Tester hardware

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CPC
G06F11/273

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Parent Industries

GPHYSICS G06Computing G06FELECTRICAL DIGITAL DATA PROCESSING G06F11/00Error detection Error correction Monitoring

Current Industry

G06F11/273Tester hardware

Industries

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Patents Grantslast 30 patents

Information Patent Grant
CXL protocol enablement for test environment systems and methods
- Patent number 12,360,868
- Issue date Jul 15, 2025
- Advantest Corporation
- Srdjan Malisic
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Management of hot add in a testing environment for DUTs that are CX...
- Patent number 12,353,306
- Issue date Jul 8, 2025
- Advantest Corporation
- Srdjan Malisic
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Processor with debug pipeline
- Patent number 12,353,308
- Issue date Jul 8, 2025
- Texas Instruments Incorporated
- Shrey Bhatia
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test method and multi-processor SOC chip
- Patent number 12,346,230
- Issue date Jul 1, 2025
- INSPUR SUZHOU INTELLIGENT TECHNOLOGY CO., LTD
- Wentao Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System-on-chip and method for performing a diagnosis during runtime
- Patent number 12,339,758
- Issue date Jun 24, 2025
- DEEPX CO., LTD.
- Lok Won Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method, an all-in-one tester and computer program product
- Patent number 12,332,756
- Issue date Jun 17, 2025
- OptoFidelity Oy
- Natalia Leinonen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electronic device, server testing system and method with environmen...
- Patent number 12,332,757
- Issue date Jun 17, 2025
- Fulian Precision Electronics (Tianjin) Co., LTD.
- Teng-Fei Ma
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test circuit, method, and apparatus for to-be-tested module
- Patent number 12,326,791
- Issue date Jun 10, 2025
- Horizon Journey (Hangzhou) Artificial Intelligence Technology Co., Ltd.
- Jing Li
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for reducing error log required space in semico...
- Patent number 12,321,249
- Issue date Jun 3, 2025
- Intelligent Memory Limited
- Mike Hossein Amidi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Complex device fault diagnosis method and system based on multi-dim...
- Patent number 12,314,149
- Issue date May 27, 2025
- GUANGDONG UNIVERSITY OF TECHNOLOGY
- Yaohua Deng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Trace buffer data management for emulation systems
- Patent number 12,306,732
- Issue date May 20, 2025
- Synopsys, Inc.
- Chia-Wei Liang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and method for simultaneously clearing and installing dat...
- Patent number 12,292,808
- Issue date May 6, 2025
- Communications Test Design, Inc.
- Austin Gunter
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Computer and conduit for system testing
- Patent number 12,287,715
- Issue date Apr 29, 2025
- Visa International Service Association
- Yuexi Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for real-time hardware in the loop
- Patent number 12,277,044
- Issue date Apr 15, 2025
- Dana Belgium N.V.
- Tony Libbrecht
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Error rate measurement apparatus and error rate measurement method
- Patent number 12,253,924
- Issue date Mar 18, 2025
- Anritsu Corporation
- Hiroyuki Onuma
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems, apparatuses, and methods for autonomous functional testing...
- Patent number 12,253,925
- Issue date Mar 18, 2025
- Intel Corporation
- Michael Mishaeli
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automated functional testing systems and methods of making and usin...
- Patent number 12,222,263
- Issue date Feb 11, 2025
- Myung Ki Kim
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
Test mode state machine for a memory device
- Patent number 12,210,766
- Issue date Jan 28, 2025
- Micron Technology, Inc.
- Rucha Deepak Geedh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Debug for multi-threaded processing
- Patent number 12,204,425
- Issue date Jan 21, 2025
- Texas Instruments Incorporated
- Niraj Nandan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for testing cxl enabled devices in parallel
- Patent number 12,197,303
