Tester hardware

Industry

CPC
G06F11/273

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Parent Industries

GPHYSICS G06Computing G06FELECTRICAL DIGITAL DATA PROCESSING G06F11/00Error detection Error correction Monitoring

Current Industry

G06F11/273Tester hardware

Industries

Patents Grantslast 30 patents

Information Patent Grant
Systems and methods for advanced communication interface analysis
- Patent number 12,147,319
- Issue date Nov 19, 2024
- Cable Television Laboratories, Inc.
- Bernardo Huberman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Heterogeneous test equipment interfacing apparatus for weapon syste...
- Patent number 12,130,600
- Issue date Oct 29, 2024
- Agency for Defense Development
- Tae yeob Kang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
SOC-oriented concurrent test system for multiple clock domains and...
- Patent number 12,130,718
- Issue date Oct 29, 2024
- Macrotest Semiconductor Inc.
- Guoliang Mao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Leveraging low power states for fault testing of processing cores a...
- Patent number 12,124,346
- Issue date Oct 22, 2024
- NVIDIA Corporation
- Jonah Alben
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System, apparatus and methods for automatically testing mobile devices
- Patent number 12,124,348
- Issue date Oct 22, 2024
- Communications Test Design, Inc.
- Gerald J. Parsons
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
Systems and methods for device testing to avoid resource conflicts...
- Patent number 12,124,359
- Issue date Oct 22, 2024
- Advantest Corporation
- Jochen Rivoir
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System directed testing
- Patent number 12,117,913
- Issue date Oct 15, 2024
- Future Dial, Inc.
- Angel Michelle Anderson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Techniques for testing semiconductor devices
- Patent number 12,079,097
- Issue date Sep 3, 2024
- NVIDIA Corporation
- Animesh Khare
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automated test equipment with hardware accelerator
- Patent number 12,079,098
- Issue date Sep 3, 2024
- Advantest Corporation
- Mei-Mei Su
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
In system test of chips in functional systems
- Patent number 12,078,678
- Issue date Sep 3, 2024
- NVIDIA Corporation
- Shantanu Sarangi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for testing AI chip computing performance, and...
- Patent number 12,072,780
- Issue date Aug 27, 2024
- Kunlunxin Technology (Beijing) Company Limited
- Zhao Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Processing system, related integrated circuit, device and method
- Patent number 12,061,530
- Issue date Aug 13, 2024
- STMicroelectronics Application GmbH
- Roberto Colombo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Margin test data tagging and predictive expected margins
- Patent number 12,061,232
- Issue date Aug 13, 2024
- Tektronix, Inc.
- Sam J. Strickling
- G01 - MEASURING TESTING
Information Patent Grant
Hard disk indicator circuit and hard disk backplane
- Patent number 12,033,677
- Issue date Jul 9, 2024
- Fulian Precision Electronics (Tianjin) Co., LTD.
- Hong-Shuang Wu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods to test an asynchronous finite machine
- Patent number 12,032,460
- Issue date Jul 9, 2024
- STMicroelectronics S.r.l.
- Enea Dimroci
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Power supply health check system and method thereof
- Patent number 12,026,075
- Issue date Jul 2, 2024
- ASUSTeK COMPUTER Inc.
- Cheng-Wei Gu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Programmable test compression architecture input/output shift regis...
- Patent number 12,013,434
- Issue date Jun 18, 2024
- Texas Instruments Incorporated
- Lee D. Whetsel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Smart selection of test scripts for commodity testing on manufactur...
- Patent number 12,013,770
- Issue date Jun 18, 2024
- Dell Products L.P.
- Shibi Panikkar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test methods, tester, load board and test system
- Patent number 11,988,710
- Issue date May 21, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Chia-Chi Hsu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automated functional testing systems and methods of making and usin...
- Patent number 11,982,597
