the mass being suspended at more than one of its sides

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CPC
G01P2015/084

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Parent Industries

GPHYSICS G01Measuring instruments G01PMEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT

Current Industry

G01P2015/084the mass being suspended at more than one of its sides

Industries

Patents Grantslast 30 patents

Information Patent Grant
Multi-axis, single mass accelerometer
- Patent number 12,019,197
- Issue date Jun 25, 2024
- TGS-NOPEC Geophysical Company
- Cornelis A. M. Faber
- G01 - MEASURING TESTING
Information Patent Grant
MEMS accelerometer
- Patent number 12,013,414
- Issue date Jun 18, 2024
- AAC KAITAI TECHNOLOGIES (WUHAN) CO., LTD
- Shitao Yan
- G01 - MEASURING TESTING
Information Patent Grant
Combined corrugated piezoelectric microphone and corrugated piezoel...
- Patent number 11,962,973
- Issue date Apr 16, 2024
- Infineon Technologies AG
- Christian Bretthauer
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
3-axis accelerometer
- Patent number 11,733,263
- Issue date Aug 22, 2023
- Analog Devices, Inc.
- Jianglong Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Combined corrugated piezoelectric microphone and corrugated piezoel...
- Patent number 11,693,021
- Issue date Jul 4, 2023
- Infineon Technologies AG
- Somu Goswami
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Multi-mass MEMS motion sensor
- Patent number 11,674,803
- Issue date Jun 13, 2023
- Motion Engine, Inc.
- Robert Mark Boysel
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
MEMS tri-axial accelerometer with one or more decoupling elements
- Patent number 11,650,221
- Issue date May 16, 2023
- STMicroelectronics S.r.l.
- Alessandro Tocchio
- G01 - MEASURING TESTING
Information Patent Grant
Combined corrugated piezoelectric microphone and corrugated piezoel...
- Patent number 11,611,835
- Issue date Mar 21, 2023
- Infineon Technologies AG
- Christian Bretthauer
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Micromechanical component and method for manufacturing a micromecha...
- Patent number 11,584,634
- Issue date Feb 21, 2023
- Robert Bosch GmbH
- Johannes Classen
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Multi-axis, single mass accelerometer
- Patent number 11,561,314
- Issue date Jan 24, 2023
- TGS-NOPEC Geophysical Corporation
- Cornelis A. M. Faber
- G01 - MEASURING TESTING
Information Patent Grant
Single proof mass based three-axis accelerometer
- Patent number 11,493,533
- Issue date Nov 8, 2022
- MEMSIC Semiconductor (TIANJIN) Co., Ltd.
- Leyue Jiang
- G01 - MEASURING TESTING
Information Patent Grant
Low-noise multi-axis MEMS accelerometer
- Patent number 11,467,181
- Issue date Oct 11, 2022
- Murata Manufacturing Co., Ltd.
- Matti Liukku
- G01 - MEASURING TESTING
Information Patent Grant
Sensor with fixed and movble components
- Patent number 11,460,482
- Issue date Oct 4, 2022
- Kabushiki Kaisha Toshiba
- Akira Fujimoto
- G01 - MEASURING TESTING
Information Patent Grant
Inertial sensor, electronic instrument, and vehicle
- Patent number 11,460,483
- Issue date Oct 4, 2022
- Seiko Epson Corporation
- Satoru Tanaka
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Method for estimating attachment posture of inertial sensor
- Patent number 11,320,450
- Issue date May 3, 2022
- Honda Motor Co., Ltd.
- Yasushi Ikeuchi
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
High performance accelerometer
- Patent number 11,287,443
- Issue date Mar 29, 2022
- Invensense, Inc.
- Sriraman Dakshinamurthy
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
MEMS inertial measurement apparatus having slanted electrodes for q...
- Patent number 11,280,612
- Issue date Mar 22, 2022
- Georgia Tech Research Corporation
- Farrokh Ayazi
- G01 - MEASURING TESTING
Information Patent Grant
MEMS inertial measurement apparatus having slanted electrodes for q...
- Patent number 11,280,613
- Issue date Mar 22, 2022
- Georgia Tech Research Corporation
- Farrokh Ayazi
- G01 - MEASURING TESTING
Information Patent Grant
Single proof mass based three-axis accelerometer
- Patent number 11,150,265
- Issue date Oct 19, 2021
