the element being a crystal

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G21K2201/062

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GPHYSICS G21Nuclear engineering G21KTECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR IRRADIATION DEVICES GAMMA RAY OR X-RAY MICROSCOPES G21K2201/00Arrangements for handling radiation or particles

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G21K2201/062the element being a crystal

Industries

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Patents Grantslast 30 patents

Information Patent Grant
System and method for bending crystal wafers for use in high resolu...
- Patent number 12,062,465
- Issue date Aug 13, 2024
- UChicago Argonne, LLC
- Ayman H. Said
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Neutral atom quantum information processor
- Patent number 12,051,520
- Issue date Jul 30, 2024
- President and Fellows of Harvard College
- Alexander Keesling Contreras
- B82 - NANO-TECHNOLOGY
Information Patent Grant
X-ray optical arrangement
- Patent number 11,972,875
- Issue date Apr 30, 2024
- Shirly Borukhin
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
X-ray fluorescence analyzer and a method for performing an x-ray fl...
- Patent number 11,815,480
- Issue date Nov 14, 2023
- Outotec (Finland) Oy
- Tommi Koskinen
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Interferometer for x-ray phase contrast imaging
- Patent number 11,813,102
- Issue date Nov 14, 2023
- Houxun Miao
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray spectrometer and methods for use
- Patent number 11,796,490
- Issue date Oct 24, 2023
- University of Washington
- Gerald Todd Seidler
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Neutral atom quantum information processor
- Patent number 11,710,579
- Issue date Jul 25, 2023
- President and Fellows of Harvard College
- Alexander Keesling Contreras
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Neutral atom quantum information processor
- Patent number 11,380,455
- Issue date Jul 5, 2022
- President and Fellows of Harvard College
- Alexander Keesling Contreras
- B82 - NANO-TECHNOLOGY
Information Patent Grant
X-ray fluorescence analyzer, and a method for performing X-ray fluo...
- Patent number 11,360,036
- Issue date Jun 14, 2022
- Outotec (Finland) Oy
- Tommi Koskinen
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Constructions of x-ray lenses for converging x-rays
- Patent number 11,250,968
- Issue date Feb 15, 2022
- CONVERGENT R.N.R LTD
- Aharon Bar-David
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray apparatus including x-ray reflector and method for operating...
- Patent number 11,229,411
- Issue date Jan 25, 2022
- Siemens Healthcare GmbH
- Michael Wiets
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
X-ray fluorescence analyzer with a plurality of measurement channel...
- Patent number 11,199,513
- Issue date Dec 14, 2021
- Outotec (Finland) Oy
- Tommi Koskinen
- G01 - MEASURING TESTING
Information Patent Grant
X-ray spectrometer and methods for use
- Patent number 11,054,375
- Issue date Jul 6, 2021
- University of Washington
- Gerald Todd Seidler
- G02 - OPTICS
Information Patent Grant
Hard X-ray photoelectron spectroscopy system
- Patent number 11,002,693
- Issue date May 11, 2021
- SCIENTA OMICRON AB
- Tomas Wiell
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Methods for aligning a spectrometer
- Patent number 10,962,490
- Issue date Mar 30, 2021
- University of Washington
- Devon R. Mortensen
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
System and method for x-ray fluorescence with filtering
- Patent number 10,962,491
- Issue date Mar 30, 2021
- Sigray, Inc.
- Wenbing Yun
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray detection apparatus and x-ray detection method
- Patent number 10,859,520
- Issue date Dec 8, 2020
- Horiba, Ltd.
- Tetsuya Takimoto
- G01 - MEASURING TESTING
Information Patent Grant
3-dimensional x-ray imager
- Patent number 10,741,297
- Issue date Aug 11, 2020
- Lawrence Livermore National Security, LLC
- Bernard J. Kozioziemski
- G01 - MEASURING TESTING
Information Patent Grant
X-ray optics assembly with switching system for three beam paths, a...
- Patent number 10,429,326
- Issue date Oct 1, 2019
- Frank Hans Hoffman
- G01 - MEASURING TESTING
Information Patent Grant
X-ray source