- Issue date May 14, 2024
- Myung Ki Kim
- G01 - MEASURING TESTING
Information Patent Grant
Error rate measuring apparatus and error rate measuring method
- Patent number 11,977,464
- Issue date May 7, 2024
- Anritsu Corporation
- Ryo Sunayama
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Saturation of multiple PCIe slots in a server by multiple ports in...
- Patent number 11,966,309
- Issue date Apr 23, 2024
- Hewlett Packard Enterprise Development LP
- Hong-Jen Hsu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and system for debugging solid-state disk (SSD) device
- Patent number 11,933,847
- Issue date Mar 19, 2024
- Silicon Motion, Inc.
- Han-Chih Tsai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
API adapter test system, API adapter test assistance device, API ad...
- Patent number 11,928,040
- Issue date Mar 12, 2024
- Nippon Telegraph and Telephone Corporation
- Sho Kanemaru
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automated test equipment for testing one or more devices under test...
- Patent number 11,913,990
- Issue date Feb 27, 2024
- Advantest Corporation
- Olaf Pöppe
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
USB integrated circuit, testing platform and operating method for U...
- Patent number 11,914,491
- Issue date Feb 27, 2024
- VIA LABS, INC.
- Hao-Hsuan Chiu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Testing of hardware queue systems using on device test generation
- Patent number 11,907,088
- Issue date Feb 20, 2024
- Synopsys, Inc.
- Hillel Mendelson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Machine learning for taps to accelerate TDECQ and other measurements
- Patent number 11,907,090
- Issue date Feb 20, 2024
- Tektronix, Inc.
- Kan Tan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Baseboard management controller (BMC) test system and method
- Patent number 11,907,384
- Issue date Feb 20, 2024
- Dell Products, L.P.
- Timothy M. Lambert
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Enhanced auxiliary memory mapped interface test systems and methods
- Patent number 11,899,550
- Issue date Feb 13, 2024
- Advantest Corporation
- Chi Yuan
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
TEST METHOD BASED ON DATA SWITCH, DATA SWITCH AND STORAGE MEDIUM
- Publication number 20240385938
- Publication date Nov 21, 2024
- Fulian Precision Electronics (Tianjin) Co., LTD.
- TENG-FEI MA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR REAL-TIME HARDWARE IN THE LOOP
- Publication number 20240370343
- Publication date Nov 7, 2024
- DANA BELGIUM N.V.
- Tony LIBBRECHT
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS, SYSTEM, AND METHOD OF DEBUGGING
- Publication number 20240354211
- Publication date Oct 24, 2024
- Intel Corporation
- Aruni Nelson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PROGRAMMABLE TEST COMPRESSION ARCHITECTURE INPUT/OUTPUT SHIFT REGISTER
- Publication number 20240337691
- Publication date Oct 10, 2024
- TEXAS INSTRUMENTS INCORPORATED
- Lee D. Whetsel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and apparatus for detecting anomalies in an operation behavi...
- Publication number 20240330138
- Publication date Oct 3, 2024
- Rohde& Schwarz GmbH & Co. KG
- Hendrik Bartko
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM DIRECTED TESTING
- Publication number 20240320113
- Publication date Sep 26, 2024
- FUTURE DIAL, INC.
- Angel Michelle Anderson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
POWER SAVING BY LOADING REPAIR INFORMATION BEFORE MEMORY DEVICE SEN...
- Publication number 20240281351
- Publication date Aug 22, 2024
- Micron Technology, Inc.
- Makoto Kitagawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SOC-ORIENTED CONCURRENT TEST SYSTEM FOR MULTIPLE CLOCK DOMAINS AND...
- Publication number 20240220381
- Publication date Jul 4, 2024
- Macrotest Semiconductor Inc.
- Guoliang Mao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TEST CIRCUIT, METHOD, AND APPARATUS FOR TO-BE-TESTED MODULE
- Publication number 20240211361
- Publication date Jun 27, 2024
- Horizon Journey (Hangzhou) Artificial Intelligence Technology Co., Ltd.
- Jing LI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
GPU STRESS TEST WITH DYNAMIC LOADS
- Publication number 20240211363
- Publication date Jun 27, 2024
- Apollo Autonomous Driving USA LLC
- Congshi Huang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS AND METHOD FOR SIMULTANEOUSLY CLEARING AND INSTALLING DAT...
