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the devices having two sensing masses in anti-phase motion
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G01C19/574
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PHYSICS
G01
Measuring instruments
G01C
MEASURING DISTANCES, LEVELS OR BEARINGS SURVEYING NAVIGATION GYROSCOPIC INSTRUMENTS PHOTOGRAMMETRY OR VIDEOGRAMMETRY
G01C19/00
Gyroscopes Turn-sensitive devices using vibrating masses Turn-sensitive devices without moving masses Measuring angular rate using gyroscopic effects
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G01C19/574
the devices having two sensing masses in anti-phase motion
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Patents Grants
last 30 patents
Information
Patent Grant
Three-axis MEMS gyroscope
Patent number
12,287,205
Issue date
Apr 29, 2025
AAC KAITAI TECHNOLOGIES (WUHAN) CO., LTD
Zhao Ma
G01 - MEASURING TESTING
Information
Patent Grant
Double-lever coupling
Patent number
12,287,204
Issue date
Apr 29, 2025
Murata Manufacturing Co., LTD
Ville Kaajakari
G01 - MEASURING TESTING
Information
Patent Grant
Drive and sense balanced, semi-coupled 3-axis gyroscope
Patent number
12,228,404
Issue date
Feb 18, 2025
Invensense, Inc.
Doruk Senkal
G01 - MEASURING TESTING
Information
Patent Grant
Micromachined gyroscope and electronic product
Patent number
12,203,755
Issue date
Jan 21, 2025
AAC KAITAI TECHNOLOGIES (WUHAN) CO., LTD
Zhao Ma
G01 - MEASURING TESTING
Information
Patent Grant
Method for calibrating a vibrating inertial sensor
Patent number
12,196,576
Issue date
Jan 14, 2025
Thales
Nicolas Vercier
G01 - MEASURING TESTING
Information
Patent Grant
Inertial navigation sensor with reduced footprint
Patent number
12,146,742
Issue date
Nov 19, 2024
Commissariat a l'Energie Atomique et Aux Energies Alternatives
Giacomo Langfelder
G01 - MEASURING TESTING
Information
Patent Grant
MEMS gyroscope for three-axis detection
Patent number
12,130,139
Issue date
Oct 29, 2024
AAC KAITAI TECHNOLOGIES (WUHAN) CO., LTD
Zhao Ma
G01 - MEASURING TESTING
Information
Patent Grant
Single body multi-mode mechanical resonator accelerometer
Patent number
12,117,294
Issue date
Oct 15, 2024
United States of America as represented by the Secretary of the Navy
Andrew B. Sabater
G01 - MEASURING TESTING
Information
Patent Grant
Physical quantity sensor, composite sensor, inertial measurement un...
Patent number
12,099,075
Issue date
Sep 24, 2024
Seiko Epson Corporation
Teruo Takizawa
G01 - MEASURING TESTING
Information
Patent Grant
Frequency modulation MEMS triaxial gyroscope
Patent number
12,038,283
Issue date
Jul 16, 2024
STMicroelectronics S.r.l.
Alessandro Tocchio
G01 - MEASURING TESTING
Information
Patent Grant
Vibratory sensor with electronic balancing
Patent number
11,994,390
Issue date
May 28, 2024
Honeywell International Inc.
Markus Hans Gnerlich
G01 - MEASURING TESTING
Information
Patent Grant
Micromechanical rate-of-rotation sensor set-up, rate-of-rotation se...
Patent number
11,953,323
Issue date
Apr 9, 2024
Robert Bosch GmbH
Reinhard Neul
G01 - MEASURING TESTING
Information
Patent Grant
Gyroscope with mass pairs
Patent number
11,846,508
Issue date
Dec 19, 2023
Murata Manufacturing Co., Ltd.
Anssi Blomqvist
G01 - MEASURING TESTING
Information
Patent Grant
Drive and sense balanced, semi-coupled 3-axis gyroscope
Patent number
11,815,354
Issue date
Nov 14, 2023
Invensense, Inc.