- Patent number 10,186,341
- Issue date Jan 22, 2019
- Torr Scientific Ltd.
- David Alan Bates
- G01 - MEASURING TESTING
Information Patent Grant
Methods for manufacturing doubly bent X-ray focusing device, doubly...
- Patent number 10,175,185
- Issue date Jan 8, 2019
- Rigaku Corporation
- Naoki Kawahara
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for imaging bulk motional velocities in plasmas
- Patent number 10,018,577
- Issue date Jul 10, 2018
- Mission Support and Tests Services, LLC
- Jeffrey A. Koch
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Highly reflective crystalline mosaic neutron monochromator
- Patent number 10,020,087
- Issue date Jul 10, 2018
- Michael Kozhukh
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray analyzing system for x-ray scattering analysis
- Patent number 9,958,404
- Issue date May 1, 2018
- Bruker AXS GmbH
- Jan Skov Pedersen
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Method and apparatus for measuring scattering intensity distribution
- Patent number 9,714,907
- Issue date Jul 25, 2017
- Inter-University Research Institute Corporation High Energy Accelerator Resea...
- Tadashi Matsushita
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Mobile transport and shielding apparatus for removable x-ray analyzer
- Patent number 9,633,753
- Issue date Apr 25, 2017
- X-Ray Optical Systems, Inc.
- Steven M. Pomerantz
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
High performance Kratky assembly
- Patent number 9,575,017
- Issue date Feb 21, 2017
- Rigaku Innovative Technologies, Inc.
- Licai Jiang
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
High brightness X-ray absorption spectroscopy system
- Patent number 9,448,190
- Issue date Sep 20, 2016
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Grant
X-ray analyzer having multiple excitation energy bands produced usi...
- Patent number 9,449,780
- Issue date Sep 20, 2016
- X-Ray Optical Systems, Inc.
- Zewu Chen
- G01 - MEASURING TESTING
Information Patent Grant
Diffraction leveraged modulation of X-ray pulses using MEMS-based X...
- Patent number 9,412,480
- Issue date Aug 9, 2016
- UChicago Argonne, LLC
- Daniel Lopez
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD FOR BENDING CRYSTAL WAFERS FOR USE IN HIGH RESOLU...
- Publication number 20240062928
- Publication date Feb 22, 2024
- UChicago Argonne, LLC
- Ayman H. Said
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
NEUTRAL ATOM QUANTUM INFORMATION PROCESSOR
- Publication number 20230326623
- Publication date Oct 12, 2023
- President and Fellows of Harvard College
- Alexander Keesling Contreras
- B82 - NANO-TECHNOLOGY
Information Patent Application
X-RAY APPARATUS
- Publication number 20220386975
- Publication date Dec 8, 2022
- IPG Photonics Corporation
- Alexandre EFIMOV
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
X-RAY OPTICAL ARRANGEMENT
- Publication number 20220351874
- Publication date Nov 3, 2022
- CONVERGENT R.N.R. LTD
- Shirly BORUKHIN
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
X-RAY FLUORESCENCE ANALYZER WITH A PLURALITY OF MEASUREMENT CHANNEL...
- Publication number 20210255122
- Publication date Aug 19, 2021
- OUTOTEC (FINLAND) OY
- Tommi Koskinen
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
X-RAY FLUORESCENCE ANALYZER, AND A METHOD FOR PERFORMING X-RAY FLUO...
- Publication number 20210255123
- Publication date Aug 19, 2021
- OUTOTEC (FINLAND) OY
- Tommi Koskinen
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
X-RAY FLUORESCENCE ANALYZER, AND A METHOD FOR PERFORMING X-RAY FLUO...
- Publication number 20210255121
- Publication date Aug 19, 2021
- OUTOTEC (FINLAND) OY
- Tommi Koskinen
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
HARD X-RAY PHOTOELECTRON SPECTROSCOPY SYSTEM
- Publication number 20210010960
- Publication date Jan 14, 2021
- SCIENTA OMICRON AB
- Tomas WIELL
- G01 - MEASURING TESTING
Information Patent Application
CONSTRUCTIONS OF X-RAY LENSES FOR CONVERGING X-RAYS
- Publication number 20200350090
- Publication date Nov 5, 2020
- CONVERGENT R.N.R. LTD
- Aharon Bar-David
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
SYSTEM AND METHOD FOR X-RAY FLUORESCENCE WITH FILTERING
- Publication number 20200072770
- Publication date Mar 5, 2020
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Application
X-RAY APPARATUS AND METHOD FOR OPERATING THE X-RAY APPARATUS