- Issue date Jan 14, 2025
- Advantest Corporation
- Srdjan Malisic
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for processor debug using low-bandwidth interface...
- Patent number 12,174,714
- Issue date Dec 24, 2024
- SILICONCH SYSTEMS PVT LTD
- Rakesh Kumar Polasa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Vehicle apparatus including verification apparatus
- Patent number 12,174,726
- Issue date Dec 24, 2024
- Mitsubishi Electric Corporation
- Koji Shimamura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
GPU stress test with dynamic loads
- Patent number 12,164,399
- Issue date Dec 10, 2024
- APOLLO AUTONOMOUS DRIVING USA LLC
- Congshi Huang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for advanced communication interface analysis
- Patent number 12,147,319
- Issue date Nov 19, 2024
- Cable Television Laboratories, Inc.
- Bernardo Huberman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Heterogeneous test equipment interfacing apparatus for weapon syste...
- Patent number 12,130,600
- Issue date Oct 29, 2024
- Agency for Defense Development
- Tae yeob Kang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
SOC-oriented concurrent test system for multiple clock domains and...
- Patent number 12,130,718
- Issue date Oct 29, 2024
- Macrotest Semiconductor Inc.
- Guoliang Mao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Leveraging low power states for fault testing of processing cores a...
- Patent number 12,124,346
- Issue date Oct 22, 2024
- NVIDIA Corporation
- Jonah Alben
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System, apparatus and methods for automatically testing mobile devices
- Patent number 12,124,348
- Issue date Oct 22, 2024
- Communications Test Design, Inc.
- Gerald J. Parsons
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
Systems and methods for device testing to avoid resource conflicts...
- Patent number 12,124,359
- Issue date Oct 22, 2024
- Advantest Corporation
- Jochen Rivoir
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System directed testing
- Patent number 12,117,913
- Issue date Oct 15, 2024
- Future Dial, Inc.
- Angel Michelle Anderson
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
APPARATUS AND METHOD FOR SIMULTANEOUSLY CLEARING AND INSTALLING DAT...
- Publication number 20250231847
- Publication date Jul 17, 2025
- Communications Test Design, Inc.
- Austin Gunter
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
STORAGE DEVICE AND METHOD OF TESTING STORAGE DEVICE
- Publication number 20250231846
- Publication date Jul 17, 2025
- Samsung Electronics Co., Ltd.
- WONCHOL KIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
NOVEL AUTOMATED FUNCTIONAL TESTING SYSTEMS AND METHODS OF MAKING AN...
- Publication number 20250180439
- Publication date Jun 5, 2025
- Myung Ki KIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PROPRIETY DETERMINATION DEVICE AND PROPRIETY DETERMINATION METHOD
- Publication number 20250165367
- Publication date May 22, 2025
- SCREEN Holdings Co., Ltd.
- Hiroakira MATSUI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TEST MODE STATE MACHINE FOR A MEMORY DEVICE
- Publication number 20250138744
- Publication date May 1, 2025
- Micron Technology, Inc.
- Rucha Deepak Geedh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHIP VERIFICATION METHOD BASED ON SPI
- Publication number 20250117302
- Publication date Apr 10, 2025
- IPGoal Microelectronics (Sichuan) Co., Ltd.
- Chuan Yang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY APPARATUS, TEST FIXTURE, AND TEST SYSTEM
- Publication number 20250094301
- Publication date Mar 20, 2025
- Yangtze Memory Technologies Co., Ltd.
- Jie ZHU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SERVER TESTING SYSTEM, SERVER TESTING METHOD, AND ELECTRONIC DEVICE
- Publication number 20250068531
- Publication date Feb 27, 2025
- Fulian Precision Electronics (Tianjin) Co., LTD.
- TENG-FEI MA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM DIRECTED TESTING
- Publication number 20250036536
- Publication date Jan 30, 2025
- FUTURE DIAL, INC.
- Angel Michelle Anderson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
HIGH PERFORMANCE TRACE OFFLOAD CIRCUIT ARCHITECTURE
- Publication number 20250004919
- Publication date Jan 2, 2025
- Xilinx, Inc.
- Anurag Dubey
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LEVERAGING LOW POWER STATES FOR FAULT TESTING OF PROCESSING CORES A...
