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G01Q60/34

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GPHYSICS G01Measuring instruments G01QSCANNING-PROBE TECHNIQUES OR APPARATUS APPLICATIONS OF SCANNING-PROBE TECHNIQUES G01Q60/00Particular type of SPM [Scanning Probe Microscopy] or microscopes Essential components thereof

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Patents Grantslast 30 patents

Information Patent Grant
Atomic-force microscopy for identification of surfaces
- Patent number 12,153,068
- Issue date Nov 26, 2024
- Trustees of Tufts College
- Igor Sokolov
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Heterodyne scanning probe microscopy method and system
- Patent number 11,940,416
- Issue date Mar 26, 2024
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Hamed Sadeghian Marnani
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope and method for resonance-enhanced detecti...
- Patent number 11,846,653
- Issue date Dec 19, 2023
- MOLECULAR VISTA, INC.
- William Morrison
- G01 - MEASURING TESTING
Information Patent Grant
Atomic-force microscopy for identification of surfaces
- Patent number 11,796,564
- Issue date Oct 24, 2023
- Trustees of Tufts College
- Igor Sokolov
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for resolution and sensitivity enhanced atomic...
- Patent number 11,714,103
- Issue date Aug 1, 2023
- Bruker Nano, Inc.
- Craig Prater
- G01 - MEASURING TESTING
Information Patent Grant
AFM imaging with creep correction
- Patent number 11,714,104
- Issue date Aug 1, 2023
- Bruker Nano, Inc.
- Jason Osborne
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Photothermal imaging device and system
- Patent number 11,592,391
- Issue date Feb 28, 2023
- University of Notre Dame Du Lac
- Zhongming Li
- G01 - MEASURING TESTING
Information Patent Grant
Phase-shift-based amplitude detector for a high-speed atomic force...
- Patent number 11,549,964
- Issue date Jan 10, 2023
- Cornell University
- Atsushi Miyagi
- G01 - MEASURING TESTING
Information Patent Grant
Atomic-force microscopy for identification of surfaces
- Patent number 11,506,683
- Issue date Nov 22, 2022
- Trustees of Tufts College
- Igor Sokolov
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Scanning probe microscope and a method for operating thereof
- Patent number 11,402,404
- Issue date Aug 2, 2022
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Jan Jacobus Benjamin Biemond
- G01 - MEASURING TESTING
Information Patent Grant
Phase-shift-based amplitude detector for a high-speed atomic force...
- Patent number 11,243,229
- Issue date Feb 8, 2022
- Cornell University
- Atsushi Miyagi
- G01 - MEASURING TESTING
Information Patent Grant
System for measuring the absorption of a laser emission by a sample
- Patent number 11,237,105
- Issue date Feb 1, 2022
- Centre National de la Recherche Scientifique
- Alexandre Dazzi
- G01 - MEASURING TESTING
Information Patent Grant
Surface sensitive atomic force microscope based infrared spectroscopy
- Patent number 11,226,285
- Issue date Jan 18, 2022
- Bruker Nano, Inc.
- Kevin Kjoller
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus of atomic force microscope based infrared spec...
- Patent number 11,215,637
- Issue date Jan 4, 2022
- Bruker Nano, Inc.
- Alexandre Dazzi
- G01 - MEASURING TESTING
Information Patent Grant
Feedback correction in sub-resonant tapping mode of an atomic force...
- Patent number 11,099,210
- Issue date Aug 24, 2021
- Trustees of Tufts College
- Piers Echols-Jones
- G01 - MEASURING TESTING
Information Patent Grant
Sharpening method for probe tip of atomic force microscope (AFM)
- Patent number 11,016,120
- Issue date May 25, 2021
- YANSHAN UNIVERSITY
- Jianchao Chen
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus of operating a scanning probe microscope
- Patent number 11,002,757
- Issue date May 11, 2021
- Bruker Nano, Inc.
- Yan Hu
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method for detecting cell surface holes using atomic force microscope
- Patent number 10,996,240
- Issue date May 4, 2021
- Institute of Basic Medical Sciences, Chinese Academy of Medical Sciences
- Bo Huang
- G01 - MEASURING TESTING
Information Patent Grant
Frequency modulation detection for photo induced force microscopy
- Patent number 10,955,437
- Issue date Mar 23, 2021
- MOLECULAR VISTA, INC.
- Thomas R. Albrecht
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for resolution and sensitivity enhanced atomic...
- Patent number 10,914,755