- Publication number 20200043626
- Publication date Feb 6, 2020
- Siemens Healthcare GmbH
- Michael WIETS
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
3-DIMENSIONAL X-RAY IMAGER
- Publication number 20190148029
- Publication date May 16, 2019
- LAWRENCE LIVERMORE NATIONAL SECURITY, LLC
- Bernard J. Kozioziemski
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
X-RAY SOURCE
- Publication number 20160111177
- Publication date Apr 21, 2016
- TORR SCIENTIFIC LTD.
- David Alan Bates
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR MEASURING SCATTERING INTENSITY DISTRIBUTION
- Publication number 20160069825
- Publication date Mar 10, 2016
- INTER-UNIVERSITY RESEARCH INSTITUTE CORPORATION HIGH ENERGY ACCELERATOR RESEA...
- Tadashi Matsushita
- G01 - MEASURING TESTING
Information Patent Application
XRF SYSTEM HAVING MULTIPLE EXCITATION ENERGY BANDS IN HIGHLY ALIGNE...
- Publication number 20150262722
- Publication date Sep 17, 2015
- X-Ray Optical Systems, Inc.
- Zewu CHEN
- G01 - MEASURING TESTING
Information Patent Application
HIGH PERFORMANCE KRATKY ASSEMBLY
- Publication number 20150241366
- Publication date Aug 27, 2015
- Rigaku Innovative Technologies, Inc.
- Licai Jiang
- G01 - MEASURING TESTING
Information Patent Application
X-RAY ANALYZER HAVING MULTIPLE EXCITATION ENERGY BANDS PRODUCED USI...
- Publication number 20150043713
- Publication date Feb 12, 2015
- X-Ray Optical Systems, Inc.
- Zewu Chen
- G01 - MEASURING TESTING
Information Patent Application
DIFFRACTION LEVERAGED MODULATION OF X-RAY PULSES USING MEMS-BASED X...
- Publication number 20140334607
- Publication date Nov 13, 2014
- UChicago Argonne, LLC
- Daniel Lopez
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
MOBILE TRANSPORT AND SHIELDING APPARATUS FOR REMOVABLE X-RAY ANALYZER
- Publication number 20140328468
- Publication date Nov 6, 2014
- Steven M. Pomerantz
- G01 - MEASURING TESTING
Information Patent Application
X-ray analyzing system for x-ray scattering analysis
- Publication number 20140270079
- Publication date Sep 18, 2014
- Jan Skov Pedersen
- G01 - MEASURING TESTING
Information Patent Application
XRF SYSTEM HAVING MULTIPLE EXCITATION ENERGY BANDS IN HIGHLY ALIGNE...
- Publication number 20140105363
- Publication date Apr 17, 2014
- X-Ray Optical Systems, Inc.
- Zewu CHEN
- G01 - MEASURING TESTING
Information Patent Application
X-RAY CONTROL UNIT USING MONOCRYSTALLINE MATERIAL
- Publication number 20130195254
- Publication date Aug 1, 2013
- ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE
- Sungyoul CHOI
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
Silicon focusing mirror system
- Publication number 20130114157
- Publication date May 9, 2013
- Alex K. Deyhim
- G02 - OPTICS
Information Patent Application
METHOD FOR CHARACTERIZATION OF A SPHERICALLY BENT CRYSTAL FOR K-alp...
- Publication number 20130108022
- Publication date May 2, 2013
- LAWRENCE LIVERMORE NATIONAL SECURITY, LLC
- Nathan Kugland
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR CHARACTERIZING A FILM BY X-RAY PHOTOELECTRON...
- Publication number 20130077742
- Publication date Mar 28, 2013
- Bruno W. Schueler
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL DEVICE FOR ANALYZING A SPECIMEN BY THE SCATTERING OF AN X-R...
- Publication number 20130064354
- Publication date Mar 14, 2013
- Commissariat A L'Energie Atomique et Aux Energies Alternatives
- Olivier Tache
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
Confocal Double Crystal Monochromator
- Publication number 20120281813
- Publication date Nov 8, 2012
- The Trustees Of Columbia University In The City New York
- Joseph P. Lidestri
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
DIFFRACTOMETER
- Publication number 20120128128
- Publication date May 24, 2012
- PANALYTICAL B.V.
- Paul Fewster
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
Two-Axis Sagittal Focusing Monochromator
- Publication number 20120063569
- Publication date Mar 15, 2012
- Brookhaven Science Associates. LLC
- Edwin G. Haas
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
SYSTEMS AND METHODS FOR DETECTING AN IMAGE OF AN OBJECT USING MULTI...
- Publication number 20120039438
- Publication date Feb 16, 2012
- THE UNIVERSITY OF NORTH CAROLOINA AT CHAPEL HILL
- Christopher Parham
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE

the element being a crystal

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

System and method for bending crystal wafers for use in high resolu...

Neutral atom quantum information processor

X-ray optical arrangement

X-ray fluorescence analyzer and a method for performing an x-ray fl...

Interferometer for x-ray phase contrast imaging

X-ray spectrometer and methods for use

Neutral atom quantum information processor

Neutral atom quantum information processor

X-ray fluorescence analyzer, and a method for performing X-ray fluo...

Constructions of x-ray lenses for converging x-rays

X-ray apparatus including x-ray reflector and method for operating...

X-ray fluorescence analyzer with a plurality of measurement channel...

X-ray spectrometer and methods for use

Hard X-ray photoelectron spectroscopy system

Methods for aligning a spectrometer

System and method for x-ray fluorescence with filtering

X-ray detection apparatus and x-ray detection method

3-dimensional x-ray imager

X-ray optics assembly with switching system for three beam paths, a...

X-ray source

Methods for manufacturing doubly bent X-ray focusing device, doubly...

Methods and systems for imaging bulk motional velocities in plasmas

Highly reflective crystalline mosaic neutron monochromator

X-ray analyzing system for x-ray scattering analysis

Method and apparatus for measuring scattering intensity distribution

Mobile transport and shielding apparatus for removable x-ray analyzer

High performance Kratky assembly

High brightness X-ray absorption spectroscopy system

X-ray analyzer having multiple excitation energy bands produced usi...

Diffraction leveraged modulation of X-ray pulses using MEMS-based X...

Patents Applicationslast 30 patents

SYSTEM AND METHOD FOR BENDING CRYSTAL WAFERS FOR USE IN HIGH RESOLU...

NEUTRAL ATOM QUANTUM INFORMATION PROCESSOR

X-RAY APPARATUS

X-RAY OPTICAL ARRANGEMENT

X-RAY FLUORESCENCE ANALYZER WITH A PLURALITY OF MEASUREMENT CHANNEL...

X-RAY FLUORESCENCE ANALYZER, AND A METHOD FOR PERFORMING X-RAY FLUO...

X-RAY FLUORESCENCE ANALYZER, AND A METHOD FOR PERFORMING X-RAY FLUO...

HARD X-RAY PHOTOELECTRON SPECTROSCOPY SYSTEM

CONSTRUCTIONS OF X-RAY LENSES FOR CONVERGING X-RAYS

SYSTEM AND METHOD FOR X-RAY FLUORESCENCE WITH FILTERING

X-RAY APPARATUS AND METHOD FOR OPERATING THE X-RAY APPARATUS

3-DIMENSIONAL X-RAY IMAGER

X-RAY SOURCE

METHOD AND APPARATUS FOR MEASURING SCATTERING INTENSITY DISTRIBUTION

XRF SYSTEM HAVING MULTIPLE EXCITATION ENERGY BANDS IN HIGHLY ALIGNE...

HIGH PERFORMANCE KRATKY ASSEMBLY

X-RAY ANALYZER HAVING MULTIPLE EXCITATION ENERGY BANDS PRODUCED USI...

DIFFRACTION LEVERAGED MODULATION OF X-RAY PULSES USING MEMS-BASED X...

MOBILE TRANSPORT AND SHIELDING APPARATUS FOR REMOVABLE X-RAY ANALYZER

X-ray analyzing system for x-ray scattering analysis

XRF SYSTEM HAVING MULTIPLE EXCITATION ENERGY BANDS IN HIGHLY ALIGNE...

X-RAY CONTROL UNIT USING MONOCRYSTALLINE MATERIAL

Silicon focusing mirror system

METHOD FOR CHARACTERIZATION OF A SPHERICALLY BENT CRYSTAL FOR K-alp...

SYSTEM AND METHOD FOR CHARACTERIZING A FILM BY X-RAY PHOTOELECTRON...

OPTICAL DEVICE FOR ANALYZING A SPECIMEN BY THE SCATTERING OF AN X-R...

Confocal Double Crystal Monochromator

DIFFRACTOMETER

Two-Axis Sagittal Focusing Monochromator

SYSTEMS AND METHODS FOR DETECTING AN IMAGE OF AN OBJECT USING MULTI...