- Publication number 20240419568
- Publication date Dec 19, 2024
- NVIDIA Corporation
- Jonah ALBEN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS AND METHODS FOR AUTOMATICALLY CONFIGURING COMPUTING DEVIC...
- Publication number 20240403202
- Publication date Dec 5, 2024
- Communications Test Design, Inc.
- Stephen Tate DiJoseph
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MULTIMEDIA PRODUCT BURN-IN APPARATUS
- Publication number 20240403180
- Publication date Dec 5, 2024
- AMLOGIC (SHANGHAI) CO., LTD.
- Yuan LUO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM, APPARATUS AND METHODS FOR AUTOMATICALLY TESTING MOBILE DEVICES
- Publication number 20240394163
- Publication date Nov 28, 2024
- Communications Test Design, Inc.
- Gerald J. PARSONS
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TEST METHOD BASED ON DATA SWITCH, DATA SWITCH AND STORAGE MEDIUM
- Publication number 20240385938
- Publication date Nov 21, 2024
- Fulian Precision Electronics (Tianjin) Co., LTD.
- TENG-FEI MA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR REAL-TIME HARDWARE IN THE LOOP
- Publication number 20240370343
- Publication date Nov 7, 2024
- DANA BELGIUM N.V.
- Tony LIBBRECHT
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS, SYSTEM, AND METHOD OF DEBUGGING
- Publication number 20240354211
- Publication date Oct 24, 2024
- Intel Corporation
- Aruni Nelson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PROGRAMMABLE TEST COMPRESSION ARCHITECTURE INPUT/OUTPUT SHIFT REGISTER
- Publication number 20240337691
- Publication date Oct 10, 2024
- TEXAS INSTRUMENTS INCORPORATED
- Lee D. Whetsel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and apparatus for detecting anomalies in an operation behavi...
- Publication number 20240330138
- Publication date Oct 3, 2024
- Rohde& Schwarz GmbH & Co. KG
- Hendrik Bartko
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM DIRECTED TESTING
- Publication number 20240320113
- Publication date Sep 26, 2024
- FUTURE DIAL, INC.
- Angel Michelle Anderson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
POWER SAVING BY LOADING REPAIR INFORMATION BEFORE MEMORY DEVICE SEN...
- Publication number 20240281351
- Publication date Aug 22, 2024
- Micron Technology, Inc.
- Makoto Kitagawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SOC-ORIENTED CONCURRENT TEST SYSTEM FOR MULTIPLE CLOCK DOMAINS AND...
- Publication number 20240220381
- Publication date Jul 4, 2024
- Macrotest Semiconductor Inc.
- Guoliang Mao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TEST CIRCUIT, METHOD, AND APPARATUS FOR TO-BE-TESTED MODULE
- Publication number 20240211361
- Publication date Jun 27, 2024
- Horizon Journey (Hangzhou) Artificial Intelligence Technology Co., Ltd.
- Jing LI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
GPU STRESS TEST WITH DYNAMIC LOADS
- Publication number 20240211363
- Publication date Jun 27, 2024
- Apollo Autonomous Driving USA LLC
- Congshi Huang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS AND METHOD FOR SIMULTANEOUSLY CLEARING AND INSTALLING DAT...
- Publication number 20240193059
- Publication date Jun 13, 2024
- Communications Test Design, Inc.
- Austin Gunter
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS AND METHOD FOR TESTING A PLURALITY OF COMPUTING DEVICES
- Publication number 20240193060
- Publication date Jun 13, 2024
- Communications Test Design, Inc.
- Aaron Santangelo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS AND METHODS FOR REDUCING ERROR LOG REQUIRED SPACE IN SEMICO...
- Publication number 20240160547
- Publication date May 16, 2024
- Intelligent Memory Limited
- Mike Hossein Amidi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Optimization of Process for Exiting Machines from Test Environments
- Publication number 20240160546
- Publication date May 16, 2024
- International Business Machines Corporation
- Christopher Mazile
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CLOSED-LOOP INPUT/OUTPUT POINTS TESTING
- Publication number 20240152437
- Publication date May 9, 2024
- SCHNEIDER ELECTRIC SYSTEMS ITALIA S.p.A.
- Pascal Brunot
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEASUREMENT SYSTEM AND TESTING METHOD OF TESTING A DEVICE UNDER TEST
- Publication number 20240142345
- Publication date May 2, 2024
- ROHDE & SCHWARZ GMBH & CO. KG
- Paul Gareth Lloyd
- G06 - COMPUTING CALCULATING COUNTING

