Technical microscopes

Industry

CPC
G02B21/0016

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Parent Industries

GPHYSICS G02Optics G02BOPTICAL ELEMENTS, SYSTEMS, OR APPARATUS G02B21/00Microscopes

Current Industry

G02B21/0016Technical microscopes

Industries

Patents Grantslast 30 patents

Information Patent Grant
Arrayed visual inspectors for fiber connectors and adapters
- Patent number 12,135,458
- Issue date Nov 5, 2024
- Panduit Corp.
- Yu Huang
- G02 - OPTICS
Information Patent Grant
Method for verifying the accurate mounting of molding inserts to a...
- Patent number 12,083,728
- Issue date Sep 10, 2024
- Alcon Inc.
- Jan Bernard
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
In situ electrical properties characterization system towards surfa...
- Patent number 12,046,521
- Issue date Jul 23, 2024
- National University of Singapore
- Wei Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Holographic microscope and manufacturing method of semiconductor de...
- Patent number 12,038,718
- Issue date Jul 16, 2024
- Samsung Electronics Co., Ltd.
- Seungbeom Park
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dark field microscope
- Patent number 11,940,608
- Issue date Mar 26, 2024
- ASML Netherlands B.V.
- Sebastianus Adrianus Goorden
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Simultaneous pattern-scan placement during sample processing
- Patent number 11,850,677
- Issue date Dec 26, 2023
- ELEMENTAL SCIENTIFIC LASERS, LLC
- Ciaran O'Connor
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
System and method for monitoring of states of components of a micro...
- Patent number 11,852,797
- Issue date Dec 26, 2023
- Carl Zeiss Microscopy GmbH
- Thomas Ohrt
- G02 - OPTICS
Information Patent Grant
System and method for performing automated analysis of air samples
- Patent number 11,774,735
- Issue date Oct 3, 2023
- First Frontier Pty Ltd
- Jordan Gallagher-Gruber
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Device and method for analyzing a defect of a photolithographic mas...
- Patent number 11,733,186
- Issue date Aug 22, 2023
- Carl Zeiss SMT GmbH
- Gabriel Baralia
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Collecting apparatus for microscopic objects, collecting container...
- Patent number 11,719,603
- Issue date Aug 8, 2023
- University Public Corporation Osaka
- Takuya Iida
- G02 - OPTICS
Information Patent Grant
Adapter tip and microscope system for inspection of fiber-optic con...
- Patent number 11,644,625
- Issue date May 9, 2023
- Exfo Inc.
- Jean Filion
- G02 - OPTICS
Information Patent Grant
Bond test apparatus and method for testing the strength of bonds on...
- Patent number 11,579,058
- Issue date Feb 14, 2023
- Nordson Corporation
- Ian C. Mayes
- G02 - OPTICS
Information Patent Grant
Super resolution for magneto-optical microscopy
- Patent number 11,474,283
- Issue date Oct 18, 2022
- UChicago Argonne, LLC
- Suzanne Gabriëlle Everdine te Velthuis
- B82 - NANO-TECHNOLOGY
Information Patent Grant
System and method for determining part damage
- Patent number 11,410,298
- Issue date Aug 9, 2022
- Raytheon Technologies Corporation
- Alan Matthew Finn
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Strontium tetraborate as optical coating material
- Patent number 11,360,032
- Issue date Jun 14, 2022
- KLA Corporation
- Yung-Ho Alex Chuang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Real-time monitoring microscopic imaging system for nitride MOCVD e...
- Patent number 11,340,440
- Issue date May 24, 2022
- University of Electronic Science and Technology of China
- Chao Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Microscope
- Patent number 11,327,287
- Issue date May 10, 2022
- Bertin Technologies
- François Brygo
- G02 - OPTICS
Information Patent Grant
Quantum NV-diamond atomic clock
- Patent number 11,320,791
- Issue date May 3, 2022
- Umut Keten
- G02 - OPTICS
Information Patent Grant
Information processing apparatus, information processing method, an...
- Patent number 11,320,642
- Issue date May 3, 2022
- Sony Corporation
- Takuya Oshima
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Modular, electro-optical device for increasing the imaging field of...
- Patent number 11,294,165
- Issue date Apr 5, 2022
- The Board of Trustees of the Leland Stanford Junior University
- Karl A. Deisseroth