- MEMSIC Semiconductor (TIANJIN) Co., Ltd.
- Leyue Jiang
- G01 - MEASURING TESTING
Information Patent Grant
Coupled accordion springs in microelectromechanical systems (MEMS)...
- Patent number 10,920,756
- Issue date Feb 16, 2021
- Analog Devices, Inc.
- Qian Zhang
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Single axis inertial sensor with suppressed parasitic modes
- Patent number 10,809,277
- Issue date Oct 20, 2020
- NXP USA, INC.
- Jun Tang
- G01 - MEASURING TESTING
Information Patent Grant
Acceleration sensor
- Patent number 10,802,041
- Issue date Oct 13, 2020
- Hitachi, Ltd.
- Atsushi Isobe
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
MEMS tri-axial accelerometer with one or more decoupling elements
- Patent number 10,768,199
- Issue date Sep 8, 2020
- STMicroelectronics S.r.l.
- Alessandro Tocchio
- G01 - MEASURING TESTING
Information Patent Grant
Acceleration sensor
- Patent number 10,739,376
- Issue date Aug 11, 2020
- Hitachi, Ltd.
- Atsushi Isobe
- G01 - MEASURING TESTING
Information Patent Grant
Integrated linear and angular MEMS accelerometers
- Patent number 10,732,198
- Issue date Aug 4, 2020
- Analog Devices, Inc.
- Xin Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Multi-axis accelerometers with reduced cross-axis sensitivity
- Patent number 10,634,696
- Issue date Apr 28, 2020
- Khalifa University of Science and Technology
- Zakriya Mohammed
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
MEMS inertial measurement apparatus having slanted electrodes for q...
- Patent number 10,634,499
- Issue date Apr 28, 2020
- Georgia Tech Research Corporation
- Farrokh Ayazi
- G01 - MEASURING TESTING
Information Patent Grant
Force sensor
- Patent number 10,634,695
- Issue date Apr 28, 2020
- MINEBEA MITSUMI INC.
- Shinya Yamaguchi
- G01 - MEASURING TESTING
Information Patent Grant
Multi-Axis, single mass accelerometer
- Patent number 10,545,254
- Issue date Jan 28, 2020
- ION Geophysical Corporation
- Cornelis A. M. Faber
- G01 - MEASURING TESTING
Information Patent Grant
Dynamic self-calibration of an accelerometer system
- Patent number 10,495,664
- Issue date Dec 3, 2019
- Northrop Grumman Systems Corporation
- Robert E. Stewart
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INERTIAL SENSOR AND INERTIAL MEASUREMENT UNIT
- Publication number 20230349945
- Publication date Nov 2, 2023
- SEIKO EPSON CORPORATION
- Teruo Takizawa
- G01 - MEASURING TESTING
Information Patent Application
MEMS TRI-AXIAL ACCELEROMETER WITH ONE OR MORE DECOUPLING ELEMENTS
- Publication number 20230314469
- Publication date Oct 5, 2023
- STMicroelectronics S.r.l.
- Alessandro TOCCHIO
- G01 - MEASURING TESTING
Information Patent Application
MULTI-AXIS, SINGLE MASS ACCELEROMETER
- Publication number 20230236333
- Publication date Jul 27, 2023
- TGS-NOPEC GEOPHYSICAL CORPORATION
- Cornelius A. M. Faber
- G01 - MEASURING TESTING
Information Patent Application
DUAL AND TRIPLE AXIS ACCELEROMETERS
- Publication number 20230204622
- Publication date Jun 29, 2023
- CAMBRIDGE ENTERPRISE LIMITED
- Ashwin SESHIA
- G01 - MEASURING TESTING
Information Patent Application
MICROMECHANICAL COMPONENT AND METHOD FOR MANUFACTURING A MICROMECHA...
- Publication number 20220048758
- Publication date Feb 17, 2022
- ROBERT BOSCH GmbH
- Johannes Classen
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
SINGLE PROOF MASS BASED THREE-AXIS ACCELEROMETER
- Publication number 20210405084
- Publication date Dec 30, 2021
- MEMSIC Semiconductor (TIANJIN) Co., Ltd.
- Leyue Jiang
- G01 - MEASURING TESTING
Information Patent Application
SINGLE PROOF MASS BASED THREE-AXIS ACCELEROMETER
- Publication number 20210132107
- Publication date May 6, 2021
- MEMSIC Semiconductor (TIANJIN) Co., Ltd.
- Leyue Jiang
- G01 - MEASURING TESTING
Information Patent Application
LOW-NOISE MULTI-AXIS MEMS ACCELEROMETER
- Publication number 20210072280
- Publication date Mar 11, 2021
- Murata Manufacturing Co., Ltd.
- Matti LIUKKU
- G01 - MEASURING TESTING
Information Patent Application
SENSOR
- Publication number 20210063432
- Publication date Mar 4, 2021
- Kabushiki Kaisha Toshiba
- Akira FUJIMOTO
- G01 - MEASURING TESTING
Information Patent Application
Inertial Sensor, Electronic Instrument, And Vehicle