Tester hardware

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

CXL protocol enablement for test environment systems and methods

Management of hot add in a testing environment for DUTs that are CX...

Processor with debug pipeline

Test method and multi-processor SOC chip

System-on-chip and method for performing a diagnosis during runtime

Method, an all-in-one tester and computer program product

Electronic device, server testing system and method with environmen...

Test circuit, method, and apparatus for to-be-tested module

Systems and methods for reducing error log required space in semico...

Complex device fault diagnosis method and system based on multi-dim...

Trace buffer data management for emulation systems

Apparatus and method for simultaneously clearing and installing dat...

Computer and conduit for system testing

System and method for real-time hardware in the loop

Error rate measurement apparatus and error rate measurement method

Systems, apparatuses, and methods for autonomous functional testing...

Automated functional testing systems and methods of making and usin...

Test mode state machine for a memory device

Debug for multi-threaded processing

Systems and methods for testing cxl enabled devices in parallel

System and method for processor debug using low-bandwidth interface...

Vehicle apparatus including verification apparatus

GPU stress test with dynamic loads

Systems and methods for advanced communication interface analysis

Heterogeneous test equipment interfacing apparatus for weapon syste...

SOC-oriented concurrent test system for multiple clock domains and...

Leveraging low power states for fault testing of processing cores a...

System, apparatus and methods for automatically testing mobile devices

Systems and methods for device testing to avoid resource conflicts...

System directed testing

Patents Applicationslast 30 patents

APPARATUS AND METHOD FOR SIMULTANEOUSLY CLEARING AND INSTALLING DAT...

STORAGE DEVICE AND METHOD OF TESTING STORAGE DEVICE

NOVEL AUTOMATED FUNCTIONAL TESTING SYSTEMS AND METHODS OF MAKING AN...

PROPRIETY DETERMINATION DEVICE AND PROPRIETY DETERMINATION METHOD

TEST MODE STATE MACHINE FOR A MEMORY DEVICE

CHIP VERIFICATION METHOD BASED ON SPI

MEMORY APPARATUS, TEST FIXTURE, AND TEST SYSTEM

SERVER TESTING SYSTEM, SERVER TESTING METHOD, AND ELECTRONIC DEVICE

SYSTEM DIRECTED TESTING

HIGH PERFORMANCE TRACE OFFLOAD CIRCUIT ARCHITECTURE

LEVERAGING LOW POWER STATES FOR FAULT TESTING OF PROCESSING CORES A...

APPARATUS AND METHODS FOR AUTOMATICALLY CONFIGURING COMPUTING DEVIC...

MULTIMEDIA PRODUCT BURN-IN APPARATUS

SYSTEM, APPARATUS AND METHODS FOR AUTOMATICALLY TESTING MOBILE DEVICES

TEST METHOD BASED ON DATA SWITCH, DATA SWITCH AND STORAGE MEDIUM

SYSTEM AND METHOD FOR REAL-TIME HARDWARE IN THE LOOP

APPARATUS, SYSTEM, AND METHOD OF DEBUGGING

PROGRAMMABLE TEST COMPRESSION ARCHITECTURE INPUT/OUTPUT SHIFT REGISTER

Method and apparatus for detecting anomalies in an operation behavi...

SYSTEM DIRECTED TESTING

POWER SAVING BY LOADING REPAIR INFORMATION BEFORE MEMORY DEVICE SEN...

SOC-ORIENTED CONCURRENT TEST SYSTEM FOR MULTIPLE CLOCK DOMAINS AND...

TEST CIRCUIT, METHOD, AND APPARATUS FOR TO-BE-TESTED MODULE

GPU STRESS TEST WITH DYNAMIC LOADS

APPARATUS AND METHOD FOR SIMULTANEOUSLY CLEARING AND INSTALLING DAT...

APPARATUS AND METHOD FOR TESTING A PLURALITY OF COMPUTING DEVICES

SYSTEMS AND METHODS FOR REDUCING ERROR LOG REQUIRED SPACE IN SEMICO...

Optimization of Process for Exiting Machines from Test Environments

CLOSED-LOOP INPUT/OUTPUT POINTS TESTING

MEASUREMENT SYSTEM AND TESTING METHOD OF TESTING A DEVICE UNDER TEST