Membership
Tour
Register
Log in
the pattern being processed optically
Follow
Industry
CPC
G01J2009/0238
This industry / category may be too specific. Please go to a parent level for more data
Parent Industries
G
PHYSICS
G01
Measuring instruments
G01J
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY
Current Industry
G01J2009/0238
the pattern being processed optically
Industries
Overview
Organizations
People
Information
Impact
Please log in for detailed analytics
Patents Grants
last 30 patents
Information
Patent Grant
Totagraphy: coherent diffractive/digital information reconstruction...
Patent number
12,031,868
Issue date
Jul 9, 2024
Wavefront Analysis Systems LLC
Okan Ersoy
G01 - MEASURING TESTING
Information
Patent Grant
Totagraphy: Coherent diffractive/digital information reconstruction...
Patent number
11,237,059
Issue date
Feb 1, 2022
Gerchberg Ophthalmic Dispensing, PLLC
Okan Ersoy
G01 - MEASURING TESTING
Information
Patent Grant
High speed random access variable focusing and steering of a patter...
Patent number
11,131,845
Issue date
Sep 28, 2021
The Board of Trustees of the Leland Stanford Junior University
Stephen S. Hamann
G01 - MEASURING TESTING
Information
Patent Grant
Coherent light detection system and method
Patent number
11,047,742
Issue date
Jun 29, 2021
The Boeing Company
Thomas G. Chrien
G01 - MEASURING TESTING
Information
Patent Grant
Method and device for measuring wavefront using diffraction grating...
Patent number
10,571,340
Issue date
Feb 25, 2020
Nikon Corporation
Katsura Otaki
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Ocular metrology employing spectral wavefront analysis of reflected...
Patent number
10,470,655
Issue date
Nov 12, 2019
Steven James Frisken
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Method and device for measuring wavefront using light-exit section...
Patent number
10,288,489
Issue date
May 14, 2019
Nikon Corporation
Katsura Otaki
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Detection device and detection method
Patent number
10,094,653
Issue date
Oct 9, 2018
BOE Technology Group Co., Ltd.
Yangkun Jing
G01 - MEASURING TESTING
Information
Patent Grant
Ocular metrology employing spectral wavefront analysis of reflected...
Patent number
9,913,579
Issue date
Mar 13, 2018
Steven James Frisken
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Wavefront analyser
Patent number
9,861,277
Issue date
Jan 9, 2018
Trevor Bruce Anderson
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Device and method for characterizing a light beam
Patent number
9,243,957
Issue date
Jan 26, 2016
Commissariat a l'Energie Atomique et Aux Energies Alternatives
Fabien Quere
G01 - MEASURING TESTING
Information
Patent Grant
Method for determining power of modulated signals from a frequency...
Patent number
7,102,755
Issue date
Sep 5, 2006
Agilent Technologies, Inc.
David M Braun
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for laser beam diagnosis
Patent number
5,042,950
Issue date
Aug 27, 1991
The United States of America as represented by the United States Department o...
Joseph T. Salmon
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
LASER SYSTEM, SPECTRUM WAVEFORM CALCULATION METHOD, AND ELECTRONIC...
Publication number
20230349762
Publication date
Nov 2, 2023
Gigaphoton Inc.
Natsuhiko KOUNO
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Application
COHERENT LIGHT DETECTION SYSTEM AND METHOD
Publication number
20210148764
Publication date
May 20, 2021
The Boeing Company
THOMAS G. CHRIEN
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS FOR MEASURE OF COHERENCE OF LIGHT SOURCE FOR HOLOGRAPHIC...
Publication number
20200182701
Publication date
Jun 11, 2020
ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE
Jeho NAM
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND DEVICE FOR MEASURING WAVEFRONT, AND EXPOSURE METHOD AND...
Publication number
20190219451
Publication date
Jul 18, 2019
Nikon Corporation
Katsura Otaki
G01 - MEASURING TESTING
Information
Patent Application
OCULAR METROLOGY EMPLOYING SPECTRAL WAVEFRONT ANALYSIS OF REFLECTED...
Publication number
20180146851
Publication date
May 31, 2018
Steven James Frisken
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Application
Detection Device and Detection Method
Publication number
20170284791
Publication date
Oct 5, 2017
BOE TECHNOLOGY GROUP CO., LTD.
Yangkun JING
G01 - MEASURING TESTING
Information
Patent Application
Device And Method For Characterizing A Light Beam
Publication number
20140098367
Publication date
Apr 10, 2014
Commissariat A L'Energie Atomique et Aux Energies Alternatives
Fabien Quere
G01 - MEASURING TESTING
Information
Patent Application
WAVEFRONT ABERRATION AND DISTANCE MEASUREMENT PHASE CAMERA
Publication number
20100091146
Publication date
Apr 15, 2010
UNIVERSIDAD DE LA LAGUNA
José Manuel Rodriguez Ramos
G02 - OPTICS