Doruk Senkal
G01 - MEASURING TESTING
Information
Patent Grant
MEMS gyroscope with calibration of the scale factor in real time an...
Patent number
11,808,573
Issue date
Nov 7, 2023
STMicroelectronics S.r.l.
Luca Guerinoni
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Micromechanical detection structure of a MEMS multi-axis gyroscope,...
Patent number
11,808,574
Issue date
Nov 7, 2023
STMicroelectronics S.r.l.
Gabriele Gattere
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
3-axis gyroscope with rotational vibration rejection
Patent number
11,774,244
Issue date
Oct 3, 2023
Analog Devices, Inc.
Jeffrey A. Gregory
G01 - MEASURING TESTING
Information
Patent Grant
Gyroscope with peripheral detection
Patent number
11,698,256
Issue date
Jul 11, 2023
Murata Manufacturing Co., Ltd.
Anssi Blomqvist
G01 - MEASURING TESTING
Information
Patent Grant
Physical quantity sensor
Patent number
11,680,797
Issue date
Jun 20, 2023
PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
Takanori Aoyagi
G01 - MEASURING TESTING
Information
Patent Grant
Synchronized four mass gyroscope
Patent number
11,624,613
Issue date
Apr 11, 2023
Murata Manufacturing Co., Ltd.
Ville Kaajakari
G01 - MEASURING TESTING
Information
Patent Grant
Multiaxis gyroscope with supplementary masses
Patent number
11,561,097
Issue date
Jan 24, 2023
Murata Manufacturing Co., Ltd.
Anssi Blomqvist
G01 - MEASURING TESTING
Information
Patent Grant
Physical quantity sensor, inertia measurement device, vehicle posit...
Patent number
11,561,101
Issue date
Jan 24, 2023
Seiko Epson Corporation
Makoto Furuhata
G01 - MEASURING TESTING
Information
Patent Grant
Necrosis inhibitors
Patent number
11,478,438
Issue date
Oct 25, 2022
National Institute of Biological Sciences, Beijing
Zhiyuan Zhang
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Rotation-rate sensor, method for producing a rotation-rate sensor
Patent number
11,466,985
Issue date
Oct 11, 2022
Robert Bosch GmbH
Jan-Timo Liewald
G01 - MEASURING TESTING
Information
Patent Grant
Angular rate sensor based on frequency modulation and drive strateg...
Patent number
11,460,301
Issue date
Oct 4, 2022
NXP USA, INC.
Aaron A. Geisberger
G01 - MEASURING TESTING
Information
Patent Grant
Inertial sensor, method for manufacturing inertial sensor, inertial...
Patent number
11,448,506
Issue date
Sep 20, 2022
Seiko Epson Corporation
Koichiro Komizo
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Frequency modulation MEMS triaxial gyroscope
Patent number
11,448,507
Issue date
Sep 20, 2022
STMicroelectronics S.r.l.
Alessandro Tocchio
G01 - MEASURING TESTING
Information
Patent Grant
Yaw-rate sensor with a substrate having a main extension plane, met...
Patent number
11,421,991
Issue date
Aug 23, 2022
Robert Bosch GmbH
Andreas Lassl
G01 - MEASURING TESTING
Information
Patent Grant
Out-of-plane sensing gyroscope robust to external acceleration and...
Patent number
11,415,418
Issue date
Aug 16, 2022
Invensense, Inc.
Jaakko Ruohio
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for bias suppression in a non-degenerate MEMS s...
Patent number
11,390,517
Issue date
Jul 19, 2022
Honeywell International Inc.
Daniel Endean
B81 - MICRO-STRUCTURAL TECHNOLOGY
Patents Applications
last 30 patents
Information
Patent Application
DRIVE AND SENSE BALANCED, SEMI-COUPLED 3-AXIS GYROSCOPE
Publication number
20250164247
Publication date
May 22, 2025
InvenSense, Inc.
