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the devices involving a micro-mechanical structure
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G01C19/5621
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PHYSICS
G01
Measuring instruments
G01C
MEASURING DISTANCES, LEVELS OR BEARINGS SURVEYING NAVIGATION GYROSCOPIC INSTRUMENTS PHOTOGRAMMETRY OR VIDEOGRAMMETRY
G01C19/00
Gyroscopes Turn-sensitive devices using vibrating masses Turn-sensitive devices without moving masses Measuring angular rate using gyroscopic effects
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G01C19/5621
the devices involving a micro-mechanical structure
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Patents Grants
last 30 patents
Information
Patent Grant
Silicon MEMS gyroscopes with upper and lower sense plates
Patent number
12,092,460
Issue date
Sep 17, 2024
The Charles Stark Draper Laboratory, Inc.
Eugene H. Cook
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Vibrator device, oscillator, gyro sensor, electronic apparatus, and...
Patent number
12,034,433
Issue date
Jul 9, 2024
Seiko Epson Corporation
Tetsuya Otsuki
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Vibration element, physical quantity sensor, inertial measurement u...
Patent number
11,888,464
Issue date
Jan 30, 2024
Seiko Epson Corporation
Seiichiro Ogura
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Sensor element, angular velocity sensor, and multi-axis angular vel...
Patent number
11,835,338
Issue date
Dec 5, 2023
Kyocera Corporation
Munetaka Soejima
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Vibration element, manufacturing method of vibration element, physi...
Patent number
11,595,026
Issue date
Feb 28, 2023
Seiko Epson Corporation
Seiichiro Ogura
G01 - MEASURING TESTING
Information
Patent Grant
Physical quantity detection device, manufacturing method for physic...
Patent number
11,555,702
Issue date
Jan 17, 2023
Seiko Epson Corporation
Ryuta Nishizawa
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Piezoelectric thin film, piezoelectric thin film device, piezoelect...
Patent number
11,532,781
Issue date
Dec 20, 2022
TDK Corporation
Junpei Morishita
G11 - INFORMATION STORAGE
Information
Patent Grant
Methods for fabricating silicon MEMS gyroscopes with upper and lowe...
Patent number
11,530,917
Issue date
Dec 20, 2022
The Charles Stark Draper Laboratory, Inc.
Eugene H. Cook
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Vibrator device, oscillator, gyro sensor, electronic apparatus, and...
Patent number
11,509,288
Issue date
Nov 22, 2022
Seiko Epson Corporation
Tetsuya Otsuki
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Sensor element and angular velocity sensor
Patent number
11,448,505
Issue date
Sep 20, 2022
Kyocera Corporation
Munetaka Soejima
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Vibration element, method of manufacturing vibration element, physi...
Patent number
11,402,208
Issue date
Aug 2, 2022
Seiko Epson Corporation
Shogo Sasaki
G01 - MEASURING TESTING
Information
Patent Grant
Vibrator device, electronic apparatus, and vehicle
Patent number
11,340,070
Issue date
May 24, 2022
Seiko Epson Corporation
Ryuta Nishizawa
G01 - MEASURING TESTING
Information
Patent Grant
Vibratory error compensation in a tuning fork gyroscope such as a C...
Patent number
11,333,499
Issue date
May 17, 2022
Honeywell International Inc.
Daniel Endean
G01 - MEASURING TESTING
Information
Patent Grant
Vibrator device, circuit device, method of manufacturing vibrator d...
Patent number
11,326,881
Issue date
May 10, 2022
Seiko Epson Corporation
Hiroshi Kiya
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Accelerometer system enclosing gas
Patent number
11,079,227
Issue date
Aug 3, 2021
Honeywell International Inc.
Chad Fertig
G01 - MEASURING TESTING
Information
Patent Grant
Angular velocity sensor, sensor element, and multi-axis angular vel...
Patent number
11,054,259
Issue date
Jul 6, 2021
Kyocera Corporation
Munetaka Soejima
G01 - MEASURING TESTING
Information
Patent Grant
Vibration element, manufacturing method of vibration element, physi...
Patent number
11,025,222
Issue date
Jun 1, 2021
Seiko Epson Corporation
Seiichiro Ogura
G01 - MEASURING TESTING
Information
Patent Grant
Detection device for detecting dynamic quantity exerted on mechanic...
Patent number
10,928,198
Issue date
Feb 23, 2021
Kabushiki Kaisha Toshiba
Yohei Hatakeyama
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
MEMS metal-quartz gyroscope
Patent number
10,900,783
Issue date
Jan 26, 2021
Lawrence Livermore National Security, LLC
Sangtae Park
G01 - MEASURING TESTING
Information
Patent Grant
Silicon-based micro-machined vibratory gyroscope with an I-shaped s...
Patent number
10,876,838
Issue date
Dec 29, 2020
NANJING UNIVERSITY OF SCIENCE AND TECHNOLOGY
Qin Shi
G01 - MEASURING TESTING
Information
Patent Grant
Positioning apparatus comprising an inertial sensor and inertial se...
