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2201/00Features of devices classified in G01N21/00

Current Industry

G01N2201/1053System of scan mirrors for composite motion of beam

Industries

Patents Grantslast 30 patents

Information Patent Grant
Line scanning mechanical streak systems and methods for phosphoresc...
- Patent number 11,815,456
- Issue date Nov 14, 2023
- Purdue Research Foundation
- Meng Cui
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Welding monitoring system and welding monitoring method
- Patent number 11,029,254
- Issue date Jun 8, 2021
- Hitachi, Ltd.
- Ryoji Nakagawa
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Fast two-photon imaging by diffracted swept-laser excitation
- Patent number 11,009,459
- Issue date May 18, 2021
- The Regents of the University of California
- Sebastian Karpf
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mirror device, mirror drive method, light irradiation device, and i...
- Patent number 10,962,768
- Issue date Mar 30, 2021
- Hamamatsu Photonics K.K.
- Akira Takahashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Welding monitoring system and welding monitoring method
- Patent number 10,935,500
- Issue date Mar 2, 2021
- Hitachi, Ltd.
- Ryoji Nakagawa
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Mirror device, mirror drive method, light irradiation device, and i...
- Patent number 10,761,318
- Issue date Sep 1, 2020
- Hamamatsu Photonics K.K.
- Akira Takahashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method, apparatus and software for detection and localization of hi...
- Patent number 10,753,862
- Issue date Aug 25, 2020
- STICHTING HET NEDERLANDS KANKER INSTITUUT-ANTONI VAN LEEUWENHOEK ZIEKENHUIS
- Theodoor Jacques Marie Ruers
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Microscope and microscopy method
- Patent number 10,209,502
- Issue date Feb 19, 2019
- Olympus Corporation
- Kentaro Imoto
- G02 - OPTICS
Information Patent Grant
Optical metrology system for spectral imaging of a sample
- Patent number 9,846,122
- Issue date Dec 19, 2017
- Nanometrics Incorporated
- Andrzej Buczkowski
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Optoelectronic sensor and method for the transmission monitoring of...
- Patent number 9,810,626
- Issue date Nov 7, 2017
- Sick AG
- Joachim Kramer
- G01 - MEASURING TESTING
Information Patent Grant
Fluorescence imaging autofocus systems and methods
- Patent number 9,366,630
- Issue date Jun 14, 2016
- Li-Cor, Inc.
- Ahmed Bouzid
- G01 - MEASURING TESTING
Information Patent Grant
Image acquisition device and image acquisition method
- Patent number 9,291,807
- Issue date Mar 22, 2016
- Sony Corporation
- Junichi Sakagami
- G01 - MEASURING TESTING
Information Patent Grant
Multi-channel fluorescence detecting module and nucleic acid analys...
- Patent number 9,244,014
- Issue date Jan 26, 2016
- Samsung Electronics Co., Ltd.
- Kyung-ho Kim
- G01 - MEASURING TESTING
Information Patent Grant
Non-ionizing imager
- Patent number 9,084,535
- Issue date Jul 21, 2015
- King's College London
- John Michael Girkin
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Optical illumination apparatus and method having a reflective arran...
- Patent number 8,742,384
- Issue date Jun 3, 2014
- Koninklijke Philips N.V.
- Erik Martinus Hubertus Petrus Van Dijk
- G01 - MEASURING TESTING
Information Patent Grant
System and method for carrying out fibre-type multiphoton microscop...
- Patent number 8,237,131
- Issue date Aug 7, 2012
- Mauna Kea Technologies
- Bertrand Viellerobe
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Mapping-measurement apparatus
- Patent number 7,224,460
- Issue date May 29, 2007
- Jasco Corporation
- Noriaki Soga
- G01 - MEASURING TESTING
Information Patent Grant
3D profile analysis for surface contour inspection
- Patent number 6,366,689
- Issue date Apr 2, 2002
- ASTI, Inc.
- Sreenivas Rao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Three dimensional scanning system
- Patent number 5,276,546
- Issue date Jan 4, 1994
- Beaty; Butch
- Steven G. Palm
- G02 - OPTICS
Information Patent Grant
Three dimensional scanning system
- Patent number 5,173,796
- Issue date Dec 22, 1992
- Steven G. Palm
- G02 - OPTICS
Information Patent Grant
Photothermal test process, apparatus for performing the process and...
- Patent number 5,118,945
- Issue date Jun 2, 1992
- Siemens Aktiengesellschaft
- Erich Winschuh
- G01 - MEASURING TESTING
Information Patent Grant
Foreign particle detecting method and apparatus