- Issue date Feb 9, 2021
- Bruker Nano, Inc.
- Craig Prater
- G01 - MEASURING TESTING
Information Patent Grant
Infrared characterization of a sample using oscillating mode
- Patent number 10,845,382
- Issue date Nov 24, 2020
- Chanmin Su
- G01 - MEASURING TESTING
Information Patent Grant
Method of operating an AFM
- Patent number 10,837,981
- Issue date Nov 17, 2020
- Institut National de la Sante et de la Recherche Medicale (INSERM)
- Simon Scheuring
- G01 - MEASURING TESTING
Information Patent Grant
Method for in-line measurement of quality of microarray
- Patent number 10,732,166
- Issue date Aug 4, 2020
- Centrillion Technologies Taiwan Co. LTD.
- Tzu-Kun Ku
- G01 - MEASURING TESTING
Information Patent Grant
Method of performing surface measurements on a surface of a sample,...
- Patent number 10,697,998
- Issue date Jun 30, 2020
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Hamed Sadeghian Marnani
- G01 - MEASURING TESTING
Information Patent Grant
Photothermal imaging device and system
- Patent number 10,677,722
- Issue date Jun 9, 2020
- University of Notre Dame Du Lac
- Zhongming Li
- G01 - MEASURING TESTING
Information Patent Grant
Coupled multiscale positioning of arrays of parallel, independently...
- Patent number 10,649,003
- Issue date May 12, 2020
- Board of Regents, The University of Texas System
- Michael A. Cullinan
- G01 - MEASURING TESTING
Information Patent Grant
Determining interaction forces in a dynamic mode AFM during imaging
- Patent number 10,578,643
- Issue date Mar 3, 2020
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Hamed Sadeghian Marnani
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus of operating a scanning probe microscope
- Patent number 10,502,761
- Issue date Dec 10, 2019
- Bruker Nano, Inc.
- Yan Hu
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscope and scanning method thereof
- Patent number 10,345,335
- Issue date Jul 9, 2019
- Hitachi High-Tech Science Corporation
- Masatsugu Shigeno
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for resolution and sensitivity enhanced atomic...
- Patent number 10,228,388
- Issue date Mar 12, 2019
- Bruker Nano, Inc.
- Craig Prater
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Nano-Mechanical Infrared Spectroscopy System and Method Using Gated...
- Publication number 20240168053
- Publication date May 23, 2024
- Bruker Nano, Inc.
- Martin Wagner
- G01 - MEASURING TESTING
Information Patent Application
TRANSITIONAL TAPPING ATOMIC FORCE MICROSCOPY FOR HIGH-RESOLUTION IM...
- Publication number 20240151742
- Publication date May 9, 2024
- UTI Limited Partnership
- Arindam PHANI
- G01 - MEASURING TESTING
Information Patent Application
PHOTOTHERMAL IMAGING DEVICE AND SYSTEM
- Publication number 20230160817
- Publication date May 25, 2023
- UNIVERSITY OF NOTRE DAME DU LAC
- Zhongming Li
- G01 - MEASURING TESTING
Information Patent Application
Atomic-Force Microscopy for Identification of Surfaces
- Publication number 20230058610
- Publication date Feb 23, 2023
- Trustees of Tufts College
- Igor Sokolov
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SCANNING PROBE MICROSCOPE AND METHOD FOR RESONANCE-ENHANCED DETECTI...
- Publication number 20230018874
- Publication date Jan 19, 2023
- MOLECULAR VISTA, INC.
- William Morrison
- G01 - MEASURING TESTING
Information Patent Application
AFM Imaging with Creep Correction
- Publication number 20220381803
- Publication date Dec 1, 2022
- Bruker Nano, Inc.
- Jason Osborne
- B82 - NANO-TECHNOLOGY
Information Patent Application
PHASE-SHIFT-BASED AMPLITUDE DETECTOR FOR A HIGH-SPEED ATOMIC FORCE...
- Publication number 20220260612
- Publication date Aug 18, 2022
- Cornell University
- Atsushi Miyagi
- G01 - MEASURING TESTING
Information Patent Application
ACTIVE BIMODAL AFM OPERATION FOR MEASUREMENTS OF OPTICAL INTERACTION
- Publication number 20220163559
- Publication date May 26, 2022
- attocube systems AG
- Alexander A. GOVYADINOV
- G01 - MEASURING TESTING
Information Patent Application
Atomic-Force Microscopy for Identification of Surfaces
- Publication number 20220003798
- Publication date Jan 6, 2022
- Trustees of Tufts College
- Igor Sokolov
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM FOR MEASURING THE ABSORPTION OF A LASER EMISSION BY A SAMPLE
- Publication number 20210341385
- Publication date Nov 4, 2021
- Centre National de la Recherche Scientifique
- Alexandre DAZZI
- G01 - MEASURING TESTING
Information Patent Application