Patent number
10,877,059
Issue date
Dec 29, 2020
STMicroelectronics S.r.l.
Nicola Matteo Palella
G01 - MEASURING TESTING
Information
Patent Grant
Sensor element, physical quantity sensor, electronic apparatus, and...
Patent number
10,866,097
Issue date
Dec 15, 2020
Seiko Epson Corporation
Keiichi Yamaguchi
G01 - MEASURING TESTING
Information
Patent Grant
Physical quantity detecting device, electronic apparatus, and movin...
Patent number
10,794,778
Issue date
Oct 6, 2020
Seiko Epson Corporation
Ryuta Nishizawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Vibration device, electronic apparatus, and vehicle
Patent number
10,784,835
Issue date
Sep 22, 2020
Seiko Epson Corporation
Ryuta Nishizawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Vibration device, angular velocity sensor, electronic device, and v...
Patent number
10,760,908
Issue date
Sep 1, 2020
Seiko Epson Corporation
Ryuta Nishizawa
B60 - VEHICLES IN GENERAL
Information
Patent Grant
Silicon carbide microelectromechanical structure, device, and method
Patent number
10,717,642
Issue date
Jul 21, 2020
The Government of the United States of America, as represented by the Secreta...
Francis J. Kub
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Sensor element, sensor, electronic apparatus, and vehicle
Patent number
10,690,500
Issue date
Jun 23, 2020
Seiko Epson Corporation
Ryuta Nishizawa
B60 - VEHICLES IN GENERAL
Information
Patent Grant
Vibrator device, oscillator, gyro sensor, electronic apparatus, and...
Patent number
10,651,819
Issue date
May 12, 2020
Seiko Epson Corporation
Tetsuya Otsuki
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Silicon carbide microelectromechanical structure, device, and method
Patent number
10,589,983
Issue date
Mar 17, 2020
The Government of the United States of America, as represented by the Secreta...
Francis J. Kub
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Vibration device
Patent number
10,541,671
Issue date
Jan 21, 2020
Kabushiki Kaisha Toshiba
Tamio Ikehashi
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Vibration Element, Manufacturing Method of Vibration Element, Physi...
Publication number
20230387885
Publication date
Nov 30, 2023
SEIKO EPSON CORPORATION
Seiichiro OGURA
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
PRECISION GYROSCOPE MODE-MATCHING INSENSITIVE TO RATE INPUT
Publication number
20230304799
Publication date
Sep 28, 2023
The Regents of the University of California
Bernhard E. Boser
G01 - MEASURING TESTING
Information
Patent Application
Vibration Element, Physical Quantity Sensor, Inertial Measurement U...
Publication number
20230109944
Publication date
Apr 13, 2023
SEIKO EPSON CORPORATION
Seiichiro OGURA
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
METHODS FOR FABRICATING SILICON MEMS GYROSCOPES WITH UPPER AND LOWE...
Publication number
20230076161
Publication date
Mar 9, 2023
The Charles Stark Draper Laboratory, Inc.
Eugene H. Cook
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
Vibrator Device, Oscillator, Gyro Sensor, Electronic Apparatus, And...
Publication number
20230040197
Publication date
Feb 9, 2023
SEIKO EPSON CORPORATION
Tetsuya OTSUKI
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
Vibrator Device, Electronic Apparatus, And Vehicle
Publication number
20220236058
Publication date
Jul 28, 2022
SEIKO EPSON CORPORATION
Ryuta Nishizawa
G01 - MEASURING TESTING
Information
Patent Application
SENSOR ELEMENT AND ANGULAR VELOCITY SENSOR
Publication number
20220042800
Publication date
Feb 10, 2022
KYOCERA Corporation
Munetaka SOEJIMA
G01 - MEASURING TESTING
Information
Patent Application
Vibration Element, Manufacturing Method Of Vibration Element, Physi...
Publication number
20210313959
Publication date
Oct 7, 2021
SEIKO EPSON CORPORATION
Seiichiro OGURA
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
VIBRATOR DEVICE, ELECTRONIC APPARATUS, AND VEHICLE
Publication number
20210033398
Publication date
Feb 4, 2021
SEIKO EPSON CORPORATION
Ryuta Nishizawa
G01 - MEASURING TESTING
Information
Patent Application
ACCELEROMETER SYSTEM ENCLOSING GAS
Publication number
20200309524
Publication date
Oct 1, 2020
HONEYWELL INTERNATIONAL INC.
Chad Fertig
G01 - MEASURING TESTING
Information
Patent Application
POSITIONING APPARATUS COMPRISING AN INERTIAL SENSOR AND INERTIAL SE...
Publication number
20200292570
Publication date
Sep 17, 2020
STMicroelectronics S.r.l.