- Publication number 20200408802
- Publication date Dec 31, 2020
- SEIKO EPSON CORPORATION
- Satoru TANAKA
- G01 - MEASURING TESTING
Information Patent Application
MEMS TRI-AXIAL ACCELEROMETER WITH ONE OR MORE DECOUPLING ELEMENTS
- Publication number 20200363448
- Publication date Nov 19, 2020
- STMicroelectronics S.r.l.
- Alessandro TOCCHIO
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR ESTIMATING ATTACHMENT POSTURE OF INERTIAL SENSOR
- Publication number 20200292573
- Publication date Sep 17, 2020
- Honda Motor Co.,Ltd.
- Yasushi IKEUCHI
- G01 - MEASURING TESTING
Information Patent Application
HIGH PERFORMANCE ACCELEROMETER
- Publication number 20200264210
- Publication date Aug 20, 2020
- InvenSense, Inc.
- Sriraman Dakshinamurthy
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
MEMS INERTIAL MEASUREMENT APPARATUS HAVING SLANTED ELECTRODES FOR Q...
- Publication number 20200225036
- Publication date Jul 16, 2020
- Farrokh Ayazi
- G01 - MEASURING TESTING
Information Patent Application
MEMS INERTIAL MEASUREMENT APPARATUS HAVING SLANTED ELECTRODES FOR Q...
- Publication number 20200225037
- Publication date Jul 16, 2020
- Farrokh Ayazi
- G01 - MEASURING TESTING
Information Patent Application
MULTI-AXIS, SINGLE MASS ACCELEROMETER
- Publication number 20200166666
- Publication date May 28, 2020
- ION Geophysical Corporation
- Cornelis A.M. Faber
- G01 - MEASURING TESTING
Information Patent Application
3-AXIS ACCELEROMETER
- Publication number 20200096538
- Publication date Mar 26, 2020
- Analog Devices, Inc.
- Jianglong Zhang
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED MOTION PROCESSING UNIT (MPU) WITH MEMS INERTIAL SENSING...
- Publication number 20190226848
- Publication date Jul 25, 2019
- InvenSense, Inc.
- Steven S. NASIRI
- G01 - MEASURING TESTING
Information Patent Application
SINGLE AXIS INERTIAL SENSOR WITH SUPPRESSED PARASITIC MODES
- Publication number 20190187169
- Publication date Jun 20, 2019
- NXP USA, Inc.
- Jun Tang
- G01 - MEASURING TESTING
Information Patent Application
ACCELERATION SENSOR
- Publication number 20190162752
- Publication date May 30, 2019
- Hitachi, Ltd
- Atsushi ISOBE
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
DYNAMIC SELF-CALIBRATION OF AN ACCELEROMETER SYSTEM
- Publication number 20190049485
- Publication date Feb 14, 2019
- Northrop Grumman Systems Corporation
- Robert E. Stewart
- G01 - MEASURING TESTING
Information Patent Application
FORCE SENSOR
- Publication number 20180313866
- Publication date Nov 1, 2018
- MITSUMI ELECTRIC CO., LTD.
- Shinya YAMAGUCHI
- G01 - MEASURING TESTING
Information Patent Application
Acceleration Sensor
- Publication number 20180252745
- Publication date Sep 6, 2018
- Hitachi, Ltd
- Atsushi ISOBE
- G01 - MEASURING TESTING
Information Patent Application
ANCHOR TRACKING FOR MEMS ACCELEROMETERS
- Publication number 20180231580
- Publication date Aug 16, 2018
- Analog Devices, Inc.
- William A. Clark
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
MULTI-AXIS ACCELEROMETERS WITH REDUCED CROSS-AXIS SENSITIVITY
- Publication number 20180188283
- Publication date Jul 5, 2018
- Khalifa University of Science and Technology
- Zakriya MOHAMMED
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEMS TRI-AXIAL ACCELEROMETER
- Publication number 20180120342
- Publication date May 3, 2018
- STMicroelectronics S.r.l.
- Alessandro TOCCHIO
- G01 - MEASURING TESTING
Information Patent Application
ACCELERATION SENSOR AND MOUNTING STRUCTURE OF ACCELERATION SENSOR
- Publication number 20170345948
- Publication date Nov 30, 2017
- Kiyomasa SUGIMOTO
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
DYNAMIC SELF-CALIBRATION OF AN ACCELEROMETER SYSTEM
- Publication number 20170269122
- Publication date Sep 21, 2017
- Northrop Grumman Systems Corporation
- Robert E. Stewart
- G01 - MEASURING TESTING
Information Patent Application
MULTI-AXIS, SINGLE MASS ACCELEROMETER
- Publication number 20170123088
- Publication date May 4, 2017
- ION Geophysical Corporation
- Kees Faber
- G01 - MEASURING TESTING
Information Patent Application
INERTIAL FORCE SENSOR
- Publication number 20140373626
- Publication date Dec 25, 2014
- HIDEO OHKOSHI
- G01 - MEASURING TESTING