- Publication number 20240193059
- Publication date Jun 13, 2024
- Communications Test Design, Inc.
- Austin Gunter
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS AND METHOD FOR TESTING A PLURALITY OF COMPUTING DEVICES
- Publication number 20240193060
- Publication date Jun 13, 2024
- Communications Test Design, Inc.
- Aaron Santangelo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS AND METHODS FOR REDUCING ERROR LOG REQUIRED SPACE IN SEMICO...
- Publication number 20240160547
- Publication date May 16, 2024
- Intelligent Memory Limited
- Mike Hossein Amidi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Optimization of Process for Exiting Machines from Test Environments
- Publication number 20240160546
- Publication date May 16, 2024
- International Business Machines Corporation
- Christopher Mazile
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CLOSED-LOOP INPUT/OUTPUT POINTS TESTING
- Publication number 20240152437
- Publication date May 9, 2024
- SCHNEIDER ELECTRIC SYSTEMS ITALIA S.p.A.
- Pascal Brunot
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEASUREMENT SYSTEM AND TESTING METHOD OF TESTING A DEVICE UNDER TEST
- Publication number 20240142345
- Publication date May 2, 2024
- ROHDE & SCHWARZ GMBH & CO. KG
- Paul Gareth Lloyd
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR FIRMWARE FUNCTIONALITY TESTING OF GAS DETECTO...
- Publication number 20240143467
- Publication date May 2, 2024
- Honeywell International Inc.
- Sumit Suresh KULKARNI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR REAL-TIME DEBUGGING OF PROCESSOR
- Publication number 20240126666
- Publication date Apr 18, 2024
- SILICONCH SYSTEMS PVT LTD
- Rakesh Kumar POLASA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTELLIGENT SCORE BASED OOM TEST BASELINE MECHANISM
- Publication number 20240126667
- Publication date Apr 18, 2024
- Dell Products L.P.
- Huijuan Fan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Battery Cell/Pack Testing Devices, Systems Including Such Devices,...
- Publication number 20240111647
- Publication date Apr 4, 2024
- SES Holdings Pte. Ltd.
- Younggyu Nam
- G01 - MEASURING TESTING
Information Patent Application
GENERATING AUDIT RECORDS FOR DISTRIBUTED COMPUTING SYSTEM-BASED MOT...
- Publication number 20240104211
- Publication date Mar 28, 2024
- HEWLETT PACKARD ENTERPRISE DEVELOPMENT LP
- Sebastian Kaiser
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CXL PROTOCOL ENABLEMENT FOR TEST ENVIRONMENT SYSTEMS AND METHODS
- Publication number 20240095135
- Publication date Mar 21, 2024
- Advantest Corporation
- Srdjan Malisic
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS AND METHODS UTILIZING DAX MEMORY MANAGEMENT FOR TESTING CXL...
- Publication number 20240095138
- Publication date Mar 21, 2024
- Advantest Corporation
- Srdjan Malisic
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR ESTABLISHING DATA TRANSFER PROCESSES BETWEEN...
- Publication number 20240061757
- Publication date Feb 22, 2024
- Erik Stuart Hons
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Test Method and Multi-Processor SOC Chip
- Publication number 20240054059
- Publication date Feb 15, 2024
- INSPUR SUZHOU INTELLIGENT TECHNOLOGY CO., LTD.
- Wentao LIU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ERROR RATE MEASUREMENT APPARATUS AND ERROR RATE MEASUREMENT METHOD
- Publication number 20240045778
- Publication date Feb 8, 2024
- Anritsu Corporation
- Hiroyuki ONUMA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PROCESSOR WITH DEBUG PIPELINE
- Publication number 20240012727
- Publication date Jan 11, 2024
- TEXAS INSTRUMENTS INCORPORATED
- Shrey Bhatia
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SATURATION OF MULTIPLE PCIE SLOTS IN A SERVER BY MULTIPLE PORTS IN...
- Publication number 20240004769
- Publication date Jan 4, 2024
- HEWLETT PACKARD ENTERPRISE DEVELOPMENT LP
- Hong-Jen Hsu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SIGNAL TRANSFER CONTROL METHOD, SIGNAL TRANSFER APPARATUS, AND TEST...
- Publication number 20230418719
- Publication date Dec 28, 2023
- Huawei Technologies Co., Ltd
- Hui WANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEBUG FOR MULTI-THREADED PROCESSING
- Publication number 20230418718
- Publication date Dec 28, 2023
- TEXAS INSTRUMENTS INCORPORATED
- NIRAJ NANDAN
- G06 - COMPUTING CALCULATING COUNTING