Nicola Matteo Palella
G01 - MEASURING TESTING
Information
Patent Application
IN-PLANE NON-DEGENERATE CORIOLIS VIBRATORY GYROSCOPE
Publication number
20200292313
Publication date
Sep 17, 2020
HONEYWELL INTERNATIONAL INC.
Daniel Endean
G01 - MEASURING TESTING
Information
Patent Application
Vibrator Device, Oscillator, Gyro Sensor, Electronic Apparatus, And...
Publication number
20200235717
Publication date
Jul 23, 2020
SEIKO EPSON CORPORATION
Tetsuya OTSUKI
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
PIEZOELECTRIC THIN FILM, PIEZOELECTRIC THIN FILM DEVICE, PIEZOELECT...
Publication number
20200227621
Publication date
Jul 16, 2020
TDK Corporation
Junpei MORISHITA
C04 - CEMENTS CONCRETE ARTIFICIAL STONE CERAMICS REFRACTORIES
Information
Patent Application
SENSOR ELEMENT AND ANGULAR VELOCITY SENSOR
Publication number
20200208972
Publication date
Jul 2, 2020
KYOCERA CORPORATION
Munetaka SOEJIMA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
PHYSICAL QUANTITY DETECTION DEVICE, MANUFACTURING METHOD FOR PHYSIC...
Publication number
20200149889
Publication date
May 14, 2020
SEIKO EPSON CORPORATION
Ryuta NISHIZAWA
G01 - MEASURING TESTING
Information
Patent Application
Silicon Carbide Microelectromechanical Structure, Device, and Method
Publication number
20200115219
Publication date
Apr 16, 2020
The Government of the United States of America, as represented by the Secreta...
Francis J. Kub
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
METHODS FOR FABRICATING SILICON MEMS GYROSCOPES WITH UPPER AND LOWE...
Publication number
20200096336
Publication date
Mar 26, 2020
The Charles Stark Draper Laboratory, Inc.
Eugene H. Cook
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
VIBRATORY ERROR COMPENSATION IN A TUNING FORK GYROSCOPE SUCH AS A C...
Publication number
20200088518
Publication date
Mar 19, 2020
HONEYWELL INTERNATIONAL INC.
Daniel Endean
G01 - MEASURING TESTING
Information
Patent Application
MEMS METAL-QUARTZ GYROSCOPE
Publication number
20190383611
Publication date
Dec 19, 2019
LAWRENCE LIVERMORE NATIONAL SECURITY, LLC
Sangtae PARK
G01 - MEASURING TESTING
Information
Patent Application
SENSOR ELEMENT, ANGULAR VELOCITY SENSOR, AND MULTI-AXIS ANGULAR VE...
Publication number
20190376789
Publication date
Dec 12, 2019
KYOCERA CORPORATION
Munetaka SOEJIMA
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
PHYSICAL QUANTITY SENSOR
Publication number
20190301866
Publication date
Oct 3, 2019
DENSO CORPORATION
Takeru KANAZAWA
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
ANGULAR VELOCITY SENSOR, SENSOR ELEMENT, AND MULTI-AXIS ANGULAR VEL...
Publication number
20190265033
Publication date
Aug 29, 2019
KYOCERA CORPORATION
Munetaka SOEJIMA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
VIBRATOR DEVICE, CIRCUIT DEVICE, METHOD OF MANUFACTURING VIBRATOR D...
Publication number
20190212145
Publication date
Jul 11, 2019
SEIKO EPSON CORPORATION
Hiroshi KIYA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
VIBRATION DEVICE, ELECTRONIC APPARATUS, AND VEHICLE
Publication number
20190165759
Publication date
May 30, 2019
SEIKO EPSON CORPORATION
Ryuta NISHIZAWA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ANGULAR RATE SENSOR WITH IN-PHASE MOTION SUPPRESSION STRUCTURE
Publication number
20190017823
Publication date
Jan 17, 2019
NXP USA, INC.
Peng Shao
G01 - MEASURING TESTING
Information
Patent Application
A SILICON-BASED MICRO-MACHINED VIBRATORY GYROSCOPE WITH AN I-SHAPED...
Publication number
20190017822
Publication date
Jan 17, 2019
NANJING UNIVERSITY OF SCIENCE AND TECHNOLOGY
Qin SHI
G01 - MEASURING TESTING
Information
Patent Application
MEMS DEVICE
Publication number
20190011259
Publication date
Jan 10, 2019
RICHTEK TECHNOLOGY CORPORATION
Chiung-Wen Lin
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
Circuit Apparatus, Physical Quantity Measuring Apparatus, Electroni...
Publication number
20180348277
Publication date
Dec 6, 2018
SEIKO EPSON CORPORATION
Hideo HANEDA
B60 - VEHICLES IN GENERAL
Information
Patent Application
COMPOSITE SENSOR
Publication number
20180245919
Publication date
Aug 30, 2018
Denso Corporation
Naoki YOSHIDA
B81 - MICRO-STRUCTURAL TECHNOLOGY