A SCANNING PROBE MICROSCOPE AND A METHOD FOR OPERATING THEREOF
- Publication number 20210311090
- Publication date Oct 7, 2021
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Jan Jacobus Benjamin BIEMOND
- G01 - MEASURING TESTING
Information Patent Application
PHASE-SHIFT-BASED AMPLITUDE DETECTOR FOR A HIGH-SPEED ATOMIC FORCE...
- Publication number 20210172976
- Publication date Jun 10, 2021
- Cornell University
- Atsushi Miyagi
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus for Resolution and Sensitivity Enhanced Atomic...
- Publication number 20210165019
- Publication date Jun 3, 2021
- Bruker Nano, Inc.
- Craig Prater
- G01 - MEASURING TESTING
Information Patent Application
Method And Apparatus Of Atomic Force Microscope Based Infrared Spec...
- Publication number 20210011053
- Publication date Jan 14, 2021
- Bruker Nano, Inc.
- Alexandre Dazzi
- G01 - MEASURING TESTING
Information Patent Application
PHOTOTHERMAL IMAGING DEVICE AND SYSTEM
- Publication number 20210003504
- Publication date Jan 7, 2021
- University of Notre Dame de Lac
- Zhongming Li
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DETECTING CELL SURFACE HOLES USING ATOMIC FORCE MICROSCOPE
- Publication number 20200271690
- Publication date Aug 27, 2020
- INSTITUTE OF BASIC MEDICAL SCIENCES, CHINESE ACADEMY OF MEDICAL SCIENCES
- Bo HUANG
- G01 - MEASURING TESTING
Information Patent Application
Surface Sensitive Atomic Force Microscope Based Infrared Spectroscopy
- Publication number 20200217874
- Publication date Jul 9, 2020
- Bruker Nano, Inc.
- Kevin Kjoller
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus of Operating a Scanning Probe Microscope
- Publication number 20200191826
- Publication date Jun 18, 2020
- Bruker Nano, Inc.
- Yan Hu
- B82 - NANO-TECHNOLOGY
Information Patent Application
FREQUENCY MODULATION DETECTION FOR PHOTO-INDUCED FORCE MICROSCOPY
- Publication number 20200049735
- Publication date Feb 13, 2020
- MOLECULAR VISTA, INC.
- Thomas R. ALBRECHT
- G01 - MEASURING TESTING
Information Patent Application
FEEDBACK CORRECTION IN SUB-RESONANT TAPPING MODE OF AN ATOMIC FORCE...
- Publication number 20190391178
- Publication date Dec 26, 2019
- Piers Echols-Jones
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus for Resolution and Sensitivity Enhanced Atomic...
- Publication number 20190391177
- Publication date Dec 26, 2019
- Bruker Nano, Inc.
- Craig Prater
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF MODIFYING A SURFACE OF A SAMPLE, AND A SCANNING PROBE MIC...
- Publication number 20190353681
- Publication date Nov 21, 2019
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Hamed Sadeghian Marnani
- G01 - MEASURING TESTING
Information Patent Application
HETERODYNE SCANNING PROBE MICROSCOPY METHOD AND SYSTEM
- Publication number 20190204276
- Publication date Jul 4, 2019
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Hamed Sadeghian Marnani
- G01 - MEASURING TESTING
Information Patent Application
A METHOD OF OPERATING AN AFM
- Publication number 20190094266
- Publication date Mar 28, 2019
- Institut National de la Sante et de la Recherche Medicale (INSERM)
- Simon SCHEURING
- G01 - MEASURING TESTING
Information Patent Application
DETERMINING INTERACTION FORCES IN A DYNAMIC MODE AFM DURING IMAGING
- Publication number 20190025340
- Publication date Jan 24, 2019
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Hamed Sadeghian Marnani
- G01 - MEASURING TESTING
Information Patent Application
PHOTOTHERMAL IMAGING DEVICE AND SYSTEM
- Publication number 20180246032
- Publication date Aug 30, 2018
- UNIVERSITY OF NOTRE DAME DU LAC
- Zhongming Li
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus of Operating a Scanning Probe Microscope
- Publication number 20180136251
- Publication date May 17, 2018
- Bruker Nano, Inc.
- Jian Shi
- B82 - NANO-TECHNOLOGY
Information Patent Application
METHOD AND APPARATUS FOR RESOLUTION AND SENSITIVITY ENHANCED ATOMIC...
- Publication number 20180120344
- Publication date May 3, 2018
- ANASYS INSTRUMENTS
- Craig Prater
- G01 - MEASURING TESTING
Information Patent Application
HIGH SPEED ADAPTIVE-MULTI-LOOP MODE IMAGING ATOMIC FORCE MICROSCOPY
- Publication number 20170199219
- Publication date Jul 13, 2017
- Rutgers, The State University of New Jersey
- Qingze Zou
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus of Electrical Property Measurement Using an AF...
- Publication number 20160178659
- Publication date Jun 23, 2016
- Bruker Nano, Inc.
- Chunzeng Li
- G01 - MEASURING TESTING

