Taking dimensions of defect into account

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G01N2021/8874

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

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G01N2021/8874Taking dimensions of defect into account

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Patents Grantslast 30 patents

Information Patent Grant
Optimized printing defect compensation using automatic job image re...
- Patent number 12,076,976
- Issue date Sep 3, 2024
- Xerox Corporation
- Dara N. Lubin
- B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS
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System and method for assessing wear on the tread of a shoe for lim...
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- Issue date Jul 30, 2024
- University of Pittsburgh of the Commonwealth System of Higher Education
- Sarah L. Hemler
- G06 - COMPUTING CALCULATING COUNTING
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Grading cosmetic appearance of a test object based on multi-region...
- Patent number 11,836,912
- Issue date Dec 5, 2023
- Future Dial, Inc.
- Yan Zhou
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Smart coordinate conversion and calibration system in semiconductor...
- Patent number 11,774,372
- Issue date Oct 3, 2023
- Elite Semiconductor Inc.
- Iyun Leu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Smart coordinate conversion and calibration system in semiconductor...
- Patent number 11,774,373
- Issue date Oct 3, 2023
- Elite Semiconductor Inc.
- Iyun Leu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Smart defect calibration system in semiconductor wafer manufacturing
- Patent number 11,761,904
- Issue date Sep 19, 2023
- Elite Semiconductor Inc.
- Iyun Leu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for performing smart semiconductor wafer defect calibration
- Patent number 11,719,650
- Issue date Aug 8, 2023
- Elite Semiconductor Inc.
- Iyun Leu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for smart conversion and calibration of coordinate
- Patent number 11,719,649
- Issue date Aug 8, 2023
- Elite Semiconductor Inc.
- Iyun Leu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for smart conversion and calibration of coordinate
- Patent number 11,719,648
- Issue date Aug 8, 2023
- Elite Semiconductor Inc.
- Iyun Leu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and devices to construct artificial inline defects to calibr...
- Patent number 11,685,129
- Issue date Jun 27, 2023
- United States of America as Represented by the Adminstrator of NASA
- Peter D. Juarez
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Multimode defect classification in semiconductor inspection
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- Issue date Jun 6, 2023
- KLA Corporation
- Vaibhav Gaind
- G01 - MEASURING TESTING
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Multi-sensor pipe inspection system and method
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- Issue date Mar 7, 2023
- HYDROMAX USA, LLC
- Guy Schiavone
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Multi-sensor pipe inspection utilizing pipe templates to determine...
- Patent number 11,193,896
- Issue date Dec 7, 2021
- HYDROMAX USA, LLC
- Adam Fredrick Stewart
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect inspection device
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- Issue date Oct 12, 2021
- HITACHI HIGH-TECH CORPORATION
- Toshifumi Honda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Smart defect calibration system and the method thereof
- Patent number 11,016,035
- Issue date May 25, 2021
- Elite Semiconductor Inc.
- Iyun Leu
- G01 - MEASURING TESTING
Information Patent Grant
Method for producing an OSB
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- Issue date Mar 23, 2021
- SWISS KRONO TEC AG
- Norbert Kalwa
- G01 - MEASURING TESTING
Information Patent Grant
Interactive semi-automated borescope video analysis and damage asse...
- Patent number 10,878,556
- Issue date Dec 29, 2020
- United Technologies Corporation
- Paul D. Hestand
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Remote visual inspection method and system
- Patent number 10,853,645
- Issue date Dec 1, 2020
- COLLINEO INC.
- Guillaume Lambert
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection and cosmetic grading through image processing system and...
- Patent number 10,753,882