Doruk Senkal
G01 - MEASURING TESTING
Information
Patent Application
FULLY DECOUPLED THREE-AXIS MEMS GYROSCOPE
Publication number
20250137785
Publication date
May 1, 2025
AAC Kaitai Technologies (Wuhan) CO., LTD
Zhao Ma
G01 - MEASURING TESTING
Information
Patent Application
COMMON MODE REJECTION STRUCTURES FOR MEMS DEVICES
Publication number
20250002331
Publication date
Jan 2, 2025
NXP USA, Inc.
Mostafa Soliman
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
PHYSICAL QUANTITY SENSOR, COMPOSITE SENSOR, INERTIAL MEASUREMENT UN...
Publication number
20240402214
Publication date
Dec 5, 2024
SEIKO EPSON CORPORATION
Teruo TAKIZAWA
G01 - MEASURING TESTING
Information
Patent Application
MICRO-MECHANICAL GYROSCOPE AND ELECTRONIC PRODUCT
Publication number
20240271934
Publication date
Aug 15, 2024
AAC Kaitai Technologies (Wuhan) CO., LTD
Zhao Ma
G01 - MEASURING TESTING
Information
Patent Application
MEMS GYROSCOPE AND ELECTRONIC PRODUCT TECHNICAL FIELD
Publication number
20240271932
Publication date
Aug 15, 2024
AAC Kaitai Technologies (Wuhan) CO., LTD
Shan Yang
G01 - MEASURING TESTING
Information
Patent Application
Angular Velocity Sensor
Publication number
20240219179
Publication date
Jul 4, 2024
SEIKO EPSON CORPORATION
Norifumi SHIMIZU
G01 - MEASURING TESTING
Information
Patent Application
INERTIAL SENSOR ARCHITECTURE WITH BALANCED SENSE MODE AND IMPROVED...
Publication number
20240191994
Publication date
Jun 13, 2024
Commissariat A L'Energie Atomique et Aux Energies Alternatives
Andrea BUFFOLI
G01 - MEASURING TESTING
Information
Patent Application
MICRO-ELECTRO-MECHANICAL DEVICE
Publication number
20240118082
Publication date
Apr 11, 2024
Commissariat A L'Energie Atomique et Aux Energies Alternatives
Loïc JOET
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR CORRECTING THE MEASUREMENT FROM A VIBRATING ANGULAR INER...
Publication number
20240110790
Publication date
Apr 4, 2024
THALES
Nicolas Vercier
G01 - MEASURING TESTING
Information
Patent Application
Sinlge Body Multi-mode Mechanical Resonator Accelerometer
Publication number
20240102805
Publication date
Mar 28, 2024
The United States of America as represented by the Secretary of the Navy
Andrew B. Sabater
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR CALIBRATING THE DIFFERENCE IN STIFFNESS AND/OR QUADRATUR...
Publication number
20230366701
Publication date
Nov 16, 2023
THALES
Nicolas VERCIER
G01 - MEASURING TESTING
Information
Patent Application
DRIVE AND SENSE BALANCED, SEMI-COUPLED 3-AXIS GYROSCOPE
Publication number
20230324176
Publication date
Oct 12, 2023
InvenSense, Inc.
Doruk Senkal
G01 - MEASURING TESTING
Information
Patent Application
THREE-AXIS MEMS GYROSCOPE
Publication number
20230314139
Publication date
Oct 5, 2023
AAC Kaitai Technologies (Wuhan) CO., LTD
Zhao Ma
G01 - MEASURING TESTING
Information
Patent Application
MICROMACHINED GYROSCOPE AND ELECTRONIC PRODUCT
Publication number
20230280162
Publication date
Sep 7, 2023
AAC Kaitai Technologies (Wuhan) CO., LTD
Zhao Ma
G01 - MEASURING TESTING
Information
Patent Application
MEMS GYROSCOPE FOR THREE-AXIS DETECTION
Publication number
20230266125
Publication date
Aug 24, 2023
AAC Kaitai Technologies (Wuhan) CO., LTD
Zhao Ma
G01 - MEASURING TESTING
Information
Patent Application
VIBRATORY SENSOR WITH ELECTRONIC BALANCING
Publication number
20230251091
Publication date
Aug 10, 2023
Honeywell International Inc.
