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G01J2001/083
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PHYSICS
G01
Measuring instruments
G01J
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY
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G01J2001/083
Testing response of detector
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Patents Grants
last 30 patents
Information
Patent Grant
Low power gunshot sensor evaluation
Patent number
12,181,242
Issue date
Dec 31, 2024
Shooter Detection Systems, LLC
Richard Thomas Onofrio
F41 - WEAPONS
Information
Patent Grant
Self-checking photoelectric sensor and method of operation
Patent number
11,754,438
Issue date
Sep 12, 2023
Alcon Inc.
Christopher Carl Jung
G01 - MEASURING TESTING
Information
Patent Grant
LED array display for use in creating high fidelity simulations of...
Patent number
11,735,099
Issue date
Aug 22, 2023
DHPC TECHNOLOGIES, INC.
Yei Wo
G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information
Patent Grant
On-car stray-light testing cart
Patent number
11,330,253
Issue date
May 10, 2022
Waymo LLC
Chen David Lu
B60 - VEHICLES IN GENERAL
Information
Patent Grant
Calibration arrangement, optical sensor arrangement, and method for...
Patent number
10,859,433
Issue date
Dec 8, 2020
AMS AG
David Mehrl
G01 - MEASURING TESTING
Information
Patent Grant
Scene generation using surface plasmon polaritons
Patent number
10,788,360
Issue date
Sep 29, 2020
Truventic, LLC
Pedro N. Figueiredo
G01 - MEASURING TESTING
Information
Patent Grant
Diagnostic waveguide for optical chip testing
Patent number
10,732,029
Issue date
Aug 4, 2020
Skorpios Technologies, Inc.
Robert J. Stone
G01 - MEASURING TESTING
Information
Patent Grant
Reference light source device used for calibration of spectral lumi...
Patent number
10,330,530
Issue date
Jun 25, 2019
Otsuka Electronics Co., Ltd.
Hisashi Shiraiwa
G01 - MEASURING TESTING
Information
Patent Grant
Optoelectronic sensor including a light transmitter with multiple w...
Patent number
10,197,439
Issue date
Feb 5, 2019
Sick AG
Ingolf Horsch
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for performing testing of photonic devices
Patent number
10,151,627
Issue date
Dec 11, 2018
Skorpios Technologies, Inc.
Robert J. Stone
G01 - MEASURING TESTING
Information
Patent Grant
Method for calibrating absolute responsivity of terahertz quantum w...
Patent number
10,119,860
Issue date
Nov 6, 2018
Shanghai Institute of Microsystem and Information Technology, Chinese Academy...
Zhiyong Tan
G01 - MEASURING TESTING
Information
Patent Grant
Brightness calibration method used in optical detection system with...
Patent number
9,891,097
Issue date
Feb 13, 2018
Global Unichip Corporation
Chang-Ming Liu
G01 - MEASURING TESTING
Information
Patent Grant
Light sensing system, and method for calibrating a light sensing de...
Patent number
9,829,375
Issue date
Nov 28, 2017
Koninklijke Philips N.V.
Xavier Louis Marie Antoine Aubert
G01 - MEASURING TESTING
Information
Patent Grant
System for and method of combined LIBS and IR absorption spectrosco...
Patent number
9,625,376
Issue date
Apr 18, 2017
Foss Analytical A/S
Maja Kirstine Elsoee
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor integrated device for UV-index detection and related...
Patent number
9,568,359
Issue date
Feb 14, 2017
STMicroelectronics S.r.l.
Giuseppe Spinella
G01 - MEASURING TESTING
Information
Patent Grant
Wafer level testing of optical devices
Patent number
8,724,100
Issue date
May 13, 2014
Kotura, Inc.
Mehdi Asghari
G01 - MEASURING TESTING
Information
Patent Grant
Uniform light generating system for testing an image-sensing device...
Patent number
7,898,663
Issue date
Mar 1, 2011
Youngtek Electronics Corporation
Bily Wang
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for troubleshooting photosensors
Patent number
7,061,001
Issue date
Jun 13, 2006
Pitney Bowes Inc.
Vishal Chaudhary
G01 - MEASURING TESTING
Information
Patent Grant
System for producing uniform illumination for testing two dimension...