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Imaging integrated circuits using a single-point single-photon dete...
- Patent number 11,287,630
- Issue date Mar 29, 2022
- International Business Machines Corporation
- Franco Stellari
- G01 - MEASURING TESTING
Information Patent Grant
Automatically executing a test to inspect an end face of an optical...
- Patent number 11,257,202
- Issue date Feb 22, 2022
- VIAVI Solutions Inc.
- Jonathan Eck
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Expediting spectral measurement in semiconductor device fabrication
- Patent number 11,237,120
- Issue date Feb 1, 2022
- KLA-Tencor Corporation
- Vincent Immer
- G01 - MEASURING TESTING
Information Patent Grant
Fixtures, systems, and methods for configuring an imaging device fo...
- Patent number 11,227,411
- Issue date Jan 18, 2022
- The Boeing Company
- Hong H. Tat
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Fluid monitoring system
- Patent number 11,017,519
- Issue date May 25, 2021
- ATTEN2 ADVANCED MONITORING TECHNOLOGIES S.L.
- Jon Mabe
- G01 - MEASURING TESTING
Information Patent Grant
Optical scattering measurement method and apparatus using micro len...
- Patent number 11,016,034
- Issue date May 25, 2021
- Semiconductor Manufacturing International (Shanghai) Corporation
- Manhua Shen
- G01 - MEASURING TESTING
Information Patent Grant
System for actinic inspection of semiconductor masks
- Patent number 11,002,688
- Issue date May 11, 2021
- Steven M. Ebstein
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for direct optical visualization of graphene and its nanosca...
- Patent number 10,989,668
- Issue date Apr 27, 2021
- The Regents of the University of California
- Wan Li
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Systems and methods using stroboscopic universal structure-energy f...
- Patent number 10,989,756
- Issue date Apr 27, 2021
- The Regents of the University of California
- Naomi S. Ginsberg
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Microscope imaging optical system and light-field microscope includ...
- Patent number 10,989,906
- Issue date Apr 27, 2021
- Olympus Corporation
- Kanto Miyazaki
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
HOLOGRAPHIC MICROSCOPE AND MANUFACTURING METHOD OF SEMICONDUCTOR DE...
- Publication number 20240353795
- Publication date Oct 24, 2024
- Samsung Electronics Co., Ltd.
- Seungbeom Park
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OPTICAL FILTERING DEVICE, METHOD OF CONTROLLING OPTICAL FILTERING D...
- Publication number 20240231064
- Publication date Jul 11, 2024
- HITACHI HIGH-TECH CORPORATION
- Yasuhiro YOSHIMURA
- G02 - OPTICS
Information Patent Application
DARK FIELD MICROSCOPE
- Publication number 20240231065
- Publication date Jul 11, 2024
- ASML NETHERLANDS B.V.
- Sebastianus Adrianus GOORDEN
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
SIMULTANEOUS PATTERN-SCAN PLACEMENT DURING SAMPLE PROCESSING
- Publication number 20240207969
- Publication date Jun 27, 2024
- Elemental Scientific Lasers, LLC
- Ciaran J. O'Connor
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
Device for Acquiring Images of a Surface
- Publication number 20240210668
- Publication date Jun 27, 2024
- Frank BÖTTCHER
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
COMPACT OPTICAL MICROSCOPE, METROLOGY DEVICE COMPRISING THE OPTICAL...
- Publication number 20240184089
- Publication date Jun 6, 2024
- Nearfield Instruments B.V.
- Hamed SADEGHIAN MARNANI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OPTICAL FILTERING DEVICE, METHOD OF CONTROLLING OPTICAL FILTERING D...
- Publication number 20240134175
- Publication date Apr 25, 2024
- HITACHI HIGH-TECH CORPORATION
- Yasuhiro YOSHIMURA
- G02 - OPTICS
Information Patent Application
SYSTEM AND METHOD FOR MONITORING OF STATES OF COMPONENTS OF A MICRO...
- Publication number 20240061230
- Publication date Feb 22, 2024
- CARL ZEISS MICROSCOPY GMBH
- Thomas OHRT
- G02 - OPTICS
Information Patent Application
METHODS AND OPTICAL CHECKING UNITS FOR CHECKING A SIDE OF A FILM
- Publication number 20230377119
- Publication date Nov 23, 2023
- MARPOSS SOCIETA' PER AZIONI
- Umberto Calari
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ADAPTER TIP AND MICROSCOPE SYSTEM FOR INSPECTING DUPLEX FIBER-OPTIC...
- Publication number 20230367082
- Publication date Nov 16, 2023
- EXFO INC.