- Issue date Aug 25, 2020
- Amit Anil Mahajan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Item inspecting device
- Patent number 10,713,775
- Issue date Jul 14, 2020
- Koh Young Technology Inc.
- Young Heon Bae
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 10,677,743
- Issue date Jun 9, 2020
- TOSHIBA MEMORY CORPORATION
- Keitarou Suzuki
- G01 - MEASURING TESTING
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Inspection method and inspection apparatus
- Patent number 10,643,327
- Issue date May 5, 2020
- NuFlare Technology, Inc.
- Riki Ogawa
- G02 - OPTICS
Information Patent Grant
Contrast-based imaging and analysis computer-implemented methods to...
- Patent number 10,620,133
- Issue date Apr 14, 2020
- United States of America as represented by the Administrator of the National...
- Ajay M Koshti
- G01 - MEASURING TESTING
Information Patent Grant
Remote visual inspection system and method
- Patent number 10,354,138
- Issue date Jul 16, 2019
- COLLINEO INC.
- Guillaume Lambert
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods for defect inspection, sorting, and manufacturing photomask...
- Patent number 10,295,477
- Issue date May 21, 2019
- Shin-Etsu Chemical Co., Ltd.
- Tsuneo Terasawa
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
System and method for self-performing a cosmetic evaluation of an e...
- Patent number 10,007,934
- Issue date Jun 26, 2018
- Greystone Data Technology, Inc.
- Tu Nguyen
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
System and method to determine depth for optical wafer inspection
- Patent number 9,989,479
- Issue date Jun 5, 2018
- KLA-Tencor Corporation
- Pavel Kolchin
- G02 - OPTICS
Information Patent Grant
Method and system for inspecting wafers for electronics, optics or...
- Patent number 9,857,313
- Issue date Jan 2, 2018
- UNITY SEMICONDUCTOR
- Mayeul Durand De Gevigney
- G01 - MEASURING TESTING
Information Patent Grant
Evaluation method of defect size of photomask blank, selection meth...
- Patent number 9,772,551
- Issue date Sep 26, 2017
- Shin-Etsu Chemical Co., Ltd.
- Tsuneo Terasawa
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Defect detection apparatus, defect detection method, and computer p...
- Patent number 9,341,579
- Issue date May 17, 2016
- Keyence Corporation
- Masato Shimodaira
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD FOR GRADING, PROCESSING, AND LOADING LOGS
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- Hendtech LLC
- Andrew Henderson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SPUTTER MEASUREMENT SYSTEM
- Publication number 20240383077
- Publication date Nov 21, 2024
- Prime Planet Energy & Solutions, Inc.
- Takashi YOSHIDA
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
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VISUAL INSPECTION APPARATUS AND VISUAL INSPECTION METHOD
- Publication number 20240353347
- Publication date Oct 24, 2024
- Hitachi Astemo, Ltd.
- Shinichi INOUE
- G01 - MEASURING TESTING
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INSPECTION DEVICE AND INSPECTION METHOD FOR FILTER
- Publication number 20240302288
- Publication date Sep 12, 2024
- Japan Tobacco Inc.
- Shota KOBAYASHI
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS, RECORDING MEDIUM, AND INSPECTION SYSTEM
- Publication number 20240192143
- Publication date Jun 13, 2024
- Konica Minolta, Inc.
- Masaru OHTSUKA
- G01 - MEASURING TESTING
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METHOD AND APPARATUS FOR DETECTING DEFECTS IN THE SURFACE OF CURVED...
- Publication number 20240183791
- Publication date Jun 6, 2024
- NORDISCHER MASCHINENBAU RUD. BAADER GMBH + CO. KG
- Ulf Jacobsen
- G01 - MEASURING TESTING
Information Patent Application
Method for Inspecting Surface Deformation of Structure, System for...
- Publication number 20240175823
- Publication date May 30, 2024
- Keiwa Incorporated
- Satoru Tani
- E01 - CONSTRUCTION OF ROADS, RAILWAYS, OR BRIDGES
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MACRO PLASTIC AND MICRO PLASTIC DETECTION METHOD BASED ON RGB AND H...
- Publication number 20240125712
- Publication date Apr 18, 2024
- Tongji University
- Pinjing He
- G01 - MEASURING TESTING
Information Patent Application
GRADING COSMETIC APPEARANCE OF A TEST OBJECT
- Publication number 20240062363
- Publication date Feb 22, 2024
- FUTURE DIAL, INC.
- Yan Zhou