Tapping mode

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Atomic-force microscopy for identification of surfaces

Heterodyne scanning probe microscopy method and system

Scanning probe microscope and method for resonance-enhanced detecti...

Atomic-force microscopy for identification of surfaces

Method and apparatus for resolution and sensitivity enhanced atomic...

AFM imaging with creep correction

Photothermal imaging device and system

Phase-shift-based amplitude detector for a high-speed atomic force...

Atomic-force microscopy for identification of surfaces

Scanning probe microscope and a method for operating thereof

Phase-shift-based amplitude detector for a high-speed atomic force...

System for measuring the absorption of a laser emission by a sample

Surface sensitive atomic force microscope based infrared spectroscopy

Method and apparatus of atomic force microscope based infrared spec...

Feedback correction in sub-resonant tapping mode of an atomic force...

Sharpening method for probe tip of atomic force microscope (AFM)

Method and apparatus of operating a scanning probe microscope

Method for detecting cell surface holes using atomic force microscope

Frequency modulation detection for photo induced force microscopy

Method and apparatus for resolution and sensitivity enhanced atomic...

Infrared characterization of a sample using oscillating mode

Method of operating an AFM

Method for in-line measurement of quality of microarray

Method of performing surface measurements on a surface of a sample,...

Photothermal imaging device and system

Coupled multiscale positioning of arrays of parallel, independently...

Determining interaction forces in a dynamic mode AFM during imaging

Method and apparatus of operating a scanning probe microscope

Scanning probe microscope and scanning method thereof

Method and apparatus for resolution and sensitivity enhanced atomic...

Patents Applicationslast 30 patents

Nano-Mechanical Infrared Spectroscopy System and Method Using Gated...

TRANSITIONAL TAPPING ATOMIC FORCE MICROSCOPY FOR HIGH-RESOLUTION IM...

PHOTOTHERMAL IMAGING DEVICE AND SYSTEM

Atomic-Force Microscopy for Identification of Surfaces

SCANNING PROBE MICROSCOPE AND METHOD FOR RESONANCE-ENHANCED DETECTI...

AFM Imaging with Creep Correction

PHASE-SHIFT-BASED AMPLITUDE DETECTOR FOR A HIGH-SPEED ATOMIC FORCE...

ACTIVE BIMODAL AFM OPERATION FOR MEASUREMENTS OF OPTICAL INTERACTION

Atomic-Force Microscopy for Identification of Surfaces

SYSTEM FOR MEASURING THE ABSORPTION OF A LASER EMISSION BY A SAMPLE

A SCANNING PROBE MICROSCOPE AND A METHOD FOR OPERATING THEREOF

PHASE-SHIFT-BASED AMPLITUDE DETECTOR FOR A HIGH-SPEED ATOMIC FORCE...

Method and Apparatus for Resolution and Sensitivity Enhanced Atomic...

Method And Apparatus Of Atomic Force Microscope Based Infrared Spec...

PHOTOTHERMAL IMAGING DEVICE AND SYSTEM

METHOD FOR DETECTING CELL SURFACE HOLES USING ATOMIC FORCE MICROSCOPE

Surface Sensitive Atomic Force Microscope Based Infrared Spectroscopy

Method and Apparatus of Operating a Scanning Probe Microscope

FREQUENCY MODULATION DETECTION FOR PHOTO-INDUCED FORCE MICROSCOPY

FEEDBACK CORRECTION IN SUB-RESONANT TAPPING MODE OF AN ATOMIC FORCE...

Method and Apparatus for Resolution and Sensitivity Enhanced Atomic...

METHOD OF MODIFYING A SURFACE OF A SAMPLE, AND A SCANNING PROBE MIC...

HETERODYNE SCANNING PROBE MICROSCOPY METHOD AND SYSTEM

A METHOD OF OPERATING AN AFM

DETERMINING INTERACTION FORCES IN A DYNAMIC MODE AFM DURING IMAGING

PHOTOTHERMAL IMAGING DEVICE AND SYSTEM

Method and Apparatus of Operating a Scanning Probe Microscope

METHOD AND APPARATUS FOR RESOLUTION AND SENSITIVITY ENHANCED ATOMIC...

HIGH SPEED ADAPTIVE-MULTI-LOOP MODE IMAGING ATOMIC FORCE MICROSCOPY

Method and Apparatus of Electrical Property Measurement Using an AF...