- Patent number 4,669,875
- Issue date Jun 2, 1987
- Hitachi, Ltd.
- Masataka Shiba
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DIGITAL MIRROR DEVICE BASED CODE-DIVISION MULTIPLEXED RAMAN OPTICAL...
- Publication number 20220317046
- Publication date Oct 6, 2022
- CytoVeris Inc.
- Alan Kersey
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
LINE SCANNING MECHANICAL STREAK SYSTEMS AND METHODS FOR PHOSPHORESC...
- Publication number 20220065783
- Publication date Mar 3, 2022
- Purdue Research Foundation
- Meng Cui
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MIRROR DEVICE, MIRROR DRIVE METHOD, LIGHT IRRADIATION DEVICE, AND I...
- Publication number 20200319452
- Publication date Oct 8, 2020
- HAMAMATSU PHOTONICS K. K.
- Akira TAKAHASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGE GENERATION DEVICE
- Publication number 20190310464
- Publication date Oct 10, 2019
- Fraunhofer-Gesellschaft zur Forderung der angewandten Forschung e.V.
- Joachim Janes
- G02 - OPTICS
Information Patent Application
MIRROR DEVICE, MIRROR DRIVE METHOD, LIGHT IRRADIATION DEVICE, AND I...
- Publication number 20190121125
- Publication date Apr 25, 2019
- Hamamatsu Photonics K.K.
- Akira TAKAHASHI
- G01 - MEASURING TESTING
Information Patent Application
WELDING MONITORING SYSTEM AND WELDING MONITORING METHOD
- Publication number 20180321162
- Publication date Nov 8, 2018
- Hitachi, Ltd
- Ryoji NAKAGAWA
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
WELDING MONITORING SYSTEM AND WELDING MONITORING METHOD
- Publication number 20180113077
- Publication date Apr 26, 2018
- Hitachi, Ltd
- Ryoji NAKAGAWA
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
SURFACE SHAPE MEASURING APPARATUS AND DEFECT DETERMINING APPARATUS
- Publication number 20170241773
- Publication date Aug 24, 2017
- Canon Kabushiki Kaisha
- Masayuki Nishiwaki
- G01 - MEASURING TESTING
Information Patent Application
MICROSCOPE AND MICROSCOPY METHOD
- Publication number 20170010453
- Publication date Jan 12, 2017
- OLYMPUS CORPORATION
- Kentaro IMOTO
- G02 - OPTICS
Information Patent Application
OPTOELECTRONIC SENSOR AND METHOD FOR THE TRANSMISSION MONITORING OF...
- Publication number 20160299072
- Publication date Oct 13, 2016
- SICK AG
- Joachim KRAMER
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL METROLOGY SYSTEM FOR SPECTRAL IMAGING OF A SAMPLE
- Publication number 20160290927
- Publication date Oct 6, 2016
- Nanometrics Incorporated
- Andrzej Buczkowski
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL METROLOGY SYSTEM FOR SPECTRAL IMAGING OF A SAMPLE
- Publication number 20160116411
- Publication date Apr 28, 2016
- Nanometrics Incorporated
- Andrzej Buczkowski
- G01 - MEASURING TESTING
Information Patent Application
FLUORESCENCE IMAGING AUTOFOCUS SYSTEMS AND METHODS
- Publication number 20160069808
- Publication date Mar 10, 2016
- Li-cor, Inc.
- Ahmed BOUZID
- G02 - OPTICS
Information Patent Application
NON-DESTRUCTIVE INSPECTION SYSTEM FOR DISPLAY PANEL AND METHOD, AND...
- Publication number 20150138564
- Publication date May 21, 2015
- Samsung Electronics Co., Ltd.
- Yeong Ri JUNG
- G01 - MEASURING TESTING
Information Patent Application
MULTI-CHANNEL FLUORESCENCE DETECTING MODULE AND NUCLEIC ACID ANALYS...
- Publication number 20150037876
- Publication date Feb 5, 2015
- Samsung Electronics Co., Ltd.
- Kyung-ho Kim
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL ILLUMINATION APPARATUS AND METHOD
- Publication number 20110068260
- Publication date Mar 24, 2011
- Koninklijke Philips Electronics N.V.
- Erik Martinus Hubertus Petrus Van Dijk
- G02 - OPTICS
Information Patent Application
NON-IONISING IMAGER
- Publication number 20100137722
- Publication date Jun 3, 2010
- John Michael Girkin
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
MICROSCOPE
- Publication number 20100014156
- Publication date Jan 21, 2010
- Yoshinori Iketaki
- G02 - OPTICS
Information Patent Application
System and Method for Carrying Out Fibre-Type Multiphoton Microscop...
- Publication number 20070290145
- Publication date Dec 20, 2007
- MAUNA KEA TECHNOLOGIES
- Bertrand Viellerobe
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
DYNAMIC WAFER STRESS MANAGEMENT SYSTEM
- Publication number 20070146685
- Publication date Jun 28, 2007
- Woo Sik Yoo
- G01 - MEASURING TESTING
Information Patent Application
Mapping-measurement apparatus
- Publication number 20050088656
- Publication date Apr 28, 2005
- JASCO CORPORATION
- Noriaki Soga
- G01 - MEASURING TESTING