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT INSPECTION DEVICE AND METHOD FOR INSPECTING DEFECT
- Publication number 20240060904
- Publication date Feb 22, 2024
- SAMSUNG DISPLAY CO., LTD.
- Jeong Moon LEE
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR DETECTING A FALSE ERROR ON A COMPONENT OF A B...
- Publication number 20240053278
- Publication date Feb 15, 2024
- Siemens Industry Software Inc.
- Tova Yadin
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM AND METHOD FOR ANALYZING DEFECTS
- Publication number 20240035983
- Publication date Feb 1, 2024
- WITRINS S.R.O.
- Pavel Linhart
- G01 - MEASURING TESTING
Information Patent Application
Foreign Substance Detection Device and Detection Method
- Publication number 20230358688
- Publication date Nov 9, 2023
- LG ENERGY SOLUTION, LTD.
- Jeong Ho Park
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR ASSESSING WEAR ON THE TREAD OF A SHOE FOR LIM...
- Publication number 20230228689
- Publication date Jul 20, 2023
- University of Pittsburgh of the Commonwealth System of Higher Education
- SARAH L. HEMLER
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LEATHER DEFECT DETECTION SYSTEM
- Publication number 20230213456
- Publication date Jul 6, 2023
- Feng Chia University
- Sze Teng LIONG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT CLASSIFICATION EQUIPMENT FOR SILICON CARBIDE SUBSTRATE USING...
- Publication number 20230113093
- Publication date Apr 13, 2023
- ETAMAX CO., LTD
- Huyndon JUNG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MULTI-SENSOR PIPE INSPECTION SYSTEM AND METHOD
- Publication number 20230077875
- Publication date Mar 16, 2023
- Hydromax USA, LLC
- Guy Schiavone
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTIMIZED PRINTING DEFECT COMPENSATION USING AUTOMATIC JOB IMAGE RE...
- Publication number 20230068167
- Publication date Mar 2, 2023
- Xerox Corporation
- Dara N. Lubin
- B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS
Information Patent Application
SURFACE DEFECT MONITORING SYSTEM
- Publication number 20220373473
- Publication date Nov 24, 2022
- NOVI LLC
- Scott Steffan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
GRADING COSMETIC APPEARANCE OF A TEST OBJECT
- Publication number 20220092757
- Publication date Mar 24, 2022
- FUTURE DIAL, INC.
- Yan Zhou
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SMART COORDINATE CONVERSION AND CALIBRATION SYSTEM IN SEMICONDUCTOR...
- Publication number 20210231582
- Publication date Jul 29, 2021
- ELITE SEMICONDUCTOR INC.
- IYUN LEU
- G01 - MEASURING TESTING
Information Patent Application
SMART DEFECT CALIBRATION SYSTEM IN SEMICONDUCTOR WAFER MANUFACTURING
- Publication number 20210231584
- Publication date Jul 29, 2021
- ELITE SEMICONDUCTOR INC.
- IYUN LEU
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR SMART CONVERSION AND CALIBRATION OF COORDINATE
- Publication number 20210231580
- Publication date Jul 29, 2021
- ELITE SEMICONDUCTOR INC.
- IYUN LEU
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR PERFORMING SMART SEMICONDUCTOR WAFER DEFECT CALIBRATION
- Publication number 20210231581
- Publication date Jul 29, 2021
- ELITE SEMICONDUCTOR INC.
- IYUN LEU
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR SMART CONVERSION AND CALIBRATION OF COORDINATE
- Publication number 20210231579
- Publication date Jul 29, 2021
- ELITE SEMICONDUCTOR INC.
- IYUN LEU
- G01 - MEASURING TESTING
Information Patent Application
SMART COORDINATE CONVERSION AND CALIBRATION SYSTEM IN SEMICONDUCTOR...
- Publication number 20210231583
- Publication date Jul 29, 2021
- ELITE SEMICONDUCTOR INC.
- IYUN LEU
- G01 - MEASURING TESTING
Information Patent Application
FLAW INSPECTION APPARATUS AND METHOD
- Publication number 20200265575
- Publication date Aug 20, 2020
- FANUC CORPORATION
- Yuusuke OOTA
- G01 - MEASURING TESTING
Information Patent Application
Multimode Defect Classification in Semiconductor Inspection
- Publication number 20200025689
- Publication date Jan 23, 2020
- KLA-Tencor Corporation
- Vaibhav Gaind
- G01 - MEASURING TESTING
Information Patent Application
MULTI-SENSOR PIPE INSPECTION SYSTEM AND METHOD
- Publication number 20190339210
- Publication date Nov 7, 2019
- Hydromax USA, LLC
- Adam Fredrick Stewart
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
REMOTE VISUAL INSPECTION METHOD AND SYSTEM
- Publication number 20190272424
- Publication date Sep 5, 2019
- COLLINEO INC.
- GUILLAUME LAMBERT
- G01 - MEASURING TESTING