Tester hardware

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Systems and methods for advanced communication interface analysis

Heterogeneous test equipment interfacing apparatus for weapon syste...

SOC-oriented concurrent test system for multiple clock domains and...

Leveraging low power states for fault testing of processing cores a...

System, apparatus and methods for automatically testing mobile devices

Systems and methods for device testing to avoid resource conflicts...

System directed testing

Techniques for testing semiconductor devices

Automated test equipment with hardware accelerator

In system test of chips in functional systems

Method and apparatus for testing AI chip computing performance, and...

Processing system, related integrated circuit, device and method

Margin test data tagging and predictive expected margins

Hard disk indicator circuit and hard disk backplane

Systems and methods to test an asynchronous finite machine

Power supply health check system and method thereof

Programmable test compression architecture input/output shift regis...

Smart selection of test scripts for commodity testing on manufactur...

Test methods, tester, load board and test system

Automated functional testing systems and methods of making and usin...

Error rate measuring apparatus and error rate measuring method

Saturation of multiple PCIe slots in a server by multiple ports in...

Apparatus and system for debugging solid-state disk (SSD) device

API adapter test system, API adapter test assistance device, API ad...

Automated test equipment for testing one or more devices under test...

USB integrated circuit, testing platform and operating method for U...

Testing of hardware queue systems using on device test generation

Machine learning for taps to accelerate TDECQ and other measurements

Baseboard management controller (BMC) test system and method

Enhanced auxiliary memory mapped interface test systems and methods

Patents Applicationslast 30 patents

TEST METHOD BASED ON DATA SWITCH, DATA SWITCH AND STORAGE MEDIUM

SYSTEM AND METHOD FOR REAL-TIME HARDWARE IN THE LOOP

APPARATUS, SYSTEM, AND METHOD OF DEBUGGING

PROGRAMMABLE TEST COMPRESSION ARCHITECTURE INPUT/OUTPUT SHIFT REGISTER

Method and apparatus for detecting anomalies in an operation behavi...

SYSTEM DIRECTED TESTING

POWER SAVING BY LOADING REPAIR INFORMATION BEFORE MEMORY DEVICE SEN...

SOC-ORIENTED CONCURRENT TEST SYSTEM FOR MULTIPLE CLOCK DOMAINS AND...

TEST CIRCUIT, METHOD, AND APPARATUS FOR TO-BE-TESTED MODULE

GPU STRESS TEST WITH DYNAMIC LOADS

APPARATUS AND METHOD FOR SIMULTANEOUSLY CLEARING AND INSTALLING DAT...

APPARATUS AND METHOD FOR TESTING A PLURALITY OF COMPUTING DEVICES

SYSTEMS AND METHODS FOR REDUCING ERROR LOG REQUIRED SPACE IN SEMICO...

Optimization of Process for Exiting Machines from Test Environments

CLOSED-LOOP INPUT/OUTPUT POINTS TESTING

MEASUREMENT SYSTEM AND TESTING METHOD OF TESTING A DEVICE UNDER TEST

METHOD AND SYSTEM FOR FIRMWARE FUNCTIONALITY TESTING OF GAS DETECTO...

SYSTEM AND METHOD FOR REAL-TIME DEBUGGING OF PROCESSOR

INTELLIGENT SCORE BASED OOM TEST BASELINE MECHANISM

Battery Cell/Pack Testing Devices, Systems Including Such Devices,...

GENERATING AUDIT RECORDS FOR DISTRIBUTED COMPUTING SYSTEM-BASED MOT...

CXL PROTOCOL ENABLEMENT FOR TEST ENVIRONMENT SYSTEMS AND METHODS

SYSTEMS AND METHODS UTILIZING DAX MEMORY MANAGEMENT FOR TESTING CXL...

METHOD AND SYSTEM FOR ESTABLISHING DATA TRANSFER PROCESSES BETWEEN...

Test Method and Multi-Processor SOC Chip

ERROR RATE MEASUREMENT APPARATUS AND ERROR RATE MEASUREMENT METHOD

PROCESSOR WITH DEBUG PIPELINE

SATURATION OF MULTIPLE PCIE SLOTS IN A SERVER BY MULTIPLE PORTS IN...

SIGNAL TRANSFER CONTROL METHOD, SIGNAL TRANSFER APPARATUS, AND TEST...

DEBUG FOR MULTI-THREADED PROCESSING