- Olivier COTE
- G02 - OPTICS
Information Patent Application
DARK FIELD MICROSCOPE
- Publication number 20220229278
- Publication date Jul 21, 2022
- ASML NETHERLANDS B.V.
- Sebastianus Adrianus GOORDEN
- G01 - MEASURING TESTING
Information Patent Application
ARRAYED VISUAL INSPECTORS FOR FIBER CONNECTORS AND ADAPTERS
- Publication number 20220091342
- Publication date Mar 24, 2022
- Panduit Corp.
- Yu Huang
- G02 - OPTICS
Information Patent Application
SYSTEM AND METHOD FOR MONITORING OF STATES OF COMPONENTS OF A MICRO...
- Publication number 20220057617
- Publication date Feb 24, 2022
- CARL ZEISS MICROSCOPY GMBH
- Thomas OHRT
- G02 - OPTICS
Information Patent Application
ADAPTER TIP AND MICROSCOPE SYSTEM FOR INSPECTION OF FIBER-OPTIC CON...
- Publication number 20220035104
- Publication date Feb 3, 2022
- EXFO INC.
- Jean Filion
- G02 - OPTICS
Information Patent Application
PARTICLE CHARACTERIZATION USING OPTICAL MICROSCOPY
- Publication number 20220012456
- Publication date Jan 13, 2022
- CAMBRIDGE ENTERPRISE LIMITED
- Tuomas Pertti Jonathan Knowles
- G01 - MEASURING TESTING
Information Patent Application
SUPER RESOLUTION FOR MAGNETO-OPTICAL MICROSCOPY
- Publication number 20210405086
- Publication date Dec 30, 2021
- UChicago Argonne, LLC
- Suzanne Gabriëlle Everdine te Velthuis
- G01 - MEASURING TESTING
Information Patent Application
BEAM SPLITTER FOR ACHIEVING GRAZING INCIDENCE OF LIGHT
- Publication number 20210349325
- Publication date Nov 11, 2021
- Carl Zeiss SMT GMBH
- Konstantin Forcht
- G02 - OPTICS
Information Patent Application
QUANTUM NV-DIAMOND ATOMIC CLOCK
- Publication number 20210333761
- Publication date Oct 28, 2021
- TURK TELEKOMUNIKASYON ANONIM SIRKETI
- Umut KETEN
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR ANALYSING A DEFECT OF A PHOTOLITHOGRAPHIC MAS...
- Publication number 20210247336
- Publication date Aug 12, 2021
- Carl Zeiss SMT GMBH
- Gabriel Baralia
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HOLOGRAPHIC MICROSCOPE AND MANUFACTURING METHOD OF SEMICONDUCTOR DE...
- Publication number 20210200148
- Publication date Jul 1, 2021
- Samsung Electronics Co., Ltd.
- Seungbeom Park
- G02 - OPTICS
Information Patent Application
STRONTIUM TETRABORATE AS OPTICAL COATING MATERIAL
- Publication number 20210131978
- Publication date May 6, 2021
- KLA Corporation
- Yung-Ho Alex Chuang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON BEAM PVD ENDPOINT DETECTION AND CLOSED-LOOP PROCESS CONTRO...
- Publication number 20210062326
- Publication date Mar 4, 2021
- Applied Materials, Inc.
- David Masayuki ISHIKAWA
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATICALLY EXECUTING A TEST TO INSPECT AN END FACE OF AN OPTICAL...
- Publication number 20210049751
- Publication date Feb 18, 2021
- VIAVI Solutions Inc.
- Jonathan ECK
- G01 - MEASURING TESTING
Information Patent Application
IN SITU ELECTRICAL PROPERTIES CHARACTERIZATION SYSTEM TOWRDS SURFAC...
- Publication number 20200402865
- Publication date Dec 24, 2020
- National University of Singapore
- Wei CHEN
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
STRONTIUM TETRABORATE AS OPTICAL COATING MATERIAL
- Publication number 20200355621
- Publication date Nov 12, 2020
- KLA Corporation
- Yung-Ho Alex Chuang
- G01 - MEASURING TESTING
Information Patent Application
INFORMATION PROCESSING APPARATUS, INFORMATION PROCESSING METHOD, AN...
- Publication number 20200264423
- Publication date Aug 20, 2020
- SONY CORPORATION
- Takuya Oshima
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTICAL DEVICE FOR MICROSCOPIC OBSERVATION
- Publication number 20200241275
- Publication date Jul 30, 2020
- HAMAMATSU PHOTONICS K. K.
- Tomonori Nakamura
- G02 - OPTICS
Information Patent Application
INTERFEROMETRIC SYSTEM WITH MOTION MECHANISM FOR INSPECTING MULTI-C...
- Publication number 20200209601
- Publication date Jul 2, 2020
- Sumix Corporation
- Farhad Towfiq
- G02 - OPTICS
Information Patent Application
INSPECTION DEVICE AND INSPECTION METHOD
- Publication number 20200132629
- Publication date Apr 30, 2020
- HAMAMATSU PHOTONICS K. K.
- Tomonori Nakamura
- G02 - OPTICS
Information Patent Application
MACHINE VISION SYSTEM FOR SUBSTRATE ALIGNMENT AND ALIGNMENT D...
- Publication number 20200090971
- Publication date Mar 19, 2020
- SHANGHAI MICRO ELECTRONICS EQUIPMENT (GROUP) CO.,LTD.
- Zhi ZHU
- G02 - OPTICS