Taking dimensions of defect into account

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Optimized printing defect compensation using automatic job image re...

System and method for assessing wear on the tread of a shoe for lim...

Grading cosmetic appearance of a test object based on multi-region...

Smart coordinate conversion and calibration system in semiconductor...

Smart coordinate conversion and calibration system in semiconductor...

Smart defect calibration system in semiconductor wafer manufacturing

Method for performing smart semiconductor wafer defect calibration

Method for smart conversion and calibration of coordinate

Method for smart conversion and calibration of coordinate

Method and devices to construct artificial inline defects to calibr...

Multimode defect classification in semiconductor inspection

Multi-sensor pipe inspection system and method

Multi-sensor pipe inspection utilizing pipe templates to determine...

Defect inspection device

Smart defect calibration system and the method thereof

Method for producing an OSB

Interactive semi-automated borescope video analysis and damage asse...

Remote visual inspection method and system

Inspection and cosmetic grading through image processing system and...

Item inspecting device

Inspection apparatus and inspection method

Inspection method and inspection apparatus

Contrast-based imaging and analysis computer-implemented methods to...

Remote visual inspection system and method

Methods for defect inspection, sorting, and manufacturing photomask...

System and method for self-performing a cosmetic evaluation of an e...

System and method to determine depth for optical wafer inspection

Method and system for inspecting wafers for electronics, optics or...

Evaluation method of defect size of photomask blank, selection meth...

Defect detection apparatus, defect detection method, and computer p...

Patents Applicationslast 30 patents

SYSTEM AND METHOD FOR GRADING, PROCESSING, AND LOADING LOGS

SPUTTER MEASUREMENT SYSTEM

VISUAL INSPECTION APPARATUS AND VISUAL INSPECTION METHOD

INSPECTION DEVICE AND INSPECTION METHOD FOR FILTER

INSPECTION APPARATUS, RECORDING MEDIUM, AND INSPECTION SYSTEM

METHOD AND APPARATUS FOR DETECTING DEFECTS IN THE SURFACE OF CURVED...

Method for Inspecting Surface Deformation of Structure, System for...

MACRO PLASTIC AND MICRO PLASTIC DETECTION METHOD BASED ON RGB AND H...

GRADING COSMETIC APPEARANCE OF A TEST OBJECT

DEFECT INSPECTION DEVICE AND METHOD FOR INSPECTING DEFECT

METHOD AND SYSTEM FOR DETECTING A FALSE ERROR ON A COMPONENT OF A B...

INSPECTION SYSTEM AND METHOD FOR ANALYZING DEFECTS

Foreign Substance Detection Device and Detection Method

SYSTEM AND METHOD FOR ASSESSING WEAR ON THE TREAD OF A SHOE FOR LIM...

LEATHER DEFECT DETECTION SYSTEM

DEFECT CLASSIFICATION EQUIPMENT FOR SILICON CARBIDE SUBSTRATE USING...

MULTI-SENSOR PIPE INSPECTION SYSTEM AND METHOD

OPTIMIZED PRINTING DEFECT COMPENSATION USING AUTOMATIC JOB IMAGE RE...

SURFACE DEFECT MONITORING SYSTEM

GRADING COSMETIC APPEARANCE OF A TEST OBJECT

SMART COORDINATE CONVERSION AND CALIBRATION SYSTEM IN SEMICONDUCTOR...

SMART DEFECT CALIBRATION SYSTEM IN SEMICONDUCTOR WAFER MANUFACTURING

METHOD FOR SMART CONVERSION AND CALIBRATION OF COORDINATE

METHOD FOR PERFORMING SMART SEMICONDUCTOR WAFER DEFECT CALIBRATION

METHOD FOR SMART CONVERSION AND CALIBRATION OF COORDINATE

SMART COORDINATE CONVERSION AND CALIBRATION SYSTEM IN SEMICONDUCTOR...

FLAW INSPECTION APPARATUS AND METHOD

Multimode Defect Classification in Semiconductor Inspection

MULTI-SENSOR PIPE INSPECTION SYSTEM AND METHOD

REMOTE VISUAL INSPECTION METHOD AND SYSTEM