Markus Hans Gnerlich
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR CALIBRATING A VIBRATING INERTIAL SENSOR
Publication number
20230251107
Publication date
Aug 10, 2023
THALES
Nicolas VERCIER
G01 - MEASURING TESTING
Information
Patent Application
COUPLING DEVICE FOR COUPLING VIBRATION SYSTEMS
Publication number
20230184552
Publication date
Jun 15, 2023
NORTHROP GRUMMAN LITEF GMBH
Jan Daniel Rende
G01 - MEASURING TESTING
Information
Patent Application
DOUBLE-LEVER COUPLING
Publication number
20230152098
Publication date
May 18, 2023
Murata Manufacturing Co., Ltd.
Ville KAAJAKARI
G01 - MEASURING TESTING
Information
Patent Application
MICROMECHANICAL RATE-OF-ROTATION SENSOR SET-UP, RATE-OF-ROTATION SE...
Publication number
20230038004
Publication date
Feb 9, 2023
ROBERT BOSCH GmbH
Reinhard Neul
G01 - MEASURING TESTING
Information
Patent Application
FREQUENCY MODULATION MEMS TRIAXIAL GYROSCOPE
Publication number
20220404150
Publication date
Dec 22, 2022
STMicroelectronics S.r.l.
Alessandro TOCCHIO
G01 - MEASURING TESTING
Information
Patent Application
ANGULAR RATE SENSOR BASED ON FREQUENCY MODULATION AND DRIVE STRATEG...
Publication number
20220282972
Publication date
Sep 8, 2022
NXP USA, Inc.
Aaron A. Geisberger
G01 - MEASURING TESTING
Information
Patent Application
MEMS GYROSCOPE WITH CALIBRATION OF THE SCALE FACTOR IN REAL TIME AN...
Publication number
20220252397
Publication date
Aug 11, 2022
STMicroelectronics S.r.l.
Luca GUERINONI
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
MICROMECHANICAL DETECTION STRUCTURE OF A MEMS MULTI-AXIS GYROSCOPE,...
Publication number
20220205784
Publication date
Jun 30, 2022
STMicroelectronics S.r.l.
Gabriele Gattere
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
SYNCHRONIZED FOUR MASS GYROSCOPE
Publication number
20220178693
Publication date
Jun 9, 2022
Murata Manufacturing Co., Ltd.
Ville KAAJAKARI
G01 - MEASURING TESTING
Information
Patent Application
3-AXIS GYROSCOPE WITH ROTATIONAL VIBRATION REJECTION
Publication number
20220057210
Publication date
Feb 24, 2022
Analog Devices, Inc.
Jeffrey A. Gregory
G01 - MEASURING TESTING
Information
Patent Application
3-AXIS GYROSCOPE WITH ROTATIONAL VIBRATION REJECTION
Publication number
20210381834
Publication date
Dec 9, 2021
Analog Devices, Inc.
Jeffrey A. Gregory
G01 - MEASURING TESTING
Information
Patent Application
MULTIAXIS GYROSCOPE WITH SUPPLEMENTARY MASSES
Publication number
20210364293
Publication date
Nov 25, 2021
Murata Manufacturing Co., Ltd.
Anssi BLOMQVIST
G01 - MEASURING TESTING
Information
Patent Application
Inertial Sensor, Method For Manufacturing Inertial Sensor, Inertial...
Publication number
20210164781
Publication date
Jun 3, 2021
SEIKO EPSON CORPORATION
Koichiro KOMIZO
B81 - MICRO-STRUCTURAL TECHNOLOGY