System of scan mirrors for composite motion of beam

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Line scanning mechanical streak systems and methods for phosphoresc...

Welding monitoring system and welding monitoring method

Fast two-photon imaging by diffracted swept-laser excitation

Mirror device, mirror drive method, light irradiation device, and i...

Welding monitoring system and welding monitoring method

Mirror device, mirror drive method, light irradiation device, and i...

Method, apparatus and software for detection and localization of hi...

Microscope and microscopy method

Optical metrology system for spectral imaging of a sample

Optoelectronic sensor and method for the transmission monitoring of...

Fluorescence imaging autofocus systems and methods

Image acquisition device and image acquisition method

Multi-channel fluorescence detecting module and nucleic acid analys...

Non-ionizing imager

Optical illumination apparatus and method having a reflective arran...

System and method for carrying out fibre-type multiphoton microscop...

Mapping-measurement apparatus

3D profile analysis for surface contour inspection

Three dimensional scanning system

Three dimensional scanning system

Photothermal test process, apparatus for performing the process and...

Foreign particle detecting method and apparatus

Patents Applicationslast 30 patents

DIGITAL MIRROR DEVICE BASED CODE-DIVISION MULTIPLEXED RAMAN OPTICAL...

LINE SCANNING MECHANICAL STREAK SYSTEMS AND METHODS FOR PHOSPHORESC...

MIRROR DEVICE, MIRROR DRIVE METHOD, LIGHT IRRADIATION DEVICE, AND I...

IMAGE GENERATION DEVICE

MIRROR DEVICE, MIRROR DRIVE METHOD, LIGHT IRRADIATION DEVICE, AND I...

WELDING MONITORING SYSTEM AND WELDING MONITORING METHOD

WELDING MONITORING SYSTEM AND WELDING MONITORING METHOD

SURFACE SHAPE MEASURING APPARATUS AND DEFECT DETERMINING APPARATUS

MICROSCOPE AND MICROSCOPY METHOD

OPTOELECTRONIC SENSOR AND METHOD FOR THE TRANSMISSION MONITORING OF...

OPTICAL METROLOGY SYSTEM FOR SPECTRAL IMAGING OF A SAMPLE

OPTICAL METROLOGY SYSTEM FOR SPECTRAL IMAGING OF A SAMPLE

FLUORESCENCE IMAGING AUTOFOCUS SYSTEMS AND METHODS

NON-DESTRUCTIVE INSPECTION SYSTEM FOR DISPLAY PANEL AND METHOD, AND...

MULTI-CHANNEL FLUORESCENCE DETECTING MODULE AND NUCLEIC ACID ANALYS...

OPTICAL ILLUMINATION APPARATUS AND METHOD

NON-IONISING IMAGER

MICROSCOPE

System and Method for Carrying Out Fibre-Type Multiphoton Microscop...

DYNAMIC WAFER STRESS MANAGEMENT SYSTEM

Mapping-measurement apparatus