Patent number
6,191,891
Issue date
Feb 20, 2001
Samuel F. Pellicori
G02 - OPTICS
Information
Patent Grant
Multiple discrete analyzer test apparatus and method
Patent number
5,369,484
Issue date
Nov 29, 1994
Akzo nv
Douglas G. Haugen
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
TESTING AN ARC DETECTING SYSTEM
Publication number
20240319004
Publication date
Sep 26, 2024
ABB Schweiz AG
Jan-Peter Antin
G01 - MEASURING TESTING
Information
Patent Application
MEASUREMENT METHOD FOR CHARACTERIZATION OF A PHOTODETECTOR
Publication number
20240247977
Publication date
Jul 25, 2024
ams-OSRAM International GmbH
Gerd PLECHINGER
G01 - MEASURING TESTING
Information
Patent Application
SELF-CHECKING PHOTOELECTRIC SENSOR AND METHOD OF OPERATION
Publication number
20220268625
Publication date
Aug 25, 2022
Alcon Inc.
Christopher Carl Jung
G01 - MEASURING TESTING
Information
Patent Application
DIAGNOSTIC WAVEGUIDE FOR OPTICAL CHIP TESTING
Publication number
20210116295
Publication date
Apr 22, 2021
Skorpios Technologies, Inc.
Robert J. Stone
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
Scene Generation Using Surface Plasmon Polaritons
Publication number
20200348169
Publication date
Nov 5, 2020
Truventic, LLC
Pedro N. Figueiredo
G01 - MEASURING TESTING
Information
Patent Application
Scene Generation Using Surface Plasmon Polaritons
Publication number
20190234795
Publication date
Aug 1, 2019
Truventic, LLC
Pedro N. Figueiredo
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM FOR PERFORMING TESTING OF PHOTONIC DEVICES
Publication number
20190170572
Publication date
Jun 6, 2019
Skorpios Technologies, Inc.
Robert J. Stone
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
CALIBRATION ARRANGEMENT, OPTICAL SENSOR ARRANGEMENT, AND METHOD FOR...
Publication number
20180306639
Publication date
Oct 25, 2018
ams AG
David MEHRL
G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information
Patent Application
Method for Calibrating Absolute Responsivity of Terahertz Quantum W...
Publication number
20180216994
Publication date
Aug 2, 2018
SHANGHAI INSTITUTE OF MICROSYSTEM AND INFORMATION TECHNOLOGY, CHINESE ACADEMY...
Zhiyong TAN
G01 - MEASURING TESTING
Information
Patent Application
OPTOELECTRONIC SENSOR
Publication number
20170016763
Publication date
Jan 19, 2017
SICK AG
Ingolf HORSCH
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM FOR PERFORMING TESTING OF PHOTONIC DEVICES
Publication number
20160161333
Publication date
Jun 9, 2016
Skorpios Technologies, Inc.
Robert J. Stone
G01 - MEASURING TESTING
Information
Patent Application
LIGHT SENSING SYSTEM, AND METHOD FOR CALIBRATING A LIGHT SENSING DE...
Publication number
20150338271
Publication date
Nov 26, 2015
Koninklijke Philips N.V.
Xavier Louis Marie Antoine AUBERT
G01 - MEASURING TESTING
Information
Patent Application
WAFER LEVEL TESTING OF OPTICAL DEVICES
Publication number
20140111793
Publication date
Apr 24, 2014
Mehdi Asghari
G02 - OPTICS
Information
Patent Application
METHOD AND SYSTEM FOR PERFORMING TESTING OF PHOTONIC DEVICES
Publication number
20140043050
Publication date
Feb 13, 2014
Robert J. Stone
G01 - MEASURING TESTING
Information
Patent Application
Uniform light generating system for testing an image-sensing device...
Publication number
20090190124
Publication date
Jul 30, 2009
Bily Wang
G02 - OPTICS
Information
Patent Application
Method and apparatus for troubleshooting photosensors
Publication number
20040262549
Publication date
Dec 30, 2004
Pitney Bowes Incorporated
Vishal Chaudhary
G01 - MEASURING TESTING