the mass being suspended at more than one of its sides

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Multi-axis, single mass accelerometer

MEMS accelerometer

Combined corrugated piezoelectric microphone and corrugated piezoel...

3-axis accelerometer

Combined corrugated piezoelectric microphone and corrugated piezoel...

Multi-mass MEMS motion sensor

MEMS tri-axial accelerometer with one or more decoupling elements

Combined corrugated piezoelectric microphone and corrugated piezoel...

Micromechanical component and method for manufacturing a micromecha...

Multi-axis, single mass accelerometer

Single proof mass based three-axis accelerometer

Low-noise multi-axis MEMS accelerometer

Sensor with fixed and movble components

Inertial sensor, electronic instrument, and vehicle

Method for estimating attachment posture of inertial sensor

High performance accelerometer

MEMS inertial measurement apparatus having slanted electrodes for q...

MEMS inertial measurement apparatus having slanted electrodes for q...

Single proof mass based three-axis accelerometer

Coupled accordion springs in microelectromechanical systems (MEMS)...

Single axis inertial sensor with suppressed parasitic modes

Acceleration sensor

MEMS tri-axial accelerometer with one or more decoupling elements

Acceleration sensor

Integrated linear and angular MEMS accelerometers

Multi-axis accelerometers with reduced cross-axis sensitivity

MEMS inertial measurement apparatus having slanted electrodes for q...

Force sensor

Multi-Axis, single mass accelerometer

Dynamic self-calibration of an accelerometer system

Patents Applicationslast 30 patents

INERTIAL SENSOR AND INERTIAL MEASUREMENT UNIT

MEMS TRI-AXIAL ACCELEROMETER WITH ONE OR MORE DECOUPLING ELEMENTS

MULTI-AXIS, SINGLE MASS ACCELEROMETER

DUAL AND TRIPLE AXIS ACCELEROMETERS

MICROMECHANICAL COMPONENT AND METHOD FOR MANUFACTURING A MICROMECHA...

SINGLE PROOF MASS BASED THREE-AXIS ACCELEROMETER

SINGLE PROOF MASS BASED THREE-AXIS ACCELEROMETER

LOW-NOISE MULTI-AXIS MEMS ACCELEROMETER

SENSOR

Inertial Sensor, Electronic Instrument, And Vehicle

MEMS TRI-AXIAL ACCELEROMETER WITH ONE OR MORE DECOUPLING ELEMENTS

METHOD FOR ESTIMATING ATTACHMENT POSTURE OF INERTIAL SENSOR

HIGH PERFORMANCE ACCELEROMETER

MEMS INERTIAL MEASUREMENT APPARATUS HAVING SLANTED ELECTRODES FOR Q...

MEMS INERTIAL MEASUREMENT APPARATUS HAVING SLANTED ELECTRODES FOR Q...

MULTI-AXIS, SINGLE MASS ACCELEROMETER

3-AXIS ACCELEROMETER

INTEGRATED MOTION PROCESSING UNIT (MPU) WITH MEMS INERTIAL SENSING...

SINGLE AXIS INERTIAL SENSOR WITH SUPPRESSED PARASITIC MODES

ACCELERATION SENSOR

DYNAMIC SELF-CALIBRATION OF AN ACCELEROMETER SYSTEM

FORCE SENSOR

Acceleration Sensor

ANCHOR TRACKING FOR MEMS ACCELEROMETERS

MULTI-AXIS ACCELEROMETERS WITH REDUCED CROSS-AXIS SENSITIVITY

MEMS TRI-AXIAL ACCELEROMETER

ACCELERATION SENSOR AND MOUNTING STRUCTURE OF ACCELERATION SENSOR

DYNAMIC SELF-CALIBRATION OF AN ACCELEROMETER SYSTEM

MULTI-AXIS, SINGLE MASS ACCELEROMETER

INERTIAL FORCE SENSOR