Technical microscopes

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Arrayed visual inspectors for fiber connectors and adapters

Method for verifying the accurate mounting of molding inserts to a...

In situ electrical properties characterization system towards surfa...

Holographic microscope and manufacturing method of semiconductor de...

Dark field microscope

Simultaneous pattern-scan placement during sample processing

System and method for monitoring of states of components of a micro...

System and method for performing automated analysis of air samples

Device and method for analyzing a defect of a photolithographic mas...

Collecting apparatus for microscopic objects, collecting container...

Adapter tip and microscope system for inspection of fiber-optic con...

Bond test apparatus and method for testing the strength of bonds on...

Super resolution for magneto-optical microscopy

System and method for determining part damage

Strontium tetraborate as optical coating material

Real-time monitoring microscopic imaging system for nitride MOCVD e...

Microscope

Quantum NV-diamond atomic clock

Information processing apparatus, information processing method, an...

Modular, electro-optical device for increasing the imaging field of...

Imaging integrated circuits using a single-point single-photon dete...

Automatically executing a test to inspect an end face of an optical...

Expediting spectral measurement in semiconductor device fabrication

Fixtures, systems, and methods for configuring an imaging device fo...

Fluid monitoring system

Optical scattering measurement method and apparatus using micro len...

System for actinic inspection of semiconductor masks

Method for direct optical visualization of graphene and its nanosca...

Systems and methods using stroboscopic universal structure-energy f...

Microscope imaging optical system and light-field microscope includ...

Patents Applicationslast 30 patents

HOLOGRAPHIC MICROSCOPE AND MANUFACTURING METHOD OF SEMICONDUCTOR DE...

OPTICAL FILTERING DEVICE, METHOD OF CONTROLLING OPTICAL FILTERING D...

DARK FIELD MICROSCOPE

SIMULTANEOUS PATTERN-SCAN PLACEMENT DURING SAMPLE PROCESSING

Device for Acquiring Images of a Surface

COMPACT OPTICAL MICROSCOPE, METROLOGY DEVICE COMPRISING THE OPTICAL...

OPTICAL FILTERING DEVICE, METHOD OF CONTROLLING OPTICAL FILTERING D...

SYSTEM AND METHOD FOR MONITORING OF STATES OF COMPONENTS OF A MICRO...

METHODS AND OPTICAL CHECKING UNITS FOR CHECKING A SIDE OF A FILM

ADAPTER TIP AND MICROSCOPE SYSTEM FOR INSPECTING DUPLEX FIBER-OPTIC...

DARK FIELD MICROSCOPE

ARRAYED VISUAL INSPECTORS FOR FIBER CONNECTORS AND ADAPTERS

SYSTEM AND METHOD FOR MONITORING OF STATES OF COMPONENTS OF A MICRO...

ADAPTER TIP AND MICROSCOPE SYSTEM FOR INSPECTION OF FIBER-OPTIC CON...

PARTICLE CHARACTERIZATION USING OPTICAL MICROSCOPY

SUPER RESOLUTION FOR MAGNETO-OPTICAL MICROSCOPY

BEAM SPLITTER FOR ACHIEVING GRAZING INCIDENCE OF LIGHT

QUANTUM NV-DIAMOND ATOMIC CLOCK

DEVICE AND METHOD FOR ANALYSING A DEFECT OF A PHOTOLITHOGRAPHIC MAS...

HOLOGRAPHIC MICROSCOPE AND MANUFACTURING METHOD OF SEMICONDUCTOR DE...

STRONTIUM TETRABORATE AS OPTICAL COATING MATERIAL

ELECTRON BEAM PVD ENDPOINT DETECTION AND CLOSED-LOOP PROCESS CONTRO...

AUTOMATICALLY EXECUTING A TEST TO INSPECT AN END FACE OF AN OPTICAL...

IN SITU ELECTRICAL PROPERTIES CHARACTERIZATION SYSTEM TOWRDS SURFAC...

STRONTIUM TETRABORATE AS OPTICAL COATING MATERIAL

INFORMATION PROCESSING APPARATUS, INFORMATION PROCESSING METHOD, AN...

OPTICAL DEVICE FOR MICROSCOPIC OBSERVATION

INTERFEROMETRIC SYSTEM WITH MOTION MECHANISM FOR INSPECTING MULTI-C...

INSPECTION DEVICE AND INSPECTION METHOD

MACHINE VISION SYSTEM FOR SUBSTRATE ALIGNMENT AND ALIGNMENT D...